GB2148946B - Metal-silicide deposition using plasma-enhanced chemical vapour deposition - Google Patents
Metal-silicide deposition using plasma-enhanced chemical vapour depositionInfo
- Publication number
- GB2148946B GB2148946B GB08426071A GB8426071A GB2148946B GB 2148946 B GB2148946 B GB 2148946B GB 08426071 A GB08426071 A GB 08426071A GB 8426071 A GB8426071 A GB 8426071A GB 2148946 B GB2148946 B GB 2148946B
- Authority
- GB
- United Kingdom
- Prior art keywords
- deposition
- plasma
- metal
- enhanced chemical
- chemical vapour
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/42—Silicides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/01—Manufacture or treatment
- H10D64/011—Manufacture or treatment of electrodes ohmically coupled to a semiconductor
- H10D64/0111—Manufacture or treatment of electrodes ohmically coupled to a semiconductor to Group IV semiconductors
- H10D64/0112—Manufacture or treatment of electrodes ohmically coupled to a semiconductor to Group IV semiconductors using conductive layers comprising silicides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/01—Manufacture or treatment
- H10D64/013—Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator
- H10D64/01302—Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator the insulator being formed after the semiconductor body, the semiconductor being silicon
- H10D64/01304—Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
- H10D64/01306—Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon
- H10D64/01308—Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon the conductor further comprising a non-elemental silicon additional conductive layer, e.g. a metal silicide layer formed by the reaction of silicon with an implanted metal
- H10D64/01312—Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon the conductor further comprising a non-elemental silicon additional conductive layer, e.g. a metal silicide layer formed by the reaction of silicon with an implanted metal the additional layer comprising a metal or metal silicide formed by deposition, i.e. without a silicidation reaction, e.g. sputter deposition
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/547,050 US4557943A (en) | 1983-10-31 | 1983-10-31 | Metal-silicide deposition using plasma-enhanced chemical vapor deposition |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB8426071D0 GB8426071D0 (en) | 1984-11-21 |
| GB2148946A GB2148946A (en) | 1985-06-05 |
| GB2148946B true GB2148946B (en) | 1986-02-26 |
Family
ID=24183136
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB08426071A Expired GB2148946B (en) | 1983-10-31 | 1984-10-16 | Metal-silicide deposition using plasma-enhanced chemical vapour deposition |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4557943A (enExample) |
| JP (1) | JPS6096763A (enExample) |
| DE (1) | DE3439853A1 (enExample) |
| FR (1) | FR2554132B1 (enExample) |
| GB (1) | GB2148946B (enExample) |
| NL (1) | NL8403011A (enExample) |
Families Citing this family (67)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2505736B2 (ja) * | 1985-06-18 | 1996-06-12 | キヤノン株式会社 | 半導体装置の製造方法 |
| US4668530A (en) * | 1985-07-23 | 1987-05-26 | Massachusetts Institute Of Technology | Low pressure chemical vapor deposition of refractory metal silicides |
| US4796562A (en) * | 1985-12-03 | 1989-01-10 | Varian Associates, Inc. | Rapid thermal cvd apparatus |
| US4709655A (en) * | 1985-12-03 | 1987-12-01 | Varian Associates, Inc. | Chemical vapor deposition apparatus |
| US4732801A (en) * | 1986-04-30 | 1988-03-22 | International Business Machines Corporation | Graded oxide/nitride via structure and method of fabrication therefor |
| US4766006A (en) * | 1986-05-15 | 1988-08-23 | Varian Associates, Inc. | Low pressure chemical vapor deposition of metal silicide |
| US4800105A (en) * | 1986-07-22 | 1989-01-24 | Nihon Shinku Gijutsu Kabushiki Kaisha | Method of forming a thin film by chemical vapor deposition |
| NL8700820A (nl) * | 1987-04-08 | 1988-11-01 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting. |
| KR930003957B1 (ko) * | 1987-05-09 | 1993-05-17 | 후다바 덴시 고오교오 가부시끼가이샤 | 형광표시관 |
| FR2622052B1 (fr) * | 1987-10-19 | 1990-02-16 | Air Liquide | Procede de depot de siliciure de metal refractaire pour la fabrication de circuits integres |
| FR2623014B1 (fr) * | 1987-11-09 | 1990-03-23 | France Etat | Procede de depot selectif d'un siliciure de metal refractaire sur des zones de silicium |
| US5167986A (en) * | 1988-04-15 | 1992-12-01 | Gordon Roy G | Titanium silicide-coated glass windows |
| US5057375A (en) * | 1988-04-15 | 1991-10-15 | Gordon Roy G | Titanium silicide-coated glass windows |
| US4957777A (en) * | 1988-07-28 | 1990-09-18 | Massachusetts Institute Of Technology | Very low pressure chemical vapor deposition process for deposition of titanium silicide films |
| US5104694A (en) * | 1989-04-21 | 1992-04-14 | Nippon Telephone & Telegraph Corporation | Selective chemical vapor deposition of a metallic film on the silicon surface |
| KR930011413B1 (ko) * | 1990-09-25 | 1993-12-06 | 가부시키가이샤 한도오따이 에네루기 겐큐쇼 | 펄스형 전자파를 사용한 플라즈마 cvd 법 |
| JPH06101462B2 (ja) * | 1991-04-30 | 1994-12-12 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 過フッ化炭化水素ポリマ膜を基板に接着する方法および 基板 |
| KR970009274B1 (ko) * | 1991-11-11 | 1997-06-09 | 미쓰비시덴키 가부시키가이샤 | 반도체장치의 도전층접속구조 및 그 제조방법 |
| US5320880A (en) * | 1992-10-20 | 1994-06-14 | Micron Technology, Inc. | Method of providing a silicon film having a roughened outer surface |
| US5814599A (en) * | 1995-08-04 | 1998-09-29 | Massachusetts Insitiute Of Technology | Transdermal delivery of encapsulated drugs |
| US5426003A (en) * | 1994-02-14 | 1995-06-20 | Westinghouse Electric Corporation | Method of forming a plasma sprayed interconnection layer on an electrode of an electrochemical cell |
| AU1745695A (en) * | 1994-06-03 | 1996-01-04 | Materials Research Corporation | A method of nitridization of titanium thin films |
| US5975912A (en) * | 1994-06-03 | 1999-11-02 | Materials Research Corporation | Low temperature plasma-enhanced formation of integrated circuits |
| US5665640A (en) * | 1994-06-03 | 1997-09-09 | Sony Corporation | Method for producing titanium-containing thin films by low temperature plasma-enhanced chemical vapor deposition using a rotating susceptor reactor |
| US5628829A (en) * | 1994-06-03 | 1997-05-13 | Materials Research Corporation | Method and apparatus for low temperature deposition of CVD and PECVD films |
| US5972790A (en) * | 1995-06-09 | 1999-10-26 | Tokyo Electron Limited | Method for forming salicides |
| US5780050A (en) | 1995-07-20 | 1998-07-14 | Theratech, Inc. | Drug delivery compositions for improved stability of steroids |
| US6041253A (en) * | 1995-12-18 | 2000-03-21 | Massachusetts Institute Of Technology | Effect of electric field and ultrasound for transdermal drug delivery |
| US5947921A (en) * | 1995-12-18 | 1999-09-07 | Massachusetts Institute Of Technology | Chemical and physical enhancers and ultrasound for transdermal drug delivery |
| US6002961A (en) * | 1995-07-25 | 1999-12-14 | Massachusetts Institute Of Technology | Transdermal protein delivery using low-frequency sonophoresis |
| EP1563788B8 (en) | 1995-08-29 | 2015-04-08 | Nitto Denko Corporation | Microporation of human skin for drug delivery and monitoring applications |
| JPH09111460A (ja) * | 1995-10-11 | 1997-04-28 | Anelva Corp | チタン系導電性薄膜の作製方法 |
| JP2002515786A (ja) | 1996-06-28 | 2002-05-28 | ソントラ メディカル,エル.ピー. | 経皮輸送の超音波増強 |
| US5908659A (en) * | 1997-01-03 | 1999-06-01 | Mosel Vitelic Inc. | Method for reducing the reflectivity of a silicide layer |
| US6432479B2 (en) | 1997-12-02 | 2002-08-13 | Applied Materials, Inc. | Method for in-situ, post deposition surface passivation of a chemical vapor deposited film |
| AU740999B2 (en) | 1998-01-08 | 2001-11-22 | Sontra Medical, Inc. | Sonophoretic enhanced transdermal transport |
| US8287483B2 (en) * | 1998-01-08 | 2012-10-16 | Echo Therapeutics, Inc. | Method and apparatus for enhancement of transdermal transport |
| US7066884B2 (en) | 1998-01-08 | 2006-06-27 | Sontra Medical, Inc. | System, method, and device for non-invasive body fluid sampling and analysis |
| US6046098A (en) * | 1998-02-23 | 2000-04-04 | Micron Technology, Inc. | Process of forming metal silicide interconnects |
| US20040171980A1 (en) * | 1998-12-18 | 2004-09-02 | Sontra Medical, Inc. | Method and apparatus for enhancement of transdermal transport |
| US6821571B2 (en) | 1999-06-18 | 2004-11-23 | Applied Materials Inc. | Plasma treatment to enhance adhesion and to minimize oxidation of carbon-containing layers |
| US20030078499A1 (en) | 1999-08-12 | 2003-04-24 | Eppstein Jonathan A. | Microporation of tissue for delivery of bioactive agents |
| US6541369B2 (en) | 1999-12-07 | 2003-04-01 | Applied Materials, Inc. | Method and apparatus for reducing fixed charges in a semiconductor device |
| US6795727B2 (en) | 2001-10-17 | 2004-09-21 | Pedro Giammarusti | Devices and methods for promoting transcutaneous movement of substances |
| US9918665B2 (en) | 2002-03-11 | 2018-03-20 | Nitto Denko Corporation | Transdermal porator and patch system and method for using same |
| EP1483019A4 (en) | 2002-03-11 | 2007-07-04 | Altea Therapeutics Corp | TRANSDERMALES MEDICAMENT PAVING SYSTEM, METHOD FOR THE PRODUCTION THEREOF AND METHOD FOR THE APPLICATION THEREOF |
| US8116860B2 (en) | 2002-03-11 | 2012-02-14 | Altea Therapeutics Corporation | Transdermal porator and patch system and method for using same |
| US8016811B2 (en) | 2003-10-24 | 2011-09-13 | Altea Therapeutics Corporation | Method for transdermal delivery of permeant substances |
| US8224414B2 (en) | 2004-10-28 | 2012-07-17 | Echo Therapeutics, Inc. | System and method for analyte sampling and analysis with hydrogel |
| JP5577021B2 (ja) | 2005-02-17 | 2014-08-20 | アボット・ラボラトリーズ | 動物における障害を治療および予防するための薬剤組成物の経粘膜投与 |
| US7432069B2 (en) | 2005-12-05 | 2008-10-07 | Sontra Medical Corporation | Biocompatible chemically crosslinked hydrogels for glucose sensing |
| WO2008109739A1 (en) | 2007-03-07 | 2008-09-12 | Echo Therapeutics, Inc. | Transdermal analyte monitoring systems and methods for analyte detection |
| CA2685423C (en) | 2007-04-27 | 2014-02-18 | Echo Therapeutics, Inc. | Skin permeation device for analyte sensing or transdermal drug delivery |
| US9033898B2 (en) | 2010-06-23 | 2015-05-19 | Seventh Sense Biosystems, Inc. | Sampling devices and methods involving relatively little pain |
| EP2408369A1 (en) | 2009-03-02 | 2012-01-25 | Seventh Sense Biosystems, Inc. | Devices and methods for the analysis of an extractable medium |
| US20120277629A1 (en) | 2011-04-29 | 2012-11-01 | Seventh Sense Biosystems, Inc. | Systems and methods for collection and/or manipulation of blood spots or other bodily fluids |
| WO2010101625A2 (en) | 2009-03-02 | 2010-09-10 | Seventh Sense Biosystems, Inc. | Oxygen sensor |
| US9041541B2 (en) | 2010-01-28 | 2015-05-26 | Seventh Sense Biosystems, Inc. | Monitoring or feedback systems and methods |
| CN103068308B (zh) | 2010-07-16 | 2016-03-16 | 第七感生物系统有限公司 | 用于流体传输装置的低压环境 |
| US20130158482A1 (en) | 2010-07-26 | 2013-06-20 | Seventh Sense Biosystems, Inc. | Rapid delivery and/or receiving of fluids |
| US20120039809A1 (en) | 2010-08-13 | 2012-02-16 | Seventh Sense Biosystems, Inc. | Systems and techniques for monitoring subjects |
| EP2637562B1 (en) | 2010-11-09 | 2016-01-27 | Seventh Sense Biosystems, Inc. | Systems and interfaces for blood sampling |
| US20130158468A1 (en) | 2011-12-19 | 2013-06-20 | Seventh Sense Biosystems, Inc. | Delivering and/or receiving material with respect to a subject surface |
| CN103874460B (zh) | 2011-04-29 | 2016-06-22 | 第七感生物系统有限公司 | 一种用于从受验者的皮肤接收血液或其它物质的装置 |
| EP3106092A3 (en) | 2011-04-29 | 2017-03-08 | Seventh Sense Biosystems, Inc. | Systems and methods for collecting fluid from a subject |
| US20140066837A1 (en) | 2012-07-26 | 2014-03-06 | Ronald L. Moy | Skin care compositions and methods |
| US10204764B2 (en) * | 2014-10-28 | 2019-02-12 | Applied Materials, Inc. | Methods for forming a metal silicide interconnection nanowire structure |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3540920A (en) * | 1967-08-24 | 1970-11-17 | Texas Instruments Inc | Process of simultaneously vapor depositing silicides of chromium and titanium |
| US3658577A (en) * | 1969-10-01 | 1972-04-25 | Gene F Wakefield | Vapor phase deposition of silicide refractory coatings |
| US4180596A (en) * | 1977-06-30 | 1979-12-25 | International Business Machines Corporation | Method for providing a metal silicide layer on a substrate |
| US4218291A (en) * | 1978-02-28 | 1980-08-19 | Vlsi Technology Research Association | Process for forming metal and metal silicide films |
| US4239819A (en) * | 1978-12-11 | 1980-12-16 | Chemetal Corporation | Deposition method and products |
| JPS5644765A (en) * | 1979-09-20 | 1981-04-24 | Daijietsuto Kogyo Kk | Covered hard metal tool |
| JPS584975A (ja) * | 1981-06-30 | 1983-01-12 | Fujitsu Ltd | 半導体装置の製造方法 |
| US4359490A (en) * | 1981-07-13 | 1982-11-16 | Fairchild Camera & Instrument Corp. | Method for LPCVD co-deposition of metal and silicon to form metal silicide |
| JPS57147431A (en) * | 1981-10-06 | 1982-09-11 | Semiconductor Energy Lab Co Ltd | Plasma gas phase method |
| DE3211752C2 (de) * | 1982-03-30 | 1985-09-26 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum selektiven Abscheiden von aus Siliziden hochschmelzender Metalle bestehenden Schichtstrukturen auf im wesentlichen aus Silizium bestehenden Substraten und deren Verwendung |
| JPS5956574A (ja) * | 1982-09-24 | 1984-04-02 | Fujitsu Ltd | チタン・シリサイド膜の形成方法 |
-
1983
- 1983-10-31 US US06/547,050 patent/US4557943A/en not_active Expired - Fee Related
-
1984
- 1984-08-28 JP JP59179148A patent/JPS6096763A/ja active Granted
- 1984-10-03 NL NL8403011A patent/NL8403011A/nl not_active Application Discontinuation
- 1984-10-16 GB GB08426071A patent/GB2148946B/en not_active Expired
- 1984-10-30 FR FR8416908A patent/FR2554132B1/fr not_active Expired
- 1984-10-31 DE DE19843439853 patent/DE3439853A1/de not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| FR2554132B1 (fr) | 1988-09-23 |
| NL8403011A (nl) | 1985-05-17 |
| US4557943A (en) | 1985-12-10 |
| JPS643949B2 (enExample) | 1989-01-24 |
| JPS6096763A (ja) | 1985-05-30 |
| GB8426071D0 (en) | 1984-11-21 |
| FR2554132A1 (fr) | 1985-05-03 |
| DE3439853A1 (de) | 1985-05-09 |
| GB2148946A (en) | 1985-06-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19921016 |