DE69522539D1 - Vorrichtung zur chemischen Dampfabscheidung bei niedrigem Druck - Google Patents
Vorrichtung zur chemischen Dampfabscheidung bei niedrigem DruckInfo
- Publication number
- DE69522539D1 DE69522539D1 DE69522539T DE69522539T DE69522539D1 DE 69522539 D1 DE69522539 D1 DE 69522539D1 DE 69522539 T DE69522539 T DE 69522539T DE 69522539 T DE69522539 T DE 69522539T DE 69522539 D1 DE69522539 D1 DE 69522539D1
- Authority
- DE
- Germany
- Prior art keywords
- reactor
- vapor deposition
- chemical vapor
- low pressure
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/4557—Heated nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/12—Substrate holders or susceptors
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Plasma & Fusion (AREA)
- Physics & Mathematics (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR19940034617 | 1994-12-16 | ||
KR1019950001029A KR100225916B1 (ko) | 1994-12-16 | 1995-01-21 | 플라즈마가 적용된 저압 화학 증기 증착장치 |
KR2019950006520U KR0138989Y1 (ko) | 1995-04-01 | 1995-04-01 | 매엽식 플라즈마 저압 화학 증기 증착장치 |
KR1019950023668A KR0148714B1 (ko) | 1995-08-01 | 1995-08-01 | 매엽식 저압화학증기증착기의 서셉터 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69522539D1 true DE69522539D1 (de) | 2001-10-11 |
DE69522539T2 DE69522539T2 (de) | 2002-05-02 |
Family
ID=27483057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69522539T Expired - Fee Related DE69522539T2 (de) | 1994-12-16 | 1995-12-18 | Vorrichtung zur chemischen Dampfabscheidung bei niedrigem Druck |
Country Status (6)
Country | Link |
---|---|
US (4) | US5928427A (de) |
EP (1) | EP0717126B1 (de) |
JP (1) | JP3889074B2 (de) |
AT (1) | ATE205263T1 (de) |
DE (1) | DE69522539T2 (de) |
TW (1) | TW340138B (de) |
Families Citing this family (60)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5928427A (en) * | 1994-12-16 | 1999-07-27 | Hwang; Chul-Ju | Apparatus for low pressure chemical vapor deposition |
US5885353A (en) * | 1996-06-21 | 1999-03-23 | Micron Technology, Inc. | Thermal conditioning apparatus |
TW415970B (en) * | 1997-01-08 | 2000-12-21 | Ebara Corp | Vapor-phase film growth apparatus and gas ejection head |
US6521081B2 (en) * | 1997-12-05 | 2003-02-18 | Tegal Corporation | Deposition shield for a plasma reactor |
WO1999029923A1 (en) * | 1997-12-05 | 1999-06-17 | Tegal Corporation | Plasma reactor with a deposition shield |
US6892669B2 (en) * | 1998-02-26 | 2005-05-17 | Anelva Corporation | CVD apparatus |
US6190732B1 (en) | 1998-09-03 | 2001-02-20 | Cvc Products, Inc. | Method and system for dispensing process gas for fabricating a device on a substrate |
EP1058055B1 (de) * | 1998-12-18 | 2009-10-14 | Panasonic Corporation | Katalytische verbrennungseinrichtung |
US6250250B1 (en) * | 1999-03-18 | 2001-06-26 | Yuri Maishev | Multiple-cell source of uniform plasma |
JP2000323487A (ja) * | 1999-05-14 | 2000-11-24 | Tokyo Electron Ltd | 枚葉式熱処理装置 |
JP3317935B2 (ja) * | 1999-09-01 | 2002-08-26 | 九州日本電気株式会社 | プラズマ処理装置 |
JP2001155899A (ja) * | 1999-11-25 | 2001-06-08 | Tadahiro Omi | プラズマプロセス装置およびプラズマ装置を用いたプロセス |
US6998152B2 (en) * | 1999-12-20 | 2006-02-14 | Micron Technology, Inc. | Chemical vapor deposition methods utilizing ionic liquids |
US6302963B1 (en) * | 1999-12-21 | 2001-10-16 | Axcelis Technologies, Inc. | Bell jar having integral gas distribution channeling |
US6306247B1 (en) | 2000-04-19 | 2001-10-23 | Taiwan Semiconductor Manufacturing Company, Ltd | Apparatus and method for preventing etch chamber contamination |
US6502530B1 (en) * | 2000-04-26 | 2003-01-07 | Unaxis Balzers Aktiengesellschaft | Design of gas injection for the electrode in a capacitively coupled RF plasma reactor |
US6440219B1 (en) * | 2000-06-07 | 2002-08-27 | Simplus Systems Corporation | Replaceable shielding apparatus |
KR100419756B1 (ko) * | 2000-06-23 | 2004-02-21 | 아넬바 가부시기가이샤 | 박막 형성 장치 |
US6503331B1 (en) * | 2000-09-12 | 2003-01-07 | Applied Materials, Inc. | Tungsten chamber with stationary heater |
KR100345304B1 (ko) * | 2000-10-12 | 2002-07-25 | 한국전자통신연구원 | 수직형 초고진공 화학증착장치 |
JP4791637B2 (ja) * | 2001-01-22 | 2011-10-12 | キヤノンアネルバ株式会社 | Cvd装置とこれを用いた処理方法 |
US6506252B2 (en) | 2001-02-07 | 2003-01-14 | Emcore Corporation | Susceptorless reactor for growing epitaxial layers on wafers by chemical vapor deposition |
US6537928B1 (en) * | 2002-02-19 | 2003-03-25 | Asm Japan K.K. | Apparatus and method for forming low dielectric constant film |
KR20030028296A (ko) * | 2001-09-28 | 2003-04-08 | 학교법인 한양학원 | 플라즈마 화학기상증착 장치 및 이를 이용한 탄소나노튜브제조방법 |
JP2003209063A (ja) * | 2001-11-08 | 2003-07-25 | Tokyo Electron Ltd | 熱処理装置および熱処理方法 |
KR100561848B1 (ko) * | 2003-11-04 | 2006-03-16 | 삼성전자주식회사 | 헬리컬 공진기형 플라즈마 처리 장치 |
KR100634288B1 (ko) * | 2003-12-01 | 2006-10-16 | 야스히로 모리 | 고체물질의 표면 개질방법 및 표면 개질된 고체물질 |
US20050194374A1 (en) * | 2004-03-02 | 2005-09-08 | Applied Materials, Inc. | Heated ceramic substrate support with protective coating |
US7697260B2 (en) * | 2004-03-31 | 2010-04-13 | Applied Materials, Inc. | Detachable electrostatic chuck |
US7480974B2 (en) * | 2005-02-15 | 2009-01-27 | Lam Research Corporation | Methods of making gas distribution members for plasma processing apparatuses |
US20060281310A1 (en) * | 2005-06-08 | 2006-12-14 | Applied Materials, Inc. | Rotating substrate support and methods of use |
CN100358098C (zh) | 2005-08-05 | 2007-12-26 | 中微半导体设备(上海)有限公司 | 半导体工艺件处理装置 |
US7842135B2 (en) * | 2006-01-09 | 2010-11-30 | Aixtron Ag | Equipment innovations for nano-technology aquipment, especially for plasma growth chambers of carbon nanotube and nanowire |
US8343280B2 (en) * | 2006-03-28 | 2013-01-01 | Tokyo Electron Limited | Multi-zone substrate temperature control system and method of operating |
US20070238301A1 (en) * | 2006-03-28 | 2007-10-11 | Cabral Stephen H | Batch processing system and method for performing chemical oxide removal |
US7718032B2 (en) * | 2006-06-22 | 2010-05-18 | Tokyo Electron Limited | Dry non-plasma treatment system and method of using |
JP2010016225A (ja) * | 2008-07-04 | 2010-01-21 | Tokyo Electron Ltd | 温度調節機構および温度調節機構を用いた半導体製造装置 |
JP5308733B2 (ja) * | 2008-08-07 | 2013-10-09 | 富士電機株式会社 | 非一体型カソード電極及びプラズマcvd装置 |
JP4564570B2 (ja) * | 2009-03-10 | 2010-10-20 | 三井造船株式会社 | 原子層堆積装置 |
US8951487B2 (en) | 2010-10-25 | 2015-02-10 | ADA-ES, Inc. | Hot-side method and system |
US8496894B2 (en) | 2010-02-04 | 2013-07-30 | ADA-ES, Inc. | Method and system for controlling mercury emissions from coal-fired thermal processes |
EP2360292B1 (de) * | 2010-02-08 | 2012-03-28 | Roth & Rau AG | Paralleler Plattenreaktor zur gleichmäßigen Dünnfilmablagerung mit reduzierter Werkzeugaufstellfläche |
US20120083129A1 (en) | 2010-10-05 | 2012-04-05 | Skyworks Solutions, Inc. | Apparatus and methods for focusing plasma |
US9478428B2 (en) | 2010-10-05 | 2016-10-25 | Skyworks Solutions, Inc. | Apparatus and methods for shielding a plasma etcher electrode |
JP5243519B2 (ja) * | 2010-12-22 | 2013-07-24 | 東京エレクトロン株式会社 | 成膜装置 |
JP5604289B2 (ja) * | 2010-12-22 | 2014-10-08 | 東京エレクトロン株式会社 | 成膜装置 |
US8845986B2 (en) | 2011-05-13 | 2014-09-30 | ADA-ES, Inc. | Process to reduce emissions of nitrogen oxides and mercury from coal-fired boilers |
CN102400111B (zh) * | 2011-11-21 | 2016-06-15 | 汉能太阳能光伏科技有限公司 | 一种lpcvd工艺腔加热系统 |
US8883099B2 (en) | 2012-04-11 | 2014-11-11 | ADA-ES, Inc. | Control of wet scrubber oxidation inhibitor and byproduct recovery |
US9957454B2 (en) | 2012-08-10 | 2018-05-01 | ADA-ES, Inc. | Method and additive for controlling nitrogen oxide emissions |
CN205177785U (zh) * | 2013-03-14 | 2016-04-20 | 应用材料公司 | 处理腔室及用于将热线源耦接至该处理腔室的装置 |
CN103276373B (zh) * | 2013-05-28 | 2015-08-19 | 南方科技大学 | 一种pecvd装置 |
CN106030761B (zh) | 2014-01-27 | 2019-09-13 | 威科仪器有限公司 | 用于化学气相沉积系统的晶片载体及其制造方法 |
US9920844B2 (en) | 2014-11-26 | 2018-03-20 | Lam Research Corporation | Valve manifold deadleg elimination via reentrant flow path |
US9631276B2 (en) * | 2014-11-26 | 2017-04-25 | Lam Research Corporation | Systems and methods enabling low defect processing via controlled separation and delivery of chemicals during atomic layer deposition |
CN117265507A (zh) * | 2016-11-11 | 2023-12-22 | 优材科技有限公司 | 加热器模块、薄膜沉积装置及方法 |
JP6875918B2 (ja) * | 2017-03-31 | 2021-05-26 | 日本製鉄株式会社 | 黒色めっき鋼板の製造装置および製造システム |
US11661654B2 (en) | 2018-04-18 | 2023-05-30 | Lam Research Corporation | Substrate processing systems including gas delivery system with reduced dead legs |
TWI756117B (zh) * | 2021-04-23 | 2022-02-21 | 財團法人國家實驗研究院 | 晶圓級二維材料沉積裝置 |
CN114318543A (zh) * | 2021-12-28 | 2022-04-12 | 江苏布里其曼科技股份有限公司 | 半极性氮化镓外延层结构制造系统及方法 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4142004A (en) * | 1976-01-22 | 1979-02-27 | Bell Telephone Laboratories, Incorporated | Method of coating semiconductor substrates |
US4493997A (en) * | 1982-09-01 | 1985-01-15 | The Singer Company | Fiber optic sensor for shaft state |
JPS5959876A (ja) * | 1982-09-30 | 1984-04-05 | Ushio Inc | 光照射炉の運転方法 |
JPS59112615A (ja) * | 1982-12-17 | 1984-06-29 | Matsushita Electric Ind Co Ltd | 気相反応装置 |
JPS59121915A (ja) * | 1982-12-28 | 1984-07-14 | Hitachi Ltd | 気相成長装置 |
US4504730A (en) * | 1983-10-04 | 1985-03-12 | Ushio Denki Kabushiki Kaisha | Method for heating semiconductor wafer by means of application of radiated light |
JPS6126218A (ja) * | 1984-07-16 | 1986-02-05 | Matsushita Electric Ind Co Ltd | 気相成長装置 |
US5160543A (en) * | 1985-12-20 | 1992-11-03 | Canon Kabushiki Kaisha | Device for forming a deposited film |
FR2599558B1 (fr) * | 1986-05-27 | 1988-09-02 | Labo Electronique Physique | Procede de realisation d'un dispositif semi-conducteur, incluant le depot en phase vapeur de couches sur un substrat |
US5000113A (en) * | 1986-12-19 | 1991-03-19 | Applied Materials, Inc. | Thermal CVD/PECVD reactor and use for thermal chemical vapor deposition of silicon dioxide and in-situ multi-step planarized process |
JPH0663098B2 (ja) * | 1989-01-11 | 1994-08-17 | 国際電気株式会社 | プラズマcvd装置 |
EP0382988A1 (de) * | 1989-02-13 | 1990-08-22 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Anlage zur chemischen Dampfphasenausscheidung |
JP2662722B2 (ja) * | 1990-01-12 | 1997-10-15 | 東京エレクトロン株式会社 | バッチ式熱処理装置 |
DE4029268C2 (de) * | 1990-09-14 | 1995-07-06 | Balzers Hochvakuum | Verfahren zur gleichspannungs-bogenentladungs-unterstützten, reaktiven Behandlung von Gut und Vakuumbehandlungsanlage zur Durchführung |
JP2532401Y2 (ja) * | 1991-04-16 | 1997-04-16 | ソニー株式会社 | バイアスecrプラズマcvd装置 |
GB2256085A (en) * | 1991-05-13 | 1992-11-25 | Integrated Plasma Ltd | Plasma deposition and etching of substrates. |
US5536918A (en) * | 1991-08-16 | 1996-07-16 | Tokyo Electron Sagami Kabushiki Kaisha | Heat treatment apparatus utilizing flat heating elements for treating semiconductor wafers |
JP3230836B2 (ja) * | 1992-04-09 | 2001-11-19 | 東京エレクトロン株式会社 | 熱処理装置 |
JP3164248B2 (ja) * | 1992-06-11 | 2001-05-08 | 東京エレクトロン株式会社 | 熱処理装置 |
US5444217A (en) * | 1993-01-21 | 1995-08-22 | Moore Epitaxial Inc. | Rapid thermal processing apparatus for processing semiconductor wafers |
US5928427A (en) * | 1994-12-16 | 1999-07-27 | Hwang; Chul-Ju | Apparatus for low pressure chemical vapor deposition |
US6053982A (en) * | 1995-09-01 | 2000-04-25 | Asm America, Inc. | Wafer support system |
US6024799A (en) * | 1997-07-11 | 2000-02-15 | Applied Materials, Inc. | Chemical vapor deposition manifold |
US5997649A (en) * | 1998-04-09 | 1999-12-07 | Tokyo Electron Limited | Stacked showerhead assembly for delivering gases and RF power to a reaction chamber |
-
1995
- 1995-12-13 US US08/571,404 patent/US5928427A/en not_active Expired - Lifetime
- 1995-12-15 TW TW084113390A patent/TW340138B/zh not_active IP Right Cessation
- 1995-12-18 JP JP32847595A patent/JP3889074B2/ja not_active Expired - Fee Related
- 1995-12-18 EP EP95309190A patent/EP0717126B1/de not_active Expired - Lifetime
- 1995-12-18 DE DE69522539T patent/DE69522539T2/de not_active Expired - Fee Related
- 1995-12-18 AT AT95309190T patent/ATE205263T1/de not_active IP Right Cessation
-
1999
- 1999-07-06 US US09/348,237 patent/US6190460B1/en not_active Expired - Lifetime
- 1999-07-06 US US09/348,236 patent/US6026764A/en not_active Expired - Lifetime
- 1999-07-06 US US09/348,235 patent/US6009831A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6026764A (en) | 2000-02-22 |
US6190460B1 (en) | 2001-02-20 |
ATE205263T1 (de) | 2001-09-15 |
EP0717126B1 (de) | 2001-09-05 |
JP3889074B2 (ja) | 2007-03-07 |
EP0717126A3 (de) | 1996-12-18 |
TW340138B (en) | 1998-09-11 |
US5928427A (en) | 1999-07-27 |
EP0717126A2 (de) | 1996-06-19 |
US6009831A (en) | 2000-01-04 |
JPH08250441A (ja) | 1996-09-27 |
DE69522539T2 (de) | 2002-05-02 |
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