ES2395697T8 - Celda de memoria y procedimiento de formación de una unión de túnel magnético (MTJ) de una celda de memoria - Google Patents

Celda de memoria y procedimiento de formación de una unión de túnel magnético (MTJ) de una celda de memoria Download PDF

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Publication number
ES2395697T8
ES2395697T8 ES09700850.2T ES09700850T ES2395697T8 ES 2395697 T8 ES2395697 T8 ES 2395697T8 ES 09700850 T ES09700850 T ES 09700850T ES 2395697 T8 ES2395697 T8 ES 2395697T8
Authority
ES
Spain
Prior art keywords
memory cell
mtj
procedure
forming
tunnel junction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES09700850.2T
Other languages
English (en)
Other versions
ES2395697T3 (es
Inventor
Shiqun Gu
Seung H. Kang
Matthew M. Nowak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qualcomm Inc
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of ES2395697T3 publication Critical patent/ES2395697T3/es
Publication of ES2395697T8 publication Critical patent/ES2395697T8/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
    • H10B61/20—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
    • H10B61/22—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors of the field-effect transistor [FET] type
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/01—Manufacture or treatment
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/933—Spintronics or quantum computing
    • Y10S977/935—Spin dependent tunnel, SDT, junction, e.g. tunneling magnetoresistance, TMR

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)
  • Semiconductor Memories (AREA)
ES09700850T 2008-01-08 2009-01-08 Celda de memoria y procedimiento de formación de una unión de túnel magnético (MTJ) de una celda de memoria Active ES2395697T3 (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US970557 2008-01-08
US11/970,557 US7919794B2 (en) 2008-01-08 2008-01-08 Memory cell and method of forming a magnetic tunnel junction (MTJ) of a memory cell
PCT/US2009/030451 WO2009089360A1 (en) 2008-01-08 2009-01-08 Memory cell and method of forming a magnetic tunnel junction (mtj) of a memory cell

Publications (2)

Publication Number Publication Date
ES2395697T3 ES2395697T3 (es) 2013-02-14
ES2395697T8 true ES2395697T8 (es) 2014-11-17

Family

ID=40580629

Family Applications (1)

Application Number Title Priority Date Filing Date
ES09700850T Active ES2395697T3 (es) 2008-01-08 2009-01-08 Celda de memoria y procedimiento de formación de una unión de túnel magnético (MTJ) de una celda de memoria

Country Status (10)

Country Link
US (1) US7919794B2 (es)
EP (1) EP2240969B1 (es)
JP (2) JP5642557B2 (es)
KR (1) KR101148395B1 (es)
CN (1) CN101911326B (es)
BR (1) BRPI0907208B1 (es)
CA (1) CA2711305C (es)
ES (1) ES2395697T3 (es)
RU (1) RU2469441C2 (es)
WO (1) WO2009089360A1 (es)

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US9385308B2 (en) * 2010-03-26 2016-07-05 Qualcomm Incorporated Perpendicular magnetic tunnel junction structure
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US9082956B2 (en) 2011-04-04 2015-07-14 Micron Technology, Inc. Confined cell structures and methods of forming confined cell structures
US9082695B2 (en) 2011-06-06 2015-07-14 Avalanche Technology, Inc. Vialess memory structure and method of manufacturing same
US8928100B2 (en) 2011-06-24 2015-01-06 International Business Machines Corporation Spin transfer torque cell for magnetic random access memory
US8709956B2 (en) 2011-08-01 2014-04-29 Avalanche Technology Inc. MRAM with sidewall protection and method of fabrication
US8796795B2 (en) 2011-08-01 2014-08-05 Avalanche Technology Inc. MRAM with sidewall protection and method of fabrication
US8536063B2 (en) 2011-08-30 2013-09-17 Avalanche Technology Inc. MRAM etching processes
TWI483248B (zh) * 2011-09-08 2015-05-01 Inotera Memories Inc 自旋轉移力矩隨機存取記憶體
CN103066199B (zh) * 2011-10-19 2016-03-30 中芯国际集成电路制造(北京)有限公司 一种新型的磁隧穿结器件及其制造方法
US9007818B2 (en) 2012-03-22 2015-04-14 Micron Technology, Inc. Memory cells, semiconductor device structures, systems including such cells, and methods of fabrication
US8574928B2 (en) 2012-04-10 2013-11-05 Avalanche Technology Inc. MRAM fabrication method with sidewall cleaning
US9054030B2 (en) 2012-06-19 2015-06-09 Micron Technology, Inc. Memory cells, semiconductor device structures, memory systems, and methods of fabrication
US8923038B2 (en) 2012-06-19 2014-12-30 Micron Technology, Inc. Memory cells, semiconductor device structures, memory systems, and methods of fabrication
US8883520B2 (en) 2012-06-22 2014-11-11 Avalanche Technology, Inc. Redeposition control in MRAM fabrication process
US9373775B2 (en) 2012-09-13 2016-06-21 Micron Technology, Inc. Methods of forming magnetic memory cells
US8767448B2 (en) * 2012-11-05 2014-07-01 International Business Machines Corporation Magnetoresistive random access memory
US9379315B2 (en) 2013-03-12 2016-06-28 Micron Technology, Inc. Memory cells, methods of fabrication, semiconductor device structures, and memory systems
KR102257931B1 (ko) 2013-03-15 2021-05-28 인텔 코포레이션 내장된 자기 터널 접합을 포함하는 로직 칩
US9240546B2 (en) * 2013-03-26 2016-01-19 Infineon Technologies Ag Magnetoresistive devices and methods for manufacturing magnetoresistive devices
US9368714B2 (en) 2013-07-01 2016-06-14 Micron Technology, Inc. Memory cells, methods of operation and fabrication, semiconductor device structures, and memory systems
US9466787B2 (en) 2013-07-23 2016-10-11 Micron Technology, Inc. Memory cells, methods of fabrication, semiconductor device structures, memory systems, and electronic systems
US9461242B2 (en) 2013-09-13 2016-10-04 Micron Technology, Inc. Magnetic memory cells, methods of fabrication, semiconductor devices, memory systems, and electronic systems
US9608197B2 (en) 2013-09-18 2017-03-28 Micron Technology, Inc. Memory cells, methods of fabrication, and semiconductor devices
US10454024B2 (en) 2014-02-28 2019-10-22 Micron Technology, Inc. Memory cells, methods of fabrication, and memory devices
US9281466B2 (en) 2014-04-09 2016-03-08 Micron Technology, Inc. Memory cells, semiconductor structures, semiconductor devices, and methods of fabrication
US9269888B2 (en) 2014-04-18 2016-02-23 Micron Technology, Inc. Memory cells, methods of fabrication, and semiconductor devices
US9349945B2 (en) 2014-10-16 2016-05-24 Micron Technology, Inc. Memory cells, semiconductor devices, and methods of fabrication
US9768377B2 (en) 2014-12-02 2017-09-19 Micron Technology, Inc. Magnetic cell structures, and methods of fabrication
US9853208B2 (en) 2014-12-30 2017-12-26 International Business Machines Corporation In-situ annealing to improve the tunneling magneto-resistance of magnetic tunnel junctions
US10439131B2 (en) 2015-01-15 2019-10-08 Micron Technology, Inc. Methods of forming semiconductor devices including tunnel barrier materials
US9324937B1 (en) 2015-03-24 2016-04-26 International Business Machines Corporation Thermally assisted MRAM including magnetic tunnel junction and vacuum cavity
KR102485297B1 (ko) 2015-12-11 2023-01-05 삼성전자주식회사 자기 저항 메모리 소자 및 그 제조 방법
US9972771B2 (en) * 2016-03-24 2018-05-15 Taiwan Semiconductor Manufacturing Co., Ltd. MRAM devices and methods of forming the same
CN106229004B (zh) * 2016-07-11 2018-08-28 北京航空航天大学 一种光写入的非易失性磁存储器
KR102631843B1 (ko) 2016-12-27 2024-02-01 인텔 코포레이션 다수의 유형의 임베디드 비휘발성 메모리 디바이스들을 갖는 모놀리식 집적회로
CN111742366B (zh) * 2018-06-14 2022-08-26 华为技术有限公司 存储器
CN109521996B (zh) * 2018-11-16 2021-08-24 武汉华芯纳磁科技有限公司 基于电子自旋的多态真随机数发生器
US11195993B2 (en) * 2019-09-16 2021-12-07 International Business Machines Corporation Encapsulation topography-assisted self-aligned MRAM top contact
US20220359611A1 (en) * 2021-05-06 2022-11-10 Qualcomm Incorporated One transistor one magnetic tunnel junction multiple bit magnetoresistive random access memory cell

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Also Published As

Publication number Publication date
RU2010133158A (ru) 2012-02-20
BRPI0907208B1 (pt) 2019-05-07
CN101911326A (zh) 2010-12-08
US20090174015A1 (en) 2009-07-09
KR20100096283A (ko) 2010-09-01
KR101148395B1 (ko) 2012-05-21
ES2395697T3 (es) 2013-02-14
JP5642557B2 (ja) 2014-12-17
JP2015029119A (ja) 2015-02-12
JP2011509532A (ja) 2011-03-24
EP2240969A1 (en) 2010-10-20
CA2711305A1 (en) 2009-07-16
CA2711305C (en) 2015-02-10
US7919794B2 (en) 2011-04-05
CN101911326B (zh) 2013-04-10
BRPI0907208A2 (pt) 2015-07-14
EP2240969B1 (en) 2012-10-17
WO2009089360A1 (en) 2009-07-16
RU2469441C2 (ru) 2012-12-10

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