DE69634824D1 - Integrierte schaltungstestanordnung mit paralleler ansteuerung - Google Patents

Integrierte schaltungstestanordnung mit paralleler ansteuerung

Info

Publication number
DE69634824D1
DE69634824D1 DE69634824T DE69634824T DE69634824D1 DE 69634824 D1 DE69634824 D1 DE 69634824D1 DE 69634824 T DE69634824 T DE 69634824T DE 69634824 T DE69634824 T DE 69634824T DE 69634824 D1 DE69634824 D1 DE 69634824D1
Authority
DE
Germany
Prior art keywords
node
dut
terminal
commands
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69634824T
Other languages
English (en)
Other versions
DE69634824T2 (de
Inventor
J Lesmeister
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Credence Systems Corp
Original Assignee
Credence Systems Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Credence Systems Corp filed Critical Credence Systems Corp
Publication of DE69634824D1 publication Critical patent/DE69634824D1/de
Application granted granted Critical
Publication of DE69634824T2 publication Critical patent/DE69634824T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/02—Digital function generators
    • G06F1/025—Digital function generators for functions having two-valued amplitude, e.g. Walsh functions
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE69634824T 1995-09-25 1996-09-10 Integrierte schaltungstestanordnung mit paralleler ansteuerung Expired - Fee Related DE69634824T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/534,015 US5748642A (en) 1995-09-25 1995-09-25 Parallel processing integrated circuit tester
US534015 1995-09-25
PCT/US1996/014728 WO1997012254A1 (en) 1995-09-25 1996-09-10 Parallel processing integrated circuit tester

Publications (2)

Publication Number Publication Date
DE69634824D1 true DE69634824D1 (de) 2005-07-14
DE69634824T2 DE69634824T2 (de) 2006-05-04

Family

ID=24128358

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69634824T Expired - Fee Related DE69634824T2 (de) 1995-09-25 1996-09-10 Integrierte schaltungstestanordnung mit paralleler ansteuerung

Country Status (6)

Country Link
US (4) US5748642A (de)
EP (1) EP0852730B1 (de)
JP (1) JPH11511565A (de)
KR (1) KR100453488B1 (de)
DE (1) DE69634824T2 (de)
WO (1) WO1997012254A1 (de)

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Also Published As

Publication number Publication date
US5748642A (en) 1998-05-05
US5935256A (en) 1999-08-10
EP0852730A4 (de) 1999-06-16
US5931952A (en) 1999-08-03
EP0852730A1 (de) 1998-07-15
US5931953A (en) 1999-08-03
JPH11511565A (ja) 1999-10-05
WO1997012254A1 (en) 1997-04-03
EP0852730B1 (de) 2005-06-08
KR19990066930A (ko) 1999-08-16
KR100453488B1 (ko) 2005-04-13
DE69634824T2 (de) 2006-05-04

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee