DE69615483T2 - Leseverstärkerschaltung einer nichtflüchtigen Halbleiterspeicheranordnung - Google Patents
Leseverstärkerschaltung einer nichtflüchtigen HalbleiterspeicheranordnungInfo
- Publication number
- DE69615483T2 DE69615483T2 DE69615483T DE69615483T DE69615483T2 DE 69615483 T2 DE69615483 T2 DE 69615483T2 DE 69615483 T DE69615483 T DE 69615483T DE 69615483 T DE69615483 T DE 69615483T DE 69615483 T2 DE69615483 T2 DE 69615483T2
- Authority
- DE
- Germany
- Prior art keywords
- memory device
- semiconductor memory
- amplifier circuit
- sense amplifier
- volatile semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/065—Differential amplifiers of latching type
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR19950015577 | 1995-06-13 | ||
KR1019950018965A KR0177770B1 (ko) | 1995-06-30 | 1995-06-30 | 불 휘발성 반도체 메모리 장치 |
KR1019950018968A KR0158114B1 (ko) | 1995-06-30 | 1995-06-30 | 불 휘발성 반도체 메모리 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69615483D1 DE69615483D1 (de) | 2001-10-31 |
DE69615483T2 true DE69615483T2 (de) | 2002-05-29 |
Family
ID=27349186
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69615483T Expired - Lifetime DE69615483T2 (de) | 1995-06-13 | 1996-06-13 | Leseverstärkerschaltung einer nichtflüchtigen Halbleiterspeicheranordnung |
Country Status (5)
Country | Link |
---|---|
US (1) | US5761123A (de) |
EP (1) | EP0758127B1 (de) |
JP (1) | JP3661162B2 (de) |
CN (1) | CN1107323C (de) |
DE (1) | DE69615483T2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007019545B4 (de) * | 2006-04-25 | 2013-01-31 | Qimonda Ag | Dateninversionsverfahren |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100248868B1 (ko) * | 1996-12-14 | 2000-03-15 | 윤종용 | 플래시 불휘발성 반도체 메모리 장치 및 그 장치의 동작 모드 제어 방법 |
KR100268430B1 (ko) * | 1997-05-24 | 2000-11-01 | 윤종용 | 반도체메모리장치 |
US5995431A (en) * | 1997-06-11 | 1999-11-30 | Texas Instruments Incorporated | Bit line precharge circuit with reduced standby current |
FR2765026B1 (fr) * | 1997-06-19 | 1999-08-13 | Sgs Thomson Microelectronics | Procede et circuit de lecture pour memoire dynamique |
US6016279A (en) * | 1998-03-30 | 2000-01-18 | Vanguard International Semiconductor Corporation | DRAM sensing scheme and isolation circuit |
US5870343A (en) * | 1998-04-06 | 1999-02-09 | Vanguard International Semiconductor Corporation | DRAM sensing scheme for eliminating bit-line coupling noise |
US6130847A (en) * | 1999-07-21 | 2000-10-10 | United Microelectronics Corp. | Semiconductor device with fast write recovery circuit |
KR100326944B1 (ko) * | 2000-01-10 | 2002-03-13 | 윤종용 | 향상된 입/출력 라인 구조를 갖는 반도체 메모리 장치 |
US6480419B2 (en) * | 2001-02-22 | 2002-11-12 | Samsung Electronics Co., Ltd. | Bit line setup and discharge circuit for programming non-volatile memory |
KR100541366B1 (ko) * | 2002-07-19 | 2006-01-16 | 주식회사 하이닉스반도체 | 고속 데이터 억세스를 위한 디램 |
US7196931B2 (en) * | 2002-09-24 | 2007-03-27 | Sandisk Corporation | Non-volatile memory and method with reduced source line bias errors |
US6829167B2 (en) * | 2002-12-12 | 2004-12-07 | Sandisk Corporation | Error recovery for nonvolatile memory |
CN100407335C (zh) * | 2003-05-09 | 2008-07-30 | 联发科技股份有限公司 | 差动式只读存储器的预充电及检测电路 |
KR100546373B1 (ko) * | 2003-08-28 | 2006-01-26 | 삼성전자주식회사 | 기준셀을 사용하지 않는 vss/vdd 비트라인프리차지 스킴을 갖는 반도체 메모리장치 |
KR100702004B1 (ko) * | 2004-08-02 | 2007-03-30 | 삼성전자주식회사 | 반도체 메모리 장치 및 이 장치의 비트 라인 센싱 방법 |
KR100571650B1 (ko) * | 2005-03-31 | 2006-04-17 | 주식회사 하이닉스반도체 | 저전압용 반도체 메모리 장치 |
JP4781783B2 (ja) * | 2005-10-31 | 2011-09-28 | エルピーダメモリ株式会社 | 半導体記憶装置 |
JP2007220218A (ja) | 2006-02-17 | 2007-08-30 | Fujitsu Ltd | 半導体記憶装置およびその制御方法 |
JP2007257786A (ja) * | 2006-03-24 | 2007-10-04 | Toshiba Corp | 半導体記憶装置 |
US7742351B2 (en) * | 2006-06-30 | 2010-06-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
CN101425339B (zh) * | 2008-12-05 | 2010-12-29 | 上海贝岭股份有限公司 | 一种大容量eeprom存储器读放电路 |
US8208330B2 (en) | 2009-07-24 | 2012-06-26 | Macronix International Co., Ltd. | Sense amplifier with shielding circuit |
US8750049B2 (en) | 2010-06-02 | 2014-06-10 | Stmicroelectronics International N.V. | Word line driver for memory |
US8817562B2 (en) * | 2012-07-31 | 2014-08-26 | Freescale Semiconductor, Inc. | Devices and methods for controlling memory cell pre-charge operations |
KR20180116879A (ko) * | 2017-04-18 | 2018-10-26 | 에스케이하이닉스 주식회사 | 반도체 장치 |
CN110945586B (zh) | 2019-11-01 | 2021-01-29 | 长江存储科技有限责任公司 | 用于闪存器件的感测放大器 |
KR20210067677A (ko) * | 2019-11-29 | 2021-06-08 | 에스케이하이닉스 주식회사 | 메모리 장치 및 그 동작 방법 |
US11574657B2 (en) * | 2020-09-28 | 2023-02-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory device, sense amplifier and method for mismatch compensation |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04114395A (ja) * | 1990-09-05 | 1992-04-15 | Nec Corp | 半導体記憶回路 |
JP3279615B2 (ja) * | 1991-04-15 | 2002-04-30 | 株式会社日立製作所 | 半導体装置 |
KR940004406B1 (ko) * | 1991-09-27 | 1994-05-25 | 현대전자산업 주식회사 | Nand형 셀의 감지증폭기 |
JPH05159575A (ja) * | 1991-12-04 | 1993-06-25 | Oki Electric Ind Co Ltd | ダイナミックランダムアクセスメモリ |
JPH06290591A (ja) * | 1993-03-31 | 1994-10-18 | Sony Corp | 半導体不揮発性記憶装置 |
KR970001344B1 (ko) * | 1993-07-12 | 1997-02-05 | 삼성전자 주식회사 | 반도체 메모리 장치 |
KR960011207B1 (ko) * | 1993-11-17 | 1996-08-21 | 김광호 | 반도체 메모리 장치의 데이타 센싱방법 및 그 회로 |
US5539701A (en) * | 1994-08-05 | 1996-07-23 | Nippon Steel Corporation | Sense circuit for semiconductor memory devices |
-
1996
- 1996-06-13 US US08/663,350 patent/US5761123A/en not_active Expired - Lifetime
- 1996-06-13 CN CN96110457A patent/CN1107323C/zh not_active Expired - Fee Related
- 1996-06-13 DE DE69615483T patent/DE69615483T2/de not_active Expired - Lifetime
- 1996-06-13 JP JP15227796A patent/JP3661162B2/ja not_active Expired - Fee Related
- 1996-06-13 EP EP96304435A patent/EP0758127B1/de not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007019545B4 (de) * | 2006-04-25 | 2013-01-31 | Qimonda Ag | Dateninversionsverfahren |
Also Published As
Publication number | Publication date |
---|---|
JP3661162B2 (ja) | 2005-06-15 |
EP0758127A2 (de) | 1997-02-12 |
JPH097382A (ja) | 1997-01-10 |
US5761123A (en) | 1998-06-02 |
EP0758127B1 (de) | 2001-09-26 |
CN1107323C (zh) | 2003-04-30 |
CN1151593A (zh) | 1997-06-11 |
DE69615483D1 (de) | 2001-10-31 |
EP0758127A3 (de) | 1997-07-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |