DE69312858D1 - Substratvorspannungsgenerator ohne Oszillator - Google Patents

Substratvorspannungsgenerator ohne Oszillator

Info

Publication number
DE69312858D1
DE69312858D1 DE69312858T DE69312858T DE69312858D1 DE 69312858 D1 DE69312858 D1 DE 69312858D1 DE 69312858 T DE69312858 T DE 69312858T DE 69312858 T DE69312858 T DE 69312858T DE 69312858 D1 DE69312858 D1 DE 69312858D1
Authority
DE
Germany
Prior art keywords
oscillator
substrate bias
bias generator
generator
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69312858T
Other languages
English (en)
Other versions
DE69312858T2 (de
Inventor
Michael V Cordoba
Kim C Hardee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Promos Technologies Inc
Original Assignee
Nippon Steel Semiconductor Corp
United Memories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Semiconductor Corp, United Memories Inc filed Critical Nippon Steel Semiconductor Corp
Publication of DE69312858D1 publication Critical patent/DE69312858D1/de
Application granted granted Critical
Publication of DE69312858T2 publication Critical patent/DE69312858T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/462—Regulating voltage or current wherein the variable actually regulated by the final control device is dc as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
    • G05F1/465—Internal voltage generators for integrated circuits, e.g. step down generators
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/205—Substrate bias-voltage generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • G11C5/146—Substrate bias generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dc-Dc Converters (AREA)
  • Dram (AREA)
  • Logic Circuits (AREA)
DE69312858T 1992-10-22 1993-09-20 Substratvorspannungsgenerator ohne Oszillator Expired - Lifetime DE69312858T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/964,912 US5347172A (en) 1992-10-22 1992-10-22 Oscillatorless substrate bias generator

Publications (2)

Publication Number Publication Date
DE69312858D1 true DE69312858D1 (de) 1997-09-11
DE69312858T2 DE69312858T2 (de) 1998-02-19

Family

ID=25509149

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69312858T Expired - Lifetime DE69312858T2 (de) 1992-10-22 1993-09-20 Substratvorspannungsgenerator ohne Oszillator

Country Status (5)

Country Link
US (1) US5347172A (de)
EP (1) EP0596228B1 (de)
JP (1) JP2889979B2 (de)
KR (1) KR100278870B1 (de)
DE (1) DE69312858T2 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6424202B1 (en) * 1994-02-09 2002-07-23 Lsi Logic Corporation Negative voltage generator for use with N-well CMOS processes
JP3292417B2 (ja) * 1994-02-15 2002-06-17 三菱電機株式会社 半導体装置
KR0149224B1 (ko) * 1994-10-13 1998-10-01 김광호 반도체 집적장치의 내부전압 승압회로
US5670907A (en) * 1995-03-14 1997-09-23 Lattice Semiconductor Corporation VBB reference for pumped substrates
US5973956A (en) * 1995-07-31 1999-10-26 Information Storage Devices, Inc. Non-volatile electrically alterable semiconductor memory for analog and digital storage
US5694072A (en) * 1995-08-28 1997-12-02 Pericom Semiconductor Corp. Programmable substrate bias generator with current-mirrored differential comparator and isolated bulk-node sensing transistor for bias voltage control
JPH09330590A (ja) * 1996-06-07 1997-12-22 Mitsubishi Electric Corp 内部電圧検出回路、および基板電圧検出回路
TW362277B (en) * 1996-07-29 1999-06-21 Hynix Semiconductor Inc Charge pump for a semiconductor substrate
US6188590B1 (en) 1996-12-18 2001-02-13 Macronix International Co., Ltd. Regulator system for charge pump circuits
WO1998027477A1 (en) * 1996-12-18 1998-06-25 Macronix International Co., Ltd. A regulator system for charge pump circuits
KR100273208B1 (ko) * 1997-04-02 2000-12-15 김영환 반도체메모리장치의고효율전하펌프회로
JP3135859B2 (ja) * 1997-04-11 2001-02-19 株式会社リコー 基板バイアス回路
FR2773012B1 (fr) 1997-12-24 2001-02-02 Sgs Thomson Microelectronics Dispositif a pompe de charges negatives
FR2772941B1 (fr) * 1998-05-28 2002-10-11 Sgs Thomson Microelectronics Circuit de regulation d'une pompe de charges negatives
US6310789B1 (en) 1999-06-25 2001-10-30 The Procter & Gamble Company Dynamically-controlled, intrinsically regulated charge pump power converter
EP1190480B1 (de) 1999-06-25 2004-11-17 The Board of Trustees of the University of Illinois Batterie mit eingebautem dynamisch geschalteten kapazitiven leistungsumwandler
US6370046B1 (en) 2000-08-31 2002-04-09 The Board Of Trustees Of The University Of Illinois Ultra-capacitor based dynamically regulated charge pump power converter
JP2001332696A (ja) 2000-05-24 2001-11-30 Nec Corp 基板電位検知回路及び基板電位発生回路
US6486727B1 (en) * 2001-10-11 2002-11-26 Pericom Semiconductor Corp. Low-power substrate bias generator disabled by comparators for supply over-voltage protection and bias target voltage
DE10162309A1 (de) * 2001-12-19 2003-07-03 Philips Intellectual Property Verfahren und Anordnung zur Erhöhung der Sicherheit von Schaltkreisen gegen unbefugten Zugriff
WO2003063356A1 (en) * 2002-01-23 2003-07-31 Koninklijke Philips Electronics N.V. Intergrated circuit and battery powered electronic device
US6864664B2 (en) * 2003-06-06 2005-03-08 Sony Corporation Circuit for charging supplemental battery in portable electronic device
US7129771B1 (en) * 2003-12-23 2006-10-31 Transmeta Corporation Servo loop for well bias voltage source
US7012461B1 (en) 2003-12-23 2006-03-14 Transmeta Corporation Stabilization component for a substrate potential regulation circuit
US7649402B1 (en) * 2003-12-23 2010-01-19 Tien-Min Chen Feedback-controlled body-bias voltage source
KR100732756B1 (ko) * 2005-04-08 2007-06-27 주식회사 하이닉스반도체 전압 펌핑장치
KR100718037B1 (ko) * 2005-09-13 2007-05-14 주식회사 하이닉스반도체 반도체 메모리 장치의 기판 바이어스 전압 발생 회로
US8098089B2 (en) * 2006-07-28 2012-01-17 Stmicroelectronics S.R.L. Voltage booster
US9002447B2 (en) 2013-03-14 2015-04-07 Medtronic, Inc. Implantable medical device having power supply for generating a regulated power supply

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4142114A (en) * 1977-07-18 1979-02-27 Mostek Corporation Integrated circuit with threshold regulation
US4356412A (en) * 1979-03-05 1982-10-26 Motorola, Inc. Substrate bias regulator
JPS55162257A (en) * 1979-06-05 1980-12-17 Fujitsu Ltd Semiconductor element having substrate bias generator circuit
JPS5785253A (en) * 1980-11-17 1982-05-27 Toshiba Corp Semiconductor device
US4401897A (en) * 1981-03-17 1983-08-30 Motorola, Inc. Substrate bias voltage regulator
US4739191A (en) * 1981-04-27 1988-04-19 Signetics Corporation Depletion-mode FET for the regulation of the on-chip generated substrate bias voltage
US4553047A (en) * 1983-01-06 1985-11-12 International Business Machines Corporation Regulator for substrate voltage generator
US4585954A (en) * 1983-07-08 1986-04-29 Texas Instruments Incorporated Substrate bias generator for dynamic RAM having variable pump current level
US4581546A (en) * 1983-11-02 1986-04-08 Inmos Corporation CMOS substrate bias generator having only P channel transistors in the charge pump
NL8701278A (nl) * 1987-05-29 1988-12-16 Philips Nv Geintegreerde cmos-schakeling met een substraatvoorspanningsgenerator.
JPS6445157A (en) * 1987-08-13 1989-02-17 Toshiba Corp Semiconductor integrated circuit
US4883976A (en) * 1987-12-02 1989-11-28 Xicor, Inc. Low power dual-mode CMOS bias voltage generator
JP2568442B2 (ja) * 1989-07-14 1997-01-08 セイコー電子工業株式会社 半導体集積回路装置
US5220534A (en) * 1990-07-31 1993-06-15 Texas Instruments, Incorporated Substrate bias generator system
JP2870277B2 (ja) * 1991-01-29 1999-03-17 日本電気株式会社 ダイナミック型ランダムアクセスメモリ装置
JPH04255989A (ja) * 1991-02-07 1992-09-10 Mitsubishi Electric Corp 半導体記憶装置および内部電圧発生方法
US5126590A (en) * 1991-06-17 1992-06-30 Micron Technology, Inc. High efficiency charge pump

Also Published As

Publication number Publication date
KR100278870B1 (ko) 2001-01-15
JP2889979B2 (ja) 1999-05-10
EP0596228A1 (de) 1994-05-11
US5347172A (en) 1994-09-13
KR940009802A (ko) 1994-05-24
EP0596228B1 (de) 1997-08-06
JPH06303765A (ja) 1994-10-28
DE69312858T2 (de) 1998-02-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: MOSEL VITELIC INC., HSINCHU, TW

8328 Change in the person/name/address of the agent

Representative=s name: WEICKMANN & WEICKMANN, 81679 MUENCHEN

8327 Change in the person/name/address of the patent owner

Owner name: PROMOS TECHNOLOGIES, INC., HSINCHU, TW