FR2400748A1 - Matrice a semi-conducteurs pour memoire permanente integree - Google Patents

Matrice a semi-conducteurs pour memoire permanente integree

Info

Publication number
FR2400748A1
FR2400748A1 FR7823868A FR7823868A FR2400748A1 FR 2400748 A1 FR2400748 A1 FR 2400748A1 FR 7823868 A FR7823868 A FR 7823868A FR 7823868 A FR7823868 A FR 7823868A FR 2400748 A1 FR2400748 A1 FR 2400748A1
Authority
FR
France
Prior art keywords
conductivity
semiconductor
layer
type
bars
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7823868A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KRUZHANOV JURY
Original Assignee
KRUZHANOV JURY
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KRUZHANOV JURY filed Critical KRUZHANOV JURY
Publication of FR2400748A1 publication Critical patent/FR2400748A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/08Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8222Bipolar technology
    • H01L21/8224Bipolar technology comprising a combination of vertical and lateral transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/10Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/102Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including bipolar components
    • H01L27/1021Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including bipolar components including diodes only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/45Ohmic electrodes
    • H01L29/456Ohmic electrodes on silicon

Abstract

Matrice à semi-conducteurs pour mémoire permanente intégrée, réalisée à base d'éléments comportant une région semi-conductrice d'un premier type de conductivité, la région d'au moins une partie des éléments étant pourvue dans la couche présuperficielle d'une région semi-conductrice du second type de conductivité, lesdits éléments étant formés à l'intersection de barres semi-conductrices du premier type de conductivité, réalisées dans un substrat semi-conducteur, et de barres métalliques disposées sur une couche de diélectrique qui isole les barres semi-conductrices par rapport aux barres métalliques, tandis qu'au-dessus d'une partie des éléments dans la couche diélectrique, sont pratiquées au-dessus du second type de conductivité des ouvertures pour assurer le contact électrique entre lesdites régions du second type de conductivité et les barres métalliques, ladite matrice à semi-conducteurs étant caractérisée en ce que les barres semi-conductrices 4 comportent une couche supplémentaire 6 disposée entre le substrat 1 et la couche présuperficielle 5 et de même type de conductivité que ladite couche présuperficielle, la conductivité de la couche supplémentaire étant supérieure à la conductibilité de la couche présuperficielle et limitée par la solubilité limite de l'impureté de dopage dans le matériau d'une barre semi-conductrice.
FR7823868A 1977-08-16 1978-08-16 Matrice a semi-conducteurs pour memoire permanente integree Withdrawn FR2400748A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU2517206 1977-08-16

Publications (1)

Publication Number Publication Date
FR2400748A1 true FR2400748A1 (fr) 1979-03-16

Family

ID=20721978

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7823868A Withdrawn FR2400748A1 (fr) 1977-08-16 1978-08-16 Matrice a semi-conducteurs pour memoire permanente integree

Country Status (4)

Country Link
JP (1) JPS5448452A (fr)
DE (1) DE2835086A1 (fr)
FR (1) FR2400748A1 (fr)
GB (1) GB2004687A (fr)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1240476A (en) * 1967-12-01 1971-07-28 Plessey Co Ltd Improvements relating to information storage devices
FR2088478A1 (fr) * 1970-05-11 1972-01-07 Siemens Ag
FR2168213A1 (fr) * 1972-01-20 1973-08-31 Garyainov Stanislav
US3979734A (en) * 1975-06-16 1976-09-07 International Business Machines Corporation Multiple element charge storage memory cell

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3721964A (en) * 1970-02-18 1973-03-20 Hewlett Packard Co Integrated circuit read only memory bit organized in coincident select structure

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1240476A (en) * 1967-12-01 1971-07-28 Plessey Co Ltd Improvements relating to information storage devices
FR2088478A1 (fr) * 1970-05-11 1972-01-07 Siemens Ag
FR2168213A1 (fr) * 1972-01-20 1973-08-31 Garyainov Stanislav
US3979734A (en) * 1975-06-16 1976-09-07 International Business Machines Corporation Multiple element charge storage memory cell

Also Published As

Publication number Publication date
DE2835086A1 (de) 1979-03-01
JPS5448452A (en) 1979-04-17
GB2004687A (en) 1979-04-04

Similar Documents

Publication Publication Date Title
US2721965A (en) Power transistor
US3515850A (en) Thermal printing head with diffused printing elements
KR890015394A (ko) 부식이 감소된 리드 프레임 및 이의 제조방법
GB1272788A (en) Improvements in and relating to a semi-conductor wafer for integrated circuits and a method of forming the wafer
GB1296951A (fr)
GB1161049A (en) Field-effect semiconductor devices.
RU97120995A (ru) Способ изготовления термоэлектрического модуля
GB1400608A (en) Transcalent semiconductor device
US3573572A (en) Controlled rectifier having high rate-of-rise-of-current capability and low firing gate current
GB795478A (en) Improvements in or relating to the production of semi-conductor elements
FR2371779A1 (fr) Dispositif semi-conducteur a faible capacite parasite et son procede de fabrication
KR900019261A (ko) 반도체장치
KR970060477A (ko) 반도체 장치
FR2400748A1 (fr) Matrice a semi-conducteurs pour memoire permanente integree
KR900011016A (ko) 복합형 다이오드장치
US3914782A (en) Reverse conducting thyristor and process for producing the same
GB1421270A (en) Integrated circuit
FR2371769A1 (fr) Structure de cathode et son procede de fabrication
US4341011A (en) Method of manufacturing semiconductor device
KR860000701A (ko) 다수의 옆으로의 소멸을 가진 전력 접합전계효과 트랜지스터
FR2400747A1 (fr) Matrice a semi-conducteurs pour memoire permanente a circuits integres
FR2408216A1 (fr) Procede de fabrication de circuits integres a semi-conducteurs et circuit integre obtenu par ce procede
KR860000697A (ko) 2중스택 전력 접합전계효과 트랜지스터
ES337005A1 (es) Un metodo de fabricar un dispositivo semiconductor.
US3171067A (en) Base washer contact for transistor and method of fabricating same

Legal Events

Date Code Title Description
ST Notification of lapse