DE69934028D1 - Schaltung gegen überströmen in einem leistungshalbleiter - Google Patents

Schaltung gegen überströmen in einem leistungshalbleiter

Info

Publication number
DE69934028D1
DE69934028D1 DE69934028T DE69934028T DE69934028D1 DE 69934028 D1 DE69934028 D1 DE 69934028D1 DE 69934028 T DE69934028 T DE 69934028T DE 69934028 T DE69934028 T DE 69934028T DE 69934028 D1 DE69934028 D1 DE 69934028D1
Authority
DE
Germany
Prior art keywords
overstakes
powerful
surgery
circuit against
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69934028T
Other languages
English (en)
Other versions
DE69934028T2 (de
Inventor
Yoshifumi Tomomatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE69934028D1 publication Critical patent/DE69934028D1/de
Application granted granted Critical
Publication of DE69934028T2 publication Critical patent/DE69934028T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H03K17/0828—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in composite switches
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
    • H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
    • H01L29/7395—Vertical transistors, e.g. vertical IGBT

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electronic Switches (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE69934028T 1999-09-20 1999-09-20 Schaltung gegen überströmen in einem leistungshalbleiter Expired - Lifetime DE69934028T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1999/005158 WO2001022584A1 (fr) 1999-09-20 1999-09-20 Circuit anti-surtension pour semi-conducteur de puissance

Publications (2)

Publication Number Publication Date
DE69934028D1 true DE69934028D1 (de) 2006-12-28
DE69934028T2 DE69934028T2 (de) 2007-06-21

Family

ID=14236764

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69934028T Expired - Lifetime DE69934028T2 (de) 1999-09-20 1999-09-20 Schaltung gegen überströmen in einem leistungshalbleiter

Country Status (6)

Country Link
US (1) US6633473B1 (de)
EP (1) EP1143618B1 (de)
JP (1) JP3590612B2 (de)
KR (1) KR100427923B1 (de)
DE (1) DE69934028T2 (de)
WO (1) WO2001022584A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112311235A (zh) * 2019-07-25 2021-02-02 夏普株式会社 整流电路以及电源装置

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4219567B2 (ja) 2001-04-03 2009-02-04 三菱電機株式会社 半導体装置
TW200523340A (en) 2003-09-24 2005-07-16 Patent Treuhand Ges Fur Elek Sche Gluhlampen Mbh Hochefeizienter leuchtstoff
US7310213B2 (en) * 2003-09-26 2007-12-18 Matsushita Electric Industrial Co., Ltd. Semiconductor device provided with overheat protection circuit and electronic circuit using the same
EP1536563B1 (de) * 2003-11-28 2007-01-17 Delphi Technologies, Inc. Lastschaltvorrichtung und Verfahren zur Diagnose eines Laststromkreises mit einer Lastschaltvorrichtung
DE602004010487T2 (de) 2004-03-31 2008-11-13 Deutsche Thomson-Brandt Gmbh Schaltungsanordnung für den Betrieb eines Schalttransistors
US7375424B2 (en) * 2005-05-03 2008-05-20 International Rectifier Corporation Wirebonded device packages for semiconductor devices having elongated electrodes
JP4626513B2 (ja) * 2005-12-28 2011-02-09 株式会社デンソー ドライバ用半導体素子の過電流保護装置
JP2008042950A (ja) * 2006-08-01 2008-02-21 Mitsubishi Electric Corp 電力変換装置
JP4432953B2 (ja) * 2006-09-27 2010-03-17 株式会社日立製作所 半導体電力変換装置
JP2010045141A (ja) * 2008-08-11 2010-02-25 Fuji Electric Systems Co Ltd 半導体装置および内燃機関用点火装置
JP5407398B2 (ja) * 2009-02-12 2014-02-05 富士電機株式会社 半導体装置
JP5369300B2 (ja) * 2009-09-16 2013-12-18 三菱電機株式会社 半導体装置およびその製造方法
CN101741268B (zh) * 2010-02-03 2013-04-24 西安民展微电子有限公司 交流/直流开关电源的脉宽调制控制电路
JP2015028969A (ja) * 2013-07-30 2015-02-12 本田技研工業株式会社 半導体装置
US9882465B2 (en) * 2013-11-14 2018-01-30 Tm4 Inc. Commutation cell, power converter and compensation circuit having dynamically controlled voltage gains
DE102014202610A1 (de) * 2014-02-13 2015-08-13 Robert Bosch Gmbh Stromdetektionseinrichtung und Verfahren zum Erfassen eines elektrischen Stroms
DE102014202611A1 (de) * 2014-02-13 2015-08-13 Robert Bosch Gmbh Schaltungsanordnung und Verfahren zur Strommessung
DE112016003049T5 (de) * 2016-02-17 2018-03-29 Fuji Electric Co., Ltd. Überstromschutzvorrichtung für halbleitervorrichtung
GB2549934A (en) * 2016-04-28 2017-11-08 Reinhausen Maschf Scheubeck Junction temperature and current sensing
JP6569820B2 (ja) 2016-10-14 2019-09-04 富士電機株式会社 電力素子の駆動回路
US11139808B2 (en) * 2017-02-28 2021-10-05 Mitsubishi Electric Corporation Semiconductor device and power conversion system
CN110521122B (zh) * 2017-10-17 2023-06-13 富士电机株式会社 过电流检测装置、控制装置及过电流检测方法
KR102008277B1 (ko) * 2017-10-31 2019-08-07 현대오트론 주식회사 전력 반도체 칩
US10432186B2 (en) * 2017-11-14 2019-10-01 Ford Global Technologies, Llc Variable resistance power switch feedback
JP7087371B2 (ja) * 2017-12-18 2022-06-21 富士電機株式会社 半導体装置およびパワーモジュール
US11394378B2 (en) * 2018-03-05 2022-07-19 Infineon Technologies Ag Power switch with an integrated temperature and current sense circuit
US10848053B2 (en) * 2018-07-13 2020-11-24 Kohler Co. Robust inverter topology
US10756532B2 (en) 2018-07-13 2020-08-25 Kohler Co. Ground fault minimization
JP7342408B2 (ja) * 2019-04-15 2023-09-12 富士電機株式会社 半導体装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2681990B2 (ja) 1988-04-14 1997-11-26 株式会社デンソー 保護機能を備えた半導体装置
JP3067448B2 (ja) 1992-03-18 2000-07-17 富士電機株式会社 半導体装置
JP3052619B2 (ja) * 1992-11-12 2000-06-19 富士電機株式会社 カレントセンシング機能付半導体装置の制御回路装置
JPH06276071A (ja) * 1993-03-23 1994-09-30 Fuji Electric Co Ltd 電力用トランジスタの過電流保護回路
US5444591A (en) * 1993-04-01 1995-08-22 International Rectifier Corporation IGBT fault current limiting circuit
KR950007167A (ko) 1993-08-10 1995-03-21 이헌조 메스패트(mesfet) 제조방법
JP3982842B2 (ja) * 1993-08-18 2007-09-26 株式会社ルネサステクノロジ 半導体装置
GB9420572D0 (en) * 1994-10-12 1994-11-30 Philips Electronics Uk Ltd A protected switch
JPH08316472A (ja) 1995-05-23 1996-11-29 Hitachi Ltd 電流供給回路
JPH0918310A (ja) 1995-06-30 1997-01-17 Hitachi Ltd 絶縁ゲート半導体素子の過電流保護回路
JPH1032476A (ja) * 1996-05-14 1998-02-03 Fuji Electric Co Ltd 過電流保護回路
WO1997045957A1 (fr) 1996-05-28 1997-12-04 Hitachi, Ltd. Dispositif semiconducteur
US5909135A (en) * 1996-12-19 1999-06-01 Texas Instruments Incorporated High-side MOSFET gate protection shunt circuit
JP3468067B2 (ja) 1997-11-25 2003-11-17 株式会社日立製作所 電圧駆動型半導体素子の過電流抑制回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112311235A (zh) * 2019-07-25 2021-02-02 夏普株式会社 整流电路以及电源装置
CN112311235B (zh) * 2019-07-25 2024-06-11 夏普株式会社 整流电路以及电源装置

Also Published As

Publication number Publication date
JP3590612B2 (ja) 2004-11-17
KR100427923B1 (ko) 2004-05-06
WO2001022584A1 (fr) 2001-03-29
EP1143618B1 (de) 2006-11-15
DE69934028T2 (de) 2007-06-21
KR20010107980A (ko) 2001-12-07
EP1143618A1 (de) 2001-10-10
US6633473B1 (en) 2003-10-14
EP1143618A4 (de) 2002-11-20

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Legal Events

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8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)