FR2665973B1 - Circuit d'optimisation d'effacement automatique pour une memoire a semiconducteur programmable et effacable electriquement et procede s'y rapportant. - Google Patents

Circuit d'optimisation d'effacement automatique pour une memoire a semiconducteur programmable et effacable electriquement et procede s'y rapportant.

Info

Publication number
FR2665973B1
FR2665973B1 FR9015915A FR9015915A FR2665973B1 FR 2665973 B1 FR2665973 B1 FR 2665973B1 FR 9015915 A FR9015915 A FR 9015915A FR 9015915 A FR9015915 A FR 9015915A FR 2665973 B1 FR2665973 B1 FR 2665973B1
Authority
FR
France
Prior art keywords
semiconductor memory
electrically
related method
optimization circuit
automatic erasing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9015915A
Other languages
English (en)
Other versions
FR2665973A1 (fr
Inventor
Hyeong-Gyu Lim
Wung-Moo Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of FR2665973A1 publication Critical patent/FR2665973A1/fr
Application granted granted Critical
Publication of FR2665973B1 publication Critical patent/FR2665973B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
FR9015915A 1990-08-20 1990-12-19 Circuit d'optimisation d'effacement automatique pour une memoire a semiconducteur programmable et effacable electriquement et procede s'y rapportant. Expired - Fee Related FR2665973B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019900012816A KR940006611B1 (ko) 1990-08-20 1990-08-20 전기적으로 소거 및 프로그램이 가능한 반도체 메모리장치의 자동 소거 최적화회로 및 방법

Publications (2)

Publication Number Publication Date
FR2665973A1 FR2665973A1 (fr) 1992-02-21
FR2665973B1 true FR2665973B1 (fr) 1994-04-15

Family

ID=19302525

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9015915A Expired - Fee Related FR2665973B1 (fr) 1990-08-20 1990-12-19 Circuit d'optimisation d'effacement automatique pour une memoire a semiconducteur programmable et effacable electriquement et procede s'y rapportant.

Country Status (6)

Country Link
US (1) US5214605A (fr)
JP (1) JPH07287983A (fr)
KR (1) KR940006611B1 (fr)
DE (1) DE4040492A1 (fr)
FR (1) FR2665973B1 (fr)
IT (1) IT1241563B (fr)

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US5295255A (en) * 1991-02-22 1994-03-15 Electronic Professional Services, Inc. Method and apparatus for programming a solid state processor with overleaved array memory modules
US5396468A (en) * 1991-03-15 1995-03-07 Sundisk Corporation Streamlined write operation for EEPROM system
JP2837970B2 (ja) * 1991-04-12 1998-12-16 三菱電機株式会社 Ｉｃカード
JP2870260B2 (ja) * 1991-09-27 1999-03-17 日本電気株式会社 不揮発性半導体記憶装置
JP3080744B2 (ja) * 1991-12-27 2000-08-28 日本電気株式会社 電気的に書き込み一括消去可能な不揮発性半導体記憶装置
US5327383A (en) * 1992-04-21 1994-07-05 Intel Corporation Method and circuitry for erasing a nonvolatile semiconductor memory incorporating row redundancy
US5555204A (en) * 1993-06-29 1996-09-10 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device
JPH0721790A (ja) * 1993-07-05 1995-01-24 Mitsubishi Electric Corp 半導体集積回路
JP3179943B2 (ja) * 1993-07-12 2001-06-25 株式会社東芝 半導体記憶装置
US6166979A (en) 1995-09-13 2000-12-26 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device and method for using the same
TW389909B (en) * 1995-09-13 2000-05-11 Toshiba Corp Nonvolatile semiconductor memory device and its usage
KR0169412B1 (ko) * 1995-10-16 1999-02-01 김광호 불휘발성 반도체 메모리 장치
KR0169420B1 (ko) * 1995-10-17 1999-02-01 김광호 불 휘발성 반도체 메모리의 데이타 리드 방법 및 그에 따른 회로
US5959891A (en) 1996-08-16 1999-09-28 Altera Corporation Evaluation of memory cell characteristics
EP0913829A1 (fr) * 1997-10-31 1999-05-06 STMicroelectronics S.r.l. Circuit de mémoire avec générateur de signals d'adresse amélioré
US5933374A (en) * 1998-06-15 1999-08-03 Siemens Aktiengesellschaft Memory with reduced wire connections
FR2798767B1 (fr) * 1999-09-16 2001-12-14 St Microelectronics Sa Procede d'ecriture en mode page d'une memoire non volatile electriquement programmable/effacable et architecture correspondante
US6701783B2 (en) 2000-09-12 2004-03-09 Vega Grieshaber Kg Device and a process for determining the positions of border areas between different mediums
KR100381954B1 (ko) * 2000-10-26 2003-04-26 삼성전자주식회사 메모리 셀의 과소거를 방지할 수 있는 소거 방법 및그것을 이용한 플래시 메모리 장치
US7177197B2 (en) 2001-09-17 2007-02-13 Sandisk Corporation Latched programming of memory and method
CN102867535B (zh) * 2012-09-27 2016-12-21 上海华虹宏力半导体制造有限公司 存储器及其字线电压产生电路
CN109273031B (zh) * 2018-10-09 2021-07-27 珠海格力电器股份有限公司 一种flash译码电路和flash译码方法

Family Cites Families (17)

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Publication number Priority date Publication date Assignee Title
IT1224062B (it) * 1979-09-28 1990-09-26 Ates Componenti Elettron Metodo di programmazione per una memoria a semiconduttore non volatile elettricamente alterabile
US4408306A (en) * 1981-09-28 1983-10-04 Motorola, Inc. Column and row erasable EEPROM
US4460982A (en) * 1982-05-20 1984-07-17 Intel Corporation Intelligent electrically programmable and electrically erasable ROM
US4446536A (en) * 1982-06-21 1984-05-01 Mcdonnell Douglas Corporation Complementary metal oxide semiconductors address drive circuit
DE3318123A1 (de) * 1983-05-18 1984-11-22 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung mit einem datenspeicher und einer ansteuereinheit zum auslesen, schreiben und loeschen des speichers
JPS6233397A (ja) * 1985-08-05 1987-02-13 Mitsubishi Electric Corp 半導体装置
JP2633252B2 (ja) * 1987-06-11 1997-07-23 沖電気工業株式会社 半導体記憶装置
JPS6459693A (en) * 1987-08-31 1989-03-07 Oki Electric Ind Co Ltd Control circuit for eeprom
JPH01159895A (ja) * 1987-12-17 1989-06-22 Sharp Corp 電気的に書き込み可能な不揮発性メモリに於けるデータ書き込み方法
GB2215156B (en) * 1988-02-17 1991-11-27 Intel Corp Processor controlled command port architecture for flash memory
US4888738A (en) * 1988-06-29 1989-12-19 Seeq Technology Current-regulated, voltage-regulated erase circuit for EEPROM memory
JPH0249199A (ja) * 1988-08-11 1990-02-19 Toshiba Corp 中空糸膜モジュールの切断方法
JPH0276095A (ja) * 1988-09-12 1990-03-15 Fuji Electric Co Ltd 自動販売機の加熱装置
JPH02137196A (ja) * 1988-11-17 1990-05-25 Mitsubishi Electric Corp 不揮発性半導体記憶装置
US5287469A (en) * 1988-12-27 1994-02-15 Nec Corporation Electrically erasable and programmable non-volatile memory (EEPROM), wherein write pulses can be interrupted by subsequently received read requests
JP2654596B2 (ja) * 1989-02-06 1997-09-17 株式会社日立製作所 不揮発性記憶装置
JPH03108196A (ja) * 1989-09-20 1991-05-08 Fujitsu Ltd 電気的消去・書込み可能型不揮発性半導体記憶装置

Also Published As

Publication number Publication date
IT9048624A0 (it) 1990-12-28
US5214605A (en) 1993-05-25
JPH07287983A (ja) 1995-10-31
IT9048624A1 (it) 1992-02-21
IT1241563B (it) 1994-01-17
FR2665973A1 (fr) 1992-02-21
DE4040492C2 (fr) 1992-09-03
DE4040492A1 (de) 1992-02-27
KR940006611B1 (ko) 1994-07-23
KR920005161A (ko) 1992-03-28

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20100831