DE69303893D1 - Betatigungseinheiten und mikrosensoren in soi-technik - Google Patents

Betatigungseinheiten und mikrosensoren in soi-technik

Info

Publication number
DE69303893D1
DE69303893D1 DE69303893T DE69303893T DE69303893D1 DE 69303893 D1 DE69303893 D1 DE 69303893D1 DE 69303893 T DE69303893 T DE 69303893T DE 69303893 T DE69303893 T DE 69303893T DE 69303893 D1 DE69303893 D1 DE 69303893D1
Authority
DE
Germany
Prior art keywords
diaphragm
microsensors
actuators
silicon
soi technology
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69303893T
Other languages
English (en)
Other versions
DE69303893T2 (de
Inventor
Paul Zavracky
Richard Morrison
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kopin Corp
Original Assignee
Kopin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kopin Corp filed Critical Kopin Corp
Application granted granted Critical
Publication of DE69303893D1 publication Critical patent/DE69303893D1/de
Publication of DE69303893T2 publication Critical patent/DE69303893T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/0051Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance
    • G01L9/0052Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements
    • G01L9/0055Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements bonded on a diaphragm
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/0042Constructional details associated with semiconductive diaphragm sensors, e.g. etching, or constructional details of non-semiconductive diaphragms
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/0072Transmitting or indicating the displacement of flexible diaphragms using variations in capacitance
    • G01L9/0073Transmitting or indicating the displacement of flexible diaphragms using variations in capacitance using a semiconductive diaphragm
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0802Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/12Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
    • G01P15/123Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0822Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
    • G01P2015/0825Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
    • G01P2015/0828Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type being suspended at one of its longitudinal ends
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/43Electric condenser making
    • Y10T29/435Solid dielectric type

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Measuring Fluid Pressure (AREA)
  • Pressure Sensors (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
DE69303893T 1992-03-06 1993-03-05 Betatigungseinheiten und mikrosensoren in soi-technik Expired - Fee Related DE69303893T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/847,690 US5177661A (en) 1989-01-13 1992-03-06 SOI diaphgram sensor
PCT/US1993/001952 WO1993018382A1 (en) 1992-03-06 1993-03-05 Soi actuators and microsensors

Publications (2)

Publication Number Publication Date
DE69303893D1 true DE69303893D1 (de) 1996-09-05
DE69303893T2 DE69303893T2 (de) 1996-11-28

Family

ID=25301252

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69303893T Expired - Fee Related DE69303893T2 (de) 1992-03-06 1993-03-05 Betatigungseinheiten und mikrosensoren in soi-technik

Country Status (7)

Country Link
US (2) US5177661A (de)
EP (1) EP0629286B1 (de)
JP (1) JPH07504509A (de)
AT (1) ATE141008T1 (de)
CA (1) CA2130677A1 (de)
DE (1) DE69303893T2 (de)
WO (1) WO1993018382A1 (de)

Families Citing this family (95)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5177661A (en) * 1989-01-13 1993-01-05 Kopin Corporation SOI diaphgram sensor
US5490034A (en) * 1989-01-13 1996-02-06 Kopin Corporation SOI actuators and microsensors
US5258325A (en) * 1990-12-31 1993-11-02 Kopin Corporation Method for manufacturing a semiconductor device using a circuit transfer film
US5767405A (en) 1992-04-07 1998-06-16 The Charles Stark Draper Laboratory, Inc. Comb-drive micromechanical tuning fork gyroscope with piezoelectric readout
JP2769661B2 (ja) * 1992-09-29 1998-06-25 三菱電機株式会社 半導体装置およびその製造方法
US5369544A (en) * 1993-04-05 1994-11-29 Ford Motor Company Silicon-on-insulator capacitive surface micromachined absolute pressure sensor
US20030199179A1 (en) * 1993-11-16 2003-10-23 Formfactor, Inc. Contact tip structure for microelectronic interconnection elements and method of making same
US20020053734A1 (en) 1993-11-16 2002-05-09 Formfactor, Inc. Probe card assembly and kit, and methods of making same
US7073254B2 (en) * 1993-11-16 2006-07-11 Formfactor, Inc. Method for mounting a plurality of spring contact elements
SE9304145D0 (sv) * 1993-12-10 1993-12-10 Pharmacia Lkb Biotech Sätt att tillverka hålrumsstrukturer
US5415726A (en) * 1993-12-21 1995-05-16 Delco Electronics Corporation Method of making a bridge-supported accelerometer structure
KR0132490B1 (ko) * 1994-07-21 1998-04-16 문정환 박막트랜지스터 제조방법
US5646348A (en) 1994-08-29 1997-07-08 The Charles Stark Draper Laboratory, Inc. Micromechanical sensor with a guard band electrode and fabrication technique therefor
US5581035A (en) 1994-08-29 1996-12-03 The Charles Stark Draper Laboratory, Inc. Micromechanical sensor with a guard band electrode
US5894452A (en) * 1994-10-21 1999-04-13 The Board Of Trustees Of The Leland Stanford Junior University Microfabricated ultrasonic immersion transducer
FI100918B (fi) * 1995-02-17 1998-03-13 Vaisala Oy Pintamikromekaaninen, symmetrinen paine-eroanturi
JPH08274350A (ja) * 1995-03-29 1996-10-18 Yokogawa Electric Corp 半導体圧力センサ及びその製造方法
US5578528A (en) * 1995-05-02 1996-11-26 Industrial Technology Research Institute Method of fabrication glass diaphragm on silicon macrostructure
US5567332A (en) * 1995-06-09 1996-10-22 Fsi International Micro-machine manufacturing process
FR2736654B1 (fr) * 1995-07-13 1997-08-22 Commissariat Energie Atomique Procede de fabrication d'elements de microstructures flottants rigides et dispositif equipe de tels elements
JPH0983029A (ja) * 1995-09-11 1997-03-28 Mitsubishi Electric Corp 薄膜圧電素子の製造方法
US8033838B2 (en) * 1996-02-21 2011-10-11 Formfactor, Inc. Microelectronic contact structure
JP2001511884A (ja) * 1996-07-10 2001-08-14 ハネウェル データ インスツルメンツ インコーポレイテッド 誤差補償を有する圧力変換器
EP0890998A1 (de) * 1997-07-07 1999-01-13 STMicroelectronics S.r.l. Herstellungsverfahren und integrierter piezoresistiver Drucksensor mit einem Diaphragma aus polykristallinem Halbleitermaterial
US6472244B1 (en) 1996-07-31 2002-10-29 Sgs-Thomson Microelectronics S.R.L. Manufacturing method and integrated microstructures of semiconductor material and integrated piezoresistive pressure sensor having a diaphragm of polycrystalline semiconductor material
DE19648424C1 (de) * 1996-11-22 1998-06-25 Siemens Ag Mikromechanischer Sensor
SG86994A1 (en) * 1997-07-11 2002-03-19 Inst Of Microelectronics Nat U Method of fabricating a silicon microphone
JP3426498B2 (ja) * 1997-08-13 2003-07-14 株式会社日立ユニシアオートモティブ 圧力センサ
US5982709A (en) * 1998-03-31 1999-11-09 The Board Of Trustees Of The Leland Stanford Junior University Acoustic transducers and method of microfabrication
TW471002B (en) 1998-08-27 2002-01-01 Siemens Ag Micro-mechanical components with closed membrane-openings
DE19839606C1 (de) 1998-08-31 2000-04-27 Siemens Ag Mikromechanisches Bauelement und Verfahren zu dessen Herstellung
US6002507A (en) 1998-12-01 1999-12-14 Xerox Corpoation Method and apparatus for an integrated laser beam scanner
USRE38437E1 (en) 1998-12-01 2004-02-24 Xerox Corporation Method and apparatus for an integrated laser beam scanner using a carrier substrate
EP1144977B1 (de) * 1998-12-15 2003-10-15 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. Verfahren zum erzeugen eines mikro-elektromechanischen elements
US6297069B1 (en) * 1999-01-28 2001-10-02 Honeywell Inc. Method for supporting during fabrication mechanical members of semi-conductive dies, wafers, and devices and an associated intermediate device assembly
US6232139B1 (en) * 1999-01-29 2001-05-15 Sandia Corporation Method of making suspended thin-film semiconductor piezoelectric devices
US6056888A (en) * 1999-04-19 2000-05-02 Motorola, Inc. Electronic component and method of manufacture
US6272928B1 (en) * 2000-01-24 2001-08-14 Kulite Semiconductor Products Hermetically sealed absolute and differential pressure transducer
DE10024266B4 (de) * 2000-05-17 2010-06-17 Robert Bosch Gmbh Verfahren zur Herstellung eines mikromechanischen Bauelements
US6521965B1 (en) * 2000-09-12 2003-02-18 Robert Bosch Gmbh Integrated pressure sensor
FI112644B (fi) * 2000-11-10 2003-12-31 Vaisala Oyj Pintamikromekaaninen absoluuttipaineanturi ja menetelmä sen valmistamiseksi
US6441503B1 (en) 2001-01-03 2002-08-27 Amkor Technology, Inc. Bond wire pressure sensor die package
US6420201B1 (en) * 2001-01-03 2002-07-16 Amkor Technology, Inc. Method for forming a bond wire pressure sensor die package
US6432737B1 (en) 2001-01-03 2002-08-13 Amkor Technology, Inc. Method for forming a flip chip pressure sensor die package
FR2822541B1 (fr) 2001-03-21 2003-10-03 Commissariat Energie Atomique Procedes et dispositifs de fabrication de detecteurs de rayonnement
US6552404B1 (en) * 2001-04-17 2003-04-22 Analog Devices, Inc. Integratable transducer structure
US6661080B1 (en) 2001-06-28 2003-12-09 Amkor Technology, Inc. Structure for backside saw cavity protection
US6586824B1 (en) 2001-07-26 2003-07-01 Amkor Technology, Inc. Reduced thickness packaged electronic device
AU2002342150A1 (en) 2001-10-30 2003-05-12 George S. Lesinski Implantation method for a hearing aid microactuator implanted into the cochlea
US6755982B2 (en) * 2002-01-07 2004-06-29 Xerox Corporation Self-aligned micro hinges
US6828171B2 (en) * 2002-01-16 2004-12-07 Xerox Corporation Systems and methods for thermal isolation of a silicon structure
US6759264B2 (en) * 2002-05-17 2004-07-06 Ligh Tuning Technology Inc. Pressure type fingerprint sensor fabrication method
KR100479687B1 (ko) * 2002-05-30 2005-03-30 한국과학기술연구원 캔틸레버 센서 및 그 제조 방법
KR100725010B1 (ko) * 2003-05-26 2007-06-04 가부시키가이샤 무라타 세이사쿠쇼 압전 전자 부품, 및 그 제조방법, 통신기
JP2005201818A (ja) * 2004-01-16 2005-07-28 Alps Electric Co Ltd 圧力センサ
US7118991B2 (en) * 2004-04-01 2006-10-10 Delphi Technologies, Inc. Encapsulation wafer process
KR100605368B1 (ko) * 2004-10-20 2006-07-28 삼성전자주식회사 Soi기판, 그 제조방법, 그리고, 그 soi기판을이용한 부유 구조체 제조 방법
US7017418B1 (en) * 2004-12-15 2006-03-28 General Electric Company System and method for sensing pressure
DE602005025534D1 (de) * 2005-01-31 2011-02-03 Freescale Semiconductor Inc
US7884432B2 (en) * 2005-03-22 2011-02-08 Ametek, Inc. Apparatus and methods for shielding integrated circuitry
US7371601B2 (en) * 2005-05-12 2008-05-13 Delphi Technologies, Inc. Piezoresistive sensing structure
TWI270667B (en) * 2005-06-01 2007-01-11 Touch Micro System Tech Method of calibrating zero offset of a pressure sensor
US7231828B2 (en) * 2005-09-23 2007-06-19 Kulite Semiconductor Products, Inc. High temperature pressure sensing system
DE102005060855A1 (de) * 2005-12-20 2007-06-28 Robert Bosch Gmbh Mikromechanischer kapazitiver Druckwandler und Herstellungsverfahren
US7709264B2 (en) * 2006-09-21 2010-05-04 Philip Morris Usa Inc. Handheld microcantilever-based sensor for detecting tobacco-specific nitrosamines
CA2623793C (en) * 2008-03-03 2010-11-23 Schlumberger Canada Limited Microfluidic apparatus and method for measuring thermo-physical properties of a reservoir fluid
DE102008040521A1 (de) * 2008-07-18 2010-01-21 Robert Bosch Gmbh Verfahren zur Herstellung eines Bauelements, Verfahren zur Herstellung einer Bauelementanordnung, Bauelement und Bauelementanordnung
WO2011013111A2 (en) 2009-07-31 2011-02-03 Schlumberger Canada Limited Pressure measurement of a reservoir fluid in a microfluidic device
US9131896B2 (en) * 2009-08-12 2015-09-15 Medos International S.A.R.L. In situ offset compensation for pressure sensors
FR2959564B1 (fr) 2010-04-28 2012-06-08 Commissariat Energie Atomique Dispositif formant manometre destine a la mesure de pression de fluide diphasique, procede de realisation et reseau fluidique associes
US20120194286A1 (en) * 2011-02-01 2012-08-02 Baolab Microsystems Sl Methods and systems for mems cmos devices having arrays of elements
JP5828378B2 (ja) * 2011-06-20 2015-12-02 セイコーエプソン株式会社 圧力センサーデバイスの製造方法
US9105492B2 (en) 2012-05-08 2015-08-11 LuxVue Technology Corporation Compliant micro device transfer head
US8415768B1 (en) 2012-07-06 2013-04-09 LuxVue Technology Corporation Compliant monopolar micro device transfer head with silicon electrode
US8791530B2 (en) * 2012-09-06 2014-07-29 LuxVue Technology Corporation Compliant micro device transfer head with integrated electrode leads
WO2014076620A2 (en) * 2012-11-14 2014-05-22 Vectorious Medical Technologies Ltd. Drift compensation for implanted capacitance-based pressure transducer
US9236815B2 (en) 2012-12-10 2016-01-12 LuxVue Technology Corporation Compliant micro device transfer head array with metal electrodes
WO2014170771A1 (en) 2013-04-18 2014-10-23 Vectorious Medical Technologies Ltd. Remotely powered sensory implant
US10205488B2 (en) 2013-04-18 2019-02-12 Vectorious Medical Technologies Ltd. Low-power high-accuracy clock harvesting in inductive coupling systems
WO2017115112A1 (en) 2015-12-30 2017-07-06 Vectorious Medical Technologies Ltd. Power-efficient pressure-sensor implant
EP3008553B1 (de) 2013-06-12 2023-06-07 Rohinni, Inc. Tastaturrückbeleuchtung mit abgelagerten lichterzeugungsquellen
WO2015013828A1 (en) 2013-08-02 2015-02-05 Motion Engine Inc. Mems motion sensor and method of manufacturing
US20170030788A1 (en) 2014-04-10 2017-02-02 Motion Engine Inc. Mems pressure sensor
US11674803B2 (en) 2014-06-02 2023-06-13 Motion Engine, Inc. Multi-mass MEMS motion sensor
US11287486B2 (en) 2014-12-09 2022-03-29 Motion Engine, Inc. 3D MEMS magnetometer and associated methods
WO2016178196A2 (en) 2015-05-07 2016-11-10 Vectorious Medical Technologies Ltd. Heart implant with septum gripper
DE102015119272A1 (de) * 2015-11-09 2017-05-11 Endress+Hauser Gmbh+Co. Kg Kapazitiver Drucksensor und Verfahren zu dessen Herstellung
KR102298484B1 (ko) 2016-01-15 2021-09-03 로히니, 엘엘씨. 장치 상의 커버를 통해 후면 발광하는 장치 및 방법
DE102016200497A1 (de) * 2016-01-15 2017-07-20 Robert Bosch Gmbh Verfahren zum Herstellen eines mikromechanischen Bauelements
US10017381B2 (en) * 2016-04-04 2018-07-10 Innovative Micro Technology Microfabricated pressure transducer
EP3258235A1 (de) 2016-06-16 2017-12-20 Huba Control Ag Differenzialdruckwandler
PL3392633T3 (pl) 2017-04-19 2020-06-01 Huba Control Ag Przetwornik ciśnienia
CN108862186B (zh) * 2018-07-13 2021-07-06 河南汇纳科技有限公司 一种多传感器的协同制造工艺流程
CN209857926U (zh) * 2019-02-12 2019-12-27 精量电子(深圳)有限公司 传感器
PL3748323T3 (pl) 2019-06-03 2022-05-02 Huba Control Ag Przetwornik różnicy ciśnień

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3758830A (en) * 1972-04-10 1973-09-11 Hewlett Packard Co Transducer formed in peripherally supported thin semiconductor web
US3893228A (en) * 1972-10-02 1975-07-08 Motorola Inc Silicon pressure sensor
US3938175A (en) * 1974-04-24 1976-02-10 General Motors Corporation Polycrystalline silicon pressure transducer
US4003127A (en) * 1974-11-25 1977-01-18 General Motors Corporation Polycrystalline silicon pressure transducer
US4040172A (en) * 1975-05-01 1977-08-09 Kulite Semiconductor Products, Inc. Method of manufacturing integral transducer assemblies employing built-in pressure limiting
US4208782A (en) * 1977-12-12 1980-06-24 Kulite Semiconductor Products, Inc. Methods of fabricating transducers employing flat bondable surfaces with buried contact areas
US4222815A (en) * 1979-06-04 1980-09-16 The Babcock & Wilcox Company Isotropic etching of silicon strain gages
US4332000A (en) * 1980-10-03 1982-05-25 International Business Machines Corporation Capacitive pressure transducer
GB8506589D0 (en) * 1985-03-14 1985-04-17 Ici Plc Pressure sensor
US4592238A (en) * 1985-04-15 1986-06-03 Gould Inc. Laser-recrystallized diaphragm pressure sensor and method of making
US4665610A (en) * 1985-04-22 1987-05-19 Stanford University Method of making a semiconductor transducer having multiple level diaphragm structure
US4744863A (en) * 1985-04-26 1988-05-17 Wisconsin Alumni Research Foundation Sealed cavity semiconductor pressure transducers and method of producing the same
US4982351A (en) * 1986-05-05 1991-01-01 Texas Instruments Incorporated Low cost high precision sensor
JPH0750789B2 (ja) * 1986-07-18 1995-05-31 日産自動車株式会社 半導体圧力変換装置の製造方法
GB2198611B (en) * 1986-12-13 1990-04-04 Spectrol Reliance Ltd Method of forming a sealed diaphragm on a substrate
GB2198610B (en) * 1986-12-13 1990-04-04 Spectrol Reliance Ltd Method of producing a diaphragm on a substrate
JP2508070B2 (ja) * 1987-04-08 1996-06-19 日本電装株式会社 圧力検出素子及びその製造方法
US4812801A (en) * 1987-05-14 1989-03-14 The United States Of America As Represented By The Secretary Of The Air Force Solid state gas pressure sensor
JPH0797642B2 (ja) * 1987-05-15 1995-10-18 日産自動車株式会社 圧力変換装置の製造方法
JPH01136378A (ja) * 1987-11-24 1989-05-29 Nissan Motor Co Ltd 圧力変換装置の製造方法
US4816125A (en) * 1987-11-25 1989-03-28 The Regents Of The University Of California IC processed piezoelectric microphone
US4783821A (en) * 1987-11-25 1988-11-08 The Regents Of The University Of California IC processed piezoelectric microphone
JPH01145872A (ja) * 1987-12-02 1989-06-07 Yokogawa Electric Corp 半導体圧力センサの製造方法
US4904978A (en) * 1988-04-29 1990-02-27 Solartron Electronics, Inc. Mechanical sensor for high temperature environments
US4808549A (en) * 1988-05-27 1989-02-28 Ford Motor Company Method for fabricating a silicon force transducer
US4849070A (en) * 1988-09-14 1989-07-18 The United States Of America As Represented By The Secretary Of The Army Process for fabricating three-dimensional, free-standing microstructures
US5177661A (en) * 1989-01-13 1993-01-05 Kopin Corporation SOI diaphgram sensor
US5095401A (en) * 1989-01-13 1992-03-10 Kopin Corporation SOI diaphragm sensor
US5258097A (en) * 1992-11-12 1993-11-02 Ford Motor Company Dry-release method for sacrificial layer microstructure fabrication

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WO1993018382A1 (en) 1993-09-16
US5493470A (en) 1996-02-20
ATE141008T1 (de) 1996-08-15
CA2130677A1 (en) 1993-09-07
JPH07504509A (ja) 1995-05-18
DE69303893T2 (de) 1996-11-28
US5177661A (en) 1993-01-05
EP0629286B1 (de) 1996-07-31
EP0629286A1 (de) 1994-12-21

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