FI20105304A - Rainan paksuuden mittauslaite - Google Patents
Rainan paksuuden mittauslaite Download PDFInfo
- Publication number
- FI20105304A FI20105304A FI20105304A FI20105304A FI20105304A FI 20105304 A FI20105304 A FI 20105304A FI 20105304 A FI20105304 A FI 20105304A FI 20105304 A FI20105304 A FI 20105304A FI 20105304 A FI20105304 A FI 20105304A
- Authority
- FI
- Finland
- Prior art keywords
- thickness gauge
- strip thickness
- strip
- gauge
- thickness
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/86—Investigating moving sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/107—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/34—Paper
- G01N33/346—Paper sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/40—Caliper-like sensors
- G01B2210/44—Caliper-like sensors with detectors on both sides of the object to be measured
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US96937307P | 2007-08-31 | 2007-08-31 | |
US96937307 | 2007-08-31 | ||
PCT/US2008/010064 WO2009032094A1 (en) | 2007-08-31 | 2008-08-25 | Web thickness measurement device |
US2008010064 | 2008-08-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
FI20105304A true FI20105304A (fi) | 2010-03-25 |
FI123478B FI123478B (fi) | 2013-05-31 |
Family
ID=39940588
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20155193A FI127623B (fi) | 2007-08-31 | 2008-08-25 | Rainan paksuuden mittauslaite |
FI20105304A FI123478B (fi) | 2007-08-31 | 2010-03-25 | Rainan paksuuden mittauslaite |
FI20135026A FI127396B (fi) | 2007-08-31 | 2013-01-09 | Ilmaisin liikkuvan rainan monitoroimiseksi ja menetelmä liikkuvan rainan mittaamiseksi |
FI20135027A FI125343B (fi) | 2007-08-31 | 2013-01-09 | Rainan paksuuden mittauslaite |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20155193A FI127623B (fi) | 2007-08-31 | 2008-08-25 | Rainan paksuuden mittauslaite |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20135026A FI127396B (fi) | 2007-08-31 | 2013-01-09 | Ilmaisin liikkuvan rainan monitoroimiseksi ja menetelmä liikkuvan rainan mittaamiseksi |
FI20135027A FI125343B (fi) | 2007-08-31 | 2013-01-09 | Rainan paksuuden mittauslaite |
Country Status (6)
Country | Link |
---|---|
US (3) | US7847943B2 (fi) |
CN (1) | CN101868689B (fi) |
CA (2) | CA2884632C (fi) |
DE (1) | DE112008002244B4 (fi) |
FI (4) | FI127623B (fi) |
WO (1) | WO2009032094A1 (fi) |
Families Citing this family (52)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101868689B (zh) * | 2007-08-31 | 2016-11-02 | Abb有限公司 | 幅片厚度测量设备 |
FI20075975L (fi) * | 2007-12-31 | 2009-07-01 | Metso Automation Oy | Rainan mittaus |
EP2406579A4 (en) * | 2009-03-12 | 2017-02-15 | Daprox Ab | Method and means for non-contact measuring thickness of non-metal coating on surface of metal matrix |
GB0910736D0 (en) * | 2009-06-22 | 2009-08-05 | Pilkington Group Ltd | Improved film thickness measurement |
CN102483322A (zh) * | 2009-07-02 | 2012-05-30 | 沃依特专利有限责任公司 | 通过修正定向误差无接触地确定料幅厚度的方法和装置 |
CA2766845A1 (en) | 2009-07-02 | 2011-01-06 | Voith Patent Gmbh | Method for contactless determination of the thickness of a web of material |
FI124299B (fi) * | 2009-10-08 | 2014-06-13 | Focalspec Oy | Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi |
US8619268B2 (en) * | 2010-01-18 | 2013-12-31 | Spirit Aerosystems, Inc. | Apparatus and method for thickness detection |
EP2551405B1 (en) * | 2010-03-25 | 2015-12-16 | Japan Tobacco, Inc. | Machine for producing low-ignition-propensity web, method for producing same, and method for producing low-ignition-propensity wrapping paper used in cigarettes |
US9325860B2 (en) * | 2010-12-01 | 2016-04-26 | Quadtech, Inc. | Line color monitoring system |
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TWI426227B (zh) * | 2010-12-30 | 2014-02-11 | Ind Tech Res Inst | 移動樣品之形貌的量測方法及其裝置 |
US8527212B2 (en) | 2011-02-14 | 2013-09-03 | Honeywell Asca Inc. | Increased absorption-measurement accuracy through windowing of photon-transit times to account for scattering in continuous webs and powders |
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DE102011051601A1 (de) * | 2011-05-16 | 2012-11-22 | Wolfgang Hausmann | Vorrichtung und Verfahren zur einseitig berührungslosen Dickenmessung eines Messguts |
US8773656B2 (en) * | 2011-08-24 | 2014-07-08 | Corning Incorporated | Apparatus and method for characterizing glass sheets |
US8760669B2 (en) * | 2011-09-30 | 2014-06-24 | Honeywell Asca Inc. | Method of measuring the thickness of a moving web |
DE102012203315B4 (de) | 2011-11-30 | 2014-10-16 | Micro-Epsilon Messtechnik Gmbh & Co. Kg | Vorrichtung und ein Verfahren zur Abstands- oder Dickenmessung eines Objekts |
FI125119B (fi) * | 2011-12-28 | 2015-06-15 | Metso Automation Oy | Tasomaisen mittauskohteen mittaus |
US9441961B2 (en) | 2012-04-30 | 2016-09-13 | Honeywell Limited | System and method for correcting caliper measurements of sheet products in sheet manufacturing or processing systems |
US9266694B2 (en) | 2012-06-08 | 2016-02-23 | Honeywell International Inc. | Noncontact caliper measurements of sheet products using intersecting lines in sheet manufacturing or processing systems |
KR101897835B1 (ko) * | 2012-07-24 | 2018-09-12 | 삼성에스디아이 주식회사 | 극판 두께 측정 장치 및 방법 |
US8944001B2 (en) * | 2013-02-18 | 2015-02-03 | Nordson Corporation | Automated position locator for a height sensor in a dispensing system |
DE102013008582B4 (de) | 2013-05-08 | 2015-04-30 | Technische Universität Ilmenau | Verfahren und Vorrichtung zur chromatisch-konfokalen Mehrpunktmessung sowie deren Verwendung |
US9007589B2 (en) * | 2013-09-16 | 2015-04-14 | Honeywell Asca Inc. | Co-located porosity and caliper measurement for membranes and other web products |
US9581433B2 (en) * | 2013-12-11 | 2017-02-28 | Honeywell Asca Inc. | Caliper sensor and method using mid-infrared interferometry |
US8926798B1 (en) | 2014-02-07 | 2015-01-06 | Honeywell International Inc. | Apparatus and method for measuring cross direction (CD) profile of machine direction (MD) tension on a web |
US9151595B1 (en) | 2014-04-18 | 2015-10-06 | Advanced Gauging Technologies, LLC | Laser thickness gauge and method including passline angle correction |
JP6367041B2 (ja) * | 2014-08-05 | 2018-08-01 | 株式会社ミツトヨ | 外形寸法測定装置及び外形寸法測定方法 |
US9753114B2 (en) * | 2014-11-03 | 2017-09-05 | Honeywell Limited | Gap and displacement magnetic sensor system for scanner heads in paper machines or other systems |
DE102014019336B3 (de) * | 2014-12-29 | 2016-01-28 | Friedrich Vollmer Feinmessgerätebau Gmbh | Vorrichtung zum Schutz der Fenster von Laserabstandssensoren |
US9527320B2 (en) * | 2015-04-23 | 2016-12-27 | Xerox Corporation | Inkjet print head protection by acoustic sensing of media |
US20160349175A1 (en) * | 2015-05-28 | 2016-12-01 | Microaeth Corporation | Apparatus for receiving an analyte, method for characterizing an analyte, and substrate cartridge |
DE102015217637C5 (de) * | 2015-09-15 | 2023-06-01 | Carl Zeiss Industrielle Messtechnik Gmbh | Betreiben eines konfokalen Weißlichtsensors an einem Koordinatenmessgerät und Anordnung |
JP6520669B2 (ja) * | 2015-12-03 | 2019-05-29 | オムロン株式会社 | 光学計測装置 |
EP3396308B1 (en) * | 2015-12-25 | 2022-02-02 | Keyence Corporation | Confocal displacement meter |
US10352340B2 (en) * | 2016-03-16 | 2019-07-16 | Hexagon Metrology, Inc. | Probe clips for a coordinate measuring machine |
CN106066169B (zh) * | 2016-06-14 | 2019-01-11 | 中南大学 | 一种铜电解阴极板垂直度的检测方法、装置及系统 |
JP2018124167A (ja) | 2017-01-31 | 2018-08-09 | オムロン株式会社 | 傾斜測定装置 |
CN106871773B (zh) * | 2017-02-14 | 2019-07-09 | 肇庆市嘉仪仪器有限公司 | 一种在线非接触测厚设备及其测量方法 |
JP6852455B2 (ja) * | 2017-02-23 | 2021-03-31 | オムロン株式会社 | 光学計測装置 |
FI20185410A1 (fi) | 2018-05-03 | 2019-11-04 | Valmet Automation Oy | Liikkuvan rainan kimmokertoimen mittaaminen |
JP7062518B2 (ja) * | 2018-05-25 | 2022-05-06 | 株式会社キーエンス | 共焦点変位計 |
CN109001221A (zh) * | 2018-07-12 | 2018-12-14 | 钱晓斌 | 一种成品纸张检品机 |
CN108955549A (zh) * | 2018-09-11 | 2018-12-07 | 深圳立仪科技有限公司 | 一种透光材料双面测厚装置 |
EP3718939B1 (en) * | 2019-04-03 | 2023-01-04 | Fitesa Nãotecidos S.A. | Device and method for detecting the presence of abnormalities in a reel |
CN110425973A (zh) * | 2019-08-29 | 2019-11-08 | 威海华菱光电股份有限公司 | 厚度检测装置、方法、系统、存储介质和处理器 |
SE543802C2 (en) * | 2019-12-20 | 2021-07-27 | Stora Enso Oyj | Method for determining film thickness, method for producing a film and device for producing a film |
SE543843C2 (en) * | 2019-12-20 | 2021-08-10 | Stora Enso Oyj | Method for identifying defects in a film, method and device for producing a film |
US11740356B2 (en) | 2020-06-05 | 2023-08-29 | Honeywell International Inc. | Dual-optical displacement sensor alignment using knife edges |
CN114894106B (zh) * | 2022-05-18 | 2023-07-21 | 天津大学 | 一种不透明样品厚度测量系统及方法 |
US20240090110A1 (en) * | 2022-09-14 | 2024-03-14 | Kla Corporation | Confocal Chromatic Metrology for EUV Source Condition Monitoring |
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US3827808A (en) * | 1973-05-09 | 1974-08-06 | Industrial Nucleonics Corp | Method and apparatus for measuring the opacity of sheet material in which the transmittance signal is compensated for the reflectivity of the material |
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JPH04265814A (ja) | 1991-02-20 | 1992-09-22 | Nissin Electric Co Ltd | 変位測定装置 |
US5479720A (en) * | 1994-01-21 | 1996-01-02 | Abb Industrial Systems, Inc. | Methods and apparatus for measuring web thickness and other characteristics of a moving web |
DE19613082C2 (de) * | 1996-04-02 | 1999-10-21 | Koenig & Bauer Ag | Verfahren und Vorrichtung zur qualitativen Beurteilung von bearbeitetem Material |
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DE10220824B4 (de) * | 2001-05-14 | 2010-08-05 | Robert Bosch Gmbh | Optische Messvorrichtung |
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JP2005099430A (ja) | 2003-09-25 | 2005-04-14 | Olympus Corp | 光学的観察装置、走査型顕微鏡及び経内視鏡的観察装置 |
DE10361161A1 (de) * | 2003-12-22 | 2005-07-21 | Voith Paper Patent Gmbh | Messvorrichtung |
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DE102004026193B4 (de) * | 2004-05-28 | 2012-03-29 | Carl Mahr Holding Gmbh | Messverfahren zur Formmessung |
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DE102005002351A1 (de) * | 2005-01-18 | 2006-07-27 | Voith Paper Patent Gmbh | Anordnung und Verfahren zur ortsaufgelösten Dicken- oder Höhenmessung oder Oberflächenprofil- oder Oberflächentopographieerfassung unter Druckbelastung |
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DE102005022819A1 (de) | 2005-05-12 | 2006-11-16 | Nanofocus Ag | Verfahren zur Bestimmung der absoluten Dicke von nicht transparenten und transparenten Proben mittels konfokaler Messtechnik |
DE102005023351A1 (de) * | 2005-05-17 | 2006-11-30 | Micro-Epsilon Messtechnik Gmbh & Co Kg | Vorrichtung und Verfahren zum Vermessen von Oberflächen |
WO2006125131A2 (en) * | 2005-05-19 | 2006-11-23 | Zygo Corporation | Analyzing low-coherence interferometry signals for thin film structures |
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FI119260B (fi) * | 2006-03-10 | 2008-09-15 | Metso Automation Oy | Menetelmä mittauslaitteiston kalibroimiseksi ja mittauslaitteisto |
US7768629B2 (en) * | 2006-05-12 | 2010-08-03 | Voith Patent Gmbh | Device and process for optical distance measurement |
US20070263228A1 (en) * | 2006-05-12 | 2007-11-15 | Voith Paper Patent Gmbh | Device and process for optical distance measurement |
DE102006026775B4 (de) * | 2006-06-07 | 2008-04-30 | Stiftung Für Lasertechnologien In Der Medizin Und Messtechnik An Der Universität Ulm | Verfahren und Vorrichtung zur Charakterisierung bewegter Oberflächen |
US8282781B2 (en) * | 2006-12-11 | 2012-10-09 | Honeywell International Inc. | Apparatus and method for stabilization of a moving sheet relative to a sensor |
US20080158572A1 (en) * | 2006-12-27 | 2008-07-03 | Honeywell, Inc. | System and method for measurement of thickness of thin films |
CN101868689B (zh) * | 2007-08-31 | 2016-11-02 | Abb有限公司 | 幅片厚度测量设备 |
JP4265814B1 (ja) | 2008-06-30 | 2009-05-20 | 任天堂株式会社 | 姿勢算出装置、姿勢算出プログラム、ゲーム装置、およびゲームプログラム |
-
2008
- 2008-08-25 CN CN200880108430.8A patent/CN101868689B/zh active Active
- 2008-08-25 CA CA2884632A patent/CA2884632C/en active Active
- 2008-08-25 WO PCT/US2008/010064 patent/WO2009032094A1/en active Application Filing
- 2008-08-25 CA CA2697543A patent/CA2697543C/en active Active
- 2008-08-25 FI FI20155193A patent/FI127623B/fi active IP Right Grant
- 2008-08-25 DE DE112008002244T patent/DE112008002244B4/de active Active
- 2008-08-28 US US12/200,302 patent/US7847943B2/en active Active
- 2008-08-28 US US12/200,258 patent/US7889342B2/en active Active
- 2008-08-28 US US12/200,196 patent/US20090059244A1/en not_active Abandoned
-
2010
- 2010-03-25 FI FI20105304A patent/FI123478B/fi active IP Right Grant
-
2013
- 2013-01-09 FI FI20135026A patent/FI127396B/fi active IP Right Grant
- 2013-01-09 FI FI20135027A patent/FI125343B/fi active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
CA2884632A1 (en) | 2009-03-12 |
FI20135026A (fi) | 2013-01-09 |
DE112008002244B4 (de) | 2013-07-25 |
CN101868689B (zh) | 2016-11-02 |
FI20155193A (fi) | 2015-03-20 |
US20090059244A1 (en) | 2009-03-05 |
DE112008002244T5 (de) | 2010-07-22 |
CA2884632C (en) | 2016-10-25 |
US7847943B2 (en) | 2010-12-07 |
US20090056156A1 (en) | 2009-03-05 |
CA2697543A1 (en) | 2009-03-12 |
FI123478B (fi) | 2013-05-31 |
WO2009032094A1 (en) | 2009-03-12 |
CN101868689A (zh) | 2010-10-20 |
FI127623B (fi) | 2018-10-31 |
FI127396B (fi) | 2018-05-15 |
CA2697543C (en) | 2016-01-26 |
FI125343B (fi) | 2015-08-31 |
US7889342B2 (en) | 2011-02-15 |
FI20135027A (fi) | 2013-01-09 |
US20090059232A1 (en) | 2009-03-05 |
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