DE69205193D1 - Verfahren zum Herstellen einer Halbleiteranordnung mit einem Halbleiterkörper mit einer vergrabenen Silicidschicht. - Google Patents

Verfahren zum Herstellen einer Halbleiteranordnung mit einem Halbleiterkörper mit einer vergrabenen Silicidschicht.

Info

Publication number
DE69205193D1
DE69205193D1 DE69205193T DE69205193T DE69205193D1 DE 69205193 D1 DE69205193 D1 DE 69205193D1 DE 69205193 T DE69205193 T DE 69205193T DE 69205193 T DE69205193 T DE 69205193T DE 69205193 D1 DE69205193 D1 DE 69205193D1
Authority
DE
Germany
Prior art keywords
semiconductor
producing
silicide layer
buried silicide
semiconductor body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69205193T
Other languages
English (en)
Other versions
DE69205193T2 (de
Inventor
Ommen Alfred Hendrik Van
Jozef Jacobus Maria Ottenheim
Kempeneer Erik Hendrik Adol De
Hoften Gerrit Cornelis Van
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics NV filed Critical Philips Electronics NV
Publication of DE69205193D1 publication Critical patent/DE69205193D1/de
Application granted granted Critical
Publication of DE69205193T2 publication Critical patent/DE69205193T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26—Bombardment with radiation
    • H01L21/263—Bombardment with radiation with high-energy radiation
    • H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
    • H01L21/26506—Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/01—Manufacture or treatment
    • H10D30/012—Manufacture or treatment of static induction transistors [SIT], e.g. permeable base transistors [PBT]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
    • H10D48/01—Manufacture or treatment
    • H10D48/031—Manufacture or treatment of three-or-more electrode devices
    • H10D48/032—Manufacture or treatment of three-or-more electrode devices of unipolar transistors having ohmic electrodes on emitter-like, base-like, and collector-like regions, e.g. hot electron transistors [HET], metal base transistors [MBT], resonant tunneling transistors [RTT], bulk barrier transistors [BBT], planar doped barrier transistors [PDBT] or charge injection transistors [CHINT]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/147—Silicides

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Bipolar Transistors (AREA)
  • Electrodes Of Semiconductors (AREA)
DE69205193T 1991-03-21 1992-03-12 Verfahren zum Herstellen einer Halbleiteranordnung mit einem Halbleiterkörper mit einer vergrabenen Silicidschicht. Expired - Fee Related DE69205193T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP91200635 1991-03-21

Publications (2)

Publication Number Publication Date
DE69205193D1 true DE69205193D1 (de) 1995-11-09
DE69205193T2 DE69205193T2 (de) 1996-05-02

Family

ID=8207561

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69205193T Expired - Fee Related DE69205193T2 (de) 1991-03-21 1992-03-12 Verfahren zum Herstellen einer Halbleiteranordnung mit einem Halbleiterkörper mit einer vergrabenen Silicidschicht.

Country Status (4)

Country Link
US (1) US5236872A (de)
EP (1) EP0504987B1 (de)
JP (1) JPH07109833B2 (de)
DE (1) DE69205193T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5290715A (en) * 1991-12-31 1994-03-01 U.S. Philips Corporation Method of making dielectrically isolated metal base transistors and permeable base transistors
US5963838A (en) * 1993-06-22 1999-10-05 Kabushiki Kaisha Toshiba Method of manufacturing a semiconductor device having wiring layers within the substrate
US5661044A (en) * 1993-11-24 1997-08-26 Lockheed Martin Energy Systems, Inc. Processing method for forming dislocation-free SOI and other materials for semiconductor use
JP2978736B2 (ja) * 1994-06-21 1999-11-15 日本電気株式会社 半導体装置の製造方法
GB9525784D0 (en) * 1995-12-16 1996-02-14 Philips Electronics Nv Hot carrier transistors and their manufacture
US6803273B1 (en) * 1997-12-23 2004-10-12 Texas Instruments Incorporated Method to salicide source-line in flash memory with STI
US6841441B2 (en) 2003-01-08 2005-01-11 Chartered Semiconductor Manufacturing Ltd. Method to produce dual gates (one metal and one poly or metal silicide) for CMOS devices using sputtered metal deposition, metallic ion implantation, or silicon implantation, and laser annealing
FR2864336B1 (fr) * 2003-12-23 2006-04-28 Commissariat Energie Atomique Procede de scellement de deux plaques avec formation d'un contact ohmique entre celles-ci
US8089137B2 (en) 2009-01-07 2012-01-03 Macronix International Co., Ltd. Integrated circuit memory with single crystal silicon on silicide driver and manufacturing method
TWI398974B (zh) * 2009-01-07 2013-06-11 Macronix Int Co Ltd 具有單晶矽在矽化物上之積體電路元件及其製造方法
US8093661B2 (en) * 2009-01-07 2012-01-10 Macronix International Co., Ltd. Integrated circuit device with single crystal silicon on silicide and manufacturing method
KR101801077B1 (ko) * 2012-01-10 2017-11-27 삼성전자주식회사 매립 배선을 갖는 반도체 소자 형성 방법 및 관련된 소자

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE792589A (fr) * 1971-10-06 1973-03-30 Ibm Procede d'obtention de structures semiconductrices par implantation d'ions
US4096622A (en) * 1975-07-31 1978-06-27 General Motors Corporation Ion implanted Schottky barrier diode
US4558507A (en) * 1982-11-12 1985-12-17 Nec Corporation Method of manufacturing semiconductor device
JPS59210642A (ja) * 1983-05-16 1984-11-29 Hitachi Ltd 半導体装置の製造方法
JPS60117738A (ja) * 1983-11-30 1985-06-25 Sanken Electric Co Ltd 半導体装置の製造方法
US4875082A (en) * 1986-06-20 1989-10-17 Ford Aerospace Corporation Schottky barrier photodiode structure
SE454309B (sv) * 1986-08-29 1988-04-18 Stiftelsen Inst Mikrovags Forfarande att framstella tunna ledande eller halvledande skikt inbeddade i kisel medelst implantering av metallatomer
US4816421A (en) * 1986-11-24 1989-03-28 American Telephone And Telegraph Company, At&T Bell Laboratories Method of making a heteroepitaxial structure by mesotaxy induced by buried implantation
JPH02220444A (ja) * 1989-02-21 1990-09-03 Seiko Epson Corp 半導体装置製造方法
US5122479A (en) * 1991-04-11 1992-06-16 At&T Bell Laboratories Semiconductor device comprising a silicide layer, and method of making the device

Also Published As

Publication number Publication date
JPH07109833B2 (ja) 1995-11-22
EP0504987A2 (de) 1992-09-23
EP0504987A3 (en) 1992-10-21
EP0504987B1 (de) 1995-10-04
US5236872A (en) 1993-08-17
DE69205193T2 (de) 1996-05-02
JPH0590279A (ja) 1993-04-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee