EP1907791A4 - Vorrichtung und verfahren zur messung einer glasscheibe - Google Patents

Vorrichtung und verfahren zur messung einer glasscheibe

Info

Publication number
EP1907791A4
EP1907791A4 EP06787404A EP06787404A EP1907791A4 EP 1907791 A4 EP1907791 A4 EP 1907791A4 EP 06787404 A EP06787404 A EP 06787404A EP 06787404 A EP06787404 A EP 06787404A EP 1907791 A4 EP1907791 A4 EP 1907791A4
Authority
EP
European Patent Office
Prior art keywords
measuring
glass sheet
glass
sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP06787404A
Other languages
English (en)
French (fr)
Other versions
EP1907791A2 (de
Inventor
Jesse R Frederick
Jeffrey Clinton Mccreary
John C Morrison
Brian P Strines
James P Trice
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Corning Inc
Original Assignee
Corning Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Inc filed Critical Corning Inc
Publication of EP1907791A2 publication Critical patent/EP1907791A2/de
Publication of EP1907791A4 publication Critical patent/EP1907791A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C5/00—Measuring height; Measuring distances transverse to line of sight; Levelling between separated points; Surveyors' levels
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
    • F16C29/00—Bearings for parts moving only linearly
    • F16C29/04—Ball or roller bearings
    • F16C29/045—Ball or roller bearings having rolling elements journaled in one of the moving parts
    • F16C29/046—Ball or roller bearings having rolling elements journaled in one of the moving parts with balls journaled in pockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
EP06787404A 2005-07-27 2006-07-13 Vorrichtung und verfahren zur messung einer glasscheibe Withdrawn EP1907791A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US70332305P 2005-07-27 2005-07-27
PCT/US2006/027492 WO2007015772A2 (en) 2005-07-27 2006-07-13 Apparatus and method for measuring a glass sheet

Publications (2)

Publication Number Publication Date
EP1907791A2 EP1907791A2 (de) 2008-04-09
EP1907791A4 true EP1907791A4 (de) 2009-12-23

Family

ID=37709041

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06787404A Withdrawn EP1907791A4 (de) 2005-07-27 2006-07-13 Vorrichtung und verfahren zur messung einer glasscheibe

Country Status (6)

Country Link
EP (1) EP1907791A4 (de)
JP (3) JP5469340B2 (de)
KR (1) KR101294450B1 (de)
CN (1) CN101268356B (de)
TW (1) TWI300838B (de)
WO (1) WO2007015772A2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101268356B (zh) * 2005-07-27 2012-07-25 康宁股份有限公司 用来测量玻璃片的设备和方法
CN101910782B (zh) * 2007-11-30 2013-03-20 康宁股份有限公司 检测移动衬底的形状变化的方法和装置
CN102721356A (zh) * 2012-06-12 2012-10-10 无锡市麦希恩机械制造有限公司 汽车玻璃天窗检具结构
CN103418644B (zh) * 2013-09-02 2015-02-18 苏州赛斯德工程设备有限公司 一种具有辅助定位治具的折弯机
WO2015077113A1 (en) * 2013-11-25 2015-05-28 Corning Incorporated Methods for determining a shape of a substantially cylindrical specular reflective surface
CN103673915A (zh) * 2013-12-20 2014-03-26 苏州精创光学仪器有限公司 触摸屏保护玻璃翘曲度快速测量装置
CN104006769B (zh) * 2014-05-13 2017-01-18 苏州金牛精密机械有限公司 一种用于检测翘片管平面度的治具
CN104310032A (zh) * 2014-11-03 2015-01-28 苏州精创光学仪器有限公司 玻璃测量系统的输送装置
CN105783794B (zh) * 2016-03-22 2019-03-15 阳谷祥光铜业有限公司 一种平面检测方法及设备
CN105806247A (zh) * 2016-05-23 2016-07-27 南京林业大学 一种木质板材翘曲的在线检测装置和检测方法
CN109737881A (zh) * 2019-03-22 2019-05-10 李兆祥 一种齿轮监测设备
CN112595281B (zh) * 2020-12-31 2022-09-27 域鑫科技（惠州）有限公司 一种工件的面轮廓度快速测量方法及介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1277576A (en) * 1968-06-27 1972-06-14 Ernest James Price Conveyors or supports
JPH06331339A (ja) * 1993-05-21 1994-12-02 Hitachi Cable Ltd 薄板の変形測定方法及びその装置
US6567169B1 (en) * 1999-08-31 2003-05-20 Koninklijke Philips Electronics N.V. Method of and device for determining the warpage of a wafer
WO2007018902A1 (en) * 2005-07-27 2007-02-15 Corning Incorporated Process and apparatus for measuring the shape of an article

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60146807U (ja) * 1984-03-12 1985-09-30 河口湖精密株式会社 デジタルノギスの防塵構造
JPH057532Y2 (de) * 1986-07-07 1993-02-25
US5291269A (en) * 1991-12-06 1994-03-01 Hughes Aircraft Company Apparatus and method for performing thin film layer thickness metrology on a thin film layer having shape deformations and local slope variations
JP2991932B2 (ja) * 1994-07-12 1999-12-20 新日本製鐵株式会社 鋼板の平坦度測定方法
JPH08166226A (ja) * 1994-12-14 1996-06-25 Casio Comput Co Ltd 平面度測定装置およびそれを用いた平面度測定方法
JPH1070179A (ja) * 1996-08-28 1998-03-10 Canon Inc 基板保持装置およびこれを用いた露光装置
JPH11351857A (ja) * 1998-06-08 1999-12-24 Kuroda Precision Ind Ltd 薄板の表面形状測定方法および薄板の表面形状測定装置
JP2000065506A (ja) * 1998-08-24 2000-03-03 Ngk Insulators Ltd 厚さ測定用治具
US6608689B1 (en) * 1998-08-31 2003-08-19 Therma-Wave, Inc. Combination thin-film stress and thickness measurement device
JP2000314613A (ja) * 1999-05-06 2000-11-14 Kobe Steel Ltd 表面形状測定装置
JP4218916B2 (ja) * 1999-07-27 2009-02-04 フジノン株式会社 被測定体の支持装置の製造方法
JP2001332609A (ja) * 2000-03-13 2001-11-30 Nikon Corp 基板保持装置及び露光装置
JP2001330430A (ja) * 2000-05-22 2001-11-30 Daido Steel Co Ltd 平面度測定方法および平面度測定装置
US20020036774A1 (en) * 2000-08-08 2002-03-28 Emil Kamieniecki Apparatus and method for handling and testing of wafers
JP2004087593A (ja) * 2002-08-23 2004-03-18 Nikon Corp ステージ装置および露光装置
JP2004303923A (ja) * 2003-03-31 2004-10-28 Shimadzu Corp 基板アライメント機構、及びそれを用いた基板検査装置
US7131211B2 (en) * 2003-08-18 2006-11-07 Micron Technology, Inc. Method and apparatus for measurement of thickness and warpage of substrates
CN101268356B (zh) * 2005-07-27 2012-07-25 康宁股份有限公司 用来测量玻璃片的设备和方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1277576A (en) * 1968-06-27 1972-06-14 Ernest James Price Conveyors or supports
JPH06331339A (ja) * 1993-05-21 1994-12-02 Hitachi Cable Ltd 薄板の変形測定方法及びその装置
US6567169B1 (en) * 1999-08-31 2003-05-20 Koninklijke Philips Electronics N.V. Method of and device for determining the warpage of a wafer
WO2007018902A1 (en) * 2005-07-27 2007-02-15 Corning Incorporated Process and apparatus for measuring the shape of an article

Also Published As

Publication number Publication date
WO2007015772A3 (en) 2007-04-12
JP2015062023A (ja) 2015-04-02
EP1907791A2 (de) 2008-04-09
JP5469340B2 (ja) 2014-04-16
TWI300838B (en) 2008-09-11
CN101268356A (zh) 2008-09-17
WO2007015772A2 (en) 2007-02-08
JP6169063B2 (ja) 2017-07-26
CN101268356B (zh) 2012-07-25
JP2014066721A (ja) 2014-04-17
KR101294450B1 (ko) 2013-08-07
JP2009503504A (ja) 2009-01-29
TW200722705A (en) 2007-06-16
KR20080036118A (ko) 2008-04-24
JP5676726B2 (ja) 2015-02-25

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