DE68915940D1 - Sondeneinheit, Betriebsverfahren und Rastervorrichtung zur Feststellung eines Tunnelstromes mit dieser Sonde. - Google Patents

Sondeneinheit, Betriebsverfahren und Rastervorrichtung zur Feststellung eines Tunnelstromes mit dieser Sonde.

Info

Publication number
DE68915940D1
DE68915940D1 DE68915940T DE68915940T DE68915940D1 DE 68915940 D1 DE68915940 D1 DE 68915940D1 DE 68915940 T DE68915940 T DE 68915940T DE 68915940 T DE68915940 T DE 68915940T DE 68915940 D1 DE68915940 D1 DE 68915940D1
Authority
DE
Germany
Prior art keywords
probe
flexible member
determining
operating method
tunnel current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68915940T
Other languages
English (en)
Other versions
DE68915940T2 (de
Inventor
Hiroyasu Nose
Osamu Takamatsu
Toshihiko Miyazaki
Toshimitsu Kawase
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of DE68915940D1 publication Critical patent/DE68915940D1/de
Application granted granted Critical
Publication of DE68915940T2 publication Critical patent/DE68915940T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/873—Tip holder

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE68915940T 1988-11-09 1989-11-06 Sondeneinheit, Betriebsverfahren und Rastervorrichtung zur Feststellung eines Tunnelstromes mit dieser Sonde. Expired - Fee Related DE68915940T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP28278388 1988-11-09
JP1273041A JP2547869B2 (ja) 1988-11-09 1989-10-19 プローブユニット，該プローブの駆動方法及び該プローブユニットを備えた走査型トンネル電流検知装置

Publications (2)

Publication Number Publication Date
DE68915940D1 true DE68915940D1 (de) 1994-07-14
DE68915940T2 DE68915940T2 (de) 1994-11-17

Family

ID=26550493

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68915940T Expired - Fee Related DE68915940T2 (de) 1988-11-09 1989-11-06 Sondeneinheit, Betriebsverfahren und Rastervorrichtung zur Feststellung eines Tunnelstromes mit dieser Sonde.

Country Status (6)

Country Link
US (1) US4998016A (de)
EP (1) EP0368579B1 (de)
JP (1) JP2547869B2 (de)
AT (1) ATE107028T1 (de)
CA (1) CA2002187C (de)
DE (1) DE68915940T2 (de)

Families Citing this family (50)

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Publication number Priority date Publication date Assignee Title
JP2756254B2 (ja) * 1988-03-25 1998-05-25 キヤノン株式会社 記録装置及び再生装置
US5210714A (en) * 1988-10-14 1993-05-11 International Business Machines Corporation Distance-controlled tunneling transducer and direct access storage unit employing the transducer
US5241527A (en) * 1989-03-16 1993-08-31 Canon Kabushiki Kaisha Recording and reproducing apparatus and method using a recording layer having a positioning region
JP2686645B2 (ja) * 1989-05-08 1997-12-08 キヤノン株式会社 走査型トンネル電流検出装置
JPH02295050A (ja) * 1989-05-09 1990-12-05 Olympus Optical Co Ltd μ―ＳＴＭを用いた回路パターン作製装置および回路パターン作製方法
DE68903951T2 (de) * 1989-08-16 1993-07-08 Ibm Verfahren fuer die herstellung mikromechanischer messfuehler fuer afm/stm-profilometrie und mikromechanischer messfuehlerkopf.
CA2024648C (en) * 1989-09-07 1994-10-18 Ryo Kuroda Accessing method, and information processing method and information processing device utilizing the same
USRE36603E (en) * 1989-10-13 2000-03-07 International Business Machines Corp. Distance-controlled tunneling transducer and direct access storage unit employing the transducer
JPH03140805A (ja) * 1989-10-26 1991-06-14 Hikari Gijutsu Kenkyu Kaihatsu Kk 広域走査トンネル顕微鏡
US5132533A (en) * 1989-12-08 1992-07-21 Canon Kabushiki Kaisha Method for forming probe and apparatus therefor
DE69127379T2 (de) * 1990-01-11 1998-03-19 Canon K.K., Tokio/Tokyo Mikrosonde, Herstellungsverfahren zur Herstellung derselben und Informations-Eingabe- und/oder Ausgabe-Gerät welches dieselbe verwendet
JPH041949A (ja) * 1990-04-18 1992-01-07 Canon Inc 情報入力及び／または取出し装置
JP2891510B2 (ja) * 1990-05-09 1999-05-17 日本電子株式会社 圧電素子駆動体
JP2501945B2 (ja) * 1990-08-28 1996-05-29 三菱電機株式会社 原子間力顕微鏡のカンチレバ―及びその製造方法
JP2961452B2 (ja) * 1990-09-05 1999-10-12 キヤノン株式会社 情報処理装置
JP2741629B2 (ja) * 1990-10-09 1998-04-22 キヤノン株式会社 カンチレバー型プローブ、それを用いた走査型トンネル顕微鏡及び情報処理装置
JP2744346B2 (ja) * 1990-10-19 1998-04-28 キヤノン株式会社 情報記録ユニットと情報記録及び／又は再生装置と情報記録及び／又は再生方法と情報記録媒体
JP2802828B2 (ja) * 1990-10-19 1998-09-24 キヤノン株式会社 情報記録担体及びこれを使用する情報処理装置
DE4035075A1 (de) * 1990-11-05 1992-05-07 Jenoptik Jena Gmbh Anordnung zum messen linearer abmessungen auf einer strukturierten oberflaeche eines messobjektes
ATE155237T1 (de) * 1990-11-20 1997-07-15 Canon Kk Neigungswinkelbestimmungsverfahren sowie informationsbestimmungsschreibvorrichtung dafür
DE69121868T2 (de) * 1990-12-17 1997-02-06 Canon K.K., Tokio/Tokyo Freitragende Sonde und Apparat zur Anwendung derselben
US5237529A (en) * 1991-02-01 1993-08-17 Richard Spitzer Microstructure array and activation system therefor
CA2060674C (en) * 1991-02-08 1996-10-01 Masahiro Tagawa Driving apparatus and a recording and/or reproducing apparatus using the same
JP3010318B2 (ja) * 1991-02-26 2000-02-21 キヤノン株式会社 微小プローブ、その製造方法、該プローブを用いた表面観察装置及び情報処理装置
JP3000491B2 (ja) * 1991-04-10 2000-01-17 キヤノン株式会社 カンチレバーユニット及びこれを用いた情報処理装置、原子間力顕微鏡、磁力顕微鏡
JP2884447B2 (ja) * 1991-04-22 1999-04-19 キヤノン株式会社 カンチレバー型プローブ、及びこれを用いた走査型トンネル顕微鏡、情報処理装置
US5166520A (en) * 1991-05-13 1992-11-24 The Regents Of The University Of California Universal, microfabricated probe for scanning probe microscopes
JP2923813B2 (ja) * 1991-06-11 1999-07-26 キヤノン株式会社 カンチレバー型変位素子、及びこれを用いた走査型トンネル顕微鏡、情報処理装置
US5172002A (en) * 1991-08-22 1992-12-15 Wyko Corporation Optical position sensor for scanning probe microscopes
EP0530427B1 (de) * 1991-09-05 1995-11-08 International Business Machines Corporation Einheit mit mehreren Spitzen für ein Rastertunnelmikroskop, Verfahren für deren Herstellung und Anwendung derselben in einer Speichereinheit mit direktem Zugriff
JP3184619B2 (ja) * 1991-09-24 2001-07-09 キヤノン株式会社 平行平面保持機構及びそれを用いたメモリ装置及びｓｔｍ装置
US5360974A (en) * 1992-10-20 1994-11-01 International Business Machines Corp. Dual quad flexure scanner
JP2895694B2 (ja) * 1992-12-08 1999-05-24 シャープ株式会社 情報記録・再生用スライダー、情報記録・再生用スライダーの製造方法および情報記録・再生装置
JPH06241777A (ja) * 1993-02-16 1994-09-02 Mitsubishi Electric Corp 原子間力顕微鏡用カンチレバー、その製造方法、このカンチレバーを用いた原子間力顕微鏡及びこのカンチレバーを用いた試料表面密着性評価方法
US6445106B1 (en) 2000-02-18 2002-09-03 Intel Corporation Micro-electromechanical structure resonator, method of making, and method of using
US20070153668A1 (en) * 2002-12-31 2007-07-05 Industrial Technology Research Institute Data storage device utilizing carbon nanotubes and method for operating
US20040125733A1 (en) * 2002-12-31 2004-07-01 Industrial Technology Research Institute Data storage device utilizing carbon nanotubes and method for operating
US20050128927A1 (en) * 2003-12-15 2005-06-16 Hewlett-Packard Development Co., L.P. Electrostatic actuator for contact probe storage device
US7436753B2 (en) 2003-12-17 2008-10-14 Mejia Robert G Contact probe storage FET sensor
US7423954B2 (en) * 2003-12-17 2008-09-09 Hewlett-Packard Development Company, L.P. Contact probe storage sensor pod
US7212487B2 (en) * 2004-01-07 2007-05-01 Hewlett-Packard Development Company, L.P. Data readout arrangement
JP4226522B2 (ja) * 2004-06-30 2009-02-18 株式会社日立製作所 記録再生装置
FR2880980B1 (fr) 2005-01-17 2007-03-16 Commissariat Energie Atomique Dispositif d'enregistrement de donnees comportant des micro-pointes dont l'ensemble des extremites libres forme une surface convexe et procede de fabrication
US7212488B2 (en) 2005-03-21 2007-05-01 Hewlett-Packard Development Company, L.P. Method and device enabling capacitive probe-based data storage readout
JP5230133B2 (ja) * 2006-08-22 2013-07-10 セイコーインスツル株式会社 圧電アクチュエータを用いた駆動装置及びこれを搭載した電子機器
US8116190B2 (en) 2006-10-05 2012-02-14 Pioneer Corporation Recording/reproducing apparatus
US20080151597A1 (en) * 2006-12-20 2008-06-26 Seagate Technology Llc Wear-resistant multilayer probe
JP2009069006A (ja) * 2007-09-13 2009-04-02 Fujifilm Corp カンチレバー型センサ、それを用いる物質検知システム及び物質検査方法
CN101769711B (zh) * 2010-01-26 2012-09-05 重庆理工大学 一种基于隧道效应的接触式纳米位移传感器
CN112198412B (zh) * 2019-06-21 2023-02-28 成都辰显光电有限公司 一种测试结构及测试结构的制备方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3572030D1 (en) * 1985-03-07 1989-09-07 Ibm Scanning tunneling microscope
JPS63238503A (ja) * 1987-03-27 1988-10-04 Jeol Ltd 走査トンネル顕微鏡におけるチツプ走査装置
EP0553937B1 (de) * 1987-07-31 1999-03-03 Canon Kabushiki Kaisha Aufzeichnungsgerät und Wiedergabegerät
US4906840A (en) * 1988-01-27 1990-03-06 The Board Of Trustees Of Leland Stanford Jr., University Integrated scanning tunneling microscope

Also Published As

Publication number Publication date
DE68915940T2 (de) 1994-11-17
EP0368579A2 (de) 1990-05-16
CA2002187A1 (en) 1990-05-09
EP0368579B1 (de) 1994-06-08
ATE107028T1 (de) 1994-06-15
US4998016A (en) 1991-03-05
JPH02243908A (ja) 1990-09-28
JP2547869B2 (ja) 1996-10-23
CA2002187C (en) 1993-09-21
EP0368579A3 (de) 1991-03-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee