DE69033135T2 - Verfahren zum Schneiden eines Substrates aus Silizium mittels einer preferentiellen Ätzung - Google Patents

Verfahren zum Schneiden eines Substrates aus Silizium mittels einer preferentiellen Ätzung

Info

Publication number
DE69033135T2
DE69033135T2 DE69033135T DE69033135T DE69033135T2 DE 69033135 T2 DE69033135 T2 DE 69033135T2 DE 69033135 T DE69033135 T DE 69033135T DE 69033135 T DE69033135 T DE 69033135T DE 69033135 T2 DE69033135 T2 DE 69033135T2
Authority
DE
Germany
Prior art keywords
cutting
silicon substrate
preferential etching
preferential
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69033135T
Other languages
English (en)
Other versions
DE69033135D1 (de
Inventor
Donald J Drake
William G Hawkins
Michael R Campanelli
Thomas A Tellier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xerox Corp
Original Assignee
Xerox Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xerox Corp filed Critical Xerox Corp
Publication of DE69033135D1 publication Critical patent/DE69033135D1/de
Application granted granted Critical
Publication of DE69033135T2 publication Critical patent/DE69033135T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1601Production of bubble jet print heads
    • B41J2/1603Production of bubble jet print heads of the front shooter type
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/1626Manufacturing processes etching
    • B41J2/1628Manufacturing processes etching dry etching
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/1626Manufacturing processes etching
    • B41J2/1629Manufacturing processes etching wet etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30604Chemical etching
    • H01L21/30608Anisotropic liquid etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/308Chemical or electrical treatment, e.g. electrolytic etching using masks
    • H01L21/3081Chemical or electrical treatment, e.g. electrolytic etching using masks characterised by their composition, e.g. multilayer masks, materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76898Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics formed through a semiconductor substrate

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
DE69033135T 1989-11-22 1990-11-22 Verfahren zum Schneiden eines Substrates aus Silizium mittels einer preferentiellen Ätzung Expired - Lifetime DE69033135T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/440,296 US4961821A (en) 1989-11-22 1989-11-22 Ode through holes and butt edges without edge dicing

Publications (2)

Publication Number Publication Date
DE69033135D1 DE69033135D1 (de) 1999-07-08
DE69033135T2 true DE69033135T2 (de) 1999-10-28

Family

ID=23748209

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69033135T Expired - Lifetime DE69033135T2 (de) 1989-11-22 1990-11-22 Verfahren zum Schneiden eines Substrates aus Silizium mittels einer preferentiellen Ätzung

Country Status (4)

Country Link
US (1) US4961821A (de)
EP (1) EP0430593B1 (de)
JP (1) JP3009449B2 (de)
DE (1) DE69033135T2 (de)

Families Citing this family (100)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5297260A (en) * 1986-03-12 1994-03-22 Hitachi, Ltd. Processor having a plurality of CPUS with one CPU being normally connected to common bus
US6379998B1 (en) * 1986-03-12 2002-04-30 Hitachi, Ltd. Semiconductor device and method for fabricating the same
DE19538634C2 (de) * 1995-10-17 1997-09-04 Itt Ind Gmbh Deutsche Verfahren zum Vereinzeln von elektronischen Elementen aus einem Halbleiterwafer
DE4012080A1 (de) * 1990-04-14 1991-10-17 Bosch Gmbh Robert Verfahren zum aufbau von mikromechanischen sensoren
US5041190A (en) * 1990-05-16 1991-08-20 Xerox Corporation Method of fabricating channel plates and ink jet printheads containing channel plates
US5131978A (en) * 1990-06-07 1992-07-21 Xerox Corporation Low temperature, single side, multiple step etching process for fabrication of small and large structures
US5097274A (en) * 1990-06-18 1992-03-17 Xerox Corporation Overlapping chip replaceable subunits, methods of making same, and methods of making RIS or ROS array bars incorporating these subunits
US5272114A (en) * 1990-12-10 1993-12-21 Amoco Corporation Method for cleaving a semiconductor crystal body
AU657930B2 (en) * 1991-01-30 1995-03-30 Canon Kabushiki Kaisha Nozzle structures for bubblejet print devices
DE69204828T2 (de) * 1992-06-09 1996-05-02 Ibm Herstellung von Laserdioden mit durch Spaltung erzeugten Stirnflächen auf einem vollständigen Wafer.
DE4220284C1 (de) * 1992-06-20 1993-09-30 Bosch Gmbh Robert Verfahren zum Zerteilen von Verbundwafern
JPH0690014A (ja) * 1992-07-22 1994-03-29 Mitsubishi Electric Corp 薄型太陽電池及びその製造方法,エッチング方法及び自動エッチング装置,並びに半導体装置の製造方法
US5387314A (en) * 1993-01-25 1995-02-07 Hewlett-Packard Company Fabrication of ink fill slots in thermal ink-jet printheads utilizing chemical micromachining
US5462636A (en) * 1993-12-28 1995-10-31 International Business Machines Corporation Method for chemically scribing wafers
JP3156896B2 (ja) * 1994-01-28 2001-04-16 富士通株式会社 半導体装置の製造方法およびかかる製造方法により製造された半導体装置
US5487483A (en) * 1994-05-24 1996-01-30 Xerox Corporation Nozzles for ink jet devices and method for microfabrication of the nozzles
US5596222A (en) * 1994-08-12 1997-01-21 The Charles Stark Draper Laboratory, Inc. Wafer of transducer chips
FR2727648B1 (fr) * 1994-12-01 1997-01-03 Commissariat Energie Atomique Procede de fabrication micromecanique de buses pour jets de liquide
US6465743B1 (en) * 1994-12-05 2002-10-15 Motorola, Inc. Multi-strand substrate for ball-grid array assemblies and method
US5620614A (en) * 1995-01-03 1997-04-15 Xerox Corporation Printhead array and method of producing a printhead die assembly that minimizes end channel damage
AU734775B2 (en) * 1995-06-30 2001-06-21 Canon Kabushiki Kaisha Manufacturing method of ink jet head
JP3343875B2 (ja) * 1995-06-30 2002-11-11 キヤノン株式会社 インクジェットヘッドの製造方法
US5658471A (en) * 1995-09-22 1997-08-19 Lexmark International, Inc. Fabrication of thermal ink-jet feed slots in a silicon substrate
US5851928A (en) * 1995-11-27 1998-12-22 Motorola, Inc. Method of etching a semiconductor substrate
US5901425A (en) 1996-08-27 1999-05-11 Topaz Technologies Inc. Inkjet print head apparatus
US5776798A (en) 1996-09-04 1998-07-07 Motorola, Inc. Semiconductor package and method thereof
US5971527A (en) * 1996-10-29 1999-10-26 Xerox Corporation Ink jet channel wafer for a thermal ink jet printhead
US5904548A (en) * 1996-11-21 1999-05-18 Texas Instruments Incorporated Trench scribe line for decreased chip spacing
US6093330A (en) * 1997-06-02 2000-07-25 Cornell Research Foundation, Inc. Microfabrication process for enclosed microstructures
JP3416468B2 (ja) * 1997-06-20 2003-06-16 キヤノン株式会社 Si異方性エッチング方法、インクジェットヘッド、及びその製造方法
US6712453B2 (en) 1997-07-15 2004-03-30 Silverbrook Research Pty Ltd. Ink jet nozzle rim
AUPP398798A0 (en) * 1998-06-09 1998-07-02 Silverbrook Research Pty Ltd Image creation method and apparatus (ij43)
US7468139B2 (en) 1997-07-15 2008-12-23 Silverbrook Research Pty Ltd Method of depositing heater material over a photoresist scaffold
US7556356B1 (en) 1997-07-15 2009-07-07 Silverbrook Research Pty Ltd Inkjet printhead integrated circuit with ink spread prevention
US6648453B2 (en) 1997-07-15 2003-11-18 Silverbrook Research Pty Ltd Ink jet printhead chip with predetermined micro-electromechanical systems height
US7195339B2 (en) 1997-07-15 2007-03-27 Silverbrook Research Pty Ltd Ink jet nozzle assembly with a thermal bend actuator
US6188415B1 (en) 1997-07-15 2001-02-13 Silverbrook Research Pty Ltd Ink jet printer having a thermal actuator comprising an external coil spring
US7465030B2 (en) 1997-07-15 2008-12-16 Silverbrook Research Pty Ltd Nozzle arrangement with a magnetic field generator
US6935724B2 (en) 1997-07-15 2005-08-30 Silverbrook Research Pty Ltd Ink jet nozzle having actuator with anchor positioned between nozzle chamber and actuator connection point
US7337532B2 (en) 1997-07-15 2008-03-04 Silverbrook Research Pty Ltd Method of manufacturing micro-electromechanical device having motion-transmitting structure
US6682174B2 (en) 1998-03-25 2004-01-27 Silverbrook Research Pty Ltd Ink jet nozzle arrangement configuration
US6156585A (en) * 1998-02-02 2000-12-05 Motorola, Inc. Semiconductor component and method of manufacture
US6013540A (en) * 1998-05-01 2000-01-11 Lucent Technologies, Inc. Laser diode with substrate-side protection
US6180536B1 (en) 1998-06-04 2001-01-30 Cornell Research Foundation, Inc. Suspended moving channels and channel actuators for microfluidic applications and method for making
US6066513A (en) * 1998-10-02 2000-05-23 International Business Machines Corporation Process for precise multichip integration and product thereof
US6507001B1 (en) 1999-01-19 2003-01-14 Xerox Corporation Nozzles for ink jet devices and laser ablating or precision injection molding methods for microfabrication of the nozzles
US6935023B2 (en) 2000-03-08 2005-08-30 Hewlett-Packard Development Company, L.P. Method of forming electrical connection for fluid ejection device
US6444499B1 (en) 2000-03-30 2002-09-03 Amkor Technology, Inc. Method for fabricating a snapable multi-package array substrate, snapable multi-package array and snapable packaged electronic components
JP2002103572A (ja) * 2000-09-27 2002-04-09 Kyocera Corp インクジェットプリンタ
US6629756B2 (en) 2001-02-20 2003-10-07 Lexmark International, Inc. Ink jet printheads and methods therefor
DE10122839B4 (de) * 2001-05-11 2007-11-29 Qimonda Ag Verfahren zum Vereinzeln von Halbleiterstrukturen sowie zum Vereinzeln vorbereitetes Halbleitersubstrat
US6805432B1 (en) * 2001-07-31 2004-10-19 Hewlett-Packard Development Company, L.P. Fluid ejecting device with fluid feed slot
SG102639A1 (en) * 2001-10-08 2004-03-26 Micron Technology Inc Apparatus and method for packing circuits
US6818464B2 (en) 2001-10-17 2004-11-16 Hymite A/S Double-sided etching technique for providing a semiconductor structure with through-holes, and a feed-through metalization process for sealing the through-holes
ITTO20011019A1 (it) 2001-10-25 2003-04-28 Olivetti I Jet Procedimento perfezionato per la costruzione di un condotto di alimentazione per una testina di stampa a getto di inchiostro.
US6942320B2 (en) * 2002-01-24 2005-09-13 Industrial Technology Research Institute Integrated micro-droplet generator
US7051426B2 (en) 2002-01-31 2006-05-30 Hewlett-Packard Development Company, L.P. Method making a cutting disk into of a substrate
US7105097B2 (en) * 2002-01-31 2006-09-12 Hewlett-Packard Development Company, L.P. Substrate and method of forming substrate for fluid ejection device
US6911155B2 (en) 2002-01-31 2005-06-28 Hewlett-Packard Development Company, L.P. Methods and systems for forming slots in a substrate
JP3856123B2 (ja) * 2002-04-17 2006-12-13 セイコーエプソン株式会社 マスク及びその製造方法、エレクトロルミネッセンス装置及びその製造方法並びに電子機器
JP2003311982A (ja) * 2002-04-23 2003-11-06 Canon Inc 液体吐出ヘッド
SG142115A1 (en) 2002-06-14 2008-05-28 Micron Technology Inc Wafer level packaging
KR100425331B1 (ko) * 2002-06-26 2004-03-30 삼성전자주식회사 잉크 젯 프린트 헤드의 제조 방법
US6902872B2 (en) 2002-07-29 2005-06-07 Hewlett-Packard Development Company, L.P. Method of forming a through-substrate interconnect
US6881600B2 (en) * 2002-07-29 2005-04-19 Digital Optics Corp Etching in combination with other processing techniques to facilitate alignment of a die in a system and structures formed thereby
US6716737B2 (en) 2002-07-29 2004-04-06 Hewlett-Packard Development Company, L.P. Method of forming a through-substrate interconnect
US6821450B2 (en) * 2003-01-21 2004-11-23 Hewlett-Packard Development Company, L.P. Substrate and method of forming substrate for fluid ejection device
SG119185A1 (en) 2003-05-06 2006-02-28 Micron Technology Inc Method for packaging circuits and packaged circuits
US6890836B2 (en) * 2003-05-23 2005-05-10 Texas Instruments Incorporated Scribe street width reduction by deep trench and shallow saw cut
EP1517166B1 (de) 2003-09-15 2015-10-21 Nuvotronics, LLC Vorrichtungsgehäuse und Verfahren zu derer Prüfung und Herstellung
US7214568B2 (en) * 2004-02-06 2007-05-08 Agere Systems Inc. Semiconductor device configured for reducing post-fabrication damage
JP2005249436A (ja) * 2004-03-02 2005-09-15 Enplas Corp 液滴吐出装置及び液滴吐出装置の製造方法
US7681306B2 (en) 2004-04-28 2010-03-23 Hymite A/S Method of forming an assembly to house one or more micro components
JP4955935B2 (ja) * 2004-05-25 2012-06-20 キヤノン株式会社 貫通孔形成方法および半導体装置の製造方法
US7279110B2 (en) * 2004-12-27 2007-10-09 Asml Holding N.V. Method and apparatus for creating a phase step in mirrors used in spatial light modulator arrays
TWI250629B (en) 2005-01-12 2006-03-01 Ind Tech Res Inst Electronic package and fabricating method thereof
US7538032B2 (en) * 2005-06-23 2009-05-26 Teledyne Scientific & Imaging, Llc Low temperature method for fabricating high-aspect ratio vias and devices fabricated by said method
US7214324B2 (en) * 2005-04-15 2007-05-08 Delphi Technologies, Inc. Technique for manufacturing micro-electro mechanical structures
CN100393519C (zh) * 2005-07-27 2008-06-11 国际联合科技股份有限公司 喷墨印字头装置的通孔与喷口板的制造方法
CN100463801C (zh) * 2005-07-27 2009-02-25 国际联合科技股份有限公司 喷墨印字头装置的通孔与喷口板的制造方法
US20070072338A1 (en) * 2005-09-26 2007-03-29 Advanced Chip Engineering Technology Inc. Method for separating package of WLP
US7989915B2 (en) * 2006-07-11 2011-08-02 Teledyne Licensing, Llc Vertical electrical device
CN101517728B (zh) * 2006-09-22 2013-10-30 Nxp股份有限公司 电子器件及其制造方法
US7829462B2 (en) 2007-05-03 2010-11-09 Teledyne Licensing, Llc Through-wafer vias
JP2008288285A (ja) * 2007-05-15 2008-11-27 Sharp Corp 積層基板の切断方法、半導体装置の製造方法、半導体装置、発光装置及びバックライト装置
US8809923B2 (en) * 2008-02-06 2014-08-19 Omnivision Technologies, Inc. Backside illuminated imaging sensor having a carrier substrate and a redistribution layer
US8187972B2 (en) 2008-07-01 2012-05-29 Teledyne Scientific & Imaging, Llc Through-substrate vias with polymer fill and method of fabricating same
US20100001378A1 (en) * 2008-07-01 2010-01-07 Teledyne Scientific & Imaging, Llc Through-substrate vias and method of fabricating same
US8088667B2 (en) 2008-11-05 2012-01-03 Teledyne Scientific & Imaging, Llc Method of fabricating vertical capacitors in through-substrate vias
US8118405B2 (en) * 2008-12-18 2012-02-21 Eastman Kodak Company Buttable printhead module and pagewide printhead
US8263876B2 (en) * 2009-12-30 2012-09-11 Harvatek Corporation Conductive substrate structure with conductive channels formed by using a two-sided cut approach and a method for manufacturing the same
US9018094B2 (en) * 2011-03-07 2015-04-28 Invensas Corporation Substrates with through vias with conductive features for connection to integrated circuit elements, and methods for forming through vias in substrates
JP2013175497A (ja) * 2012-02-23 2013-09-05 Canon Inc 貫通孔形成方法、該貫通孔形成方法による貫通孔を有するシリコン基板の製造方法
JP6223006B2 (ja) * 2013-06-12 2017-11-01 キヤノン株式会社 液体吐出ヘッドチップ及びその製造方法
US10319654B1 (en) 2017-12-01 2019-06-11 Cubic Corporation Integrated chip scale packages
US10336074B1 (en) 2018-01-18 2019-07-02 Rf Printing Technologies Inkjet printhead with hierarchically aligned printhead units
CN109920759B (zh) * 2019-02-03 2021-03-09 中国科学院微电子研究所 芯片的切割方法
US10773522B1 (en) * 2019-03-14 2020-09-15 Ricoh Company, Ltd. Nozzle geometry for printheads
US11220102B2 (en) * 2019-12-12 2022-01-11 Xerox Corporation Venturi inlet printhead
US11712766B2 (en) * 2020-05-28 2023-08-01 Toyota Motor Engineering And Manufacturing North America, Inc. Method of fabricating a microscale canopy wick structure having enhanced capillary pressure and permeability

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4169008A (en) * 1977-06-13 1979-09-25 International Business Machines Corporation Process for producing uniform nozzle orifices in silicon wafers
US4601777A (en) * 1985-04-03 1986-07-22 Xerox Corporation Thermal ink jet printhead and process therefor
US4612554A (en) * 1985-07-29 1986-09-16 Xerox Corporation High density thermal ink jet printhead
US4789425A (en) * 1987-08-06 1988-12-06 Xerox Corporation Thermal ink jet printhead fabricating process
US4774530A (en) * 1987-11-02 1988-09-27 Xerox Corporation Ink jet printhead
US4829324A (en) 1987-12-23 1989-05-09 Xerox Corporation Large array thermal ink jet printhead
US4784721A (en) * 1988-02-22 1988-11-15 Honeywell Inc. Integrated thin-film diaphragm; backside etch
US4822755A (en) * 1988-04-25 1989-04-18 Xerox Corporation Method of fabricating large area semiconductor arrays
US4863560A (en) * 1988-08-22 1989-09-05 Xerox Corp Fabrication of silicon structures by single side, multiple step etching process
US4875968A (en) * 1989-02-02 1989-10-24 Xerox Corporation Method of fabricating ink jet printheads

Also Published As

Publication number Publication date
DE69033135D1 (de) 1999-07-08
US4961821A (en) 1990-10-09
JP3009449B2 (ja) 2000-02-14
EP0430593A3 (en) 1991-11-27
EP0430593A2 (de) 1991-06-05
JPH03184865A (ja) 1991-08-12
EP0430593B1 (de) 1999-06-02

Similar Documents

Publication Publication Date Title
DE69033135T2 (de) Verfahren zum Schneiden eines Substrates aus Silizium mittels einer preferentiellen Ätzung
DE69633339D1 (de) Verfahren zum verändern einer freiliegenden oberfläche eines halbleiterwafers
DE69031699T2 (de) Verfahren zur Haltung eines Substrats
DE60109080D1 (de) Verfahren zum Modifizieren einer Oberfläche eines kompakten Substrates
DE69030541D1 (de) Verfahren zum Anbringen einer Wolframschicht auf einem Halbleiterplättchen
DE69030229T2 (de) Verfahren zum Herstellen einer Halbleitervorrichtung
DE69033736D1 (de) Verfahren zum Herstellen einer Halbleitervorrichtung
DE69430097T2 (de) Verfahren zum Kristallisieren einer Siliziumschicht
DE69619602T2 (de) Verfahren zum Herstellen eines Halbleiter-Substrats
DE69610252D1 (de) Verfahren zum Zurückätzen einer Schicht auf einem Substrat
DE3750169D1 (de) Verfahren zum Ebnen eines Halbleitersubstrates.
DE69331815D1 (de) Verfahren zur Herstellung eines Halbleitersubstrates
DE69031543D1 (de) Verfahren zum Herstellen einer Halbleitervorrichtung
DE69001411T2 (de) Verfahren zur Herstellung eines Substrats für Halbleiteranordnungen.
DE69331816T2 (de) Verfahren zur Herstellung eines Halbleitersubstrats
DE59400189D1 (de) Verfahren zum Herstellen eines Metall-Keramik-Substrates
DE69734078D1 (de) Verfahren zur Reinigung einer porösen Fläche eines Halbleitersubstrats
DE69028964T2 (de) Verfahren zum Herstellen einer Halbleitervorrichtung
DE69329369T2 (de) Verfahren zum Ätzen eines Silizium-Substrats
DE69622824D1 (de) Verfahren und Vorrichtung zum Auflösen einer Oberflächenschicht eines Halbleitersubstrats
DE69300501D1 (de) Verfahren zum Beschichten einer Vertiefung eines Nickelsubstrates mittels Laser.
DE69419186T2 (de) Verfahren zur Ätzung eines halbleitenden Substrats
DE3584746D1 (de) Verfahren zur zuechtung eines einkristalls einer halbleiterverbindung.
DE59409429D1 (de) Verfahren zum Herstellen eines Metall-Keramik-Substrates
DE69031394D1 (de) Verfahren zum Herstellen eines keramischen Mehrschichtsubstrates

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)