HK1178218A1 - Method for growing a group (iii) metal nitride film iii - Google Patents

Method for growing a group (iii) metal nitride film iii

Info

Publication number
HK1178218A1
HK1178218A1 HK13105021.7A HK13105021A HK1178218A1 HK 1178218 A1 HK1178218 A1 HK 1178218A1 HK 13105021 A HK13105021 A HK 13105021A HK 1178218 A1 HK1178218 A1 HK 1178218A1
Authority
HK
Hong Kong
Prior art keywords
iii
growing
group
nitride film
metal nitride
Prior art date
Application number
HK13105021.7A
Other languages
English (en)
Chinese (zh)
Inventor
Kenneth Scott Alexander Butcher
P Fouquet Marie-Pierre Francoise Wintrebert
Patrick Po-Tsang Chen
Have John Leo Paul Ten
David Ian Johnson
Original Assignee
Gallium Entpr Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2005903494A external-priority patent/AU2005903494A0/en
Application filed by Gallium Entpr Pty Ltd filed Critical Gallium Entpr Pty Ltd
Publication of HK1178218A1 publication Critical patent/HK1178218A1/xx

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/10Heating of the reaction chamber or the substrate
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/301AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C23C16/303Nitrides
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34Nitrides
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4404Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/448Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
    • C23C16/452Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45587Mechanical means for changing the gas flow
    • C23C16/45589Movable means, e.g. fans
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45587Mechanical means for changing the gas flow
    • C23C16/45591Fixed means, e.g. wings, baffles
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    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/10Heating of the reaction chamber or the substrate
    • C30B25/105Heating of the reaction chamber or the substrate by irradiation or electric discharge
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403AIII-nitrides
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    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403AIII-nitrides
    • C30B29/406Gallium nitride
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
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    • H01L21/02387Group 13/15 materials
    • H01L21/02389Nitrides
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
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    • H01L21/02439Materials
    • H01L21/02469Group 12/16 materials
    • H01L21/02472Oxides
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02538Group 13/15 materials
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)
HK13105021.7A 2004-09-27 2013-04-25 Method for growing a group (iii) metal nitride film iii HK1178218A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US61391004P 2004-09-27 2004-09-27
AU2005903494A AU2005903494A0 (en) 2005-07-01 Heater apparatus
AU2005904919A AU2005904919A0 (en) 2005-09-07 Method and apparatus for growing a metal nitride film of improved quality using a remote plasma enhanced deposition (RPECVD) process

Publications (1)

Publication Number Publication Date
HK1178218A1 true HK1178218A1 (en) 2013-09-06

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ID=36118504

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HK13105021.7A HK1178218A1 (en) 2004-09-27 2013-04-25 Method for growing a group (iii) metal nitride film iii

Country Status (8)

Country Link
US (1) US8298624B2 (fr)
EP (2) EP2573206B1 (fr)
JP (1) JP4468990B2 (fr)
KR (1) KR101352150B1 (fr)
BR (1) BRPI0516136A (fr)
CA (1) CA2581626C (fr)
HK (1) HK1178218A1 (fr)
WO (1) WO2006034540A1 (fr)

Families Citing this family (81)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4631681B2 (ja) * 2005-12-05 2011-02-16 日立電線株式会社 窒化物系半導体基板及び半導体装置
US20070215195A1 (en) * 2006-03-18 2007-09-20 Benyamin Buller Elongated photovoltaic cells in tubular casings
US20070240631A1 (en) * 2006-04-14 2007-10-18 Applied Materials, Inc. Epitaxial growth of compound nitride semiconductor structures
KR100809243B1 (ko) * 2006-04-27 2008-02-29 삼성전기주식회사 질화물막 제조방법 및 질화물 구조
US20080092819A1 (en) * 2006-10-24 2008-04-24 Applied Materials, Inc. Substrate support structure with rapid temperature change
US20080314311A1 (en) * 2007-06-24 2008-12-25 Burrows Brian H Hvpe showerhead design
ZA200806479B (en) 2007-07-20 2009-04-29 Gallium Entpr Pty Ltd Buried contact devices for nitride-based films and manufacture thereof
US20090149008A1 (en) * 2007-10-05 2009-06-11 Applied Materials, Inc. Method for depositing group iii/v compounds
US8217498B2 (en) 2007-10-18 2012-07-10 Corning Incorporated Gallium nitride semiconductor device on SOI and process for making same
US20090194026A1 (en) * 2008-01-31 2009-08-06 Burrows Brian H Processing system for fabricating compound nitride semiconductor devices
US20100006023A1 (en) * 2008-07-11 2010-01-14 Palo Alto Research Center Incorporated Method For Preparing Films And Devices Under High Nitrogen Chemical Potential
EP2332167A4 (fr) 2008-10-03 2012-06-20 Veeco Process Equipment Inc Système d épitaxie en phase vapeur
US20100139554A1 (en) * 2008-12-08 2010-06-10 Applied Materials, Inc. Methods and apparatus for making gallium nitride and gallium aluminum nitride thin films
CA2653581A1 (fr) * 2009-02-11 2010-08-11 Kenneth Scott Alexander Butcher Migration et depot chimique en phase vapeur assistes par plasma haute frequence
EP2396449B1 (fr) * 2009-02-13 2015-08-05 Gallium Enterprises Pty Ltd Dépôt assisté par plasma
WO2010100942A1 (fr) * 2009-03-05 2010-09-10 株式会社小糸製作所 Module électroluminescent, procédé de fabrication d'un module électroluminescent et unité d'éclairage
US8247886B1 (en) 2009-03-09 2012-08-21 Soraa, Inc. Polarization direction of optical devices using selected spatial configurations
US8299473B1 (en) 2009-04-07 2012-10-30 Soraa, Inc. Polarized white light devices using non-polar or semipolar gallium containing materials and transparent phosphors
US8110889B2 (en) * 2009-04-28 2012-02-07 Applied Materials, Inc. MOCVD single chamber split process for LED manufacturing
US20110079251A1 (en) * 2009-04-28 2011-04-07 Olga Kryliouk Method for in-situ cleaning of deposition systems
CN102414797A (zh) * 2009-04-29 2012-04-11 应用材料公司 在HVPE中形成原位预GaN沉积层的方法
US8791499B1 (en) 2009-05-27 2014-07-29 Soraa, Inc. GaN containing optical devices and method with ESD stability
TWI471913B (zh) * 2009-07-02 2015-02-01 Global Wafers Co Ltd Production method of gallium nitride based compound semiconductor
US20110027973A1 (en) * 2009-07-31 2011-02-03 Applied Materials, Inc. Method of forming led structures
US20110104843A1 (en) * 2009-07-31 2011-05-05 Applied Materials, Inc. Method of reducing degradation of multi quantum well (mqw) light emitting diodes
US9000466B1 (en) 2010-08-23 2015-04-07 Soraa, Inc. Methods and devices for light extraction from a group III-nitride volumetric LED using surface and sidewall roughening
DE102009043848A1 (de) * 2009-08-25 2011-03-03 Aixtron Ag CVD-Verfahren und CVD-Reaktor
KR20120090996A (ko) * 2009-08-27 2012-08-17 어플라이드 머티어리얼스, 인코포레이티드 인-시튜 챔버 세정 후 프로세스 챔버의 제염 방법
US20110064545A1 (en) * 2009-09-16 2011-03-17 Applied Materials, Inc. Substrate transfer mechanism with preheating features
US9583678B2 (en) 2009-09-18 2017-02-28 Soraa, Inc. High-performance LED fabrication
US8933644B2 (en) 2009-09-18 2015-01-13 Soraa, Inc. LED lamps with improved quality of light
US9293644B2 (en) 2009-09-18 2016-03-22 Soraa, Inc. Power light emitting diode and method with uniform current density operation
US8502465B2 (en) * 2009-09-18 2013-08-06 Soraa, Inc. Power light emitting diode and method with current density operation
US20110076400A1 (en) * 2009-09-30 2011-03-31 Applied Materials, Inc. Nanocrystalline diamond-structured carbon coating of silicon carbide
CN102414846A (zh) * 2009-10-07 2012-04-11 应用材料公司 用于led制造的改良多腔室分离处理
US20110108854A1 (en) * 2009-11-10 2011-05-12 Chien-Min Sung Substantially lattice matched semiconductor materials and associated methods
US8905588B2 (en) 2010-02-03 2014-12-09 Sorra, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
US8740413B1 (en) 2010-02-03 2014-06-03 Soraa, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
US10147850B1 (en) 2010-02-03 2018-12-04 Soraa, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
DE102010000388A1 (de) * 2010-02-11 2011-08-11 Aixtron Ag, 52134 Gaseinlassorgan mit Prallplattenanordnung
US20110204376A1 (en) * 2010-02-23 2011-08-25 Applied Materials, Inc. Growth of multi-junction led film stacks with multi-chambered epitaxy system
US20110207256A1 (en) * 2010-02-24 2011-08-25 Applied Materials, Inc. In-situ acceptor activation with nitrogen and/or oxygen plasma treatment
US9450143B2 (en) 2010-06-18 2016-09-20 Soraa, Inc. Gallium and nitrogen containing triangular or diamond-shaped configuration for optical devices
US9076827B2 (en) 2010-09-14 2015-07-07 Applied Materials, Inc. Transfer chamber metrology for improved device yield
US8786053B2 (en) 2011-01-24 2014-07-22 Soraa, Inc. Gallium-nitride-on-handle substrate materials and devices and method of manufacture
US8143147B1 (en) 2011-02-10 2012-03-27 Intermolecular, Inc. Methods and systems for forming thin films
US10707082B2 (en) * 2011-07-06 2020-07-07 Asm International N.V. Methods for depositing thin films comprising indium nitride by atomic layer deposition
US8686431B2 (en) 2011-08-22 2014-04-01 Soraa, Inc. Gallium and nitrogen containing trilateral configuration for optical devices
CN104040675A (zh) * 2011-09-29 2014-09-10 氮化物处理股份有限公司 无机材料、制作其的方法和装置、及其使用
DE102011114671A1 (de) 2011-09-30 2013-04-04 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung eines optoelektronischen Halbleiterchips und optoelektronischer Halbleiterchip
US8912025B2 (en) 2011-11-23 2014-12-16 Soraa, Inc. Method for manufacture of bright GaN LEDs using a selective removal process
JP2013124201A (ja) * 2011-12-14 2013-06-24 Tokyo Electron Ltd 窒化ガリウム膜の成膜装置および成膜方法ならびに水素化ガリウム発生器
EP2823515A4 (fr) 2012-03-06 2015-08-19 Soraa Inc Diodes électroluminescentes à couches de matériau à faible indice de réfraction destinées à réduire des effets de guidage de lumière
US8971368B1 (en) 2012-08-16 2015-03-03 Soraa Laser Diode, Inc. Laser devices having a gallium and nitrogen containing semipolar surface orientation
US9978904B2 (en) 2012-10-16 2018-05-22 Soraa, Inc. Indium gallium nitride light emitting devices
US9761763B2 (en) 2012-12-21 2017-09-12 Soraa, Inc. Dense-luminescent-materials-coated violet LEDs
US8802471B1 (en) 2012-12-21 2014-08-12 Soraa, Inc. Contacts for an n-type gallium and nitrogen substrate for optical devices
US8994033B2 (en) 2013-07-09 2015-03-31 Soraa, Inc. Contacts for an n-type gallium and nitrogen substrate for optical devices
US9410664B2 (en) 2013-08-29 2016-08-09 Soraa, Inc. Circadian friendly LED light source
CN104631091A (zh) * 2013-11-08 2015-05-20 中国石油天然气股份有限公司 一种碳纤维表面处理方法
KR102279673B1 (ko) 2014-01-15 2021-07-21 갈리움 엔터프라이지즈 피티와이 엘티디 필름 내의 불순물의 감소를 위한 장치 및 방법
WO2015120513A1 (fr) * 2014-02-11 2015-08-20 Kenneth Scott Alexander Butcher Contrôle électrostatique de couches de mouillage de métal pendant un dépôt
US20170229647A1 (en) 2014-05-05 2017-08-10 Okinawa Institute Of Science And Technology School Corporation System and method for fabricating perovskite film for solar cell applications
US10192717B2 (en) 2014-07-21 2019-01-29 Applied Materials, Inc. Conditioning remote plasma source for enhanced performance having repeatable etch and deposition rates
CN105895551A (zh) * 2014-12-25 2016-08-24 百力达太阳能股份有限公司 一种板式pecvd镀膜异常的补救装置
WO2016158651A1 (fr) * 2015-03-30 2016-10-06 東ソー株式会社 Compact fritté à base de nitrure de gallium et son procédé de fabrication
WO2016205562A1 (fr) 2015-06-16 2016-12-22 Georgia Tech Research Corporation Système et procédé d'augmentation de la vitesse de croissance de semi-conducteurs de nitrure iii et de réduction de courant ionique endommageant
JP6590420B2 (ja) * 2015-11-04 2019-10-16 国立研究開発法人産業技術総合研究所 窒素化合物の製造方法及び製造装置
JP6527482B2 (ja) * 2016-03-14 2019-06-05 東芝デバイス&ストレージ株式会社 半導体製造装置
JP7165529B2 (ja) * 2018-07-27 2022-11-04 大陽日酸株式会社 フランジ締結構造及びこれを用いた気相成長装置
KR102137886B1 (ko) * 2018-10-26 2020-07-24 인제대학교 산학협력단 h-BN 성장용 LPCVD 시스템
KR20210130264A (ko) 2019-03-22 2021-10-29 어플라이드 머티어리얼스, 인코포레이티드 초전도 막을 갖는 다층 디바이스의 증착을 위한 방법 및 장치
EP3942088A4 (fr) * 2019-03-22 2022-12-21 Applied Materials, Inc. Procédé et appareil de dépôt de nitrures métalliques
EP3976231A4 (fr) * 2019-05-24 2023-10-11 Entegris, Inc. Procédés et systèmes d'adsorption de vapeur organométallique
CN112531173A (zh) * 2019-09-17 2021-03-19 宁德新能源科技有限公司 金属箔处理工艺、电极极片及电化学装置
TWI780579B (zh) 2020-02-03 2022-10-11 美商應用材料股份有限公司 具有整合化氮化鋁晶種或波導層的超導奈米線單光子偵測器
TWI753759B (zh) 2020-02-03 2022-01-21 美商應用材料股份有限公司 具有整合化氮化鋁種晶或波導層的超導奈米線單光子偵測器
US20210395883A1 (en) * 2020-06-22 2021-12-23 Tokyo Electron Limited System and Method for Thermally Cracking Ammonia
JP2022139024A (ja) * 2021-03-11 2022-09-26 株式会社Screenホールディングス Iii族窒化物半導体の製造方法および製造装置
CN115010134B (zh) * 2022-06-21 2023-08-04 浙江六方碳素科技有限公司 一种化学气相沉积制备碳化硅海绵的装置
CN115110025B (zh) * 2022-07-20 2023-10-20 苏州大学 一种螺旋波等离子体溅射沉积氮化钨薄膜的方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4777022A (en) 1984-08-28 1988-10-11 Stephen I. Boldish Epitaxial heater apparatus and process
US5343022A (en) 1992-09-29 1994-08-30 Advanced Ceramics Corporation Pyrolytic boron nitride heating unit
WO1995033866A1 (fr) * 1994-06-03 1995-12-14 Materials Research Corporation Procede et appareil de production de films minces par depot chimique en phase vapeur basse temperature, renforce par plasma, utilisant un reacteur a suscepteur rotatif
JP3353514B2 (ja) 1994-12-09 2002-12-03 ソニー株式会社 プラズマ処理装置、プラズマ処理方法及び半導体装置の作製方法
JP4111145B2 (ja) 1996-05-28 2008-07-02 富士ゼロックス株式会社 光半導体素子
US5986285A (en) * 1996-11-07 1999-11-16 Fuji Xerox, Co., Ltd. Group III-V amorphous and microcrystalline optical semiconductor including hydrogen, and method of forming thereof
JPH1187253A (ja) 1997-09-02 1999-03-30 Sumitomo Electric Ind Ltd 化合物半導体薄膜の成膜方法
US6140624A (en) 1999-07-02 2000-10-31 Advanced Ceramics Corporation Pyrolytic boron nitride radiation heater
JP2003188104A (ja) 2001-12-14 2003-07-04 Fuji Xerox Co Ltd 窒化物半導体の製造装置、窒化物半導体の製造方法、及びリモートプラズマ装置
JP2003193237A (ja) 2001-12-26 2003-07-09 Ulvac Japan Ltd 金属窒化物膜の形成方法
AUPS240402A0 (en) * 2002-05-17 2002-06-13 Macquarie Research Limited Gallium nitride
JP2003342715A (ja) 2002-05-27 2003-12-03 Sumitomo Electric Ind Ltd GaN結晶の成長方法
JP2003342719A (ja) 2002-05-27 2003-12-03 Sumitomo Electric Ind Ltd GaN結晶の成長方法
JP2003342716A (ja) 2002-05-27 2003-12-03 Sumitomo Electric Ind Ltd GaN結晶の成長方法

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BRPI0516136A (pt) 2008-08-26
KR101352150B1 (ko) 2014-02-17
EP2573206A1 (fr) 2013-03-27
KR20070103363A (ko) 2007-10-23
US8298624B2 (en) 2012-10-30
CA2581626A1 (fr) 2006-04-06
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