FR2438344A1 - Dispositif photosensible a spectres multiples, notamment pour la lecture optique de caracteres - Google Patents
Dispositif photosensible a spectres multiples, notamment pour la lecture optique de caracteresInfo
- Publication number
- FR2438344A1 FR2438344A1 FR7924822A FR7924822A FR2438344A1 FR 2438344 A1 FR2438344 A1 FR 2438344A1 FR 7924822 A FR7924822 A FR 7924822A FR 7924822 A FR7924822 A FR 7924822A FR 2438344 A1 FR2438344 A1 FR 2438344A1
- Authority
- FR
- France
- Prior art keywords
- photosensitive device
- multiple spectrum
- optical character
- character reading
- photodiod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000003287 optical effect Effects 0.000 title abstract 2
- 238000001228 spectrum Methods 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 239000011159 matrix material Substances 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 230000003595 spectral effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/11—Devices sensitive to infrared, visible or ultraviolet radiation characterised by two potential barriers, e.g. bipolar phototransistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/1443—Devices controlled by radiation with at least one potential jump or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14645—Colour imagers
- H01L27/14647—Multicolour imagers having a stacked pixel-element structure, e.g. npn, npnpn or MQW elements
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Facsimile Heads (AREA)
Abstract
L'INVENTION CONCERNE UN DISPOSITIF PHOTOSENSIBLE A SPECTRES MULTIPLES. IL COMPORTE AU MOINS UNE PHOTODIODE FORMEE SOUS LA SURFACE D'UN SUBSTRAT SEMI-CONDUCTEUR, AU-DESSOUS D'UNE PHOTODIODE SUPERFICIELLE, DE MANIERE A FORMER PLUSIEURS PHOTODIODES DONT LES REPONSES SPECTRALES SONT DIFFERENTES. LA PHOTODIODE SUPERFICIELLE EST SENSIBLE A LA LUMIERE VISIBLE ET LA PHOTODIODE QUI SE TROUVE AU-DESSOUS EST SENSIBLE A UN RAYONNEMENT DE PLUS GRANDE LONGUEUR D'ONDE, SELON LA PROFONDEUR A LAQUELLE ELLE SE TROUVE SOUS LA SURFACE. UNE MATRICE BIDIMENSIONNELLE DE CES PHOTODIODES PEUT ETRE REALISEE DANS UN SEUL SUBSTRAT SEMI-CONDUCTEUR. L'INVENTION S'APPLIQUE NOTAMMENT A DES MATRICES DE LECTURE OPTIQUE DES CARACTERES.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/949,346 US4238760A (en) | 1978-10-06 | 1978-10-06 | Multi-spectrum photodiode devices |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2438344A1 true FR2438344A1 (fr) | 1980-04-30 |
Family
ID=25488951
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7924822A Withdrawn FR2438344A1 (fr) | 1978-10-06 | 1979-10-05 | Dispositif photosensible a spectres multiples, notamment pour la lecture optique de caracteres |
Country Status (7)
Country | Link |
---|---|
US (1) | US4238760A (fr) |
JP (1) | JPS5552277A (fr) |
CA (1) | CA1138081A (fr) |
DE (1) | DE2940343A1 (fr) |
FR (1) | FR2438344A1 (fr) |
GB (1) | GB2034971A (fr) |
NL (1) | NL7907416A (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4466691A (en) * | 1981-10-05 | 1984-08-21 | Merlin Gerin | Connecting terminal for circuit interrupter |
Families Citing this family (82)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4547792A (en) * | 1980-06-19 | 1985-10-15 | Rockwell International Corporation | Selective access array integrated circuit |
US4533940A (en) * | 1983-06-13 | 1985-08-06 | Chappell Barbara A | High spatial resolution energy discriminator |
JPS60130274A (ja) * | 1983-12-19 | 1985-07-11 | Toshiba Corp | 固体撮像装置 |
JPS60164354A (ja) * | 1984-02-06 | 1985-08-27 | Victor Co Of Japan Ltd | 固体撮像装置 |
US5121377A (en) * | 1988-04-19 | 1992-06-09 | Bose Corporation | Error detection method and apparatus for reducing the number of errors generated when reading digital data stored on a recording medium such as film |
US4939369A (en) * | 1988-10-04 | 1990-07-03 | Loral Fairchild Corporation | Imaging and tracking sensor designed with a sandwich structure |
GB2228824A (en) * | 1989-03-01 | 1990-09-05 | Gen Electric Co Plc | Radiation detectors |
DE69232432T2 (de) * | 1991-11-20 | 2002-07-18 | Canon Kk | Verfahren zur Herstellung einer Halbleiteranordnung |
DE4243421A1 (en) * | 1992-12-16 | 1993-07-29 | Medium Sensor Gmbh | Opto-electronic component for measuring limited region of ultraviolet radiation - contains fluorescent medium stimulated by ultraviolet, optical and filtering arrangement ensuring narrow spectral stimulation region |
JP2799540B2 (ja) * | 1993-04-19 | 1998-09-17 | シャープ株式会社 | 受光素子 |
US5942775A (en) * | 1997-04-30 | 1999-08-24 | Lucent Technologies Inc. | Photosensing device with improved spectral response and low thermal leakage |
US5965875A (en) * | 1998-04-24 | 1999-10-12 | Foveon, Inc. | Color separation in an active pixel cell imaging array using a triple-well structure |
US6606120B1 (en) * | 1998-04-24 | 2003-08-12 | Foveon, Inc. | Multiple storage node full color active pixel sensors |
US6410899B1 (en) | 1998-06-17 | 2002-06-25 | Foveon, Inc. | Active pixel sensor with bootstrap amplification and reduced leakage during readout |
US6727521B2 (en) | 2000-09-25 | 2004-04-27 | Foveon, Inc. | Vertical color filter detector group and array |
US6697114B1 (en) * | 1999-08-13 | 2004-02-24 | Foveon, Inc. | Triple slope pixel sensor and arry |
US6809768B1 (en) | 2000-02-14 | 2004-10-26 | Foveon, Inc. | Double slope pixel sensor and array |
US6882367B1 (en) | 2000-02-29 | 2005-04-19 | Foveon, Inc. | High-sensitivity storage pixel sensor having auto-exposure detection |
KR100386609B1 (ko) | 2000-04-28 | 2003-06-02 | 주식회사 하이닉스반도체 | 씨모스 이미지 센서 및 그의 제조 방법 |
US6930336B1 (en) | 2001-06-18 | 2005-08-16 | Foveon, Inc. | Vertical-color-filter detector group with trench isolation |
US6960757B2 (en) * | 2001-06-18 | 2005-11-01 | Foveon, Inc. | Simplified wiring schemes for vertical color filter pixel sensors |
US6864557B2 (en) * | 2001-06-18 | 2005-03-08 | Foveon, Inc. | Vertical color filter detector group and array |
JP3932098B2 (ja) * | 2002-01-31 | 2007-06-20 | 株式会社デンソー | 車両用配電装置およびユーザー後付け負荷接続用の補助端子 |
US20040178463A1 (en) * | 2002-03-20 | 2004-09-16 | Foveon, Inc. | Vertical color filter sensor group with carrier-collection elements of different size and method for fabricating such a sensor group |
US6998660B2 (en) * | 2002-03-20 | 2006-02-14 | Foveon, Inc. | Vertical color filter sensor group array that emulates a pattern of single-layer sensors with efficient use of each sensor group's sensors |
US6841816B2 (en) | 2002-03-20 | 2005-01-11 | Foveon, Inc. | Vertical color filter sensor group with non-sensor filter and method for fabricating such a sensor group |
US7164444B1 (en) | 2002-05-17 | 2007-01-16 | Foveon, Inc. | Vertical color filter detector group with highlight detector |
US7794394B2 (en) * | 2002-05-22 | 2010-09-14 | Beth Israel Deaconess Medical Center | Device for wavelength-selective imaging |
US6946715B2 (en) * | 2003-02-19 | 2005-09-20 | Micron Technology, Inc. | CMOS image sensor and method of fabrication |
US7453129B2 (en) * | 2002-12-18 | 2008-11-18 | Noble Peak Vision Corp. | Image sensor comprising isolated germanium photodetectors integrated with a silicon substrate and silicon circuitry |
US20060055800A1 (en) * | 2002-12-18 | 2006-03-16 | Noble Device Technologies Corp. | Adaptive solid state image sensor |
US7154157B2 (en) * | 2002-12-30 | 2006-12-26 | Intel Corporation | Stacked semiconductor radiation sensors having color component and infrared sensing capability |
US6914314B2 (en) * | 2003-01-31 | 2005-07-05 | Foveon, Inc. | Vertical color filter sensor group including semiconductor other than crystalline silicon and method for fabricating same |
US6894265B2 (en) * | 2003-01-31 | 2005-05-17 | Foveon, Inc. | Vertical color filter sensor group and semiconductor integrated circuit fabrication method for fabricating same |
US7339216B1 (en) | 2003-01-31 | 2008-03-04 | Foveon, Inc. | Vertical color filter sensor group array with full-resolution top layer and lower-resolution lower layer |
US7709921B2 (en) | 2008-08-27 | 2010-05-04 | Udt Sensors, Inc. | Photodiode and photodiode array with improved performance characteristics |
US8686529B2 (en) * | 2010-01-19 | 2014-04-01 | Osi Optoelectronics, Inc. | Wavelength sensitive sensor photodiodes |
US8519503B2 (en) | 2006-06-05 | 2013-08-27 | Osi Optoelectronics, Inc. | High speed backside illuminated, front side contact photodiode array |
JP4578797B2 (ja) * | 2003-11-10 | 2010-11-10 | パナソニック株式会社 | 撮像装置 |
US7098439B2 (en) * | 2003-12-22 | 2006-08-29 | Searete Llc | Augmented photo-detector filter |
US7053809B2 (en) * | 2003-12-19 | 2006-05-30 | Searete Llc | Analog-to-digital converter circuitry having a cascade |
US7045760B2 (en) * | 2003-12-19 | 2006-05-16 | Searete Llc | Intensity detector circuitry |
US7515082B2 (en) * | 2003-12-19 | 2009-04-07 | Searete, Llc | Photo-detector filter having a cascaded low noise amplifier |
US7999214B2 (en) * | 2003-12-19 | 2011-08-16 | The Invention Science Fund I, Llc | Photo-detector filter having a cascaded low noise amplifier |
US7250595B2 (en) * | 2004-01-14 | 2007-07-31 | Searete, Llc | Photo-detector filter having a cascaded low noise amplifier |
US7511254B2 (en) * | 2003-12-19 | 2009-03-31 | Searete, Llc | Photo-detector filter having a cascaded low noise amplifier |
US7542133B2 (en) * | 2003-12-22 | 2009-06-02 | Searete, Llc | Photo-detector filter |
WO2006122425A1 (fr) * | 2005-05-20 | 2006-11-23 | Tir Systems Ltd. | Capteur de chromaticite multicolore |
KR100760142B1 (ko) * | 2005-07-27 | 2007-09-18 | 매그나칩 반도체 유한회사 | 고해상도 cmos 이미지 센서를 위한 스택형 픽셀 |
KR100800310B1 (ko) * | 2006-02-16 | 2008-02-01 | 마루엘에스아이 주식회사 | 가시광선 및 적외선을 감지할 수 있는 광 감지 소자 및 그제조 방법 |
JP2007336362A (ja) * | 2006-06-16 | 2007-12-27 | Fujifilm Corp | 情報読み取り装置 |
JP4839990B2 (ja) * | 2006-07-06 | 2011-12-21 | 株式会社ニコン | 固体撮像素子及びこれを用いた撮像装置 |
JP2009544017A (ja) * | 2006-07-18 | 2009-12-10 | ティーアイアール テクノロジー エルピー | 光の輝度及びピーク波長を決定する方法及び装置 |
JP5045012B2 (ja) * | 2006-07-20 | 2012-10-10 | 株式会社ニコン | 固体撮像素子及びこれを用いた撮像装置 |
US20090021598A1 (en) * | 2006-12-06 | 2009-01-22 | Mclean John | Miniature integrated multispectral/multipolarization digital camera |
US7602430B1 (en) | 2007-04-18 | 2009-10-13 | Foveon, Inc. | High-gain multicolor pixel sensor with reset noise cancellation |
WO2009013725A1 (fr) * | 2007-07-25 | 2009-01-29 | Nxp B.V. | Détection interne/externe |
WO2009016600A2 (fr) * | 2007-07-30 | 2009-02-05 | Nxp B.V. | Arrangement de détecteur de lumière |
US8446470B2 (en) | 2007-10-04 | 2013-05-21 | Magna Electronics, Inc. | Combined RGB and IR imaging sensor |
US7888763B2 (en) * | 2008-02-08 | 2011-02-15 | Omnivision Technologies, Inc. | Backside illuminated imaging sensor with improved infrared sensitivity |
US7745773B1 (en) | 2008-04-11 | 2010-06-29 | Foveon, Inc. | Multi-color CMOS pixel sensor with shared row wiring and dual output lines |
US8084739B2 (en) | 2008-07-16 | 2011-12-27 | Infrared Newco., Inc. | Imaging apparatus and methods |
US8686365B2 (en) * | 2008-07-28 | 2014-04-01 | Infrared Newco, Inc. | Imaging apparatus and methods |
JP2012503314A (ja) | 2008-09-15 | 2012-02-02 | オーエスアイ.オプトエレクトロニクス.インコーポレイテッド | 浅いn+層を有する薄い能動層フィッシュボーン・フォトダイオードとその製造方法 |
US8054355B2 (en) * | 2008-10-16 | 2011-11-08 | Omnivision Technologies, Inc. | Image sensor having multiple sensing layers |
US7915652B2 (en) * | 2008-10-24 | 2011-03-29 | Sharp Laboratories Of America, Inc. | Integrated infrared and color CMOS imager sensor |
US20100102229A1 (en) * | 2008-10-28 | 2010-04-29 | Sony Ericsson Mobile Communications Ab | Combined sensor for portable communication devices |
US8399909B2 (en) | 2009-05-12 | 2013-03-19 | Osi Optoelectronics, Inc. | Tetra-lateral position sensing detector |
CN102687502B (zh) * | 2009-08-25 | 2015-07-08 | 双光圈国际株式会社 | 减少彩色图像中的噪声 |
EP2346094A1 (fr) | 2010-01-13 | 2011-07-20 | FEI Company | Procédé de fabrication d'un détecteur de rayonnements |
US8692198B2 (en) * | 2010-04-21 | 2014-04-08 | Sionyx, Inc. | Photosensitive imaging devices and associated methods |
RU2431906C1 (ru) * | 2010-06-25 | 2011-10-20 | Алексей Олегович Федосеенко | Способ регистрации светового сигнала, устройство для его осуществления и способ сканирования объекта |
JP6081694B2 (ja) * | 2010-10-07 | 2017-02-15 | 株式会社半導体エネルギー研究所 | 光検出装置 |
FR2969390B1 (fr) * | 2010-12-15 | 2014-09-26 | St Microelectronics Rousset | Dispositif d'imagerie avec filtrage du rayonnement infrarouge. |
US9751465B2 (en) | 2012-04-16 | 2017-09-05 | Magna Electronics Inc. | Vehicle vision system with reduced image color data processing by use of dithering |
US8897522B2 (en) * | 2012-05-30 | 2014-11-25 | Xerox Corporation | Processing a video for vascular pattern detection and cardiac function analysis |
US9231015B2 (en) | 2012-09-24 | 2016-01-05 | Omnivision Technologies, Inc. | Backside-illuminated photosensor array with white, yellow and red-sensitive elements |
US8912615B2 (en) | 2013-01-24 | 2014-12-16 | Osi Optoelectronics, Inc. | Shallow junction photodiode for detecting short wavelength light |
US9455291B2 (en) | 2015-01-20 | 2016-09-27 | Omnivision Technologies, Inc. | Blue enhanced image sensor |
US9565405B2 (en) | 2015-02-03 | 2017-02-07 | Omnivision Technologies, Inc. | Image sensor with enhanced quantum efficiency |
US20160255323A1 (en) | 2015-02-26 | 2016-09-01 | Dual Aperture International Co. Ltd. | Multi-Aperture Depth Map Using Blur Kernels and Down-Sampling |
JP6755679B2 (ja) * | 2016-03-04 | 2020-09-16 | キヤノン株式会社 | 撮像装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3413603A (en) * | 1964-04-22 | 1968-11-26 | Kimura Kenjiro | Semiconductor character sensing device |
LU71811A1 (fr) * | 1975-02-07 | 1975-06-24 | ||
US4011016A (en) * | 1974-04-30 | 1977-03-08 | Martin Marietta Corporation | Semiconductor radiation wavelength detector |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3478214A (en) * | 1966-02-16 | 1969-11-11 | North American Rockwell | Photodetector responsive to light intensity in different spectral bands |
US3812518A (en) * | 1973-01-02 | 1974-05-21 | Gen Electric | Photodiode with patterned structure |
NL7308240A (fr) * | 1973-06-14 | 1974-12-17 | ||
US4048649A (en) * | 1976-02-06 | 1977-09-13 | Transitron Electronic Corporation | Superintegrated v-groove isolated bipolar and vmos transistors |
DE2619713C2 (de) * | 1976-05-04 | 1984-12-20 | Siemens AG, 1000 Berlin und 8000 München | Halbleiterspeicher |
US4084175A (en) * | 1976-09-30 | 1978-04-11 | Research Corporation | Double implanted planar mos device with v-groove and process of manufacture thereof |
-
1978
- 1978-10-06 US US05/949,346 patent/US4238760A/en not_active Expired - Lifetime
-
1979
- 1979-09-25 CA CA000336322A patent/CA1138081A/fr not_active Expired
- 1979-10-04 DE DE19792940343 patent/DE2940343A1/de not_active Ceased
- 1979-10-04 GB GB7934536A patent/GB2034971A/en not_active Withdrawn
- 1979-10-05 FR FR7924822A patent/FR2438344A1/fr not_active Withdrawn
- 1979-10-05 NL NL7907416A patent/NL7907416A/nl not_active Application Discontinuation
- 1979-10-06 JP JP12849179A patent/JPS5552277A/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3413603A (en) * | 1964-04-22 | 1968-11-26 | Kimura Kenjiro | Semiconductor character sensing device |
US4011016A (en) * | 1974-04-30 | 1977-03-08 | Martin Marietta Corporation | Semiconductor radiation wavelength detector |
LU71811A1 (fr) * | 1975-02-07 | 1975-06-24 |
Non-Patent Citations (1)
Title |
---|
EXBK/70 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4466691A (en) * | 1981-10-05 | 1984-08-21 | Merlin Gerin | Connecting terminal for circuit interrupter |
Also Published As
Publication number | Publication date |
---|---|
GB2034971A (en) | 1980-06-11 |
NL7907416A (nl) | 1980-04-09 |
US4238760A (en) | 1980-12-09 |
CA1138081A (fr) | 1982-12-21 |
JPS5552277A (en) | 1980-04-16 |
DE2940343A1 (de) | 1980-04-10 |
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ST | Notification of lapse |