ES2043908T3 - Dispositivo optico de medida. - Google Patents

Dispositivo optico de medida.

Info

Publication number
ES2043908T3
ES2043908T3 ES89102842T ES89102842T ES2043908T3 ES 2043908 T3 ES2043908 T3 ES 2043908T3 ES 89102842 T ES89102842 T ES 89102842T ES 89102842 T ES89102842 T ES 89102842T ES 2043908 T3 ES2043908 T3 ES 2043908T3
Authority
ES
Spain
Prior art keywords
measuring device
optical measuring
opto
electric transducer
extreme
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES89102842T
Other languages
English (en)
Inventor
Ullrich Dipl-Ing Thiedig
Holger Dipl-Ing Wente
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=6347936&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ES2043908(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of ES2043908T3 publication Critical patent/ES2043908T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/87—Combinations of systems using electromagnetic waves other than radio waves

Abstract

EN UN DISPOSITIVO DE MEDICION OPTICO PARA LA DETERMINACION DE LA POSICION DE OBJETOS (32, 32'') PUNTUALES DEPOSITADOS EN EL FONDO CONSISTIENDO EN UN CONVERTIDOR (2, 2'') OPTO - ELECTRICO EXPLORANDO UN ENCUADRE CUYAS SEÑALES DE SALIDA SELECCIONADAS SE CONDUCEN A UN MECANISMO ANALIZADOR, SE CARACTERIZA A TRAVES DE UNA CONEXION DE DETECCION DE VALORES EXTREMOS (5, 6, 8, 26, 30, 8, 8'') ENLAZADO CON LA SALIDA DE LOS CONVERTIDORES (2, 2'') OPTO - ELECTRICOS QUE CONTROLA UN ACUMULADOR (7) DE DATOS DE POSICION CORRESPONDIENTES A VALOR EXTREMO VERIFICADO.
ES89102842T 1988-02-23 1989-02-18 Dispositivo optico de medida. Expired - Lifetime ES2043908T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3805548A DE3805548A1 (de) 1988-02-23 1988-02-23 Optische fernmesseinrichtung

Publications (1)

Publication Number Publication Date
ES2043908T3 true ES2043908T3 (es) 1994-01-01

Family

ID=6347936

Family Applications (1)

Application Number Title Priority Date Filing Date
ES89102842T Expired - Lifetime ES2043908T3 (es) 1988-02-23 1989-02-18 Dispositivo optico de medida.

Country Status (4)

Country Link
EP (1) EP0330100B2 (es)
AT (1) ATE92615T1 (es)
DE (2) DE3805548A1 (es)
ES (1) ES2043908T3 (es)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0425943A3 (en) * 1989-10-31 1991-08-28 Inoex Gmbh Procedure to determine the geometry of a transversal cut of an object coming out of a profiling machine, in particular a longitudinal extruder object
FR2656700B1 (fr) * 1989-12-28 1992-08-07 Aerospatiale Procede de restitution du mouvement d'un mobile par observation d'un symbole forme sur ce dernier et dispositifs pour la mise en óoeuvre du procede.
DE4027732A1 (de) * 1990-09-01 1992-03-05 Thiedig Ullrich Kamerachip fuer eine punktfoermige ereignisse erfassende und auswertende kamera
DE19528465C2 (de) * 1995-08-03 2000-07-06 Leica Geosystems Ag Verfahren und Vorrichtung zur schnellen Erfassung der Lage einer Zielmarke
EP1189017B1 (en) * 2000-03-15 2013-01-23 Omron Corporation Displacement sensor

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4396945A (en) * 1981-08-19 1983-08-02 Solid Photography Inc. Method of sensing the position and orientation of elements in space
US4527891A (en) * 1982-08-18 1985-07-09 Eastman Kodak Company Rangefinder device with serial readout linear image sensor and peak detector with threshold setting means
JPS59107332A (ja) * 1982-12-13 1984-06-21 Asahi Optical Co Ltd カメラの自動焦点装置
NL8302228A (nl) * 1983-06-22 1985-01-16 Optische Ind De Oude Delft Nv Meetstelsel voor het onder gebruikmaking van een op driehoeksmeting berustend principe, contactloos meten van een door een oppervlakcontour van een objectvlak gegeven afstand tot een referentieniveau.
IT1168640B (it) * 1983-08-31 1987-05-20 Sincon Spa Sistemi Informativi Procedimento ed apparecchiatura per la individuazione della posizione di oggetti nello spazio attraverso l'acquisizione di immagini con massima riduzione dei dati da gestire
FR2560472B1 (fr) * 1984-02-23 1987-08-21 Proge Dispositif de releve de profil rapide
DE3423135A1 (de) * 1984-06-22 1986-01-02 Dornier Gmbh, 7990 Friedrichshafen Verfahren zum auslesen einer entfernungsbildzeile
US4692864A (en) * 1985-05-23 1987-09-08 Elscint Ltd. Method of determining stenosis of blood vessels
DE3601536C1 (de) * 1986-01-20 1987-07-02 Messerschmitt Boelkow Blohm Anordnung zur Lagebestimmung eines Objektes
FR2605401B1 (fr) * 1986-10-20 1992-04-17 France Etat Armement Procede et dispositif optoelectronique de mesure en temps reel de mouvements d'une structure solide soumise a l'effet d'un fluide
NL8701847A (nl) * 1987-08-05 1989-03-01 Optische Ind De Oude Delft Nv Detectiestelsel voor een stralingsprofiellijn.

Also Published As

Publication number Publication date
EP0330100A3 (en) 1990-11-22
EP0330100A2 (de) 1989-08-30
DE3805548A1 (de) 1989-08-31
DE58905076D1 (de) 1993-09-09
EP0330100B1 (de) 1993-08-04
EP0330100B2 (de) 1997-04-02
ATE92615T1 (de) 1993-08-15

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