DE60303868D1 - Verfahren zur Herstellung eines Halbleiterlasers - Google Patents

Verfahren zur Herstellung eines Halbleiterlasers

Info

Publication number
DE60303868D1
DE60303868D1 DE60303868T DE60303868T DE60303868D1 DE 60303868 D1 DE60303868 D1 DE 60303868D1 DE 60303868 T DE60303868 T DE 60303868T DE 60303868 T DE60303868 T DE 60303868T DE 60303868 D1 DE60303868 D1 DE 60303868D1
Authority
DE
Germany
Prior art keywords
producing
semiconductor laser
laser
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60303868T
Other languages
English (en)
Other versions
DE60303868T2 (de
Inventor
Mamoru Miyachi
Atsushi Watanabe
Hirokazu Takahashi
Yoshinori Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Corp filed Critical Pioneer Corp
Publication of DE60303868D1 publication Critical patent/DE60303868D1/de
Application granted granted Critical
Publication of DE60303868T2 publication Critical patent/DE60303868T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/125Optical beam sources therefor, e.g. laser control circuitry specially adapted for optical storage devices; Modulators, e.g. means for controlling the size or intensity of optical spots or optical traces
    • G11B7/127Lasers; Multiple laser arrays
    • G11B7/1275Two or more lasers having different wavelengths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/04Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042Electrical excitation ; Circuits therefor
    • H01S5/0425Electrodes, e.g. characterised by the structure
    • H01S5/04256Electrodes, e.g. characterised by the structure characterised by the configuration
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/223Buried stripe structure
    • H01S5/2231Buried stripe structure with inner confining structure only between the active layer and the upper electrode
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34326Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on InGa(Al)P, e.g. red laser
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34333Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/40Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • H01S5/4031Edge-emitting structures
    • H01S5/4043Edge-emitting structures with vertically stacked active layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B2007/0003Recording, reproducing or erasing systems characterised by the structure or type of the carrier
    • G11B2007/0006Recording, reproducing or erasing systems characterised by the structure or type of the carrier adapted for scanning different types of carrier, e.g. CD & DVD
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2301/00Functional characteristics
    • H01S2301/17Semiconductor lasers comprising special layers
    • H01S2301/173The laser chip comprising special buffer layers, e.g. dislocation prevention or reduction
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2304/00Special growth methods for semiconductor lasers
    • H01S2304/04MOCVD or MOVPE
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0201Separation of the wafer into individual elements, e.g. by dicing, cleaving, etching or directly during growth
    • H01S5/0202Cleaving
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/0207Substrates having a special shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/0213Sapphire, quartz or diamond based substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/0217Removal of the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/0233Mounting configuration of laser chips
    • H01S5/0234Up-side down mountings, e.g. Flip-chip, epi-side down mountings or junction down mountings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/0235Method for mounting laser chips
    • H01S5/02355Fixing laser chips on mounts
    • H01S5/0237Fixing laser chips on mounts by soldering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/024Arrangements for thermal management
    • H01S5/02461Structure or details of the laser chip to manipulate the heat flow, e.g. passive layers in the chip with a low heat conductivity
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/04Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042Electrical excitation ; Circuits therefor
    • H01S5/0421Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2214Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on oxides or nitrides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/323Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/32308Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
    • H01S5/32325Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm red laser based on InGaP
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/323Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/32308Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
    • H01S5/32341Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/40Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • H01S5/4087Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Geometry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Lasers (AREA)
DE60303868T 2002-12-25 2003-12-19 Verfahren zur Herstellung eines Halbleiterlasers Expired - Lifetime DE60303868T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002374635A JP2004207479A (ja) 2002-12-25 2002-12-25 半導体レーザ装置及びその製造方法
JP2002374635 2002-12-25

Publications (2)

Publication Number Publication Date
DE60303868D1 true DE60303868D1 (de) 2006-05-04
DE60303868T2 DE60303868T2 (de) 2006-08-10

Family

ID=32463542

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60303868T Expired - Lifetime DE60303868T2 (de) 2002-12-25 2003-12-19 Verfahren zur Herstellung eines Halbleiterlasers

Country Status (4)

Country Link
US (1) US7098063B2 (de)
EP (2) EP1434321B1 (de)
JP (1) JP2004207479A (de)
DE (1) DE60303868T2 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4634047B2 (ja) * 2004-01-23 2011-02-16 パイオニア株式会社 集積型半導体発光素子及びその製造方法
JP4660224B2 (ja) * 2004-03-30 2011-03-30 三洋電機株式会社 半導体レーザ装置
JP2006128602A (ja) * 2004-03-30 2006-05-18 Sanyo Electric Co Ltd 半導体レーザ装置およびその製造方法
US7227192B2 (en) * 2004-03-31 2007-06-05 Tekcove Co., Ltd Light-emitting device and manufacturing process of the light-emitting device
US7692179B2 (en) 2004-07-09 2010-04-06 Hewlett-Packard Development Company, L.P. Nanowire device with (111) vertical sidewalls and method of fabrication
JP4614715B2 (ja) 2004-08-31 2011-01-19 三洋電機株式会社 半導体レーザ装置およびその製造方法
US7512167B2 (en) 2004-09-24 2009-03-31 Sanyo Electric Co., Ltd. Integrated semiconductor laser device and method of fabricating the same
JP2006278578A (ja) * 2005-03-28 2006-10-12 Sanyo Electric Co Ltd 集積型半導体レーザ素子およびその製造方法
JP4906256B2 (ja) * 2004-11-10 2012-03-28 株式会社沖データ 半導体複合装置の製造方法
JP2006190973A (ja) * 2004-12-06 2006-07-20 Sharp Corp 窒化物系化合物半導体発光素子の製造方法
US7932111B2 (en) * 2005-02-23 2011-04-26 Cree, Inc. Substrate removal process for high light extraction LEDs
JP4671728B2 (ja) * 2005-03-25 2011-04-20 三洋電機株式会社 半導体レーザ装置および光ピックアップ装置
JP2006278577A (ja) 2005-03-28 2006-10-12 Sanyo Electric Co Ltd 半導体レーザ装置
JP4701832B2 (ja) * 2005-05-24 2011-06-15 ソニー株式会社 半導体レーザ素子
JP4466503B2 (ja) * 2005-08-08 2010-05-26 ソニー株式会社 半導体レーザ
US8236588B2 (en) 2005-12-20 2012-08-07 Pioneer Corporation Method for manufacturing a multi-wavelength integrated semiconductor laser
US7929587B2 (en) * 2007-04-27 2011-04-19 Sanyo Electric Co., Ltd. Semiconductor laser diode element and method of manufacturing the same
US7994524B1 (en) * 2007-09-12 2011-08-09 David Yaunien Chung Vertically structured LED array light source
JP5288852B2 (ja) * 2008-03-21 2013-09-11 スタンレー電気株式会社 半導体素子の製造方法
EP2178133B1 (de) * 2008-10-16 2019-09-18 Semiconductor Energy Laboratory Co., Ltd. Flexible lichtemittierende Vorrichtung, elektronische Vorrichtung und Herstellungsverfahren für die flexible lichtemittierende Vorrichtung
US8064492B2 (en) * 2009-01-26 2011-11-22 Sanyo Electric Co., Ltd. Method of manufacturing semiconductor laser device, semiconductor laser device and light apparatus
JP4901909B2 (ja) * 2009-05-19 2012-03-21 シャープ株式会社 光学部品及びその製造方法
JP5505379B2 (ja) * 2011-07-11 2014-05-28 住友電気工業株式会社 半導体レーザ装置
GB2527564A (en) * 2014-06-26 2015-12-30 Ibm Photonic circuit device with reduced losses caused by electrical contact pads
US10366883B2 (en) * 2014-07-30 2019-07-30 Hewlett Packard Enterprise Development Lp Hybrid multilayer device
WO2017039674A1 (en) 2015-09-03 2017-03-09 Hewlett Packard Enterprise Development Lp Defect free heterogeneous substrates
US10586847B2 (en) 2016-01-15 2020-03-10 Hewlett Packard Enterprise Development Lp Multilayer device
US11088244B2 (en) 2016-03-30 2021-08-10 Hewlett Packard Enterprise Development Lp Devices having substrates with selective airgap regions
US10605984B2 (en) 2016-12-01 2020-03-31 Waymo Llc Array of waveguide diffusers for light detection using an aperture
US10502618B2 (en) 2016-12-03 2019-12-10 Waymo Llc Waveguide diffuser for light detection using an aperture
EP3367446B1 (de) * 2017-02-28 2020-06-17 Nichia Corporation Verfahren zur herstellung einer optischen komponente
US10698088B2 (en) 2017-08-01 2020-06-30 Waymo Llc LIDAR receiver using a waveguide and an aperture
US10890650B2 (en) 2017-09-05 2021-01-12 Waymo Llc LIDAR with co-aligned transmit and receive paths
US10381801B1 (en) 2018-04-26 2019-08-13 Hewlett Packard Enterprise Development Lp Device including structure over airgap
DE102020125510A1 (de) 2020-09-30 2022-03-31 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronische vorrichtung und verfahren zur herstellung derselben
JPWO2022172679A1 (de) * 2021-02-10 2022-08-18
JPWO2022172680A1 (de) * 2021-02-10 2022-08-18

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3419930B2 (ja) * 1994-12-21 2003-06-23 三菱電機株式会社 半導体レーザ装置とこの半導体レーザ装置を備えた光ディスク装置
JPH0997943A (ja) * 1995-09-28 1997-04-08 Denso Corp スタック型半導体レーザ
JP3719467B2 (ja) * 1997-05-16 2005-11-24 日本オプネクスト株式会社 光半導体装置
US5920766A (en) * 1998-01-07 1999-07-06 Xerox Corporation Red and blue stacked laser diode array by wafer fusion
US6144683A (en) * 1998-01-07 2000-11-07 Xerox Corporation Red, infrared, and blue stacked laser diode array by wafer fusion
US6071795A (en) * 1998-01-23 2000-06-06 The Regents Of The University Of California Separation of thin films from transparent substrates by selective optical processing
US6136623A (en) * 1998-05-06 2000-10-24 Xerox Corporation Multiple wavelength laser arrays by flip-chip bonding
JP3685306B2 (ja) * 1999-03-03 2005-08-17 パイオニア株式会社 2波長半導体レーザ素子及びその製造方法
JP3486900B2 (ja) * 2000-02-15 2004-01-13 ソニー株式会社 発光装置およびそれを用いた光装置
JP2001332805A (ja) * 2000-05-24 2001-11-30 Samsung Electro Mech Co Ltd 2波長レーザーダイオード及びその製造方法
JP2002118331A (ja) * 2000-10-06 2002-04-19 Toshiba Corp 集積型半導体発光装置及びその製造方法
JP2002176229A (ja) * 2000-12-07 2002-06-21 Mitsubishi Electric Corp 半導体レーザ装置及びその製造方法
JP4649745B2 (ja) * 2001-02-01 2011-03-16 ソニー株式会社 発光素子の転写方法
WO2002093695A2 (en) * 2001-05-15 2002-11-21 Agility Communications, Inc. Sampled grating distributed bragg reflector laser controller
US6901086B2 (en) * 2002-10-30 2005-05-31 Chian Chiu Li Stack-type diode laser device
JP4097510B2 (ja) * 2002-11-20 2008-06-11 株式会社沖データ 半導体装置の製造方法

Also Published As

Publication number Publication date
EP1434321A1 (de) 2004-06-30
EP1589624A2 (de) 2005-10-26
US20040184502A1 (en) 2004-09-23
EP1434321B1 (de) 2006-03-08
JP2004207479A (ja) 2004-07-22
DE60303868T2 (de) 2006-08-10
EP1589624A3 (de) 2006-01-04
US7098063B2 (en) 2006-08-29

Similar Documents

Publication Publication Date Title
DE60303868D1 (de) Verfahren zur Herstellung eines Halbleiterlasers
DE60327721D1 (de) Verfahren zur Herstellung eines Halbleiterbauelements
DE50302301D1 (de) Verfahren zur herstellung eines formteiles
DE50303605D1 (de) Verfahren zur herstellung eines pressgehärteten bauteils
DE60201421D1 (de) Verfahren zur herstellung eines wachsartigen raffinats
DE60022857D1 (de) Verfahren zur Herstellung eines Halbleiterbauelements
DE60307157D1 (de) Verfahren zur Herstellung einer Halbleitervorrichtung
DE60038423D1 (de) Verfahren zur Herstellung eines Halbleiterbauelements
ATE414058T1 (de) Verfahren zur herstellung eines sulfinyl- acetamids
DE50113179D1 (de) Verfahren zur Herstellung eines Halbleiterbauelements
DE60044470D1 (de) Verfahren zur herstellung eines halbleiterelement
DE60222896D1 (de) Verfahren zur herstellung eines polyurethan-weichschaumstoffs
DE60205676D1 (de) Verfahren zur Herstellung eines Gegenstandes
DE60327706D1 (de) Verfahren zur herstellung eines gasturbinenmotordiffusors
DE60212643D1 (de) Verfahren zur herstellung eines reifenkomponentenglieds
ATE466016T1 (de) Verfahren for zur herstellung eines 14- hydroxynormorphinon-derivats
DE60317715D1 (de) Verfahren zur herstellung eines sektionaltorpaneels
DE50304619D1 (de) Verfahren zur herstellung eines bauteils
DE60225135D1 (de) Verfahren zur herstellung eines halbleiterswafers
DE60230982D1 (de) Verfahren zur herstellung eines halbleiterbauelements
DE60209835D1 (de) Verfahren zur Herstellung eines Halbleiterbauelements
DE50212805D1 (de) Verfahren zur Herstellung eines Querträgers
DE60140362D1 (de) Verfahren zur herstellung eines halbleiterbauelements
DE60317963D1 (de) Verfahren zur Herstellung eines Halbleiterbauelements
DE602005003318D1 (de) Verfahren zur Herstellung eines Halbleitersubstrats

Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)
8364 No opposition during term of opposition