DE69606450D1 - Wellenfrontenbestimmung mit Mikrospiegel zur Selbstreferenz und seine Justage - Google Patents

Wellenfrontenbestimmung mit Mikrospiegel zur Selbstreferenz und seine Justage

Info

Publication number
DE69606450D1
DE69606450D1 DE69606450T DE69606450T DE69606450D1 DE 69606450 D1 DE69606450 D1 DE 69606450D1 DE 69606450 T DE69606450 T DE 69606450T DE 69606450 T DE69606450 T DE 69606450T DE 69606450 D1 DE69606450 D1 DE 69606450D1
Authority
DE
Germany
Prior art keywords
lateral dimension
disposed
micromirror
reflector
imaging device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69606450T
Other languages
English (en)
Other versions
DE69606450T2 (de
Inventor
Ivan Prikryl
Hollis O'neal Hall
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Discovision Associates
Original Assignee
Discovision Associates
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Discovision Associates filed Critical Discovision Associates
Publication of DE69606450D1 publication Critical patent/DE69606450D1/de
Application granted granted Critical
Publication of DE69606450T2 publication Critical patent/DE69606450T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4535—Devices with moving mirror
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69606450T 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit Mikrospiegel zur Selbstreferenz und seine Justage Expired - Lifetime DE69606450T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US41832895A 1995-04-07 1995-04-07

Publications (2)

Publication Number Publication Date
DE69606450D1 true DE69606450D1 (de) 2000-03-09
DE69606450T2 DE69606450T2 (de) 2000-06-21

Family

ID=23657656

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69606450T Expired - Lifetime DE69606450T2 (de) 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit Mikrospiegel zur Selbstreferenz und seine Justage
DE69612844T Expired - Lifetime DE69612844T2 (de) 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit Mikrospiegel zur Selbstreferenz und seine Justage

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69612844T Expired - Lifetime DE69612844T2 (de) 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit Mikrospiegel zur Selbstreferenz und seine Justage

Country Status (16)

Country Link
US (5) US5771095A (de)
EP (2) EP0736759B1 (de)
JP (3) JPH08297009A (de)
KR (1) KR100297262B1 (de)
CN (2) CN1075630C (de)
AT (2) ATE189520T1 (de)
AU (1) AU721210B2 (de)
CA (1) CA2169141A1 (de)
DE (2) DE69606450T2 (de)
DK (2) DK0736759T3 (de)
ES (2) ES2156326T3 (de)
HK (1) HK1012704A1 (de)
NO (1) NO960583L (de)
PT (2) PT736759E (de)
SG (3) SG73523A1 (de)
TW (1) TW285713B (de)

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US5822066A (en) * 1997-02-26 1998-10-13 Ultratech Stepper, Inc. Point diffraction interferometer and pin mirror for use therewith
US6700606B1 (en) 1999-06-09 2004-03-02 Activcard Ireland Limited Micromirror optical imager
US6525802B1 (en) 1999-11-05 2003-02-25 Nikon Corporation Kinematic mounted reference mirror with provision for stable mounting of alignment optics
JP4593768B2 (ja) * 1999-12-27 2010-12-08 キヤノン株式会社 光干渉装置及び位置検出装置
US6320707B1 (en) 2000-01-18 2001-11-20 The Boeing Company Miniature piezoelectric translators for optical applications
US6307301B1 (en) 2000-02-02 2001-10-23 The Boeing Company Buckling resistant piezoelectric actuator
JP2001343208A (ja) * 2000-03-30 2001-12-14 Fuji Photo Optical Co Ltd フーリエ変換を用いた縞解析方法および装置
US6717159B2 (en) 2000-10-18 2004-04-06 Nikon Corporation Low distortion kinematic reticle support
US6646773B2 (en) * 2001-05-23 2003-11-11 Board Of Regents, The University Of Texas System Digital micro-mirror holographic projection
US6906784B2 (en) * 2002-03-04 2005-06-14 Zygo Corporation Spatial filtering in interferometry
JP2004184309A (ja) 2002-12-05 2004-07-02 Pulstec Industrial Co Ltd 干渉計
US7106457B1 (en) 2003-05-29 2006-09-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Achromatic shearing phase sensor for generating images indicative of measure(s) of alignment between segments of a segmented telescope's mirrors
GB0402941D0 (en) * 2004-02-11 2004-03-17 Qinetiq Ltd Surface shape measurement
US7471443B2 (en) * 2004-03-02 2008-12-30 Hewlett-Packard Development Company, L.P. Piezoelectric flexures for light modulator
JP4739806B2 (ja) * 2004-06-07 2011-08-03 富士フイルム株式会社 光ビーム測定装置および方法
JP4853938B2 (ja) * 2004-06-07 2012-01-11 富士フイルム株式会社 波面測定用干渉計装置
US7538890B2 (en) 2004-06-07 2009-05-26 Fujinon Corporation Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof
AT413765B (de) * 2004-06-24 2006-05-15 Ctr Carinthian Tech Res Ag Anordnung zum aufbau eines miniaturisierten fourier-transform-interferometers für optische strahlung nach dem michelson- bzw. einem daraus abgeleiteten prinzip
US7508488B2 (en) 2004-10-13 2009-03-24 Carl Zeiss Smt Ag Projection exposure system and method of manufacturing a miniaturized device
US7630085B2 (en) * 2005-04-19 2009-12-08 Texas Instruments Incorporated Interferometers of high resolutions
US7557932B2 (en) * 2005-04-19 2009-07-07 Texas Instruments Incorporated Characterization of micromirror array devices using interferometers
US20060232784A1 (en) * 2005-04-19 2006-10-19 Regis Grasser Interferometers of high resolutions
JP4667965B2 (ja) * 2005-06-07 2011-04-13 富士フイルム株式会社 光ビーム測定装置
TWI264523B (en) * 2005-09-06 2006-10-21 Instr Technology Res Ct Method and instrument for measuring decenter and tilt of lens by interferometer
US7733493B2 (en) * 2005-12-23 2010-06-08 Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. Fourier transform spectrometer
KR100777423B1 (ko) * 2005-12-26 2007-11-20 한국항공우주연구원 정지궤도 전자광학카메라 보정시스템
BRPI0720851B1 (pt) * 2006-12-21 2019-10-08 Johnson & Johnson Vision Care, Inc. Aparelho de teste de lente por interferometria, método para alinhar detectores de um aparelho de teste de lente e método para testar uma lente
JP4802110B2 (ja) * 2007-01-31 2011-10-26 富士フイルム株式会社 光波干渉測定装置
US7570366B2 (en) * 2007-02-21 2009-08-04 Corning Incorporated Apparatus for measuring defects in a glass sheet
EP2184596B1 (de) * 2007-08-27 2018-11-14 Nikon Corporation Vorrichtung und verfahren zur messung von wellenfrontabweichungen sowie verfahren zur einstellung von wellenfrontabweichungen
CN101183042B (zh) * 2007-12-13 2011-10-12 上海微电子装备有限公司 点衍射干涉仪
US8575528B1 (en) * 2010-03-03 2013-11-05 Jeffrey D. Barchers System and method for coherent phased array beam transmission and imaging
JP5607392B2 (ja) * 2010-03-12 2014-10-15 株式会社ミツトヨ 光干渉測定装置
EP3240990A4 (de) * 2015-01-04 2018-07-04 Joshua Noel Hogan Referenzsignalfilter für interferometrisches system
CN104567752A (zh) * 2015-01-19 2015-04-29 复旦大学 消杂光双光路光学定中仪
RU2615717C1 (ru) * 2016-03-25 2017-04-07 Акционерное общество "Лыткаринский завод оптического стекла" Интерферометр для многоцелевых оптических измерений
US10739277B2 (en) * 2016-04-21 2020-08-11 Nova Measuring Instruments Ltd. Optical system and method for measurements of samples
EP3824245B1 (de) * 2018-07-16 2023-08-23 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Interferometrie mit achromatischer interferometrischer überlagerung von elektromagnetischen feldern

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US4225236A (en) * 1977-11-11 1980-09-30 Rca Corporation Fabry-perot interferometer
US4682025A (en) * 1984-04-13 1987-07-21 Trw Inc. Active mirror wavefront sensor
US4707137A (en) * 1985-10-25 1987-11-17 Laser Magnetic Storage International Company Device and method for testing the wave front quality of optical components
JPH01193623A (ja) * 1988-01-28 1989-08-03 Nippon Sheet Glass Co Ltd 干渉測定装置
US5026977A (en) 1989-04-05 1991-06-25 The Charles Stark Draper Laboratory, Inc. Wavefront sensing and correction with deformable mirror
JP2902421B2 (ja) * 1989-10-16 1999-06-07 旭光学工業株式会社 干渉計
US5042950A (en) * 1990-05-22 1991-08-27 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for laser beam diagnosis
IL100655A (en) 1991-02-08 1994-11-28 Hughes Aircraft Co Profile gauge for interferometric laser
JP3130638B2 (ja) 1992-04-27 2001-01-31 株式会社東芝 電動機器単体試験支援装置
US5305074A (en) * 1992-07-17 1994-04-19 The United States Of America As Represented By The United States Department Of Energy Achromatic self-referencing interferometer
JP3012439B2 (ja) * 1992-12-28 2000-02-21 シャープ株式会社 光ヘテロダイン検波方式および検波装置
JP3230781B2 (ja) * 1993-08-11 2001-11-19 日本電信電話株式会社 共振器分散測定方法および装置
WO1995020811A1 (en) * 1994-01-31 1995-08-03 Sdl, Inc. Laser illuminated display system
CA2169141A1 (en) * 1995-04-07 1996-10-08 Ivan Prikryl Interferometer having a micromirror

Also Published As

Publication number Publication date
KR100297262B1 (ko) 2001-11-22
DE69612844T2 (de) 2001-09-27
EP0736759A3 (de) 1998-01-21
US6025912A (en) 2000-02-15
PT814331E (pt) 2001-10-31
ES2156326T3 (es) 2001-06-16
AU4578896A (en) 1996-10-17
EP0814331B1 (de) 2001-05-16
CN1153297A (zh) 1997-07-02
SG73524A1 (en) 2000-06-20
ATE189520T1 (de) 2000-02-15
DK0814331T3 (da) 2001-06-11
US20010019415A1 (en) 2001-09-06
TW285713B (de) 1996-09-11
NO960583L (no) 1996-10-08
JPH08297009A (ja) 1996-11-12
HK1012704A1 (en) 1999-08-06
DE69606450T2 (de) 2000-06-21
EP0814331A2 (de) 1997-12-29
JP2003185503A (ja) 2003-07-03
SG43240A1 (en) 1997-10-17
ES2142023T3 (es) 2000-04-01
JP2003177006A (ja) 2003-06-27
CN1210975A (zh) 1999-03-17
US5771095A (en) 1998-06-23
DE69612844D1 (de) 2001-06-21
AU721210B2 (en) 2000-06-29
US6493094B2 (en) 2002-12-10
EP0736759A2 (de) 1996-10-09
DK0736759T3 (da) 2000-06-13
EP0814331A3 (de) 1998-02-11
ATE201265T1 (de) 2001-06-15
KR960038363A (ko) 1996-11-21
US6204925B1 (en) 2001-03-20
EP0736759B1 (de) 2000-02-02
CN1075630C (zh) 2001-11-28
NO960583D0 (no) 1996-02-14
PT736759E (pt) 2000-05-31
SG73523A1 (en) 2000-06-20
CA2169141A1 (en) 1996-10-08
US5675413A (en) 1997-10-07

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Legal Events

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