IL106513A - Integrated circuit security system and method with implanted interconnections - Google Patents
Integrated circuit security system and method with implanted interconnectionsInfo
- Publication number
- IL106513A IL106513A IL106513A IL10651393A IL106513A IL 106513 A IL106513 A IL 106513A IL 106513 A IL106513 A IL 106513A IL 10651393 A IL10651393 A IL 10651393A IL 106513 A IL106513 A IL 106513A
- Authority
- IL
- Israel
- Prior art keywords
- integrated circuit
- interconnect
- security system
- substrate
- circuit security
- Prior art date
Links
- 239000000758 substrate Substances 0.000 abstract 3
- 239000002019 doping agent Substances 0.000 abstract 2
- 239000007943 implant Substances 0.000 abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/57—Protection from inspection, reverse engineering or tampering
- H01L23/573—Protection from inspection, reverse engineering or tampering using passive means
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US92341192A | 1992-07-31 | 1992-07-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
IL106513A true IL106513A (en) | 1997-03-18 |
Family
ID=25448650
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL106513A IL106513A (en) | 1992-07-31 | 1993-07-28 | Integrated circuit security system and method with implanted interconnections |
Country Status (5)
Country | Link |
---|---|
US (3) | US5866933A (xx) |
EP (2) | EP0940851B1 (xx) |
JP (1) | JPH06163539A (xx) |
DE (2) | DE69324637T2 (xx) |
IL (1) | IL106513A (xx) |
Families Citing this family (59)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69324637T2 (de) | 1992-07-31 | 1999-12-30 | Hughes Electronics Corp., El Segundo | Sicherheitssystem für integrierte Schaltung und Verfahren mit implantierten Leitungen |
US5783846A (en) * | 1995-09-22 | 1998-07-21 | Hughes Electronics Corporation | Digital circuit with transistor geometry and channel stops providing camouflage against reverse engineering |
JPH09293283A (ja) * | 1996-04-25 | 1997-11-11 | Hewlett Packard Co <Hp> | プローブ装置およびその製造方法、ならびにメディア移動型メモリ装置 |
JP3405508B2 (ja) * | 1997-05-30 | 2003-05-12 | 富士通株式会社 | 半導体集積回路 |
US5973375A (en) * | 1997-06-06 | 1999-10-26 | Hughes Electronics Corporation | Camouflaged circuit structure with step implants |
DE19810730A1 (de) * | 1998-03-12 | 1999-09-16 | Philips Patentverwaltung | Microcontrollerschaltung |
DE19852072C2 (de) | 1998-11-11 | 2001-10-18 | Infineon Technologies Ag | Verfahren zur Herstellung eines Halbleiterbauelements mit einer stückweise im Substrat verlaufenden Verdrahtung |
US6096580A (en) * | 1999-09-24 | 2000-08-01 | International Business Machines Corporation | Low programming voltage anti-fuse |
US6275072B1 (en) * | 1999-10-07 | 2001-08-14 | Velio Communications, Inc. | Combined phase comparator and charge pump circuit |
US6396368B1 (en) | 1999-11-10 | 2002-05-28 | Hrl Laboratories, Llc | CMOS-compatible MEM switches and method of making |
US6515304B1 (en) * | 2000-06-23 | 2003-02-04 | International Business Machines Corporation | Device for defeating reverse engineering of integrated circuits by optical means |
JP4794030B2 (ja) * | 2000-07-10 | 2011-10-12 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US7217977B2 (en) * | 2004-04-19 | 2007-05-15 | Hrl Laboratories, Llc | Covert transformation of transistor properties as a circuit protection method |
US6815816B1 (en) * | 2000-10-25 | 2004-11-09 | Hrl Laboratories, Llc | Implanted hidden interconnections in a semiconductor device for preventing reverse engineering |
US6791191B2 (en) | 2001-01-24 | 2004-09-14 | Hrl Laboratories, Llc | Integrated circuits protected against reverse engineering and method for fabricating the same using vias without metal terminations |
US7294935B2 (en) * | 2001-01-24 | 2007-11-13 | Hrl Laboratories, Llc | Integrated circuits protected against reverse engineering and method for fabricating the same using an apparent metal contact line terminating on field oxide |
JP4899248B2 (ja) * | 2001-04-02 | 2012-03-21 | 富士通セミコンダクター株式会社 | 半導体集積回路 |
US6459629B1 (en) * | 2001-05-03 | 2002-10-01 | Hrl Laboratories, Llc | Memory with a bit line block and/or a word line block for preventing reverse engineering |
US6740942B2 (en) | 2001-06-15 | 2004-05-25 | Hrl Laboratories, Llc. | Permanently on transistor implemented using a double polysilicon layer CMOS process with buried contact |
US6774413B2 (en) | 2001-06-15 | 2004-08-10 | Hrl Laboratories, Llc | Integrated circuit structure with programmable connector/isolator |
US6897535B2 (en) | 2002-05-14 | 2005-05-24 | Hrl Laboratories, Llc | Integrated circuit with reverse engineering protection |
US7049667B2 (en) * | 2002-09-27 | 2006-05-23 | Hrl Laboratories, Llc | Conductive channel pseudo block process and circuit to inhibit reverse engineering |
US6924552B2 (en) * | 2002-10-21 | 2005-08-02 | Hrl Laboratories, Llc | Multilayered integrated circuit with extraneous conductive traces |
US6979606B2 (en) | 2002-11-22 | 2005-12-27 | Hrl Laboratories, Llc | Use of silicon block process step to camouflage a false transistor |
AU2003293540A1 (en) | 2002-12-13 | 2004-07-09 | Raytheon Company | Integrated circuit modification using well implants |
WO2004070832A1 (ja) * | 2003-02-04 | 2004-08-19 | Matsushita Electric Industrial Co., Ltd. | 半導体集積回路装置 |
EP1654762A1 (en) * | 2003-07-11 | 2006-05-10 | Philips Intellectual Property & Standards GmbH | Security-sensitive semiconductor product, particularly a smart-card chip |
FR2865827A1 (fr) * | 2004-01-29 | 2005-08-05 | St Microelectronics Sa | Securisation du mode de test d'un circuit integre |
GB0410975D0 (en) | 2004-05-17 | 2004-06-16 | Nds Ltd | Chip shielding system and method |
US8296577B2 (en) * | 2004-06-08 | 2012-10-23 | Hrl Laboratories, Llc | Cryptographic bus architecture for the prevention of differential power analysis |
US7242063B1 (en) | 2004-06-29 | 2007-07-10 | Hrl Laboratories, Llc | Symmetric non-intrusive and covert technique to render a transistor permanently non-operable |
US8247840B2 (en) * | 2004-07-07 | 2012-08-21 | Semi Solutions, Llc | Apparatus and method for improved leakage current of silicon on insulator transistors using a forward biased diode |
US7375402B2 (en) * | 2004-07-07 | 2008-05-20 | Semi Solutions, Llc | Method and apparatus for increasing stability of MOS memory cells |
US7224205B2 (en) * | 2004-07-07 | 2007-05-29 | Semi Solutions, Llc | Apparatus and method for improving drive-strength and leakage of deep submicron MOS transistors |
US7683433B2 (en) * | 2004-07-07 | 2010-03-23 | Semi Solution, Llc | Apparatus and method for improving drive-strength and leakage of deep submicron MOS transistors |
US7651905B2 (en) * | 2005-01-12 | 2010-01-26 | Semi Solutions, Llc | Apparatus and method for reducing gate leakage in deep sub-micron MOS transistors using semi-rectifying contacts |
US7898297B2 (en) * | 2005-01-04 | 2011-03-01 | Semi Solution, Llc | Method and apparatus for dynamic threshold voltage control of MOS transistors in dynamic logic circuits |
DE102005028905A1 (de) * | 2005-06-22 | 2006-12-28 | Infineon Technologies Ag | Transistorbauelement |
FR2897439A1 (fr) * | 2006-02-15 | 2007-08-17 | St Microelectronics Sa | Circuit elelctronique comprenant un mode de test securise par l'utilisation d'un identifiant, et procede associe |
US7863689B2 (en) * | 2006-09-19 | 2011-01-04 | Semi Solutions, Llc. | Apparatus for using a well current source to effect a dynamic threshold voltage of a MOS transistor |
US8168487B2 (en) | 2006-09-28 | 2012-05-01 | Hrl Laboratories, Llc | Programmable connection and isolation of active regions in an integrated circuit using ambiguous features to confuse a reverse engineer |
US7994042B2 (en) * | 2007-10-26 | 2011-08-09 | International Business Machines Corporation | Techniques for impeding reverse engineering |
US7709401B2 (en) * | 2008-02-22 | 2010-05-04 | International Business Machines Corporation | Method of making thermally programmable anti-reverse engineering interconnects wherein interconnects only conduct when heated above room temperature |
US10691860B2 (en) | 2009-02-24 | 2020-06-23 | Rambus Inc. | Secure logic locking and configuration with camouflaged programmable micro netlists |
US8418091B2 (en) | 2009-02-24 | 2013-04-09 | Syphermedia International, Inc. | Method and apparatus for camouflaging a standard cell based integrated circuit |
US8151235B2 (en) * | 2009-02-24 | 2012-04-03 | Syphermedia International, Inc. | Camouflaging a standard cell based integrated circuit |
US8510700B2 (en) | 2009-02-24 | 2013-08-13 | Syphermedia International, Inc. | Method and apparatus for camouflaging a standard cell based integrated circuit with micro circuits and post processing |
US9735781B2 (en) | 2009-02-24 | 2017-08-15 | Syphermedia International, Inc. | Physically unclonable camouflage structure and methods for fabricating same |
US8111089B2 (en) * | 2009-05-28 | 2012-02-07 | Syphermedia International, Inc. | Building block for a secure CMOS logic cell library |
JP2012054502A (ja) * | 2010-09-03 | 2012-03-15 | Elpida Memory Inc | 半導体装置 |
US8975748B1 (en) | 2011-06-07 | 2015-03-10 | Secure Silicon Layer, Inc. | Semiconductor device having features to prevent reverse engineering |
US9287879B2 (en) * | 2011-06-07 | 2016-03-15 | Verisiti, Inc. | Semiconductor device having features to prevent reverse engineering |
US9437555B2 (en) * | 2011-06-07 | 2016-09-06 | Verisiti, Inc. | Semiconductor device having features to prevent reverse engineering |
US9218511B2 (en) | 2011-06-07 | 2015-12-22 | Verisiti, Inc. | Semiconductor device having features to prevent reverse engineering |
US9484110B2 (en) * | 2013-07-29 | 2016-11-01 | Qualcomm Incorporated | Mask-programmed read only memory with enhanced security |
US9479176B1 (en) | 2013-12-09 | 2016-10-25 | Rambus Inc. | Methods and circuits for protecting integrated circuits from reverse engineering |
US10568202B2 (en) | 2017-07-25 | 2020-02-18 | International Business Machines Corporation | Tamper-respondent assembly with interconnect characteristic(s) obscuring circuit layout |
US11695011B2 (en) | 2018-05-02 | 2023-07-04 | Nanyang Technological University | Integrated circuit layout cell, integrated circuit layout arrangement, and methods of forming the same |
US10923596B2 (en) | 2019-03-08 | 2021-02-16 | Rambus Inc. | Camouflaged FinFET and method for producing same |
Family Cites Families (68)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3946426A (en) * | 1973-03-14 | 1976-03-23 | Harris Corporation | Interconnect system for integrated circuits |
US4267578A (en) * | 1974-08-26 | 1981-05-12 | Texas Instruments Incorporated | Calculator system with anti-theft feature |
US4139864A (en) * | 1976-01-14 | 1979-02-13 | Schulman Lawrence S | Security system for a solid state device |
NL185376C (nl) | 1976-10-25 | 1990-03-16 | Philips Nv | Werkwijze ter vervaardiging van een halfgeleiderinrichting. |
US4164461A (en) * | 1977-01-03 | 1979-08-14 | Raytheon Company | Semiconductor integrated circuit structures and manufacturing methods |
JPS54157092A (en) * | 1978-05-31 | 1979-12-11 | Nec Corp | Semiconductor integrated circuit device |
NL7903158A (nl) | 1979-04-23 | 1980-10-27 | Philips Nv | Werkwijze voor het vervaardigen van een veldeffekt- transistor met geisoleerde poortelektrode, en transistor vervaardigd door toepassing van een derge- lijke werkwijze. |
US4291391A (en) | 1979-09-14 | 1981-09-22 | Texas Instruments Incorporated | Taper isolated random access memory array and method of operating |
US4295897B1 (en) | 1979-10-03 | 1997-09-09 | Texas Instruments Inc | Method of making cmos integrated circuit device |
US4317273A (en) | 1979-11-13 | 1982-03-02 | Texas Instruments Incorporated | Method of making high coupling ratio DMOS electrically programmable ROM |
NL8003612A (nl) | 1980-06-23 | 1982-01-18 | Philips Nv | Werkwijze ter vervaardiging van een halfgeleider- inrichting en halfgeleiderinrichting vervaardigd door toepassing van deze werkwijze. |
FR2486717A1 (fr) * | 1980-07-08 | 1982-01-15 | Dassault Electronique | Dispositif de transistor pour circuit integre |
US4471376A (en) * | 1981-01-14 | 1984-09-11 | Harris Corporation | Amorphous devices and interconnect system and method of fabrication |
JPS5856355A (ja) * | 1981-09-30 | 1983-04-04 | Hitachi Ltd | 半導体集積回路装置 |
US4435895A (en) | 1982-04-05 | 1984-03-13 | Bell Telephone Laboratories, Incorporated | Process for forming complementary integrated circuit devices |
JPS58190064A (ja) * | 1982-04-30 | 1983-11-05 | Hitachi Ltd | 半導体集積回路 |
US4603381A (en) * | 1982-06-30 | 1986-07-29 | Texas Instruments Incorporated | Use of implant process for programming ROM type processor for encryption |
JPS598352A (ja) | 1982-07-05 | 1984-01-17 | Nippon Gakki Seizo Kk | 半導体装置の製法 |
US4623255A (en) * | 1983-10-13 | 1986-11-18 | The United States Of America As Represented By The Administrator, National Aeronautics And Space Administration | Method of examining microcircuit patterns |
US4583011A (en) * | 1983-11-01 | 1986-04-15 | Standard Microsystems Corp. | Circuit to prevent pirating of an MOS circuit |
US4727493A (en) * | 1984-05-04 | 1988-02-23 | Integrated Logic Systems, Inc. | Integrated circuit architecture and fabrication method therefor |
US4975756A (en) * | 1985-05-01 | 1990-12-04 | Texas Instruments Incorporated | SRAM with local interconnect |
US4821085A (en) * | 1985-05-01 | 1989-04-11 | Texas Instruments Incorporated | VLSI local interconnect structure |
JPH06101551B2 (ja) | 1985-11-30 | 1994-12-12 | 日本電信電話株式会社 | Cmos集積回路装置 |
DE3705173A1 (de) * | 1986-02-28 | 1987-09-03 | Canon Kk | Halbleitervorrichtung |
EP0248267A3 (de) * | 1986-06-06 | 1990-04-25 | Siemens Aktiengesellschaft | Monolithisch integrierte Schaltung mit zueinander parallelen Schaltungszweigen |
JPS63129647A (ja) * | 1986-11-20 | 1988-06-02 | Fujitsu Ltd | 半導体装置 |
US5065208A (en) * | 1987-01-30 | 1991-11-12 | Texas Instruments Incorporated | Integrated bipolar and CMOS transistor with titanium nitride interconnections |
US4766516A (en) * | 1987-09-24 | 1988-08-23 | Hughes Aircraft Company | Method and apparatus for securing integrated circuits from unauthorized copying and use |
US4830974A (en) | 1988-01-11 | 1989-05-16 | Atmel Corporation | EPROM fabrication process |
JPH0246762A (ja) * | 1988-08-09 | 1990-02-16 | Mitsubishi Electric Corp | 半導体集積回路 |
US5168340A (en) | 1988-08-17 | 1992-12-01 | Texas Instruments Incorporated | Semiconductor integrated circuit device with guardring regions to prevent the formation of an MOS diode |
JPH0777239B2 (ja) * | 1988-09-22 | 1995-08-16 | 日本電気株式会社 | 浮遊ゲート型不揮発性半導体記憶装置 |
JPH02201935A (ja) * | 1988-12-02 | 1990-08-10 | Ncr Corp | コピー防止付回路ロジツク |
JPH02290043A (ja) * | 1989-02-02 | 1990-11-29 | Mitsubishi Electric Corp | 半導体装置 |
US5227649A (en) * | 1989-02-27 | 1993-07-13 | Texas Instruments Incorporated | Circuit layout and method for VLSI circuits having local interconnects |
JPH02237038A (ja) * | 1989-03-09 | 1990-09-19 | Ricoh Co Ltd | 半導体装置 |
DE69034027T2 (de) * | 1989-07-18 | 2003-09-25 | Sony Corp., Tokio/Tokyo | Verfahren zur Herstellung einer nicht flüchtigen Halbleiterspeichervorrichtung |
US5030796A (en) * | 1989-08-11 | 1991-07-09 | Rockwell International Corporation | Reverse-engineering resistant encapsulant for microelectric device |
US5117276A (en) * | 1989-08-14 | 1992-05-26 | Fairchild Camera And Instrument Corp. | High performance interconnect system for an integrated circuit |
JP2501428Y2 (ja) * | 1989-12-22 | 1996-06-19 | 株式会社リコー | 熱複写装置 |
FR2656939B1 (fr) * | 1990-01-09 | 1992-04-03 | Sgs Thomson Microelectronics | Verrous de securite pour circuit integre. |
US5124774A (en) * | 1990-01-12 | 1992-06-23 | Paradigm Technology, Inc. | Compact SRAM cell layout |
JPH0828120B2 (ja) * | 1990-05-23 | 1996-03-21 | 株式会社東芝 | アドレスデコード回路 |
US5132571A (en) * | 1990-08-01 | 1992-07-21 | Actel Corporation | Programmable interconnect architecture having interconnects disposed above function modules |
DE69133311T2 (de) | 1990-10-15 | 2004-06-24 | Aptix Corp., San Jose | Verbindungssubstrat mit integrierter Schaltung zur programmierbaren Verbindung und Probenuntersuchung |
US5050123A (en) * | 1990-11-13 | 1991-09-17 | Intel Corporation | Radiation shield for EPROM cells |
JP3027990B2 (ja) * | 1991-03-18 | 2000-04-04 | 富士通株式会社 | 半導体装置の製造方法 |
US5146117A (en) * | 1991-04-01 | 1992-09-08 | Hughes Aircraft Company | Convertible multi-function microelectronic logic gate structure and method of fabricating the same |
JP3110799B2 (ja) * | 1991-06-28 | 2000-11-20 | 株式会社東芝 | 半導体装置 |
JPH06204414A (ja) * | 1991-07-31 | 1994-07-22 | Texas Instr Inc <Ti> | Cmos集積回路のチャネルストップ構造 |
US5202591A (en) | 1991-08-09 | 1993-04-13 | Hughes Aircraft Company | Dynamic circuit disguise for microelectronic integrated digital logic circuits |
JP3118899B2 (ja) * | 1991-10-01 | 2000-12-18 | 日本電気株式会社 | アライメントチェックパターン |
JPH05136125A (ja) * | 1991-11-14 | 1993-06-01 | Hitachi Ltd | クロツク配線及びクロツク配線を有する半導体集積回路装置 |
US5231299A (en) * | 1992-03-24 | 1993-07-27 | International Business Machines Corporation | Structure and fabrication method for EEPROM memory cell with selective channel implants |
JPH05275529A (ja) | 1992-03-27 | 1993-10-22 | Matsushita Electron Corp | 半導体集積回路の製造方法 |
JPH05304207A (ja) | 1992-04-28 | 1993-11-16 | Oki Electric Ind Co Ltd | 半導体装置の素子間分離兼配線構造 |
US5384472A (en) | 1992-06-10 | 1995-01-24 | Aspec Technology, Inc. | Symmetrical multi-layer metal logic array with continuous substrate taps and extension portions for increased gate density |
DE69324637T2 (de) * | 1992-07-31 | 1999-12-30 | Hughes Electronics Corp., El Segundo | Sicherheitssystem für integrierte Schaltung und Verfahren mit implantierten Leitungen |
US5468990A (en) * | 1993-07-22 | 1995-11-21 | National Semiconductor Corp. | Structures for preventing reverse engineering of integrated circuits |
US5369299A (en) * | 1993-07-22 | 1994-11-29 | National Semiconductor Corporation | Tamper resistant integrated circuit structure |
US5354704A (en) * | 1993-07-28 | 1994-10-11 | United Microelectronics Corporation | Symmetric SRAM cell with buried N+ local interconnection line |
US5721150A (en) | 1993-10-25 | 1998-02-24 | Lsi Logic Corporation | Use of silicon for integrated circuit device interconnection by direct writing of patterns therein |
US5399441A (en) * | 1994-04-12 | 1995-03-21 | Dow Corning Corporation | Method of applying opaque coatings |
US5475251A (en) * | 1994-05-31 | 1995-12-12 | National Semiconductor Corporation | Secure non-volatile memory cell |
US5376577A (en) * | 1994-06-30 | 1994-12-27 | Micron Semiconductor, Inc. | Method of forming a low resistive current path between a buried contact and a diffusion region |
US5783846A (en) | 1995-09-22 | 1998-07-21 | Hughes Electronics Corporation | Digital circuit with transistor geometry and channel stops providing camouflage against reverse engineering |
US5973375A (en) | 1997-06-06 | 1999-10-26 | Hughes Electronics Corporation | Camouflaged circuit structure with step implants |
-
1993
- 1993-07-28 DE DE69324637T patent/DE69324637T2/de not_active Expired - Lifetime
- 1993-07-28 IL IL106513A patent/IL106513A/xx not_active IP Right Cessation
- 1993-07-28 EP EP98119897A patent/EP0940851B1/en not_active Expired - Lifetime
- 1993-07-28 EP EP93111978A patent/EP0585601B1/en not_active Expired - Lifetime
- 1993-07-28 DE DE69333881T patent/DE69333881T2/de not_active Expired - Lifetime
- 1993-08-02 JP JP5191479A patent/JPH06163539A/ja active Pending
-
1994
- 1994-02-03 US US08/191,063 patent/US5866933A/en not_active Expired - Lifetime
-
1998
- 1998-05-29 US US09/087,748 patent/US6294816B1/en not_active Expired - Lifetime
-
2000
- 2000-06-29 US US09/607,009 patent/US6613661B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0585601A1 (en) | 1994-03-09 |
US6613661B1 (en) | 2003-09-02 |
DE69333881D1 (de) | 2006-02-16 |
US6294816B1 (en) | 2001-09-25 |
EP0940851B1 (en) | 2005-10-05 |
EP0940851A1 (en) | 1999-09-08 |
US5866933A (en) | 1999-02-02 |
DE69324637T2 (de) | 1999-12-30 |
JPH06163539A (ja) | 1994-06-10 |
DE69324637D1 (de) | 1999-06-02 |
EP0585601B1 (en) | 1999-04-28 |
DE69333881T2 (de) | 2006-07-13 |
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