FI120804B - Röntgenkuvauslaitteisto - Google Patents
Röntgenkuvauslaitteisto Download PDFInfo
- Publication number
- FI120804B FI120804B FI974420A FI974420A FI120804B FI 120804 B FI120804 B FI 120804B FI 974420 A FI974420 A FI 974420A FI 974420 A FI974420 A FI 974420A FI 120804 B FI120804 B FI 120804B
- Authority
- FI
- Finland
- Prior art keywords
- ray
- control
- ray tube
- imaging
- image
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title claims description 130
- 230000035945 sensitivity Effects 0.000 claims description 61
- 230000001105 regulatory effect Effects 0.000 claims description 16
- 230000001276 controlling effect Effects 0.000 claims description 13
- 230000005855 radiation Effects 0.000 claims 4
- 210000000582 semen Anatomy 0.000 claims 2
- 239000004094 surface-active agent Substances 0.000 claims 2
- 239000003292 glue Substances 0.000 claims 1
- 210000003899 penis Anatomy 0.000 claims 1
- 238000002591 computed tomography Methods 0.000 description 29
- 238000000034 method Methods 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 230000007423 decrease Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 210000001847 jaw Anatomy 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 7
- 238000005070 sampling Methods 0.000 description 7
- 238000013170 computed tomography imaging Methods 0.000 description 6
- 230000010354 integration Effects 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 210000002455 dental arch Anatomy 0.000 description 2
- 239000007943 implant Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 210000003800 pharynx Anatomy 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000001356 surgical procedure Methods 0.000 description 2
- 229910000497 Amalgam Inorganic materials 0.000 description 1
- 230000027311 M phase Effects 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- -1 crown Substances 0.000 description 1
- 210000004513 dentition Anatomy 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000003702 image correction Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 150000002736 metal compounds Chemical class 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000002601 radiography Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- 230000036346 tooth eruption Effects 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- A61B6/51—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/30—Controlling
- H05G1/38—Exposure time
- H05G1/42—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube
- H05G1/44—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube in which the switching instant is determined by measuring the amount of radiation directly
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/64—Circuit arrangements for X-ray apparatus incorporating image intensifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33006596 | 1996-12-10 | ||
JP33006596 | 1996-12-10 | ||
JP24284797A JP3869083B2 (ja) | 1996-12-10 | 1997-09-08 | X線撮影装置 |
JP24284797 | 1997-09-08 |
Publications (3)
Publication Number | Publication Date |
---|---|
FI974420A0 FI974420A0 (fi) | 1997-12-05 |
FI974420A FI974420A (fi) | 1998-06-11 |
FI120804B true FI120804B (fi) | 2010-03-15 |
Family
ID=26535946
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI974420A FI120804B (fi) | 1996-12-10 | 1997-12-05 | Röntgenkuvauslaitteisto |
Country Status (4)
Country | Link |
---|---|
US (1) | US6018563A (de) |
JP (1) | JP3869083B2 (de) |
DE (1) | DE19754463B4 (de) |
FI (1) | FI120804B (de) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI104944B (fi) * | 1998-06-26 | 2000-05-15 | Planmeca Oy | Menetelmät, laitteet ja kuvausmoodi tomografiakuvantamisessa |
JP3919048B2 (ja) * | 1998-09-02 | 2007-05-23 | 株式会社モリタ製作所 | 局所照射x線ct撮影装置 |
JP4015366B2 (ja) * | 1999-03-25 | 2007-11-28 | 学校法人日本大学 | 局所照射x線ct撮影方法及び装置 |
DE19933776C2 (de) * | 1999-07-19 | 2001-11-22 | Sirona Dental Systems Gmbh | Verfahren zur Kompensation der Spannungserhöhung bei dentalen Röntgenschichtaufnahmen oder Ceph-Aufnahmen und Verfahren zur Bildverarbeitung dieser Aufnahmen |
CA2388256A1 (en) | 1999-10-08 | 2001-04-19 | Dentsply International Inc. | Automatic exposure control for dental panoramic and cephalographic x-ray equipment |
AU782164B2 (en) | 2000-02-02 | 2005-07-07 | Gendex Corporation | Automatic x-ray detection for intra-oral dental x-ray imaging apparatus |
DE60041249D1 (de) * | 2000-06-02 | 2009-02-12 | Palodex Group Oy | Bestimmung und Einstellung von den Belichtungswerten für Röntgenstrahlung-Bilderzeugung |
JP4594572B2 (ja) * | 2000-11-24 | 2010-12-08 | 朝日レントゲン工業株式会社 | パノラマx線ct撮影装置 |
FI117818B (fi) * | 2001-08-03 | 2007-03-15 | Palodex Group Oy | Säteilytyksen säätö röntgenkuvauslaitteessa, jota käytetään intraoraalisovellutukseen |
JP2003284707A (ja) * | 2002-03-27 | 2003-10-07 | Canon Inc | 撮影装置、ゲイン補正方法、記録媒体及びプログラム |
JP3864106B2 (ja) * | 2002-03-27 | 2006-12-27 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | 透過x線データ獲得装置およびx線断層像撮影装置 |
JP3785576B2 (ja) * | 2002-04-24 | 2006-06-14 | 株式会社モリタ製作所 | 被写体ブレ補正手段、これを用いた医療用x線撮影装置 |
US7086859B2 (en) * | 2003-06-10 | 2006-08-08 | Gendex Corporation | Compact digital intraoral camera system |
US7099428B2 (en) * | 2002-06-25 | 2006-08-29 | The Regents Of The University Of Michigan | High spatial resolution X-ray computed tomography (CT) system |
CA2491759A1 (en) | 2002-07-25 | 2004-02-19 | Gendex Corporation | Real-time digital x-ray imaging apparatus and method |
JP2004136027A (ja) * | 2002-10-21 | 2004-05-13 | Univ Nihon | 画像処理装置 |
JP3947847B2 (ja) * | 2003-05-26 | 2007-07-25 | セイコーエプソン株式会社 | 撮像装置及びその駆動方法 |
WO2005070296A1 (ja) | 2004-01-22 | 2005-08-04 | Canon Kabushiki Kaisha | X線撮影装置及びx線撮影方法 |
JP4799000B2 (ja) * | 2004-01-22 | 2011-10-19 | キヤノン株式会社 | X線撮影装置及びx線撮影方法 |
DE112006002694B4 (de) | 2005-10-17 | 2023-02-23 | J. Morita Mfg. Corp. | Medizinisches, digitales Röntgenbildgerät und medizinischer und digitaler Röntgenstrahlungssensor |
KR100888888B1 (ko) | 2006-08-02 | 2009-03-17 | (주)이우테크놀로지 | 두부계측 촬영방법 |
EP2123223B1 (de) * | 2008-05-19 | 2017-07-05 | Cefla S.C. | Verfahren und Vorrichtung zur vereinfachten Patientenpositionierung für dentale tomografische Röntgenbildgebung |
JP5569951B2 (ja) | 2008-09-01 | 2014-08-13 | 学校法人日本大学 | 頭部用x線ct撮影装置及びその撮影制御方法 |
US8693613B2 (en) * | 2010-01-14 | 2014-04-08 | General Electric Company | Nuclear fuel pellet inspection |
KR101819257B1 (ko) * | 2010-07-13 | 2018-01-16 | 다카라 텔레시스템즈 가부시키가이샤 | X선 단층상 촬영 장치 |
CN103648386B (zh) * | 2011-07-04 | 2017-08-29 | 皇家飞利浦有限公司 | 在x射线成像设备中调整扫描运动 |
ES2935893T3 (es) * | 2012-09-07 | 2023-03-13 | Trophy | Aparato para la obtención parcial de imágenes por TC |
JP6636923B2 (ja) * | 2013-08-20 | 2020-01-29 | バテック カンパニー リミテッド | X線画像装置 |
WO2018086048A1 (zh) * | 2016-11-11 | 2018-05-17 | 江苏美伦影像系统有限公司 | 一种可移动的口腔ct机 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2518549A1 (de) * | 1975-04-25 | 1977-03-17 | Siemens Ag | Zahnaerztliche roentgendiagnostikeinrichtung |
DE3143160A1 (de) * | 1981-10-30 | 1983-05-11 | Siemens AG, 1000 Berlin und 8000 München | "zahnaerztliche roentgendiagnostikeinrichtung" |
DE3702914A1 (de) * | 1986-02-11 | 1987-08-13 | Radiante Oy | Verfahren zur herstellung von roentgenaufnahmen |
US4910592A (en) * | 1988-01-13 | 1990-03-20 | Picker International, Inc. | Radiation imaging automatic gain control |
US5003572A (en) * | 1990-04-06 | 1991-03-26 | General Electric Company | Automatic brightness compensation for x-ray imaging systems |
JPH04206397A (ja) * | 1990-11-30 | 1992-07-28 | Toshiba Corp | X線診断装置 |
JP2979520B2 (ja) * | 1992-05-31 | 1999-11-15 | 株式会社島津製作所 | X線診断装置 |
EP0629105B1 (de) * | 1993-05-21 | 1999-08-04 | Koninklijke Philips Electronics N.V. | Röntgenuntersuchungsgerät und Detektionssystem für ein sichtbares Bild für ein Röntgenuntersuchungsgerät |
BE1007674A3 (nl) * | 1993-10-28 | 1995-09-12 | Philips Electronics Nv | Röntgenonderzoekapparaat. |
DE4343072C1 (de) * | 1993-12-16 | 1995-06-29 | Siemens Ag | Röntgendiagnostikeinrichtung |
JPH08213189A (ja) * | 1995-01-31 | 1996-08-20 | Shimadzu Corp | X線撮影装置 |
JP3368136B2 (ja) * | 1995-03-10 | 2003-01-20 | 株式会社モリタ製作所 | デジタルパノラマx線撮影装置 |
JP3319905B2 (ja) * | 1995-03-24 | 2002-09-03 | 株式会社モリタ製作所 | デジタルx線撮影装置 |
US5617462A (en) * | 1995-08-07 | 1997-04-01 | Oec Medical Systems, Inc. | Automatic X-ray exposure control system and method of use |
EP0796549B1 (de) * | 1995-10-10 | 2004-01-07 | Koninklijke Philips Electronics N.V. | Röntgenuntersuchungsvorrichtung mit dosierungskontrolle |
US5675624A (en) * | 1995-12-14 | 1997-10-07 | General Electric Company | Adaptive x-ray brightness and display control for a medical imaging system |
-
1997
- 1997-09-08 JP JP24284797A patent/JP3869083B2/ja not_active Expired - Lifetime
- 1997-12-05 FI FI974420A patent/FI120804B/fi not_active IP Right Cessation
- 1997-12-08 DE DE19754463A patent/DE19754463B4/de not_active Expired - Fee Related
- 1997-12-08 US US08/986,945 patent/US6018563A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6018563A (en) | 2000-01-25 |
FI974420A (fi) | 1998-06-11 |
FI974420A0 (fi) | 1997-12-05 |
DE19754463B4 (de) | 2006-07-06 |
JP3869083B2 (ja) | 2007-01-17 |
DE19754463A1 (de) | 1998-06-18 |
JPH10225454A (ja) | 1998-08-25 |
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