EP1717336A1 - Cible de pulverisation cathodique, moyen d'enregistrement d'information optique et processus de fabrication de semblable - Google Patents
Cible de pulverisation cathodique, moyen d'enregistrement d'information optique et processus de fabrication de semblable Download PDFInfo
- Publication number
- EP1717336A1 EP1717336A1 EP04771017A EP04771017A EP1717336A1 EP 1717336 A1 EP1717336 A1 EP 1717336A1 EP 04771017 A EP04771017 A EP 04771017A EP 04771017 A EP04771017 A EP 04771017A EP 1717336 A1 EP1717336 A1 EP 1717336A1
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- EP
- European Patent Office
- Prior art keywords
- sputtering target
- recording medium
- optical information
- information recording
- sputtering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005477 sputtering target Methods 0.000 title claims abstract description 44
- 230000003287 optical effect Effects 0.000 title claims abstract description 43
- 238000000034 method Methods 0.000 title 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 48
- XOLBLPGZBRYERU-UHFFFAOYSA-N SnO2 Inorganic materials O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims abstract description 43
- 239000000463 material Substances 0.000 claims abstract description 36
- 229910052681 coesite Inorganic materials 0.000 claims abstract description 29
- 229910052906 cristobalite Inorganic materials 0.000 claims abstract description 29
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 29
- 229910052682 stishovite Inorganic materials 0.000 claims abstract description 29
- 229910052905 tridymite Inorganic materials 0.000 claims abstract description 29
- 239000010409 thin film Substances 0.000 claims abstract description 18
- 238000004519 manufacturing process Methods 0.000 claims abstract description 10
- 150000001875 compounds Chemical class 0.000 claims abstract description 4
- 238000000151 deposition Methods 0.000 abstract description 36
- 230000008021 deposition Effects 0.000 abstract description 36
- 239000010408 film Substances 0.000 abstract description 20
- 230000005540 biological transmission Effects 0.000 abstract description 18
- 230000006866 deterioration Effects 0.000 abstract description 7
- 230000001681 protective effect Effects 0.000 abstract description 7
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 abstract description 3
- 239000010410 layer Substances 0.000 description 34
- 238000004544 sputter deposition Methods 0.000 description 28
- 230000000052 comparative effect Effects 0.000 description 22
- 239000000843 powder Substances 0.000 description 19
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 15
- 239000000470 constituent Substances 0.000 description 13
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 12
- 239000000203 mixture Substances 0.000 description 12
- 229910052717 sulfur Inorganic materials 0.000 description 12
- 239000011593 sulfur Substances 0.000 description 12
- 230000000694 effects Effects 0.000 description 11
- 239000011241 protective layer Substances 0.000 description 11
- 238000009792 diffusion process Methods 0.000 description 9
- 230000015556 catabolic process Effects 0.000 description 8
- 238000006731 degradation reaction Methods 0.000 description 8
- 239000000758 substrate Substances 0.000 description 7
- 238000001552 radio frequency sputter deposition Methods 0.000 description 5
- 229910001316 Ag alloy Inorganic materials 0.000 description 4
- 238000011109 contamination Methods 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000005245 sintering Methods 0.000 description 3
- 150000003568 thioethers Chemical class 0.000 description 3
- 239000007789 gas Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 238000001272 pressureless sintering Methods 0.000 description 2
- 241001025261 Neoraja caerulea Species 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 238000001354 calcination Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 230000002829 reductive effect Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/16—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on silicates other than clay
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- C—CHEMISTRY; METALLURGY
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- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
- C04B35/457—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates based on tin oxides or stannates
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/086—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
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- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
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- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/252—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
- G11B7/253—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates
- G11B7/2531—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates comprising glass
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- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
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- G11B7/257—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers
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- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/252—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
- G11B7/258—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of reflective layers
- G11B7/259—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of reflective layers based on silver
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- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
- G11B7/266—Sputtering or spin-coating layers
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3284—Zinc oxides, zincates, cadmium oxides, cadmiates, mercury oxides, mercurates or oxide forming salts thereof
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- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3286—Gallium oxides, gallates, indium oxides, indates, thallium oxides, thallates or oxide forming salts thereof, e.g. zinc gallate
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- C—CHEMISTRY; METALLURGY
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- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3293—Tin oxides, stannates or oxide forming salts thereof, e.g. indium tin oxide [ITO]
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/34—Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3409—Boron oxide, borates, boric acids, or oxide forming salts thereof, e.g. borax
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/34—Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3418—Silicon oxide, silicic acids or oxide forming salts thereof, e.g. silica sol, fused silica, silica fume, cristobalite, quartz or flint
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/252—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
- G11B7/257—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers
- G11B2007/25705—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials
- G11B2007/25706—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials containing transition metal elements (Zn, Fe, Co, Ni, Pt)
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/252—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
- G11B7/257—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers
- G11B2007/25705—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials
- G11B2007/25708—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials containing group 13 elements (B, Al, Ga)
Definitions
- the present invention relates to a thin film for an optical information recording medium (especially used as a protective film) that has stable film amorphous nature, realizes high deposition speed, is superior in adhesiveness and mechanical properties with the recording layer, has a high transmission factor, and is composed with a non-sulfide system, whereby the deterioration of the adjacent reflective layer and recording layer can be suppressed.
- the present invention also relates to a manufacturing method of such a thin film, and a sputtering target for use therein.
- ZnS-SiO 2 generally and primarily used as a protective layer of a phase change optical information recording medium has superior characteristics such as in optical characteristics, heat characteristics, and adhesiveness with the recording layer, and is being widely used.
- this kind of reflective layer is also disposed to come in contact with the protective layer material of ZnS-SiO 2 .
- the pure Ag or Ag alloy reflective layer material is subject to corrosive degradation, and would cause the characteristic degradation in the reflection ratio of the optical information recording medium.
- a ceramic target of ZnS-SiO 2 or the like has high bulk electric resistance, it is not possible to perform deposition with a DC sputtering device, and a radio frequency sputtering (RF) device is generally used.
- RF radio frequency sputtering
- Patent Document 1 has a problem in that it contains areas where the optical characteristics and amorphous nature are inferior, and Patent Document 2 has a problem in that it contains areas where sufficient deposition speed cannot be obtained, and where the amorphous nature is inferior.
- Patent Document 2 Japanese Patent Laid-Open Publication No. 2000-256061
- An object of the present invention is to provide a thin film for an optical information recording medium (especially used as a protective film) that has stable film amorphous nature, realizes high deposition speed, is superior in adhesiveness and mechanical properties with the recording layer, has a high transmission factor, and is composed with a non-sulfide system, whereby the deterioration of the adjacent reflective layer and recording layer can be suppressed.
- the present invention also provides a manufacturing method of such a thin film, and a sputtering target for use therein. As a result, the present invention is able to improve the performance of the optical information recording medium, and to considerably improve the productivity thereof.
- the present inventors discovered that, by substituting the conventional protective layer material ZnS-SiO 2 with an oxide material presented below that does not contain sulfides, it is possible to ensure optical characteristics and amorphous stability that are equivalent to ZnS-SiO 2 , and it is further possible to realize high-speed deposition while improving the characteristics of the optical information recording medium and improving the productivity.
- the present invention also provides 6) the sputtering target according to any one of 1) to 5) above, wherein the relative density is 90% or higher, 7) an optical information recording medium, wherein the sputtering target according to any one of 1) to 6) above is used at least as a thin film in forming a part of an optical information recording medium structure, and a manufacturing method thereof, and 8) an optical information recording medium, wherein the sputtering target according to any one of 1) to 7) above is used at least as a thin film in forming a part of an optical information recording medium structure and disposed adjacent to a recording layer or a reflective layer, and a manufacturing method thereof.
- the protective layer material ZnS-SiO 2 with an oxide material that does not contain sulfides, it is possible to provide to a thin film for an optical information recording medium (especially used as a protective film) that has superior characteristics such as having stable film amorphous nature, realizing high deposition speed, being superior in adhesiveness and mechanical properties with the recording layer, and having a high transmission factor, whereby the deterioration of the adjacent reflective layer and recording layer caused by sulfur can be suppressed, as well as a manufacturing method of such a thin film, and a sputtering target for use therein.
- the sputtering target of the present invention is formed from a material obtained by adding any one or both of SiO 2 and B 2 O 3 oxides to an ln 2 O 3 -ZnO-SnO 2 system compound oxide having SnO 2 as its primary component.
- this material has stable optical characteristics and amorphous nature of the film, is suitable as a protective layer material of a phase change optical recording medium, and the sputtering deposition speed via radio frequency sputtering is also high.
- the amorphous stability and optical characteristics reffractive index and transmission factor
- the sputtering target of the present invention is able to achieve a relative density of 90% or higher.
- the improvement in density yields an effect of improving the uniformity of the sputtered film and inhibiting the generation of particles during sputtering.
- the sputtering target described above can be used to form a thin film in a part of an optical information recording medium structure to provide an optical information recording medium. Further, the foregoing sputtering target can be used to form a thin film in a part of an optical information recording medium structure, and the thin film is disposed adjacent to a recording layer or a reflective layer.
- the thin film formed using the sputtering target of the present invention forms a part of the optical information recording medium structure and is disposed adjacent to the recording layer or reflective layer, but as described above, ZnS is not used, there is no contamination by S, there is no diffusion of the sulfur constituent to the recording layer material disposed between the protective layers, and there is a significant effect in that the deterioration of the recording layer can be prevented thereby.
- the sputtering target of the present invention can be manufactured by subjecting the oxide powder of the respective constituent elements, in which the average grain size is 5 ⁇ m or less, to pressureless sintering or high temperature pressure sintering. It is thereby possible to obtain a sputtering target having a relative density of 90% or higher. In such a case, it is desirable to calcinate the oxide powder having tin oxide as its primary component at a temperature of 800 to 1300°C before sintering. After this calcination, the resultant powder is pulverized to 3 ⁇ m or less and used as the raw material for sintering.
- the sputtering target of the present invention a significant effect is yielded in that it is possible to improve the productivity, obtain a high-quality material, and stably manufacture an optical recording medium having an optical disk protective film at low costs.
- Improvement in the density of the sputtering target of the present invention reduces holes and miniaturizes crystal grains, and enables the sputtered face of the target to become uniform and smooth. As a result, a significant result is yielded in that particles and nodules generated during sputtering can be reduced, the target life can be extended, and the mass productivity can be improved with minimal variation in the quality.
- the foregoing 6-inch ⁇ size target subject to finish processing was used to perform sputtering.
- the sputtering conditions were RF sputtering, sputtering power of 1000W, and Ar gas pressure of 0.5Pa, and deposition was performed at a target film thickness of 1500 ⁇ .
- the sputtering target of Examples 1 to 3 achieved a relative density of 90 to 99%, and stable RF sputtering could be performed.
- the deposition speed achieved 1.5 to 3.2 ⁇ /sec, and showed extremely favorable sputtering performance.
- the transmission factor of the sputtered film achieved 92 to 98% (633nm), the refractive index was 1.9 to 2.2, no specific crystal peak could be observed, and possessed a stable amorphous nature (1.0 to 1.2).
- the targets of the Examples do not use ZnS, there is no characteristic degradation in the optical information recording medium caused by the diffusion or contamination of sulfur. Further, in comparison to the Comparative Examples described later, the transmission factor, refractive index, amorphous stability, target density, and deposition speed of the deposition sample all showed favorable numerical values.
- Comparative Example 1 With respect to the components and compositions of the Comparative Examples that deviate from the composition ratio of the present invention; for instance regarding Comparative Example 1, although the deposition speed was fast since the Sn oxide content was high and the Si oxide content was low, the transmission factor was 84%, the refractive index was 2.3 and the amorphous nature was 3.4 and showed inferior results.
- Comparative Example 4 in particular contained large amounts of ZnS, and resulted in a material with risk of being contamination with sulfur.
- this calcinated powder was used to form a target as with Examples 1 to 3.
- the constituent and composition ratio (In/(In + Zn + Sn + B), Zn/(In + Zn + Sn + B), Sn/(In + Zn + Sn + B), B/(In + Zn + Sn + B)) of this target are shown in Table 2.
- the foregoing 6-inch ⁇ size target subject to finish processing was used to perform sputtering.
- the sputtering conditions were RF sputtering, sputtering power of 1000W, and Ar gas pressure of 0.5Pa, and deposition was performed at a target film thickness of 1500 ⁇ .
- the sputtering target of Examples 4 to 6 achieved a relative density of 90 to 95%, and stable RF sputtering could be performed.
- the deposition speed achieved 0.8 to 1.9 ⁇ /sec, and showed favorable and stable sputtering performance.
- the transmission factor of the sputtered film achieved 93 to 98% (633nm), the refractive index was 1.9 to 2.1, no specific crystal peak could be observed, and possessed a stable amorphous nature (1.0 to 1.2).
- the targets of the Examples do not use ZnS, there is no characteristic degradation in the optical information recording medium caused by the diffusion or contamination of sulfur. Further, in comparison to the Comparative Examples described later, the transmission factor, refractive index, amorphous stability, target density, and deposition speed of the deposition sample all showed favorable numerical values.
- the thin film formed by using a sputtering target of the present invention forms a part of the structure of the optical information recording medium and does not use ZnS, it yields a significant effect in that diffusion of the sulfur constituent to the recording layer material will not occur, and deterioration of the recording layer can be prevented thereby. Further, when using pure Ag or Ag alloy having high thermal conduction properties at a high reflection ratio as material of adjacent reflective layers, diffusion of the sulfur constituent to such reflective layers will not occur, and a superior effect is yielded in that the cause of the reflective layer being subject to corrosive degradation and causing characteristic degradation can be cleared out.
- the target in addition to the amorphous nature becoming stabilized, the target will be provided with conductivity, and stable RF sputtering deposition will be enabled by making the relative density a high density of 90% or higher. Moreover, there is a significant effect in that the controllability of sputtering can be facilitated, the deposition speed can be increased, and the sputtering efficiency can also be improved. Further still, there is significant effect in that it is possible to reduce the particles (dust) or nodules arising during sputtering upon performing deposition, improve the mass productivity with little variation in quality, and stably manufacture an optical recording medium having an optical disk protective film at low costs.
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Structural Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Optical Record Carriers And Manufacture Thereof (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP08104904A EP2022871B1 (fr) | 2004-02-17 | 2004-07-29 | Moyen d'enregistrement d'information optique et processus de fabrication de semblable |
EP08104906.6A EP1985725B1 (fr) | 2004-02-17 | 2004-07-29 | Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication |
EP08104905A EP2028287B1 (fr) | 2004-02-17 | 2004-07-29 | Cible de pulvérisation cathodique |
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JP2004039139 | 2004-02-17 | ||
PCT/JP2004/010804 WO2005078153A1 (fr) | 2004-02-17 | 2004-07-29 | Cible de pulverisation cathodique, moyen d'enregistrement d'information optique et processus de fabrication de semblable |
Related Child Applications (6)
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EP08104905A Division EP2028287B1 (fr) | 2004-02-17 | 2004-07-29 | Cible de pulvérisation cathodique |
EP08104905A Division-Into EP2028287B1 (fr) | 2004-02-17 | 2004-07-29 | Cible de pulvérisation cathodique |
EP08104906.6A Division EP1985725B1 (fr) | 2004-02-17 | 2004-07-29 | Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication |
EP08104906.6A Division-Into EP1985725B1 (fr) | 2004-02-17 | 2004-07-29 | Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication |
EP08104904A Division EP2022871B1 (fr) | 2004-02-17 | 2004-07-29 | Moyen d'enregistrement d'information optique et processus de fabrication de semblable |
EP08104904A Division-Into EP2022871B1 (fr) | 2004-02-17 | 2004-07-29 | Moyen d'enregistrement d'information optique et processus de fabrication de semblable |
Publications (3)
Publication Number | Publication Date |
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EP1717336A1 true EP1717336A1 (fr) | 2006-11-02 |
EP1717336A4 EP1717336A4 (fr) | 2008-02-27 |
EP1717336B1 EP1717336B1 (fr) | 2012-09-26 |
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ID=34857834
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
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EP04771017A Expired - Lifetime EP1717336B1 (fr) | 2004-02-17 | 2004-07-29 | Cible de pulverisation cathodique |
EP08104906.6A Expired - Lifetime EP1985725B1 (fr) | 2004-02-17 | 2004-07-29 | Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication |
EP08104905A Expired - Lifetime EP2028287B1 (fr) | 2004-02-17 | 2004-07-29 | Cible de pulvérisation cathodique |
EP08104904A Expired - Lifetime EP2022871B1 (fr) | 2004-02-17 | 2004-07-29 | Moyen d'enregistrement d'information optique et processus de fabrication de semblable |
Family Applications After (3)
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EP08104906.6A Expired - Lifetime EP1985725B1 (fr) | 2004-02-17 | 2004-07-29 | Couche mince dans un moyen d'enregistrement d'information optique et son procédé de fabrication |
EP08104905A Expired - Lifetime EP2028287B1 (fr) | 2004-02-17 | 2004-07-29 | Cible de pulvérisation cathodique |
EP08104904A Expired - Lifetime EP2022871B1 (fr) | 2004-02-17 | 2004-07-29 | Moyen d'enregistrement d'information optique et processus de fabrication de semblable |
Country Status (6)
Country | Link |
---|---|
EP (4) | EP1717336B1 (fr) |
JP (1) | JP4376868B2 (fr) |
KR (1) | KR100799074B1 (fr) |
CN (1) | CN100567558C (fr) |
TW (1) | TWI309679B (fr) |
WO (1) | WO2005078153A1 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2052871A1 (fr) * | 2007-03-23 | 2009-04-29 | Sony Corporation | Support d'enregistrement optique et son procédé de fabrication |
GB2482544A (en) * | 2010-08-06 | 2012-02-08 | Advanced Tech Materials | Making high density indium tin oxide sputtering targets |
US11443943B2 (en) | 2012-11-14 | 2022-09-13 | Idemitsu Kosam Co., Ltd. | Sputtering target, oxide semiconductor thin film, and method for producing these |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4788463B2 (ja) * | 2006-04-25 | 2011-10-05 | 住友金属鉱山株式会社 | 酸化物焼結体、透明酸化物膜、ガスバリア性透明樹脂基板、ガスバリア性透明導電性樹脂基板およびフレキシブル表示素子 |
JP2008097791A (ja) * | 2006-09-11 | 2008-04-24 | Ricoh Co Ltd | 多層相変化型光記録媒体 |
JP5440388B2 (ja) * | 2010-05-26 | 2014-03-12 | 三菱マテリアル株式会社 | 酸化物スパッタリングターゲットおよび光記録媒体用酸化物膜 |
CN103534382B (zh) | 2011-05-10 | 2016-01-20 | 出光兴产株式会社 | In2O3-SnO2-ZnO系溅射靶 |
CN102351528B (zh) * | 2011-09-28 | 2013-07-10 | 华南理工大学 | 硼化镧掺杂的氧化物半导体材料及其应用 |
JP5965338B2 (ja) | 2012-07-17 | 2016-08-03 | 出光興産株式会社 | スパッタリングターゲット、酸化物半導体薄膜及びそれらの製造方法 |
JP6284710B2 (ja) | 2012-10-18 | 2018-02-28 | 出光興産株式会社 | スパッタリングターゲット、酸化物半導体薄膜及びそれらの製造方法 |
Citations (3)
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EP1211679A1 (fr) * | 1999-08-12 | 2002-06-05 | Nikko Materials Company, Limited | Film photoemetteur et cible de pulverisation pour former ce film photoemetteur |
US20030148871A1 (en) * | 1998-08-31 | 2003-08-07 | Idemitsu Kosan Co., Ltd. | Target for transparent electroconductive film, transparent electroconductive material, transparent electroconductive glass and transparent electroconductive film |
US20040027982A1 (en) * | 2002-08-08 | 2004-02-12 | Akemi Hirotsune | Information recording medium |
Family Cites Families (8)
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JP3636914B2 (ja) * | 1998-02-16 | 2005-04-06 | 株式会社日鉱マテリアルズ | 高抵抗透明導電膜及び高抵抗透明導電膜の製造方法並びに高抵抗透明導電膜形成用スパッタリングターゲット |
JP2000195101A (ja) * | 1998-12-28 | 2000-07-14 | Japan Energy Corp | 光ディスク保護膜及び同保護膜形成用スパッタリングタ―ゲット |
JP4559553B2 (ja) * | 1999-03-05 | 2010-10-06 | 出光興産株式会社 | スパッタリング、エレクトロンビーム、イオンプレーティング用焼結体、透明導電ガラス及び透明導電フィルム |
JP4560149B2 (ja) * | 1999-03-05 | 2010-10-13 | 出光興産株式会社 | 透明導電材料、透明導電ガラス及び透明導電フィルム |
JP4424889B2 (ja) * | 2001-06-26 | 2010-03-03 | 三井金属鉱業株式会社 | 高抵抗透明導電膜用スパッタリングターゲット及び高抵抗透明導電膜の製造方法 |
JP4448648B2 (ja) * | 2002-08-02 | 2010-04-14 | 出光興産株式会社 | スパッタリングターゲット及び焼結体それらを利用して製造した導電膜。 |
US7635440B2 (en) * | 2003-03-04 | 2009-12-22 | Nippon Mining & Metals Co., Ltd. | Sputtering target, thin film for optical information recording medium and process for producing the same |
JP4793773B2 (ja) * | 2003-03-04 | 2011-10-12 | Jx日鉱日石金属株式会社 | スパッタリングターゲットの製造方法 |
-
2004
- 2004-07-29 WO PCT/JP2004/010804 patent/WO2005078153A1/fr active Application Filing
- 2004-07-29 CN CNB200480041806XA patent/CN100567558C/zh not_active Expired - Lifetime
- 2004-07-29 KR KR1020067018747A patent/KR100799074B1/ko not_active IP Right Cessation
- 2004-07-29 EP EP04771017A patent/EP1717336B1/fr not_active Expired - Lifetime
- 2004-07-29 EP EP08104906.6A patent/EP1985725B1/fr not_active Expired - Lifetime
- 2004-07-29 EP EP08104905A patent/EP2028287B1/fr not_active Expired - Lifetime
- 2004-07-29 EP EP08104904A patent/EP2022871B1/fr not_active Expired - Lifetime
- 2004-07-29 JP JP2005517893A patent/JP4376868B2/ja not_active Expired - Lifetime
- 2004-12-24 TW TW093140520A patent/TWI309679B/zh active
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US20030148871A1 (en) * | 1998-08-31 | 2003-08-07 | Idemitsu Kosan Co., Ltd. | Target for transparent electroconductive film, transparent electroconductive material, transparent electroconductive glass and transparent electroconductive film |
EP1211679A1 (fr) * | 1999-08-12 | 2002-06-05 | Nikko Materials Company, Limited | Film photoemetteur et cible de pulverisation pour former ce film photoemetteur |
US20040027982A1 (en) * | 2002-08-08 | 2004-02-12 | Akemi Hirotsune | Information recording medium |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2052871A1 (fr) * | 2007-03-23 | 2009-04-29 | Sony Corporation | Support d'enregistrement optique et son procédé de fabrication |
EP2052871A4 (fr) * | 2007-03-23 | 2009-11-11 | Sony Corp | Support d'enregistrement optique et son procédé de fabrication |
US8075975B2 (en) | 2007-03-23 | 2011-12-13 | Sony Corporation | Optical recording medium and method for manufacturing the same |
GB2482544A (en) * | 2010-08-06 | 2012-02-08 | Advanced Tech Materials | Making high density indium tin oxide sputtering targets |
US11443943B2 (en) | 2012-11-14 | 2022-09-13 | Idemitsu Kosam Co., Ltd. | Sputtering target, oxide semiconductor thin film, and method for producing these |
Also Published As
Publication number | Publication date |
---|---|
EP1985725A2 (fr) | 2008-10-29 |
TW200528568A (en) | 2005-09-01 |
CN100567558C (zh) | 2009-12-09 |
EP2022871A3 (fr) | 2009-02-18 |
JP4376868B2 (ja) | 2009-12-02 |
TWI309679B (en) | 2009-05-11 |
EP2028287A1 (fr) | 2009-02-25 |
EP2022871A2 (fr) | 2009-02-11 |
KR20060110371A (ko) | 2006-10-24 |
EP2028287B1 (fr) | 2012-08-22 |
WO2005078153A1 (fr) | 2005-08-25 |
CN1918319A (zh) | 2007-02-21 |
KR100799074B1 (ko) | 2008-01-29 |
EP1717336B1 (fr) | 2012-09-26 |
EP2022871B1 (fr) | 2012-08-22 |
EP1985725A3 (fr) | 2012-03-21 |
EP1717336A4 (fr) | 2008-02-27 |
JPWO2005078153A1 (ja) | 2007-11-22 |
EP1985725B1 (fr) | 2013-04-10 |
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