DE60203032D1 - Integrierte Halbleiterschaltung - Google Patents

Integrierte Halbleiterschaltung

Info

Publication number
DE60203032D1
DE60203032D1 DE60203032T DE60203032T DE60203032D1 DE 60203032 D1 DE60203032 D1 DE 60203032D1 DE 60203032 T DE60203032 T DE 60203032T DE 60203032 T DE60203032 T DE 60203032T DE 60203032 D1 DE60203032 D1 DE 60203032D1
Authority
DE
Germany
Prior art keywords
test
semiconductor circuit
integrated semiconductor
tested
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60203032T
Other languages
English (en)
Other versions
DE60203032T2 (de
Inventor
Takayuki Kamei
Yukihiro Urakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE60203032D1 publication Critical patent/DE60203032D1/de
Publication of DE60203032T2 publication Critical patent/DE60203032T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
DE60203032T 2001-09-25 2002-09-25 Integrierte Halbleiterschaltung Expired - Lifetime DE60203032T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001292093 2001-09-25
JP2001292093A JP2003098225A (ja) 2001-09-25 2001-09-25 半導体集積回路

Publications (2)

Publication Number Publication Date
DE60203032D1 true DE60203032D1 (de) 2005-03-31
DE60203032T2 DE60203032T2 (de) 2006-04-13

Family

ID=19114127

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60203032T Expired - Lifetime DE60203032T2 (de) 2001-09-25 2002-09-25 Integrierte Halbleiterschaltung

Country Status (5)

Country Link
US (1) US20030061555A1 (de)
EP (1) EP1296154B1 (de)
JP (1) JP2003098225A (de)
CN (1) CN1187826C (de)
DE (1) DE60203032T2 (de)

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DE60203032T2 (de) 2006-04-13
EP1296154B1 (de) 2005-02-23
EP1296154A3 (de) 2003-10-22
US20030061555A1 (en) 2003-03-27
EP1296154A2 (de) 2003-03-26
CN1187826C (zh) 2005-02-02
JP2003098225A (ja) 2003-04-03
CN1411065A (zh) 2003-04-16

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