FR2537323B1 - Procede de controle de l'integrite d'une memoire supplementaire dans une machine a coudre electronique - Google Patents

Procede de controle de l'integrite d'une memoire supplementaire dans une machine a coudre electronique

Info

Publication number
FR2537323B1
FR2537323B1 FR8317479A FR8317479A FR2537323B1 FR 2537323 B1 FR2537323 B1 FR 2537323B1 FR 8317479 A FR8317479 A FR 8317479A FR 8317479 A FR8317479 A FR 8317479A FR 2537323 B1 FR2537323 B1 FR 2537323B1
Authority
FR
France
Prior art keywords
integrity
controlling
sewing machine
additional memory
electronic sewing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8317479A
Other languages
English (en)
Other versions
FR2537323A1 (fr
Inventor
Leonard I Horey
Kurland Marvin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Singer Co
Original Assignee
Singer Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Singer Co filed Critical Singer Co
Publication of FR2537323A1 publication Critical patent/FR2537323A1/fr
Application granted granted Critical
Publication of FR2537323B1 publication Critical patent/FR2537323B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
    • D—TEXTILES; PAPER
    • D05—SEWING; EMBROIDERING; TUFTING
    • D05B—SEWING
    • D05B19/00—Programme-controlled sewing machines
    • D05B19/02—Sewing machines having electronic memory or microprocessor control unit
    • D05B19/04—Sewing machines having electronic memory or microprocessor control unit characterised by memory aspects
    • D05B19/06—Physical exchange of memory
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/40—Response verification devices using compression techniques
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/23—Pc programming
    • G05B2219/23215—Check data validity in ram, keep correct validity, compare rom ram
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/25—Pc structure of the system
    • G05B2219/25301—Expansion of system, memory

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Automation & Control Theory (AREA)
  • Sewing Machines And Sewing (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
FR8317479A 1982-12-01 1983-11-03 Procede de controle de l'integrite d'une memoire supplementaire dans une machine a coudre electronique Expired FR2537323B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/445,814 US4488300A (en) 1982-12-01 1982-12-01 Method of checking the integrity of a source of additional memory for use in an electronically controlled sewing machine

Publications (2)

Publication Number Publication Date
FR2537323A1 FR2537323A1 (fr) 1984-06-08
FR2537323B1 true FR2537323B1 (fr) 1988-11-18

Family

ID=23770303

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8317479A Expired FR2537323B1 (fr) 1982-12-01 1983-11-03 Procede de controle de l'integrite d'une memoire supplementaire dans une machine a coudre electronique

Country Status (6)

Country Link
US (1) US4488300A (fr)
JP (1) JPS59146692A (fr)
BR (1) BR8306667A (fr)
DE (1) DE3338153A1 (fr)
FR (1) FR2537323B1 (fr)
IT (1) IT1169861B (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD1240G2 (ro) * 1998-07-22 1999-10-31 Генадие БОДЯН Metodă de testare a dispozitivului de memorie operativă

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999505A (ja) * 1982-11-29 1984-06-08 Mitsubishi Electric Corp 電子ミシンの制御装置
US4558416A (en) * 1983-05-27 1985-12-10 Allied Corporation Method for maintaining the integrity of a dual microprocessor multiprocessing computing system
FR2567302A1 (fr) * 1984-07-09 1986-01-10 Stanislas Cottignies Procede de controle d'une memoire non volatile de type semi-conducteur a injection de charges electriques, memoire controlable et dispositif de controle de ladite memoire
JPH0137585Y2 (fr) * 1984-09-17 1989-11-13
JPH0137586Y2 (fr) * 1984-09-17 1989-11-13
JPS61141056A (ja) * 1984-12-14 1986-06-28 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 揮発性メモリの間欠エラ−検出方法
JPS6252609A (ja) * 1985-09-02 1987-03-07 Fanuc Ltd 数値制御方法
US4712213A (en) * 1985-12-11 1987-12-08 Northern Telecom Limited Flip status line
US4872168A (en) * 1986-10-02 1989-10-03 American Telephone And Telegraph Company, At&T Bell Laboratories Integrated circuit with memory self-test
GB2200476B (en) * 1987-01-29 1991-02-06 British Gas Plc Monitor system
DE3709524C2 (de) * 1987-03-23 1996-08-14 Bosch Gmbh Robert Verfahren zur Überprüfung der Speicherzelleninhalte eines Programmspeichers
US4907231A (en) * 1987-05-06 1990-03-06 Fuji Photo Film Co., Ltd. Memory cartridge-connectable electronic device such as electronic still video camera
GB2214673A (en) * 1988-01-29 1989-09-06 Texas Instruments Ltd Electronic control device for producing a particular code group of digits when energised.
US5040178A (en) * 1989-05-12 1991-08-13 Chrysler Corporation Method of fault protection for a microcomputer system
JPH0549766A (ja) * 1991-08-24 1993-03-02 Brother Ind Ltd 刺繍装置付きミシン
JPH0557071A (ja) * 1991-08-31 1993-03-09 Brother Ind Ltd 電子制御式ミシン用外部メモリ
DE19501177C1 (de) * 1995-01-17 1996-04-11 Pfaff Ag G M Programmgesteuerte Näh- oder Stickmaschine
SE515527C2 (sv) * 1996-11-19 2001-08-20 Viking Sewing Machines Ab Datastyrd symaskin
DE10248138B4 (de) * 2002-10-16 2004-11-04 Pfaff Industrie Maschinen Ag Näh- oder Stickmaschine

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3838264A (en) * 1970-11-25 1974-09-24 P Maker Apparatus for, and method of, checking the contents of a computer store
GB1364449A (en) * 1970-11-25 1974-08-21 Lucas Industries Ltd Apparatus for checking the contents of a digitaldata store
US3735105A (en) * 1971-06-11 1973-05-22 Ibm Error correcting system and method for monolithic memories
US3745316A (en) * 1971-12-13 1973-07-10 Elliott Bros Computer checking system
US3906460A (en) * 1973-01-11 1975-09-16 Halpern John Wolfgang Proximity data transfer system with tamper proof portable data token
MX4130E (es) * 1977-05-20 1982-01-04 Amdahl Corp Mejoras en sistema de procesamiento de datos y escrutinio de informacion utilizando sumas de comprobacion
JPS5494850A (en) * 1978-01-11 1979-07-26 Nissan Motor Arithmetic processor
JPS5622300A (en) * 1979-08-01 1981-03-02 Fanuc Ltd Memory check method
DE2939461C2 (de) * 1979-09-28 1989-07-20 Siemens AG, 1000 Berlin und 8000 München Verfahren zum Feststellen von Datenstörungen in Speichern
JPS6011398B2 (ja) * 1979-11-21 1985-03-25 タケダ理研工業株式会社 メモリ試験用パタ−ン書込み装置
US4369511A (en) * 1979-11-21 1983-01-18 Nippon Telegraph & Telephone Public Corp. Semiconductor memory test equipment
JPS6011399B2 (ja) * 1979-11-21 1985-03-25 タケダ理研工業株式会社 メモリ不良解析装置
JPS5938680B2 (ja) * 1979-11-21 1984-09-18 タケダ理研工業株式会社 メモリ試験装置
US4446520A (en) * 1980-07-30 1984-05-01 Mitsubishi Denki Kabushiki Kaisha Process of preparing and processing sewing data for an automatic sewing machine
US4341170A (en) * 1981-04-30 1982-07-27 The Singer Company Pattern display arrangement for an electronically controlled sewing machine
US4430735A (en) * 1981-05-26 1984-02-07 Burroughs Corporation Apparatus and technique for testing IC memories

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD1240G2 (ro) * 1998-07-22 1999-10-31 Генадие БОДЯН Metodă de testare a dispozitivului de memorie operativă

Also Published As

Publication number Publication date
IT1169861B (it) 1987-06-03
JPH0326061B2 (fr) 1991-04-09
BR8306667A (pt) 1984-07-17
JPS59146692A (ja) 1984-08-22
IT8323381A0 (it) 1983-10-20
DE3338153A1 (de) 1984-06-07
US4488300A (en) 1984-12-11
FR2537323A1 (fr) 1984-06-08
DE3338153C2 (fr) 1992-05-14

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse