FR2404861A1 - Detecteur de rayonnement invisible - Google Patents
Detecteur de rayonnement invisibleInfo
- Publication number
- FR2404861A1 FR2404861A1 FR7827744A FR7827744A FR2404861A1 FR 2404861 A1 FR2404861 A1 FR 2404861A1 FR 7827744 A FR7827744 A FR 7827744A FR 7827744 A FR7827744 A FR 7827744A FR 2404861 A1 FR2404861 A1 FR 2404861A1
- Authority
- FR
- France
- Prior art keywords
- radiation detector
- invisible radiation
- photodetector
- window surface
- invisible
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20186—Position of the photodiode with respect to the incoming radiation, e.g. in the front of, below or sideways the scintillator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
- G01T1/2019—Shielding against direct hits
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Nuclear Medicine (AREA)
Abstract
L'invention concerne un détecteur de rayonnement invisible. Il comporte un cristal scintillateur avec une surface formant fenêtre, couplée optiquement avec un photodétecteur, de préférence à semi-conducteur, et dont les autres surfaces diffusent la lumière. La surface formant fenêtre voit toutes les autres surfaces et laisse passer les photons lumineux de cristal vers le photodétecteur. L'invention s'applique notamment à des dispositifs de tomographie par calculateur.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/837,958 US4234792A (en) | 1977-09-29 | 1977-09-29 | Scintillator crystal radiation detector |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2404861A1 true FR2404861A1 (fr) | 1979-04-27 |
Family
ID=25275887
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7827744A Pending FR2404861A1 (fr) | 1977-09-29 | 1978-09-28 | Detecteur de rayonnement invisible |
Country Status (5)
Country | Link |
---|---|
US (1) | US4234792A (fr) |
JP (1) | JPS5458484A (fr) |
DE (1) | DE2841394A1 (fr) |
FR (1) | FR2404861A1 (fr) |
GB (1) | GB2005405A (fr) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2404427A2 (fr) * | 1977-09-30 | 1979-04-27 | Siemens Ag | Appareil de tomographie pour la realisation de tomographies transversales |
FR2435123A1 (fr) * | 1978-08-30 | 1980-03-28 | Gen Electric | Structure de scintillateur pour camera de gammagraphie |
FR2436598A1 (fr) * | 1978-09-20 | 1980-04-18 | Siemens Ag | Appareil de radiodiagnostic permettant la realisation de tomographies d'un objet de prise de vue |
FR2462719A1 (fr) * | 1979-07-30 | 1981-02-13 | American Science & Eng Inc | Detecteur de rayonnement a haute resolution |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4187427A (en) * | 1978-01-09 | 1980-02-05 | General Electric Company | Structure for collimated scintillation detectors useful in tomography |
US4159424A (en) * | 1978-04-03 | 1979-06-26 | General Electric Company | Trapezoidal scintillator for radiation detectors |
JPS55103270U (fr) * | 1979-01-09 | 1980-07-18 | ||
JPS597679B2 (ja) * | 1979-03-28 | 1984-02-20 | 株式会社日立製作所 | シンチレ−タ用結晶及びその製造方法 |
CA1120616A (fr) * | 1979-06-19 | 1982-03-23 | Montreal Neurological Institute | Forme et configuration de detecteurs pour dispositif de visualisation d'annihilations positoniques |
US4292538A (en) * | 1979-08-08 | 1981-09-29 | Technicare Corporation | Shaped detector |
DE2943027C2 (de) * | 1979-10-24 | 1983-09-08 | Siemens AG, 1000 Berlin und 8000 München | Strahlendiagnostikgerät für die Erzeugung von Schichtbildern eines Aufnahmeobjektes |
DE3003295A1 (de) * | 1980-01-30 | 1981-08-06 | Siemens AG, 1000 Berlin und 8000 München | Strahlendiagnostikgeraet |
US4415808A (en) * | 1980-12-24 | 1983-11-15 | General Electric Company | Scintillation detector array employing zig-zag plates |
DE3104030A1 (de) * | 1981-02-05 | 1982-08-26 | Siemens AG, 1000 Berlin und 8000 München | Roentgen- und/oder korpuskularstrahlungs-halbleiterdetektor in integrierter bauweise |
JPS58133237A (ja) * | 1982-02-01 | 1983-08-08 | 株式会社東芝 | 診断用x線ct装置 |
JPS58138774A (ja) * | 1982-02-12 | 1983-08-17 | Hitachi Chem Co Ltd | γ線検出器 |
JPS5988676A (ja) * | 1982-11-12 | 1984-05-22 | Toshiba Corp | 多チヤンネル放射線検出器ブロツクの製造方法 |
US4626688A (en) * | 1982-11-26 | 1986-12-02 | Barnes Gary T | Split energy level radiation detection |
US4563584A (en) * | 1982-12-29 | 1986-01-07 | General Electric Company | Solid state detector |
US4560877A (en) * | 1982-12-29 | 1985-12-24 | General Electric Company | Solid state detector module |
JPS6052786A (ja) * | 1983-08-31 | 1985-03-26 | Shimadzu Corp | 核医学イメ−ジング装置 |
JPS6089786A (ja) * | 1983-10-24 | 1985-05-20 | Hitachi Ltd | 放射線検出器 |
US4929835A (en) * | 1985-04-12 | 1990-05-29 | Takaji Yamashita | Position-sensitive radiation detector |
US4845731A (en) * | 1985-06-05 | 1989-07-04 | Picker International | Radiation data acquistion |
JPS6243585A (ja) * | 1985-08-21 | 1987-02-25 | Toshiba Corp | X線ct用検出器 |
JPS6271881A (ja) * | 1985-09-26 | 1987-04-02 | Toshiba Corp | 放射線検出器 |
US5463224A (en) * | 1986-07-01 | 1995-10-31 | American Science And Engineering, Inc. | X-ray detector suited for high energy applications with wide dynamic range, high stopping power and good protection for opto-electronic transducers |
NL8602021A (nl) * | 1986-08-07 | 1988-03-01 | Optische Ind De Oude Delft Nv | Werkwijze voor het vervaardigen van een beeldopneeminrichting voor radiografische toepassingen. |
JPH065290B2 (ja) * | 1986-09-18 | 1994-01-19 | 浜松ホトニクス株式会社 | ポジトロンct装置 |
US4963746A (en) * | 1986-11-25 | 1990-10-16 | Picker International, Inc. | Split energy level radiation detection |
US4914301A (en) * | 1987-04-21 | 1990-04-03 | Kabushiki Kaisha Toshiba | X-ray detector |
JPH0627844B2 (ja) * | 1987-05-14 | 1994-04-13 | 浜松ホトニクス株式会社 | 放射線位置検出器 |
AT387289B (de) * | 1987-07-09 | 1988-12-27 | Hoerschlaeger Herbert | Einrichtung zur radioaktivitaetsmessung |
US5097492A (en) * | 1987-10-30 | 1992-03-17 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
US5621811A (en) * | 1987-10-30 | 1997-04-15 | Hewlett-Packard Co. | Learning method and apparatus for detecting and controlling solder defects |
US5561696A (en) * | 1987-10-30 | 1996-10-01 | Hewlett-Packard Company | Method and apparatus for inspecting electrical connections |
US4926452A (en) * | 1987-10-30 | 1990-05-15 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
US5081656A (en) * | 1987-10-30 | 1992-01-14 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
US4870279A (en) * | 1988-06-20 | 1989-09-26 | General Electric Company | High resolution X-ray detector |
US4864138A (en) * | 1988-07-14 | 1989-09-05 | Clayton Foundation For Research | Positron emission tomography camera |
EP0360886A1 (fr) * | 1988-09-26 | 1990-04-04 | Siemens Aktiengesellschaft | Détecteur pour rayons X |
US5087949A (en) * | 1989-06-27 | 1992-02-11 | Hewlett-Packard Company | Light-emitting diode with diagonal faces |
US5259012A (en) * | 1990-08-30 | 1993-11-02 | Four Pi Systems Corporation | Laminography system and method with electromagnetically directed multipath radiation source |
JP2861340B2 (ja) * | 1990-09-07 | 1999-02-24 | ソニー株式会社 | 半導体装置 |
FR2711799B1 (fr) * | 1993-10-29 | 1996-02-02 | Stoichita Catalin | Système et capteur pour numérisation par balayage des images en rayons X. |
US5687209A (en) * | 1995-04-11 | 1997-11-11 | Hewlett-Packard Co. | Automatic warp compensation for laminographic circuit board inspection |
US5583904A (en) * | 1995-04-11 | 1996-12-10 | Hewlett-Packard Co. | Continuous linear scan laminography system and method |
US6553092B1 (en) * | 2000-03-07 | 2003-04-22 | Koninklijke Philips Electronics, N.V. | Multi-layer x-ray detector for diagnostic imaging |
US6473486B2 (en) * | 2000-12-05 | 2002-10-29 | Ge Medical Systems Global Technology Co., Llc | System and method of computed tomography imaging using a focused scintillator and method of manufacturing |
US6510195B1 (en) * | 2001-07-18 | 2003-01-21 | Koninklijke Philips Electronics, N.V. | Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same |
CA2474450A1 (fr) * | 2002-02-01 | 2003-08-07 | Board Of Regents, The University Of Texas System | Cristaux de scintillation interconnectes et places de maniere asymetrique |
US6979826B2 (en) * | 2002-07-29 | 2005-12-27 | Ge Medical Systems Global Technology Company Llc | Scintillator geometry for enhanced radiation detection and reduced error sensitivity |
US6933504B2 (en) * | 2003-03-12 | 2005-08-23 | General Electric Company | CT detector having a segmented optical coupler and method of manufacturing same |
GB2418015B (en) * | 2004-05-24 | 2006-12-20 | Symetrica Ltd | Gamma ray spectrometers |
CN101052895A (zh) * | 2004-10-29 | 2007-10-10 | 皇家飞利浦电子股份有限公司 | 用于医学df和rf成像以及ct中的gos陶瓷闪烁纤维光学x射线成像板 |
JP5017821B2 (ja) * | 2005-06-10 | 2012-09-05 | 日立化成工業株式会社 | シンチレータ用単結晶及びその製造方法 |
US20070086565A1 (en) * | 2005-10-13 | 2007-04-19 | Thompson Richard A | Focally aligned CT detector |
US8373132B2 (en) * | 2009-02-06 | 2013-02-12 | Koninklijke Philips Electronics N. V. | Radiation detector with a stack of scintillator elements and photodiode arrays |
DE102009033304A1 (de) * | 2009-07-15 | 2011-01-27 | Siemens Aktiengesellschaft | Computertomographiedetektor mit hoher Strahlungsfestigkeit |
DE102009036079A1 (de) * | 2009-08-04 | 2011-02-17 | Siemens Aktiengesellschaft | Röntgendetektor und Herstellungsverfahren für einen Röntgendetektor |
GB201004923D0 (en) * | 2010-03-24 | 2010-05-12 | Sensl Technologies Ltd | Compact method for medical detection |
US8466421B2 (en) * | 2010-07-30 | 2013-06-18 | Varian Medical Systems Inc. | Radiation detector with multiple operating schemes |
DE102010054340B3 (de) * | 2010-12-13 | 2012-04-05 | Yxlon International Gmbh | Röntgenzeilendetektor sowie Verfahren zur Herstellung desselben |
US9535169B2 (en) * | 2011-01-04 | 2017-01-03 | Hamamatsu Photonics K.K. | Radiation detector |
US9164181B2 (en) * | 2011-12-30 | 2015-10-20 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation crystals having features on a side, radiation detection apparatuses including such scintillation crystals, and processes of forming the same |
JP2014032124A (ja) * | 2012-08-03 | 2014-02-20 | Canon Inc | 放射線撮像装置及び放射線撮像システム |
JP2018009803A (ja) * | 2016-07-11 | 2018-01-18 | コニカミノルタ株式会社 | シンチレータパネル |
EP3532872B1 (fr) | 2016-10-26 | 2024-05-01 | Koninklijke Philips N.V. | Détecteur à scintillation de rayonnement à interconnexion intégrée par trou traversant |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2317667A1 (fr) * | 1975-07-10 | 1977-02-04 | Emi Ltd | Perfectionnements apportes a la detection de rayonnement |
US4110621A (en) * | 1977-03-23 | 1978-08-29 | Butler-Newton, Inc. | Tomography X-ray detector |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2745968A (en) * | 1949-03-12 | 1956-05-15 | Texaco Development Corp | Detection and measurement of penetrative radiation |
US3068359A (en) * | 1959-04-02 | 1962-12-11 | Harshaw Chem Corp | Scintillator component |
US3790799A (en) * | 1972-06-21 | 1974-02-05 | American Science & Eng Inc | Radiant energy imaging with rocking scanning |
-
1977
- 1977-09-29 US US05/837,958 patent/US4234792A/en not_active Expired - Lifetime
-
1978
- 1978-09-12 GB GB7836561A patent/GB2005405A/en not_active Withdrawn
- 1978-09-22 DE DE19782841394 patent/DE2841394A1/de not_active Withdrawn
- 1978-09-28 FR FR7827744A patent/FR2404861A1/fr active Pending
- 1978-09-29 JP JP12033478A patent/JPS5458484A/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2317667A1 (fr) * | 1975-07-10 | 1977-02-04 | Emi Ltd | Perfectionnements apportes a la detection de rayonnement |
US4110621A (en) * | 1977-03-23 | 1978-08-29 | Butler-Newton, Inc. | Tomography X-ray detector |
Non-Patent Citations (4)
Title |
---|
EXBK/60 * |
EXBK/67 * |
EXBK/68 * |
EXRV/64 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2404427A2 (fr) * | 1977-09-30 | 1979-04-27 | Siemens Ag | Appareil de tomographie pour la realisation de tomographies transversales |
FR2435123A1 (fr) * | 1978-08-30 | 1980-03-28 | Gen Electric | Structure de scintillateur pour camera de gammagraphie |
FR2436598A1 (fr) * | 1978-09-20 | 1980-04-18 | Siemens Ag | Appareil de radiodiagnostic permettant la realisation de tomographies d'un objet de prise de vue |
FR2462719A1 (fr) * | 1979-07-30 | 1981-02-13 | American Science & Eng Inc | Detecteur de rayonnement a haute resolution |
Also Published As
Publication number | Publication date |
---|---|
DE2841394A1 (de) | 1979-04-12 |
JPS5458484A (en) | 1979-05-11 |
US4234792A (en) | 1980-11-18 |
GB2005405A (en) | 1979-04-19 |
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