DE69207303D1 - Fluessiges reinigungsmittel fuer halbleitersubstrat - Google Patents
Fluessiges reinigungsmittel fuer halbleitersubstratInfo
- Publication number
- DE69207303D1 DE69207303D1 DE69207303T DE69207303T DE69207303D1 DE 69207303 D1 DE69207303 D1 DE 69207303D1 DE 69207303 T DE69207303 T DE 69207303T DE 69207303 T DE69207303 T DE 69207303T DE 69207303 D1 DE69207303 D1 DE 69207303D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor substrate
- liquid cleaner
- cleaner
- liquid
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B15/00—Peroxides; Peroxyhydrates; Peroxyacids or salts thereof; Superoxides; Ozonides
- C01B15/01—Hydrogen peroxide
- C01B15/037—Stabilisation by additives
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03055736A JP3075290B2 (ja) | 1991-02-28 | 1991-02-28 | 半導体基板の洗浄液 |
PCT/JP1992/000219 WO1992016017A1 (en) | 1991-02-28 | 1992-02-28 | Cleaning liquid for semiconductor substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69207303D1 true DE69207303D1 (de) | 1996-02-15 |
DE69207303T2 DE69207303T2 (de) | 1996-05-15 |
Family
ID=13007140
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69207303T Expired - Fee Related DE69207303T2 (de) | 1991-02-28 | 1992-02-28 | Fluessiges reinigungsmittel fuer halbleitersubstrat |
Country Status (6)
Country | Link |
---|---|
US (1) | US5302311A (de) |
EP (1) | EP0528053B1 (de) |
JP (1) | JP3075290B2 (de) |
KR (1) | KR100199687B1 (de) |
DE (1) | DE69207303T2 (de) |
WO (1) | WO1992016017A1 (de) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW263531B (de) * | 1992-03-11 | 1995-11-21 | Mitsubishi Gas Chemical Co | |
JP3074366B2 (ja) * | 1993-02-22 | 2000-08-07 | 東京エレクトロン株式会社 | 処理装置 |
US5950645A (en) | 1993-10-20 | 1999-09-14 | Verteq, Inc. | Semiconductor wafer cleaning system |
US5656097A (en) * | 1993-10-20 | 1997-08-12 | Verteq, Inc. | Semiconductor wafer cleaning system |
TW274630B (de) * | 1994-01-28 | 1996-04-21 | Wako Zunyaku Kogyo Kk | |
US5637151A (en) * | 1994-06-27 | 1997-06-10 | Siemens Components, Inc. | Method for reducing metal contamination of silicon wafers during semiconductor manufacturing |
JPH08162425A (ja) * | 1994-12-06 | 1996-06-21 | Mitsubishi Electric Corp | 半導体集積回路装置の製造方法および製造装置 |
US5712168A (en) * | 1995-02-03 | 1998-01-27 | Imec | Method for evaluating, monitoring or controlling the efficiency, stability, or exhaustion of a complexing or chelating agent present in a chemical solution used for oxidizing, dissolving, etching or stripping a semiconductor wafer |
US5725678A (en) * | 1995-03-06 | 1998-03-10 | The Penn State Research Foundation | Aqueous-based cleaner for the removal of residue |
US5885362A (en) * | 1995-07-27 | 1999-03-23 | Mitsubishi Chemical Corporation | Method for treating surface of substrate |
US6884557B2 (en) * | 1995-12-14 | 2005-04-26 | Fuji Photo Film Co., Ltd. | Desensitizing treatment liquid for lithographic printing |
US5674826A (en) * | 1996-01-02 | 1997-10-07 | Mcmullen; Robert W. | Cleaning composition |
US6905550B2 (en) * | 1996-05-06 | 2005-06-14 | Princeton Trade & Technology, Inc. | Method of removing organic materials using aqueous cleaning solutions |
US6410494B2 (en) * | 1996-06-05 | 2002-06-25 | Wako Pure Chemical Industries, Ltd. | Cleaning agent |
DE19631363C1 (de) * | 1996-08-02 | 1998-02-12 | Siemens Ag | Wässrige Reinigungslösung für ein Halbleitersubstrat |
KR100497835B1 (ko) | 1997-01-27 | 2005-09-08 | 미쓰비시 가가꾸 가부시키가이샤 | 표면처리조성물및이를이용한기판의표면처리방법 |
US6066609A (en) * | 1997-07-31 | 2000-05-23 | Siemens Aktiengesellschaft | Aqueous solution for cleaning a semiconductor substrate |
US5962384A (en) * | 1997-10-28 | 1999-10-05 | International Business Machines Corporation | Method for cleaning semiconductor devices |
US6063205A (en) * | 1998-01-28 | 2000-05-16 | Cooper; Steven P. | Use of H2 O2 solution as a method of post lap cleaning |
JP3111979B2 (ja) | 1998-05-20 | 2000-11-27 | 日本電気株式会社 | ウエハの洗浄方法 |
TW467953B (en) * | 1998-11-12 | 2001-12-11 | Mitsubishi Gas Chemical Co | New detergent and cleaning method of using it |
SG73683A1 (en) | 1998-11-24 | 2000-06-20 | Texas Instruments Inc | Stabilized slurry compositions |
EP1018759A3 (de) * | 1999-01-08 | 2000-08-30 | Interuniversitair Micro-Elektronica Centrum Vzw | Chemische Lösung und Verfahren zur Verminderung der Metallkontamination auf der Oberfläche eines Halbleitersubstrats |
US6592676B1 (en) | 1999-01-08 | 2003-07-15 | Interuniversitair Micro-Elektronica Centrum | Chemical solution and method for reducing the metal contamination on the surface of a semiconductor substrate |
EP1039518A1 (de) * | 1999-03-24 | 2000-09-27 | Interuniversitair Micro-Elektronica Centrum Vzw | Chemische Lösung und Verfahren zur Verminderung der Metallkontamination auf der Oberfläche eines Halbleitersubstrats |
EP1091395A1 (de) * | 1999-09-30 | 2001-04-11 | Interuniversitair Microelektronica Centrum Vzw | Reinigungslösung für Behandlung von Halbleitersubstraten |
US7456113B2 (en) * | 2000-06-26 | 2008-11-25 | Applied Materials, Inc. | Cleaning method and solution for cleaning a wafer in a single wafer process |
US6927176B2 (en) | 2000-06-26 | 2005-08-09 | Applied Materials, Inc. | Cleaning method and solution for cleaning a wafer in a single wafer process |
WO2002051961A2 (en) * | 2000-12-22 | 2002-07-04 | Interuniversitair Microelektronica Centrum (Imec) | Composition comprising an oxidizing and complexing compound |
US20040002430A1 (en) * | 2002-07-01 | 2004-01-01 | Applied Materials, Inc. | Using a time critical wafer cleaning solution by combining a chelating agent with an oxidizer at point-of-use |
EP1562225A4 (de) * | 2002-11-08 | 2007-04-18 | Wako Pure Chem Ind Ltd | Reinigungszusammensetzung und verfahren zum reinigen damit |
US7459005B2 (en) * | 2002-11-22 | 2008-12-02 | Akzo Nobel N.V. | Chemical composition and method |
DE602004009584T2 (de) * | 2003-06-27 | 2008-08-07 | Interuniversitair Microelektronica Centrum (Imec) | Halbleiterreinigungslösung |
US7432233B2 (en) * | 2003-12-18 | 2008-10-07 | Interuniversitair Microelektronica Centrum (Imec) | Composition and method for treating a semiconductor substrate |
US7431775B2 (en) * | 2004-04-08 | 2008-10-07 | Arkema Inc. | Liquid detergent formulation with hydrogen peroxide |
US7169237B2 (en) * | 2004-04-08 | 2007-01-30 | Arkema Inc. | Stabilization of alkaline hydrogen peroxide |
US7323421B2 (en) * | 2004-06-16 | 2008-01-29 | Memc Electronic Materials, Inc. | Silicon wafer etching process and composition |
US7045493B2 (en) * | 2004-07-09 | 2006-05-16 | Arkema Inc. | Stabilized thickened hydrogen peroxide containing compositions |
JP4431461B2 (ja) * | 2004-08-09 | 2010-03-17 | オプトレックス株式会社 | 表示装置の製造方法 |
US7776713B2 (en) * | 2007-05-30 | 2010-08-17 | Macronix International Co., Ltd. | Etching solution, method of surface modification of semiconductor substrate and method of forming shallow trench isolation |
SI2225175T1 (sl) | 2007-12-12 | 2013-04-30 | Akzo Nobel N.V. | Stabilizirane raztopine vodikovega peroksida |
JP5278492B2 (ja) * | 2010-06-16 | 2013-09-04 | 株式会社デンソー | 半導体装置の製造方法 |
US10935896B2 (en) * | 2016-07-25 | 2021-03-02 | Applied Materials, Inc. | Cleaning solution mixing system with ultra-dilute cleaning solution and method of operation thereof |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL130828C (de) * | 1959-06-03 | |||
US3234140A (en) * | 1964-06-05 | 1966-02-08 | Monsanto Co | Stabilization of peroxy solutions |
US3701825A (en) * | 1970-10-23 | 1972-10-31 | Fmc Corp | Stabilization of hydrogen peroxide with ethylenediamine tetra (methylenephosphonic acid) |
JPS5634637B2 (de) * | 1973-07-02 | 1981-08-11 | ||
JPS5921994B2 (ja) * | 1977-09-03 | 1984-05-23 | 貴和子 佐藤 | 飯と墨とで布地を染める方法 |
US4304762A (en) * | 1978-09-27 | 1981-12-08 | Lever Brothers Company | Stabilization of hydrogen peroxide |
US4497725A (en) * | 1980-04-01 | 1985-02-05 | Interox Chemicals Ltd. | Aqueous bleach compositions |
US4614646A (en) * | 1984-12-24 | 1986-09-30 | The Dow Chemical Company | Stabilization of peroxide systems in the presence of alkaline earth metal ions |
JPS61294824A (ja) * | 1985-06-21 | 1986-12-25 | Nec Corp | 半導体集積回路の製造装置 |
GB8701759D0 (en) * | 1987-01-27 | 1987-03-04 | Laporte Industries Ltd | Processing of semi-conductor materials |
JPH01154523A (ja) * | 1987-12-11 | 1989-06-16 | Fujitsu Ltd | シリコン層用洗浄液 |
US4808259A (en) * | 1988-01-25 | 1989-02-28 | Intel Corporation | Plasma etching process for MOS circuit pregate etching utiliizing a multi-step power reduction recipe |
JPH024991A (ja) * | 1988-06-23 | 1990-01-09 | Kao Corp | 金属洗浄用薬剤 |
DE3822350A1 (de) * | 1988-07-01 | 1990-01-04 | Siemens Ag | Verfahren zum entfernen von metall-verunreinigungen auf halbleiterkristalloberflaechen |
JPH02225684A (ja) * | 1989-02-27 | 1990-09-07 | C Uyemura & Co Ltd | 銅又は銅合金のスマット除去剤及び除去方法 |
JP2850395B2 (ja) * | 1989-08-31 | 1999-01-27 | 三菱瓦斯化学株式会社 | 過酸化水素組成物 |
JP3060499B2 (ja) * | 1989-09-01 | 2000-07-10 | 三菱瓦斯化学株式会社 | 過酸化水素の製造方法 |
CA2059841A1 (en) * | 1991-01-24 | 1992-07-25 | Ichiro Hayashida | Surface treating solutions and cleaning method |
-
1991
- 1991-02-28 JP JP03055736A patent/JP3075290B2/ja not_active Expired - Fee Related
-
1992
- 1992-02-28 DE DE69207303T patent/DE69207303T2/de not_active Expired - Fee Related
- 1992-02-28 US US07/927,282 patent/US5302311A/en not_active Expired - Lifetime
- 1992-02-28 WO PCT/JP1992/000219 patent/WO1992016017A1/ja active IP Right Grant
- 1992-02-28 EP EP92906248A patent/EP0528053B1/de not_active Expired - Lifetime
- 1992-09-23 KR KR1019920702311A patent/KR100199687B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100199687B1 (ko) | 1999-06-15 |
JPH06116770A (ja) | 1994-04-26 |
US5302311A (en) | 1994-04-12 |
EP0528053A4 (en) | 1993-06-30 |
DE69207303T2 (de) | 1996-05-15 |
EP0528053B1 (de) | 1996-01-03 |
JP3075290B2 (ja) | 2000-08-14 |
EP0528053A1 (de) | 1993-02-24 |
WO1992016017A1 (en) | 1992-09-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69207303D1 (de) | Fluessiges reinigungsmittel fuer halbleitersubstrat | |
DE69231409D1 (de) | Oberflächenmontierbare Halbleiterpackung | |
DE59207136D1 (de) | Direktes substratbonden | |
DE69229924D1 (de) | Oberflächenbehandeltes Substrat | |
DE69219268D1 (de) | Planarisierung eines Halbleitersubstrates | |
DE69328743D1 (de) | Halbleiteranordnung | |
DE69334253D1 (de) | Halbleitervorrichtung | |
DE69217772D1 (de) | Halbleiteranordnung vom Dünntyp | |
DE69210767D1 (de) | Substrat-Transport-Vorrichtung | |
DE69322565D1 (de) | Diamant-Halbleiteranordnung | |
DE69210063D1 (de) | Integrierte Halbleiter-Schaltungseinheit mit Detektionsschaltung für Substrat-Potential | |
DE69225801D1 (de) | Passivierung mit hoher leistung fuer halbleiteranordnungen | |
DE69101818D1 (de) | Halbleitersubstrat-Ätzgerät. | |
DE69312799D1 (de) | Optoelektronische Halbleiteranordnung | |
DE69226742D1 (de) | Halbleitervorrichtung | |
DE69222084D1 (de) | Oberflächenmontierbare Halbleiterpackung | |
DE69219509D1 (de) | Halbleiteranordnung mit Substrat | |
DE69223017D1 (de) | Verbindungshalbleiterbauelement | |
DE69210935D1 (de) | Halbleiteranordnung | |
ITMI920338A0 (it) | Dispositivo di isolamento del substrato | |
KR960015599U (ko) | 웨이퍼 저면 세척장치 | |
DE69417173D1 (de) | Keramiksubstrat für Halbleitervorrichtung | |
KR940008664U (ko) | 반도체 웨이퍼 세정장치 | |
KR970015302U (ko) | 반도체 웨이퍼 세정장치 | |
KR950002241U (ko) | 반도체 스크러빙용 캐치컵 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |