EP1717336A1 - Cible de pulverisation cathodique, moyen d'enregistrement d'information optique et processus de fabrication de semblable - Google Patents

Cible de pulverisation cathodique, moyen d'enregistrement d'information optique et processus de fabrication de semblable Download PDF

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Publication number
EP1717336A1
EP1717336A1 EP04771017A EP04771017A EP1717336A1 EP 1717336 A1 EP1717336 A1 EP 1717336A1 EP 04771017 A EP04771017 A EP 04771017A EP 04771017 A EP04771017 A EP 04771017A EP 1717336 A1 EP1717336 A1 EP 1717336A1
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Prior art keywords
sputtering target
recording medium
optical information
information recording
sputtering
Prior art date
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EP04771017A
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German (de)
English (en)
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EP1717336B1 (fr
EP1717336A4 (fr
Inventor
Hideo c/o Nikko Materials Co. Ltd. TAKAMI
Masataka c/o Nikko Materials Co. Ltd. YAHAGI
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JX Nippon Mining and Metals Corp
Original Assignee
Nippon Mining and Metals Co Ltd
Nippon Mining Co Ltd
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Application filed by Nippon Mining and Metals Co Ltd, Nippon Mining Co Ltd filed Critical Nippon Mining and Metals Co Ltd
Priority to EP08104904A priority Critical patent/EP2022871B1/fr
Priority to EP08104906.6A priority patent/EP1985725B1/fr
Priority to EP08104905A priority patent/EP2028287B1/fr
Publication of EP1717336A1 publication Critical patent/EP1717336A1/fr
Publication of EP1717336A4 publication Critical patent/EP1717336A4/fr
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/01Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
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    • C04B35/01Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
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    • C04B35/01Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
    • C04B35/453Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
    • C04B35/457Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates based on tin oxides or stannates
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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • C23C14/086Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/242Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
    • G11B7/243Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
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    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/253Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates
    • G11B7/2531Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates comprising glass
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
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    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/257Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/258Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of reflective layers
    • G11B7/259Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of reflective layers based on silver
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26Apparatus or processes specially adapted for the manufacture of record carriers
    • G11B7/266Sputtering or spin-coating layers
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    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3284Zinc oxides, zincates, cadmium oxides, cadmiates, mercury oxides, mercurates or oxide forming salts thereof
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    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3286Gallium oxides, gallates, indium oxides, indates, thallium oxides, thallates or oxide forming salts thereof, e.g. zinc gallate
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    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3293Tin oxides, stannates or oxide forming salts thereof, e.g. indium tin oxide [ITO]
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    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/34Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3409Boron oxide, borates, boric acids, or oxide forming salts thereof, e.g. borax
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    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/34Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3418Silicon oxide, silicic acids or oxide forming salts thereof, e.g. silica sol, fused silica, silica fume, cristobalite, quartz or flint
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/257Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers
    • G11B2007/25705Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials
    • G11B2007/25706Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials containing transition metal elements (Zn, Fe, Co, Ni, Pt)
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/257Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers
    • G11B2007/25705Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials
    • G11B2007/25708Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials containing group 13 elements (B, Al, Ga)

Definitions

  • the present invention relates to a thin film for an optical information recording medium (especially used as a protective film) that has stable film amorphous nature, realizes high deposition speed, is superior in adhesiveness and mechanical properties with the recording layer, has a high transmission factor, and is composed with a non-sulfide system, whereby the deterioration of the adjacent reflective layer and recording layer can be suppressed.
  • the present invention also relates to a manufacturing method of such a thin film, and a sputtering target for use therein.
  • ZnS-SiO 2 generally and primarily used as a protective layer of a phase change optical information recording medium has superior characteristics such as in optical characteristics, heat characteristics, and adhesiveness with the recording layer, and is being widely used.
  • this kind of reflective layer is also disposed to come in contact with the protective layer material of ZnS-SiO 2 .
  • the pure Ag or Ag alloy reflective layer material is subject to corrosive degradation, and would cause the characteristic degradation in the reflection ratio of the optical information recording medium.
  • a ceramic target of ZnS-SiO 2 or the like has high bulk electric resistance, it is not possible to perform deposition with a DC sputtering device, and a radio frequency sputtering (RF) device is generally used.
  • RF radio frequency sputtering
  • Patent Document 1 has a problem in that it contains areas where the optical characteristics and amorphous nature are inferior, and Patent Document 2 has a problem in that it contains areas where sufficient deposition speed cannot be obtained, and where the amorphous nature is inferior.
  • Patent Document 2 Japanese Patent Laid-Open Publication No. 2000-256061
  • An object of the present invention is to provide a thin film for an optical information recording medium (especially used as a protective film) that has stable film amorphous nature, realizes high deposition speed, is superior in adhesiveness and mechanical properties with the recording layer, has a high transmission factor, and is composed with a non-sulfide system, whereby the deterioration of the adjacent reflective layer and recording layer can be suppressed.
  • the present invention also provides a manufacturing method of such a thin film, and a sputtering target for use therein. As a result, the present invention is able to improve the performance of the optical information recording medium, and to considerably improve the productivity thereof.
  • the present inventors discovered that, by substituting the conventional protective layer material ZnS-SiO 2 with an oxide material presented below that does not contain sulfides, it is possible to ensure optical characteristics and amorphous stability that are equivalent to ZnS-SiO 2 , and it is further possible to realize high-speed deposition while improving the characteristics of the optical information recording medium and improving the productivity.
  • the present invention also provides 6) the sputtering target according to any one of 1) to 5) above, wherein the relative density is 90% or higher, 7) an optical information recording medium, wherein the sputtering target according to any one of 1) to 6) above is used at least as a thin film in forming a part of an optical information recording medium structure, and a manufacturing method thereof, and 8) an optical information recording medium, wherein the sputtering target according to any one of 1) to 7) above is used at least as a thin film in forming a part of an optical information recording medium structure and disposed adjacent to a recording layer or a reflective layer, and a manufacturing method thereof.
  • the protective layer material ZnS-SiO 2 with an oxide material that does not contain sulfides, it is possible to provide to a thin film for an optical information recording medium (especially used as a protective film) that has superior characteristics such as having stable film amorphous nature, realizing high deposition speed, being superior in adhesiveness and mechanical properties with the recording layer, and having a high transmission factor, whereby the deterioration of the adjacent reflective layer and recording layer caused by sulfur can be suppressed, as well as a manufacturing method of such a thin film, and a sputtering target for use therein.
  • the sputtering target of the present invention is formed from a material obtained by adding any one or both of SiO 2 and B 2 O 3 oxides to an ln 2 O 3 -ZnO-SnO 2 system compound oxide having SnO 2 as its primary component.
  • this material has stable optical characteristics and amorphous nature of the film, is suitable as a protective layer material of a phase change optical recording medium, and the sputtering deposition speed via radio frequency sputtering is also high.
  • the amorphous stability and optical characteristics reffractive index and transmission factor
  • the sputtering target of the present invention is able to achieve a relative density of 90% or higher.
  • the improvement in density yields an effect of improving the uniformity of the sputtered film and inhibiting the generation of particles during sputtering.
  • the sputtering target described above can be used to form a thin film in a part of an optical information recording medium structure to provide an optical information recording medium. Further, the foregoing sputtering target can be used to form a thin film in a part of an optical information recording medium structure, and the thin film is disposed adjacent to a recording layer or a reflective layer.
  • the thin film formed using the sputtering target of the present invention forms a part of the optical information recording medium structure and is disposed adjacent to the recording layer or reflective layer, but as described above, ZnS is not used, there is no contamination by S, there is no diffusion of the sulfur constituent to the recording layer material disposed between the protective layers, and there is a significant effect in that the deterioration of the recording layer can be prevented thereby.
  • the sputtering target of the present invention can be manufactured by subjecting the oxide powder of the respective constituent elements, in which the average grain size is 5 ⁇ m or less, to pressureless sintering or high temperature pressure sintering. It is thereby possible to obtain a sputtering target having a relative density of 90% or higher. In such a case, it is desirable to calcinate the oxide powder having tin oxide as its primary component at a temperature of 800 to 1300°C before sintering. After this calcination, the resultant powder is pulverized to 3 ⁇ m or less and used as the raw material for sintering.
  • the sputtering target of the present invention a significant effect is yielded in that it is possible to improve the productivity, obtain a high-quality material, and stably manufacture an optical recording medium having an optical disk protective film at low costs.
  • Improvement in the density of the sputtering target of the present invention reduces holes and miniaturizes crystal grains, and enables the sputtered face of the target to become uniform and smooth. As a result, a significant result is yielded in that particles and nodules generated during sputtering can be reduced, the target life can be extended, and the mass productivity can be improved with minimal variation in the quality.
  • the foregoing 6-inch ⁇ size target subject to finish processing was used to perform sputtering.
  • the sputtering conditions were RF sputtering, sputtering power of 1000W, and Ar gas pressure of 0.5Pa, and deposition was performed at a target film thickness of 1500 ⁇ .
  • the sputtering target of Examples 1 to 3 achieved a relative density of 90 to 99%, and stable RF sputtering could be performed.
  • the deposition speed achieved 1.5 to 3.2 ⁇ /sec, and showed extremely favorable sputtering performance.
  • the transmission factor of the sputtered film achieved 92 to 98% (633nm), the refractive index was 1.9 to 2.2, no specific crystal peak could be observed, and possessed a stable amorphous nature (1.0 to 1.2).
  • the targets of the Examples do not use ZnS, there is no characteristic degradation in the optical information recording medium caused by the diffusion or contamination of sulfur. Further, in comparison to the Comparative Examples described later, the transmission factor, refractive index, amorphous stability, target density, and deposition speed of the deposition sample all showed favorable numerical values.
  • Comparative Example 1 With respect to the components and compositions of the Comparative Examples that deviate from the composition ratio of the present invention; for instance regarding Comparative Example 1, although the deposition speed was fast since the Sn oxide content was high and the Si oxide content was low, the transmission factor was 84%, the refractive index was 2.3 and the amorphous nature was 3.4 and showed inferior results.
  • Comparative Example 4 in particular contained large amounts of ZnS, and resulted in a material with risk of being contamination with sulfur.
  • this calcinated powder was used to form a target as with Examples 1 to 3.
  • the constituent and composition ratio (In/(In + Zn + Sn + B), Zn/(In + Zn + Sn + B), Sn/(In + Zn + Sn + B), B/(In + Zn + Sn + B)) of this target are shown in Table 2.
  • the foregoing 6-inch ⁇ size target subject to finish processing was used to perform sputtering.
  • the sputtering conditions were RF sputtering, sputtering power of 1000W, and Ar gas pressure of 0.5Pa, and deposition was performed at a target film thickness of 1500 ⁇ .
  • the sputtering target of Examples 4 to 6 achieved a relative density of 90 to 95%, and stable RF sputtering could be performed.
  • the deposition speed achieved 0.8 to 1.9 ⁇ /sec, and showed favorable and stable sputtering performance.
  • the transmission factor of the sputtered film achieved 93 to 98% (633nm), the refractive index was 1.9 to 2.1, no specific crystal peak could be observed, and possessed a stable amorphous nature (1.0 to 1.2).
  • the targets of the Examples do not use ZnS, there is no characteristic degradation in the optical information recording medium caused by the diffusion or contamination of sulfur. Further, in comparison to the Comparative Examples described later, the transmission factor, refractive index, amorphous stability, target density, and deposition speed of the deposition sample all showed favorable numerical values.
  • the thin film formed by using a sputtering target of the present invention forms a part of the structure of the optical information recording medium and does not use ZnS, it yields a significant effect in that diffusion of the sulfur constituent to the recording layer material will not occur, and deterioration of the recording layer can be prevented thereby. Further, when using pure Ag or Ag alloy having high thermal conduction properties at a high reflection ratio as material of adjacent reflective layers, diffusion of the sulfur constituent to such reflective layers will not occur, and a superior effect is yielded in that the cause of the reflective layer being subject to corrosive degradation and causing characteristic degradation can be cleared out.
  • the target in addition to the amorphous nature becoming stabilized, the target will be provided with conductivity, and stable RF sputtering deposition will be enabled by making the relative density a high density of 90% or higher. Moreover, there is a significant effect in that the controllability of sputtering can be facilitated, the deposition speed can be increased, and the sputtering efficiency can also be improved. Further still, there is significant effect in that it is possible to reduce the particles (dust) or nodules arising during sputtering upon performing deposition, improve the mass productivity with little variation in quality, and stably manufacture an optical recording medium having an optical disk protective film at low costs.

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Structural Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Inorganic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Compositions Of Oxide Ceramics (AREA)
  • Optical Record Carriers And Manufacture Thereof (AREA)
EP04771017A 2004-02-17 2004-07-29 Cible de pulverisation cathodique Expired - Lifetime EP1717336B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP08104904A EP2022871B1 (fr) 2004-02-17 2004-07-29 Moyen d'enregistrement d'information optique et processus de fabrication de semblable
EP08104906.6A EP1985725B1 (fr) 2004-02-17 2004-07-29 Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication
EP08104905A EP2028287B1 (fr) 2004-02-17 2004-07-29 Cible de pulvérisation cathodique

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004039139 2004-02-17
PCT/JP2004/010804 WO2005078153A1 (fr) 2004-02-17 2004-07-29 Cible de pulverisation cathodique, moyen d'enregistrement d'information optique et processus de fabrication de semblable

Related Child Applications (6)

Application Number Title Priority Date Filing Date
EP08104905A Division EP2028287B1 (fr) 2004-02-17 2004-07-29 Cible de pulvérisation cathodique
EP08104905A Division-Into EP2028287B1 (fr) 2004-02-17 2004-07-29 Cible de pulvérisation cathodique
EP08104906.6A Division EP1985725B1 (fr) 2004-02-17 2004-07-29 Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication
EP08104906.6A Division-Into EP1985725B1 (fr) 2004-02-17 2004-07-29 Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication
EP08104904A Division EP2022871B1 (fr) 2004-02-17 2004-07-29 Moyen d'enregistrement d'information optique et processus de fabrication de semblable
EP08104904A Division-Into EP2022871B1 (fr) 2004-02-17 2004-07-29 Moyen d'enregistrement d'information optique et processus de fabrication de semblable

Publications (3)

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EP1717336A1 true EP1717336A1 (fr) 2006-11-02
EP1717336A4 EP1717336A4 (fr) 2008-02-27
EP1717336B1 EP1717336B1 (fr) 2012-09-26

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EP04771017A Expired - Lifetime EP1717336B1 (fr) 2004-02-17 2004-07-29 Cible de pulverisation cathodique
EP08104906.6A Expired - Lifetime EP1985725B1 (fr) 2004-02-17 2004-07-29 Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication
EP08104905A Expired - Lifetime EP2028287B1 (fr) 2004-02-17 2004-07-29 Cible de pulvérisation cathodique
EP08104904A Expired - Lifetime EP2022871B1 (fr) 2004-02-17 2004-07-29 Moyen d'enregistrement d'information optique et processus de fabrication de semblable

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EP08104906.6A Expired - Lifetime EP1985725B1 (fr) 2004-02-17 2004-07-29 Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication
EP08104905A Expired - Lifetime EP2028287B1 (fr) 2004-02-17 2004-07-29 Cible de pulvérisation cathodique
EP08104904A Expired - Lifetime EP2022871B1 (fr) 2004-02-17 2004-07-29 Moyen d'enregistrement d'information optique et processus de fabrication de semblable

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EP (4) EP1717336B1 (fr)
JP (1) JP4376868B2 (fr)
KR (1) KR100799074B1 (fr)
CN (1) CN100567558C (fr)
TW (1) TWI309679B (fr)
WO (1) WO2005078153A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2052871A1 (fr) * 2007-03-23 2009-04-29 Sony Corporation Support d'enregistrement optique et son procédé de fabrication
GB2482544A (en) * 2010-08-06 2012-02-08 Advanced Tech Materials Making high density indium tin oxide sputtering targets
US11443943B2 (en) 2012-11-14 2022-09-13 Idemitsu Kosam Co., Ltd. Sputtering target, oxide semiconductor thin film, and method for producing these

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4788463B2 (ja) * 2006-04-25 2011-10-05 住友金属鉱山株式会社 酸化物焼結体、透明酸化物膜、ガスバリア性透明樹脂基板、ガスバリア性透明導電性樹脂基板およびフレキシブル表示素子
JP2008097791A (ja) * 2006-09-11 2008-04-24 Ricoh Co Ltd 多層相変化型光記録媒体
JP5440388B2 (ja) * 2010-05-26 2014-03-12 三菱マテリアル株式会社 酸化物スパッタリングターゲットおよび光記録媒体用酸化物膜
CN103534382B (zh) 2011-05-10 2016-01-20 出光兴产株式会社 In2O3-SnO2-ZnO系溅射靶
CN102351528B (zh) * 2011-09-28 2013-07-10 华南理工大学 硼化镧掺杂的氧化物半导体材料及其应用
JP5965338B2 (ja) 2012-07-17 2016-08-03 出光興産株式会社 スパッタリングターゲット、酸化物半導体薄膜及びそれらの製造方法
JP6284710B2 (ja) 2012-10-18 2018-02-28 出光興産株式会社 スパッタリングターゲット、酸化物半導体薄膜及びそれらの製造方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1211679A1 (fr) * 1999-08-12 2002-06-05 Nikko Materials Company, Limited Film photoemetteur et cible de pulverisation pour former ce film photoemetteur
US20030148871A1 (en) * 1998-08-31 2003-08-07 Idemitsu Kosan Co., Ltd. Target for transparent electroconductive film, transparent electroconductive material, transparent electroconductive glass and transparent electroconductive film
US20040027982A1 (en) * 2002-08-08 2004-02-12 Akemi Hirotsune Information recording medium

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3636914B2 (ja) * 1998-02-16 2005-04-06 株式会社日鉱マテリアルズ 高抵抗透明導電膜及び高抵抗透明導電膜の製造方法並びに高抵抗透明導電膜形成用スパッタリングターゲット
JP2000195101A (ja) * 1998-12-28 2000-07-14 Japan Energy Corp 光ディスク保護膜及び同保護膜形成用スパッタリングタ―ゲット
JP4559553B2 (ja) * 1999-03-05 2010-10-06 出光興産株式会社 スパッタリング、エレクトロンビーム、イオンプレーティング用焼結体、透明導電ガラス及び透明導電フィルム
JP4560149B2 (ja) * 1999-03-05 2010-10-13 出光興産株式会社 透明導電材料、透明導電ガラス及び透明導電フィルム
JP4424889B2 (ja) * 2001-06-26 2010-03-03 三井金属鉱業株式会社 高抵抗透明導電膜用スパッタリングターゲット及び高抵抗透明導電膜の製造方法
JP4448648B2 (ja) * 2002-08-02 2010-04-14 出光興産株式会社 スパッタリングターゲット及び焼結体それらを利用して製造した導電膜。
US7635440B2 (en) * 2003-03-04 2009-12-22 Nippon Mining & Metals Co., Ltd. Sputtering target, thin film for optical information recording medium and process for producing the same
JP4793773B2 (ja) * 2003-03-04 2011-10-12 Jx日鉱日石金属株式会社 スパッタリングターゲットの製造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030148871A1 (en) * 1998-08-31 2003-08-07 Idemitsu Kosan Co., Ltd. Target for transparent electroconductive film, transparent electroconductive material, transparent electroconductive glass and transparent electroconductive film
EP1211679A1 (fr) * 1999-08-12 2002-06-05 Nikko Materials Company, Limited Film photoemetteur et cible de pulverisation pour former ce film photoemetteur
US20040027982A1 (en) * 2002-08-08 2004-02-12 Akemi Hirotsune Information recording medium

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2005078153A1 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2052871A1 (fr) * 2007-03-23 2009-04-29 Sony Corporation Support d'enregistrement optique et son procédé de fabrication
EP2052871A4 (fr) * 2007-03-23 2009-11-11 Sony Corp Support d'enregistrement optique et son procédé de fabrication
US8075975B2 (en) 2007-03-23 2011-12-13 Sony Corporation Optical recording medium and method for manufacturing the same
GB2482544A (en) * 2010-08-06 2012-02-08 Advanced Tech Materials Making high density indium tin oxide sputtering targets
US11443943B2 (en) 2012-11-14 2022-09-13 Idemitsu Kosam Co., Ltd. Sputtering target, oxide semiconductor thin film, and method for producing these

Also Published As

Publication number Publication date
EP1985725A2 (fr) 2008-10-29
TW200528568A (en) 2005-09-01
CN100567558C (zh) 2009-12-09
EP2022871A3 (fr) 2009-02-18
JP4376868B2 (ja) 2009-12-02
TWI309679B (en) 2009-05-11
EP2028287A1 (fr) 2009-02-25
EP2022871A2 (fr) 2009-02-11
KR20060110371A (ko) 2006-10-24
EP2028287B1 (fr) 2012-08-22
WO2005078153A1 (fr) 2005-08-25
CN1918319A (zh) 2007-02-21
KR100799074B1 (ko) 2008-01-29
EP1717336B1 (fr) 2012-09-26
EP2022871B1 (fr) 2012-08-22
EP1985725A3 (fr) 2012-03-21
EP1717336A4 (fr) 2008-02-27
JPWO2005078153A1 (ja) 2007-11-22
EP1985725B1 (fr) 2013-04-10

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