DE69719896D1 - Integrierte Halbleiterschaltung mit Fehlererkennungsschaltung - Google Patents

Integrierte Halbleiterschaltung mit Fehlererkennungsschaltung

Info

Publication number
DE69719896D1
DE69719896D1 DE69719896T DE69719896T DE69719896D1 DE 69719896 D1 DE69719896 D1 DE 69719896D1 DE 69719896 T DE69719896 T DE 69719896T DE 69719896 T DE69719896 T DE 69719896T DE 69719896 D1 DE69719896 D1 DE 69719896D1
Authority
DE
Germany
Prior art keywords
signal
instruction
code
circuit
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69719896T
Other languages
English (en)
Other versions
DE69719896T2 (de
Inventor
Makoto Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Electronics Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE69719896D1 publication Critical patent/DE69719896D1/de
Application granted granted Critical
Publication of DE69719896T2 publication Critical patent/DE69719896T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/40—Response verification devices using compression techniques

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Detection And Correction Of Errors (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
DE69719896T 1996-09-25 1997-09-25 Integrierte Halbleiterschaltung mit Fehlererkennungsschaltung Expired - Fee Related DE69719896T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8252731A JPH10105426A (ja) 1996-09-25 1996-09-25 半導体集積回路
JP25273196 1996-09-25

Publications (2)

Publication Number Publication Date
DE69719896D1 true DE69719896D1 (de) 2003-04-24
DE69719896T2 DE69719896T2 (de) 2004-02-19

Family

ID=17241487

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69719896T Expired - Fee Related DE69719896T2 (de) 1996-09-25 1997-09-25 Integrierte Halbleiterschaltung mit Fehlererkennungsschaltung

Country Status (4)

Country Link
US (1) US6073267A (de)
EP (1) EP0833249B1 (de)
JP (1) JPH10105426A (de)
DE (1) DE69719896T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI229276B (en) * 2003-07-23 2005-03-11 Tatung Co Protocol method of reusable hardware IP
GB2418269B (en) * 2004-09-15 2010-07-21 Tatung Co Ltd Reusable hardware IP protocol method for a system-on-chip device
JP4178248B2 (ja) * 2004-10-28 2008-11-12 富士通マイクロエレクトロニクス株式会社 半導体装置
US8140912B2 (en) * 2006-11-02 2012-03-20 Nec Corporation Semiconductor integrated circuits and method of detecting faults of processors
JP2009087485A (ja) * 2007-10-01 2009-04-23 Elpida Memory Inc 半導体装置
CN108288489B (zh) * 2018-04-24 2023-07-25 长鑫存储技术有限公司 半导体存储器循环冗余校验装置及半导体存储器
KR20200056732A (ko) * 2018-11-15 2020-05-25 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
US11604692B2 (en) * 2021-08-19 2023-03-14 Wuxi Esiontech Co., Ltd. Field programmable gate array (FPGA) with automatic error detection and correction function for programmable logic modules

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3585378A (en) * 1969-06-30 1971-06-15 Ibm Error detection scheme for memories
JPS5352029A (en) * 1976-10-22 1978-05-12 Fujitsu Ltd Arithmetic circuit unit
DE2655653C2 (de) * 1976-12-08 1982-12-16 Siemens AG, 1000 Berlin und 8000 München Anordnung zur Feststellung der richtigen Zuordnung von Adresse und Speicherwort in einem wortorganisierten Datenspeicher
JPS5378127A (en) * 1976-12-22 1978-07-11 Sharp Corp Self diagnosis system of fixed program memory unit
JPS58107966A (ja) * 1981-12-22 1983-06-27 Fujitsu Ltd スキヤン方式
JPS6318597A (ja) * 1986-07-10 1988-01-26 Mitsubishi Electric Corp 集積回路内蔵メモリテスト装置
JPH01292550A (ja) * 1988-05-20 1989-11-24 Nec Corp 誤り検出回路
JPH02302833A (ja) * 1989-05-02 1990-12-14 Motorola Inc マイクロプロセッサのための動作機能チェック装置および方法
US5226043A (en) * 1990-12-27 1993-07-06 Raytheon Company Apparatus and method for data error detection and correction and address error detection in a memory system
US5793687A (en) * 1996-12-03 1998-08-11 Mitsubishi Semiconductor America, Inc. Micro ROM testing system using micro ROM timing circuitry for testing operations

Also Published As

Publication number Publication date
JPH10105426A (ja) 1998-04-24
US6073267A (en) 2000-06-06
EP0833249B1 (de) 2003-03-19
DE69719896T2 (de) 2004-02-19
EP0833249A1 (de) 1998-04-01

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee