ATE201265T1 - Wellenfrontenbestimmung mit mikrospiegel zur selbstreferenz und seine justage - Google Patents

Wellenfrontenbestimmung mit mikrospiegel zur selbstreferenz und seine justage

Info

Publication number
ATE201265T1
ATE201265T1 AT97116978T AT97116978T ATE201265T1 AT E201265 T1 ATE201265 T1 AT E201265T1 AT 97116978 T AT97116978 T AT 97116978T AT 97116978 T AT97116978 T AT 97116978T AT E201265 T1 ATE201265 T1 AT E201265T1
Authority
AT
Austria
Prior art keywords
lateral dimension
disposed
micromirror
reflector
imaging device
Prior art date
Application number
AT97116978T
Other languages
English (en)
Inventor
Ivan Prikryl
Hollis O'neal Hall
Original Assignee
Discovision Ass
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Discovision Ass filed Critical Discovision Ass
Application granted granted Critical
Publication of ATE201265T1 publication Critical patent/ATE201265T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4535—Devices with moving mirror
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT97116978T 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit mikrospiegel zur selbstreferenz und seine justage ATE201265T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US41832895A 1995-04-07 1995-04-07

Publications (1)

Publication Number Publication Date
ATE201265T1 true ATE201265T1 (de) 2001-06-15

Family

ID=23657656

Family Applications (2)

Application Number Title Priority Date Filing Date
AT97116978T ATE201265T1 (de) 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit mikrospiegel zur selbstreferenz und seine justage
AT96301860T ATE189520T1 (de) 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit mikrospiegel zur selbstreferenz und seine justage

Family Applications After (1)

Application Number Title Priority Date Filing Date
AT96301860T ATE189520T1 (de) 1995-04-07 1996-03-19 Wellenfrontenbestimmung mit mikrospiegel zur selbstreferenz und seine justage

Country Status (16)

Country Link
US (5) US5675413A (de)
EP (2) EP0814331B1 (de)
JP (3) JPH08297009A (de)
KR (1) KR100297262B1 (de)
CN (2) CN1075630C (de)
AT (2) ATE201265T1 (de)
AU (1) AU721210B2 (de)
CA (1) CA2169141A1 (de)
DE (2) DE69606450T2 (de)
DK (2) DK0736759T3 (de)
ES (2) ES2142023T3 (de)
HK (1) HK1012704A1 (de)
NO (1) NO960583L (de)
PT (2) PT814331E (de)
SG (3) SG43240A1 (de)
TW (1) TW285713B (de)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2169141A1 (en) 1995-04-07 1996-10-08 Ivan Prikryl Interferometer having a micromirror
JPH1090196A (ja) * 1996-09-19 1998-04-10 Toppan Printing Co Ltd 透明保護層の検査方法およびその検査装置
US5822066A (en) * 1997-02-26 1998-10-13 Ultratech Stepper, Inc. Point diffraction interferometer and pin mirror for use therewith
US6700606B1 (en) 1999-06-09 2004-03-02 Activcard Ireland Limited Micromirror optical imager
US6525802B1 (en) 1999-11-05 2003-02-25 Nikon Corporation Kinematic mounted reference mirror with provision for stable mounting of alignment optics
JP4593768B2 (ja) * 1999-12-27 2010-12-08 キヤノン株式会社 光干渉装置及び位置検出装置
US6320707B1 (en) 2000-01-18 2001-11-20 The Boeing Company Miniature piezoelectric translators for optical applications
US6307301B1 (en) 2000-02-02 2001-10-23 The Boeing Company Buckling resistant piezoelectric actuator
JP2001343208A (ja) * 2000-03-30 2001-12-14 Fuji Photo Optical Co Ltd フーリエ変換を用いた縞解析方法および装置
US6717159B2 (en) 2000-10-18 2004-04-06 Nikon Corporation Low distortion kinematic reticle support
US6646773B2 (en) * 2001-05-23 2003-11-11 Board Of Regents, The University Of Texas System Digital micro-mirror holographic projection
US6906784B2 (en) * 2002-03-04 2005-06-14 Zygo Corporation Spatial filtering in interferometry
JP2004184309A (ja) 2002-12-05 2004-07-02 Pulstec Industrial Co Ltd 干渉計
US7106457B1 (en) 2003-05-29 2006-09-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Achromatic shearing phase sensor for generating images indicative of measure(s) of alignment between segments of a segmented telescope's mirrors
GB0402941D0 (en) * 2004-02-11 2004-03-17 Qinetiq Ltd Surface shape measurement
US7471443B2 (en) * 2004-03-02 2008-12-30 Hewlett-Packard Development Company, L.P. Piezoelectric flexures for light modulator
JP4853938B2 (ja) * 2004-06-07 2012-01-11 富士フイルム株式会社 波面測定用干渉計装置
US7538890B2 (en) 2004-06-07 2009-05-26 Fujinon Corporation Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof
JP4739806B2 (ja) * 2004-06-07 2011-08-03 富士フイルム株式会社 光ビーム測定装置および方法
AT413765B (de) * 2004-06-24 2006-05-15 Ctr Carinthian Tech Res Ag Anordnung zum aufbau eines miniaturisierten fourier-transform-interferometers für optische strahlung nach dem michelson- bzw. einem daraus abgeleiteten prinzip
US7508488B2 (en) 2004-10-13 2009-03-24 Carl Zeiss Smt Ag Projection exposure system and method of manufacturing a miniaturized device
US7557932B2 (en) * 2005-04-19 2009-07-07 Texas Instruments Incorporated Characterization of micromirror array devices using interferometers
US7630085B2 (en) * 2005-04-19 2009-12-08 Texas Instruments Incorporated Interferometers of high resolutions
US20060232784A1 (en) * 2005-04-19 2006-10-19 Regis Grasser Interferometers of high resolutions
JP4667965B2 (ja) * 2005-06-07 2011-04-13 富士フイルム株式会社 光ビーム測定装置
TWI264523B (en) * 2005-09-06 2006-10-21 Instr Technology Res Ct Method and instrument for measuring decenter and tilt of lens by interferometer
US7733493B2 (en) * 2005-12-23 2010-06-08 Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. Fourier transform spectrometer
KR100777423B1 (ko) * 2005-12-26 2007-11-20 한국항공우주연구원 정지궤도 전자광학카메라 보정시스템
CA2672900C (en) * 2006-12-21 2015-02-17 Johnson & Johnson Vision Care, Inc. Interferometry testing of lenses, and systems and devices for same
JP4802110B2 (ja) * 2007-01-31 2011-10-26 富士フイルム株式会社 光波干渉測定装置
US7570366B2 (en) * 2007-02-21 2009-08-04 Corning Incorporated Apparatus for measuring defects in a glass sheet
WO2009028332A1 (ja) * 2007-08-27 2009-03-05 Nikon Corporation 波面収差計測装置および方法、並びに波面収差調整方法
CN101183042B (zh) * 2007-12-13 2011-10-12 上海微电子装备有限公司 点衍射干涉仪
US8575528B1 (en) * 2010-03-03 2013-11-05 Jeffrey D. Barchers System and method for coherent phased array beam transmission and imaging
JP5607392B2 (ja) * 2010-03-12 2014-10-15 株式会社ミツトヨ 光干渉測定装置
US10018461B2 (en) * 2015-01-04 2018-07-10 Joshua Noel Hogan Reference signal filter for interferometric system
CN104567752A (zh) * 2015-01-19 2015-04-29 复旦大学 消杂光双光路光学定中仪
RU2615717C1 (ru) * 2016-03-25 2017-04-07 Акционерное общество "Лыткаринский завод оптического стекла" Интерферометр для многоцелевых оптических измерений
CN109313008B (zh) * 2016-04-21 2020-12-04 诺威量测设备股份有限公司 用于样本测量的光学系统和方法
US11408724B2 (en) 2018-07-16 2022-08-09 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Interferometry with an achromatic interferometric superposition of electromagnetic fields

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4225236A (en) * 1977-11-11 1980-09-30 Rca Corporation Fabry-perot interferometer
US4682025A (en) * 1984-04-13 1987-07-21 Trw Inc. Active mirror wavefront sensor
US4707137A (en) * 1985-10-25 1987-11-17 Laser Magnetic Storage International Company Device and method for testing the wave front quality of optical components
JPH01193623A (ja) * 1988-01-28 1989-08-03 Nippon Sheet Glass Co Ltd 干渉測定装置
US5026977A (en) 1989-04-05 1991-06-25 The Charles Stark Draper Laboratory, Inc. Wavefront sensing and correction with deformable mirror
JP2902421B2 (ja) * 1989-10-16 1999-06-07 旭光学工業株式会社 干渉計
US5042950A (en) * 1990-05-22 1991-08-27 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for laser beam diagnosis
IL100655A (en) 1991-02-08 1994-11-28 Hughes Aircraft Co Profile gauge for interferometric laser
JP3130638B2 (ja) 1992-04-27 2001-01-31 株式会社東芝 電動機器単体試験支援装置
US5305074A (en) * 1992-07-17 1994-04-19 The United States Of America As Represented By The United States Department Of Energy Achromatic self-referencing interferometer
JP3012439B2 (ja) * 1992-12-28 2000-02-21 シャープ株式会社 光ヘテロダイン検波方式および検波装置
JP3230781B2 (ja) * 1993-08-11 2001-11-19 日本電信電話株式会社 共振器分散測定方法および装置
EP0742940A4 (de) * 1994-01-31 1998-09-30 Sdl Inc Laserlicht beleuchtetes anzeigesystem
CA2169141A1 (en) * 1995-04-07 1996-10-08 Ivan Prikryl Interferometer having a micromirror

Also Published As

Publication number Publication date
SG43240A1 (en) 1997-10-17
EP0736759B1 (de) 2000-02-02
AU4578896A (en) 1996-10-17
DE69606450T2 (de) 2000-06-21
ATE189520T1 (de) 2000-02-15
JP2003185503A (ja) 2003-07-03
DE69606450D1 (de) 2000-03-09
US5771095A (en) 1998-06-23
US20010019415A1 (en) 2001-09-06
TW285713B (de) 1996-09-11
EP0814331A3 (de) 1998-02-11
EP0736759A2 (de) 1996-10-09
AU721210B2 (en) 2000-06-29
SG73523A1 (en) 2000-06-20
PT814331E (pt) 2001-10-31
KR960038363A (ko) 1996-11-21
US6025912A (en) 2000-02-15
US6493094B2 (en) 2002-12-10
JP2003177006A (ja) 2003-06-27
DK0814331T3 (da) 2001-06-11
US5675413A (en) 1997-10-07
KR100297262B1 (ko) 2001-11-22
CA2169141A1 (en) 1996-10-08
ES2142023T3 (es) 2000-04-01
EP0814331B1 (de) 2001-05-16
NO960583D0 (no) 1996-02-14
DK0736759T3 (da) 2000-06-13
EP0736759A3 (de) 1998-01-21
ES2156326T3 (es) 2001-06-16
JPH08297009A (ja) 1996-11-12
DE69612844D1 (de) 2001-06-21
HK1012704A1 (en) 1999-08-06
DE69612844T2 (de) 2001-09-27
PT736759E (pt) 2000-05-31
NO960583L (no) 1996-10-08
US6204925B1 (en) 2001-03-20
CN1075630C (zh) 2001-11-28
EP0814331A2 (de) 1997-12-29
CN1210975A (zh) 1999-03-17
SG73524A1 (en) 2000-06-20
CN1153297A (zh) 1997-07-02

Similar Documents

Publication Publication Date Title
ATE201265T1 (de) Wellenfrontenbestimmung mit mikrospiegel zur selbstreferenz und seine justage
KR940013473A (ko) 렌즈 검사 시스템용 조명 및 영상 서브시스템
TW359852B (en) Apparatus for measuring an aerial image using transmitted light and reflected light
CA2311818A1 (en) Objective measurement and correction of optical systems using wavefront analysis
KR930010527A (ko) 조사를 이용한 표면상태 검사방법 및 그 장치
WO1998052025A1 (fr) Procede et instrument de controle de surface
TW343357B (en) Projection exposure device, projection exposure method, mask pattern for amplitude aberration evaluation, amplitude aberration evaluation method
EP1199026A3 (de) Aberrationsfreies Auslieferungssystem
CA2210703A1 (en) Optical measurement instrument for living body
SU1712777A1 (ru) Способ контрол формы вогнутых эллиптических поверхностей
RU1791701C (ru) Интерферометр дл контрол качества поверхностей оптических деталей
JPS6327703A (ja) 位置検出用光源装置
RU1772609C (ru) Устройство дл изменени угла падени луча на образец
JPH06337207A (ja) 三次元形状計測用輝線結像方法及び装置
JPH0213831A (ja) 顕微分光装置の光学系

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee