FI20135027A - Rainan paksuuden mittauslaite - Google Patents
Rainan paksuuden mittauslaite Download PDFInfo
- Publication number
- FI20135027A FI20135027A FI20135027A FI20135027A FI20135027A FI 20135027 A FI20135027 A FI 20135027A FI 20135027 A FI20135027 A FI 20135027A FI 20135027 A FI20135027 A FI 20135027A FI 20135027 A FI20135027 A FI 20135027A
- Authority
- FI
- Finland
- Prior art keywords
- measuring device
- thickness measuring
- track thickness
- track
- thickness
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/86—Investigating moving sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/107—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/34—Paper
- G01N33/346—Paper sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/40—Caliper-like sensors
- G01B2210/44—Caliper-like sensors with detectors on both sides of the object to be measured
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US96937307P | 2007-08-31 | 2007-08-31 | |
US96937307 | 2007-08-31 | ||
US2008010064 | 2008-08-25 | ||
PCT/US2008/010064 WO2009032094A1 (en) | 2007-08-31 | 2008-08-25 | Web thickness measurement device |
Publications (2)
Publication Number | Publication Date |
---|---|
FI20135027A true FI20135027A (fi) | 2013-01-09 |
FI125343B FI125343B (fi) | 2015-08-31 |
Family
ID=39940588
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20155193A FI127623B (fi) | 2007-08-31 | 2008-08-25 | Rainan paksuuden mittauslaite |
FI20105304A FI123478B (fi) | 2007-08-31 | 2010-03-25 | Rainan paksuuden mittauslaite |
FI20135026A FI127396B (fi) | 2007-08-31 | 2013-01-09 | Ilmaisin liikkuvan rainan monitoroimiseksi ja menetelmä liikkuvan rainan mittaamiseksi |
FI20135027A FI125343B (fi) | 2007-08-31 | 2013-01-09 | Rainan paksuuden mittauslaite |
Family Applications Before (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20155193A FI127623B (fi) | 2007-08-31 | 2008-08-25 | Rainan paksuuden mittauslaite |
FI20105304A FI123478B (fi) | 2007-08-31 | 2010-03-25 | Rainan paksuuden mittauslaite |
FI20135026A FI127396B (fi) | 2007-08-31 | 2013-01-09 | Ilmaisin liikkuvan rainan monitoroimiseksi ja menetelmä liikkuvan rainan mittaamiseksi |
Country Status (6)
Country | Link |
---|---|
US (3) | US7889342B2 (fi) |
CN (1) | CN101868689B (fi) |
CA (2) | CA2884632C (fi) |
DE (1) | DE112008002244B4 (fi) |
FI (4) | FI127623B (fi) |
WO (1) | WO2009032094A1 (fi) |
Families Citing this family (52)
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CA2884632C (en) * | 2007-08-31 | 2016-10-25 | Abb Ltd. | Web thickness measurement device |
FI20075975L (fi) * | 2007-12-31 | 2009-07-01 | Metso Automation Oy | Rainan mittaus |
EP2406579A4 (en) * | 2009-03-12 | 2017-02-15 | Daprox Ab | Method and means for non-contact measuring thickness of non-metal coating on surface of metal matrix |
GB0910736D0 (en) * | 2009-06-22 | 2009-08-05 | Pilkington Group Ltd | Improved film thickness measurement |
EP2449338B1 (de) * | 2009-07-02 | 2013-08-14 | Voith Patent GmbH | Verfahren und vorrichtung zur berührungslosen bestimmung der dicke einer materialbahn mit korrektur des ausrichtfehlers |
EP2449339A1 (de) | 2009-07-02 | 2012-05-09 | Voith Patent GmbH | Verfahren zur berührungslosen bestimmung der dicke einer materialbahn |
FI124299B (fi) * | 2009-10-08 | 2014-06-13 | Focalspec Oy | Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi |
US8619268B2 (en) * | 2010-01-18 | 2013-12-31 | Spirit Aerosystems, Inc. | Apparatus and method for thickness detection |
BR112012023814A2 (pt) * | 2010-03-25 | 2016-08-02 | Japan Tobacco Inc | máquina e método de fabricar uma folha contínua com baixa propagação de chamas e método de fabricar um papel de envolvimento com baixa propagação de chamas |
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US8773656B2 (en) * | 2011-08-24 | 2014-07-08 | Corning Incorporated | Apparatus and method for characterizing glass sheets |
US8760669B2 (en) * | 2011-09-30 | 2014-06-24 | Honeywell Asca Inc. | Method of measuring the thickness of a moving web |
DE102012203315B4 (de) | 2011-11-30 | 2014-10-16 | Micro-Epsilon Messtechnik Gmbh & Co. Kg | Vorrichtung und ein Verfahren zur Abstands- oder Dickenmessung eines Objekts |
FI125119B (fi) | 2011-12-28 | 2015-06-15 | Metso Automation Oy | Tasomaisen mittauskohteen mittaus |
US9441961B2 (en) | 2012-04-30 | 2016-09-13 | Honeywell Limited | System and method for correcting caliper measurements of sheet products in sheet manufacturing or processing systems |
US9266694B2 (en) | 2012-06-08 | 2016-02-23 | Honeywell International Inc. | Noncontact caliper measurements of sheet products using intersecting lines in sheet manufacturing or processing systems |
KR101897835B1 (ko) * | 2012-07-24 | 2018-09-12 | 삼성에스디아이 주식회사 | 극판 두께 측정 장치 및 방법 |
US8944001B2 (en) * | 2013-02-18 | 2015-02-03 | Nordson Corporation | Automated position locator for a height sensor in a dispensing system |
DE102013008582B4 (de) | 2013-05-08 | 2015-04-30 | Technische Universität Ilmenau | Verfahren und Vorrichtung zur chromatisch-konfokalen Mehrpunktmessung sowie deren Verwendung |
US9007589B2 (en) * | 2013-09-16 | 2015-04-14 | Honeywell Asca Inc. | Co-located porosity and caliper measurement for membranes and other web products |
US9581433B2 (en) * | 2013-12-11 | 2017-02-28 | Honeywell Asca Inc. | Caliper sensor and method using mid-infrared interferometry |
US8926798B1 (en) | 2014-02-07 | 2015-01-06 | Honeywell International Inc. | Apparatus and method for measuring cross direction (CD) profile of machine direction (MD) tension on a web |
US9151595B1 (en) | 2014-04-18 | 2015-10-06 | Advanced Gauging Technologies, LLC | Laser thickness gauge and method including passline angle correction |
JP6367041B2 (ja) * | 2014-08-05 | 2018-08-01 | 株式会社ミツトヨ | 外形寸法測定装置及び外形寸法測定方法 |
US9753114B2 (en) * | 2014-11-03 | 2017-09-05 | Honeywell Limited | Gap and displacement magnetic sensor system for scanner heads in paper machines or other systems |
DE102014019336B3 (de) * | 2014-12-29 | 2016-01-28 | Friedrich Vollmer Feinmessgerätebau Gmbh | Vorrichtung zum Schutz der Fenster von Laserabstandssensoren |
US9527320B2 (en) * | 2015-04-23 | 2016-12-27 | Xerox Corporation | Inkjet print head protection by acoustic sensing of media |
US20160349175A1 (en) * | 2015-05-28 | 2016-12-01 | Microaeth Corporation | Apparatus for receiving an analyte, method for characterizing an analyte, and substrate cartridge |
DE102015217637C5 (de) | 2015-09-15 | 2023-06-01 | Carl Zeiss Industrielle Messtechnik Gmbh | Betreiben eines konfokalen Weißlichtsensors an einem Koordinatenmessgerät und Anordnung |
JP6520669B2 (ja) | 2015-12-03 | 2019-05-29 | オムロン株式会社 | 光学計測装置 |
CN108474646B (zh) * | 2015-12-25 | 2021-07-23 | 株式会社基恩士 | 共焦位移计 |
CN109154494A (zh) * | 2016-03-16 | 2019-01-04 | 海克斯康测量技术有限公司 | 具有防撞保护的探针和探针夹 |
CN106066169B (zh) * | 2016-06-14 | 2019-01-11 | 中南大学 | 一种铜电解阴极板垂直度的检测方法、装置及系统 |
JP2018124167A (ja) | 2017-01-31 | 2018-08-09 | オムロン株式会社 | 傾斜測定装置 |
CN106871773B (zh) * | 2017-02-14 | 2019-07-09 | 肇庆市嘉仪仪器有限公司 | 一种在线非接触测厚设备及其测量方法 |
JP6852455B2 (ja) * | 2017-02-23 | 2021-03-31 | オムロン株式会社 | 光学計測装置 |
FI20185410A1 (fi) | 2018-05-03 | 2019-11-04 | Valmet Automation Oy | Liikkuvan rainan kimmokertoimen mittaaminen |
JP7062518B2 (ja) * | 2018-05-25 | 2022-05-06 | 株式会社キーエンス | 共焦点変位計 |
CN109001221A (zh) * | 2018-07-12 | 2018-12-14 | 钱晓斌 | 一种成品纸张检品机 |
CN108955549A (zh) * | 2018-09-11 | 2018-12-07 | 深圳立仪科技有限公司 | 一种透光材料双面测厚装置 |
EP3718939B1 (en) * | 2019-04-03 | 2023-01-04 | Fitesa Nãotecidos S.A. | Device and method for detecting the presence of abnormalities in a reel |
CN110425973A (zh) | 2019-08-29 | 2019-11-08 | 威海华菱光电股份有限公司 | 厚度检测装置、方法、系统、存储介质和处理器 |
SE543802C2 (en) * | 2019-12-20 | 2021-07-27 | Stora Enso Oyj | Method for determining film thickness, method for producing a film and device for producing a film |
SE543843C2 (en) * | 2019-12-20 | 2021-08-10 | Stora Enso Oyj | Method for identifying defects in a film, method and device for producing a film |
US11740356B2 (en) | 2020-06-05 | 2023-08-29 | Honeywell International Inc. | Dual-optical displacement sensor alignment using knife edges |
CN114894106B (zh) * | 2022-05-18 | 2023-07-21 | 天津大学 | 一种不透明样品厚度测量系统及方法 |
US20240090110A1 (en) * | 2022-09-14 | 2024-03-14 | Kla Corporation | Confocal Chromatic Metrology for EUV Source Condition Monitoring |
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US5479720A (en) * | 1994-01-21 | 1996-01-02 | Abb Industrial Systems, Inc. | Methods and apparatus for measuring web thickness and other characteristics of a moving web |
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DE102006026775B4 (de) * | 2006-06-07 | 2008-04-30 | Stiftung Für Lasertechnologien In Der Medizin Und Messtechnik An Der Universität Ulm | Verfahren und Vorrichtung zur Charakterisierung bewegter Oberflächen |
US8282781B2 (en) * | 2006-12-11 | 2012-10-09 | Honeywell International Inc. | Apparatus and method for stabilization of a moving sheet relative to a sensor |
US20080158572A1 (en) * | 2006-12-27 | 2008-07-03 | Honeywell, Inc. | System and method for measurement of thickness of thin films |
CA2884632C (en) * | 2007-08-31 | 2016-10-25 | Abb Ltd. | Web thickness measurement device |
JP4265814B1 (ja) | 2008-06-30 | 2009-05-20 | 任天堂株式会社 | 姿勢算出装置、姿勢算出プログラム、ゲーム装置、およびゲームプログラム |
-
2008
- 2008-08-25 CA CA2884632A patent/CA2884632C/en active Active
- 2008-08-25 FI FI20155193A patent/FI127623B/fi active IP Right Grant
- 2008-08-25 WO PCT/US2008/010064 patent/WO2009032094A1/en active Application Filing
- 2008-08-25 CA CA2697543A patent/CA2697543C/en active Active
- 2008-08-25 DE DE112008002244T patent/DE112008002244B4/de active Active
- 2008-08-25 CN CN200880108430.8A patent/CN101868689B/zh active Active
- 2008-08-28 US US12/200,258 patent/US7889342B2/en active Active
- 2008-08-28 US US12/200,196 patent/US20090059244A1/en not_active Abandoned
- 2008-08-28 US US12/200,302 patent/US7847943B2/en active Active
-
2010
- 2010-03-25 FI FI20105304A patent/FI123478B/fi active IP Right Grant
-
2013
- 2013-01-09 FI FI20135026A patent/FI127396B/fi active IP Right Grant
- 2013-01-09 FI FI20135027A patent/FI125343B/fi active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
WO2009032094A1 (en) | 2009-03-12 |
CA2697543C (en) | 2016-01-26 |
CA2884632C (en) | 2016-10-25 |
FI123478B (fi) | 2013-05-31 |
DE112008002244B4 (de) | 2013-07-25 |
US20090056156A1 (en) | 2009-03-05 |
CN101868689B (zh) | 2016-11-02 |
FI20105304A (fi) | 2010-03-25 |
FI127396B (fi) | 2018-05-15 |
US20090059244A1 (en) | 2009-03-05 |
FI20155193A (fi) | 2015-03-20 |
US20090059232A1 (en) | 2009-03-05 |
CN101868689A (zh) | 2010-10-20 |
US7847943B2 (en) | 2010-12-07 |
CA2884632A1 (en) | 2009-03-12 |
FI127623B (fi) | 2018-10-31 |
FI20135026A (fi) | 2013-01-09 |
FI125343B (fi) | 2015-08-31 |
CA2697543A1 (en) | 2009-03-12 |
DE112008002244T5 (de) | 2010-07-22 |
US7889342B2 (en) | 2011-02-15 |
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