JP2015028969A - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
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- JP2015028969A JP2015028969A JP2013157366A JP2013157366A JP2015028969A JP 2015028969 A JP2015028969 A JP 2015028969A JP 2013157366 A JP2013157366 A JP 2013157366A JP 2013157366 A JP2013157366 A JP 2013157366A JP 2015028969 A JP2015028969 A JP 2015028969A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 51
- 230000003071 parasitic effect Effects 0.000 claims abstract description 27
- 230000002159 abnormal effect Effects 0.000 abstract description 10
- 230000000694 effects Effects 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 description 14
- 230000003111 delayed effect Effects 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 230000005856 abnormality Effects 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
- H03K17/162—Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
- H03K17/163—Soft switching
- H03K17/164—Soft switching using parallel switching arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/168—Modifications for eliminating interference voltages or currents in composite switches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
- H03K17/0828—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in composite switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Power Conversion In General (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
Abstract
【解決手段】メイン領域の複数のセルと、センス領域の複数のセルと、各セルを駆動するトランジスタと、を備えた半導体装置であって、トランジスタにおけるメイン領域のゲート抵抗値とセンス領域のゲート抵抗値が、各々Rgm、Rgsであり、トランジスタにおけるメイン領域の寄生容量とセンス領域の寄生容量が、各々Cgm、Cgsであるとき、CR遅延比D=(Cgs/Cgm)*(Rgs/Rgm)に基づき、センス領域のゲート遮断時間が、メイン領域のゲート遮断時間より早く設定される。
【選択図】図4
Description
(2)センス抵抗Rsを変更して検出能力を緩和する。
12 駆動回路
16 トランジスタ
18 RCフィルタ
Claims (5)
- メイン領域の複数のセルと、センス領域の複数のセルと、前記各セルを駆動するトランジスタとを備えた半導体装置であって、
前記トランジスタにおける前記メイン領域のゲート抵抗値と前記センス領域のゲート抵抗値が、各々Rgm、Rgsであり、
前記トランジスタにおける前記メイン領域の寄生容量と前記センス領域の寄生容量が、各々Cgm、Cgsであるとき、
CR遅延比D=(Cgs/Cgm)*(Rgs/Rgm)に基づき、前記センス領域のゲート遮断時間が、前記メイン領域のゲート遮断時間より早く設定される、半導体装置。 - 請求項1に記載の半導体装置であって、
前記メイン領域のセル数と前記センス領域のセル数が、各々Nm、Nsであり、前記CR遅延比Dに関して、
CR遅延比D=(Ns/Nm)*(Rgs/Rgm)が成立する、半導体装置。 - 請求項1に記載の半導体装置であって、
前記メイン領域の面積と前記センス領域の面積が、各々Sm、Ssであり、前記CR遅延比Dに関して、
CR遅延比D=(Ss/Sm)*(Rgs/Rgm)が成立する、半導体装置。 - 請求項1から3のいずれか1項に記載の半導体装置であって、
前記CR遅延比Dが0<D<1に設定される半導体装置。 - 請求項1から4のいずれか1項に記載の半導体装置であって、
前記トランジスタが、コレクタ端子とゲート端子と少なくとも二つのエミッタ端子とを備えるIGBTより構成される半導体装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013157366A JP2015028969A (ja) | 2013-07-30 | 2013-07-30 | 半導体装置 |
US14/314,035 US9213055B2 (en) | 2013-07-30 | 2014-06-25 | Semiconductor device |
CN201410369698.4A CN104348454A (zh) | 2013-07-30 | 2014-07-30 | 半导体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013157366A JP2015028969A (ja) | 2013-07-30 | 2013-07-30 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2015028969A true JP2015028969A (ja) | 2015-02-12 |
Family
ID=52426836
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013157366A Pending JP2015028969A (ja) | 2013-07-30 | 2013-07-30 | 半導体装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9213055B2 (ja) |
JP (1) | JP2015028969A (ja) |
CN (1) | CN104348454A (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10629587B2 (en) * | 2015-04-30 | 2020-04-21 | Mitsubishi Electric Corporation | Protection circuit and protection circuit system |
US9484908B1 (en) * | 2015-06-19 | 2016-11-01 | Hella Corporate Center Usa, Inc. | Gate drive circuit |
US11099216B2 (en) * | 2016-03-03 | 2021-08-24 | Kongsberg Inc. | Circuit and method for shunt current sensing |
DE102022214264A1 (de) | 2022-12-22 | 2024-06-27 | Zf Friedrichshafen Ag | Verfahren und Steuereinheit zum Betreiben einer Schaltereinrichtung mit einer Schaltereinheit und Schaltereinrichtung |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63318781A (ja) * | 1987-06-22 | 1988-12-27 | Nissan Motor Co Ltd | 過電流保護機能を備えたmosfet |
JPH0653795A (ja) * | 1992-03-18 | 1994-02-25 | Fuji Electric Co Ltd | 半導体装置 |
JPH07146722A (ja) * | 1993-10-01 | 1995-06-06 | Fuji Electric Co Ltd | トランジスタ用過電流保護装置 |
WO2001022584A1 (fr) * | 1999-09-20 | 2001-03-29 | Mitsubishi Denki Kabushiki Kaisha | Circuit anti-surtension pour semi-conducteur de puissance |
JP2004088001A (ja) * | 2002-08-29 | 2004-03-18 | Renesas Technology Corp | トレンチゲート型半導体装置 |
JP2008078375A (ja) * | 2006-09-21 | 2008-04-03 | Denso Corp | Mos型パワー素子を有する半導体装置およびそれを備えた点火装置 |
JP2010028040A (ja) * | 2008-07-24 | 2010-02-04 | Mitsumi Electric Co Ltd | Mosトランジスタ、cmos及びこれを用いたモータ駆動用半導体集積回路装置 |
WO2012036247A1 (ja) * | 2010-09-17 | 2012-03-22 | 富士電機株式会社 | 半導体装置 |
JP2012085131A (ja) * | 2010-10-13 | 2012-04-26 | Fuji Electric Co Ltd | センス機能付きパワー半導体デバイス |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6180966B1 (en) * | 1997-03-25 | 2001-01-30 | Hitachi, Ltd. | Trench gate type semiconductor device with current sensing cell |
JP3703435B2 (ja) * | 2002-02-05 | 2005-10-05 | 三菱電機株式会社 | 半導体装置 |
JP4622214B2 (ja) | 2003-07-30 | 2011-02-02 | トヨタ自動車株式会社 | 電流センシング機能を有する半導体装置 |
JP2006271098A (ja) * | 2005-03-24 | 2006-10-05 | Hitachi Ltd | 電力変換装置 |
JP2008235856A (ja) * | 2007-02-22 | 2008-10-02 | Matsushita Electric Ind Co Ltd | 半導体装置 |
US9735704B2 (en) * | 2012-04-23 | 2017-08-15 | Infineon Technologies Korea Co. Ltd. | Apparatus for controlling inverter current and method of operating the same |
DE112012006543T5 (de) * | 2012-07-20 | 2015-02-26 | Mitsubishi Electric Corp. | Halbleitervorrichtung und Verfahren zu ihrer Herstellung |
-
2013
- 2013-07-30 JP JP2013157366A patent/JP2015028969A/ja active Pending
-
2014
- 2014-06-25 US US14/314,035 patent/US9213055B2/en not_active Expired - Fee Related
- 2014-07-30 CN CN201410369698.4A patent/CN104348454A/zh active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63318781A (ja) * | 1987-06-22 | 1988-12-27 | Nissan Motor Co Ltd | 過電流保護機能を備えたmosfet |
JPH0653795A (ja) * | 1992-03-18 | 1994-02-25 | Fuji Electric Co Ltd | 半導体装置 |
JPH07146722A (ja) * | 1993-10-01 | 1995-06-06 | Fuji Electric Co Ltd | トランジスタ用過電流保護装置 |
WO2001022584A1 (fr) * | 1999-09-20 | 2001-03-29 | Mitsubishi Denki Kabushiki Kaisha | Circuit anti-surtension pour semi-conducteur de puissance |
JP2004088001A (ja) * | 2002-08-29 | 2004-03-18 | Renesas Technology Corp | トレンチゲート型半導体装置 |
JP2008078375A (ja) * | 2006-09-21 | 2008-04-03 | Denso Corp | Mos型パワー素子を有する半導体装置およびそれを備えた点火装置 |
JP2010028040A (ja) * | 2008-07-24 | 2010-02-04 | Mitsumi Electric Co Ltd | Mosトランジスタ、cmos及びこれを用いたモータ駆動用半導体集積回路装置 |
WO2012036247A1 (ja) * | 2010-09-17 | 2012-03-22 | 富士電機株式会社 | 半導体装置 |
JP2012085131A (ja) * | 2010-10-13 | 2012-04-26 | Fuji Electric Co Ltd | センス機能付きパワー半導体デバイス |
Also Published As
Publication number | Publication date |
---|---|
CN104348454A (zh) | 2015-02-11 |
US20150034952A1 (en) | 2015-02-05 |
US9213055B2 (en) | 2015-12-15 |
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