DE60122412D1 - Verbessertes Programmierungsverfahren für eine Speicherzelle - Google Patents

Verbessertes Programmierungsverfahren für eine Speicherzelle

Info

Publication number
DE60122412D1
DE60122412D1 DE60122412T DE60122412T DE60122412D1 DE 60122412 D1 DE60122412 D1 DE 60122412D1 DE 60122412 T DE60122412 T DE 60122412T DE 60122412 T DE60122412 T DE 60122412T DE 60122412 D1 DE60122412 D1 DE 60122412D1
Authority
DE
Germany
Prior art keywords
cells
unselected
memory cell
programming procedure
improved programming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60122412T
Other languages
English (en)
Other versions
DE60122412T2 (de
Inventor
Donald S Gerber
Jeffrey Shields
Kent D Hewitt
David M Davies
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Microchip Technology Inc
Original Assignee
Microchip Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/617,280 external-priority patent/US6236595B1/en
Application filed by Microchip Technology Inc filed Critical Microchip Technology Inc
Publication of DE60122412D1 publication Critical patent/DE60122412D1/de
Application granted granted Critical
Publication of DE60122412T2 publication Critical patent/DE60122412T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427—Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/28—Floating gate memory programmed by reverse programming, e.g. programmed with negative gate voltage and erased with positive gate voltage or programmed with high source or drain voltage and erased with high gate voltage

Landscapes

  • Non-Volatile Memory (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
DE60122412T 2000-03-22 2001-03-12 Verbessertes Programmierungsverfahren für eine Speicherzelle Expired - Lifetime DE60122412T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US19122500P 2000-03-22 2000-03-22
US191225P 2000-03-22
US617280 2000-07-17
US09/617,280 US6236595B1 (en) 2000-07-17 2000-07-17 Programming method for a memory cell

Publications (2)

Publication Number Publication Date
DE60122412D1 true DE60122412D1 (de) 2006-10-05
DE60122412T2 DE60122412T2 (de) 2007-05-03

Family

ID=26886871

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60122412T Expired - Lifetime DE60122412T2 (de) 2000-03-22 2001-03-12 Verbessertes Programmierungsverfahren für eine Speicherzelle

Country Status (7)

Country Link
EP (1) EP1137012B1 (de)
JP (1) JP2001319487A (de)
KR (1) KR100523529B1 (de)
CN (1) CN1317800A (de)
AT (1) ATE337602T1 (de)
DE (1) DE60122412T2 (de)
TW (1) TW507200B (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6771536B2 (en) * 2002-02-27 2004-08-03 Sandisk Corporation Operating techniques for reducing program and read disturbs of a non-volatile memory
US7317116B2 (en) 2004-12-10 2008-01-08 Archer-Daniels-Midland-Company Processes for the preparation and purification of hydroxymethylfuraldehyde and derivatives
EP1830366B1 (de) * 2004-12-24 2011-07-13 Spansion Japan Limited Bias-anwendungsverfahren für speicherung und speicherung
DE102005004107A1 (de) 2005-01-28 2006-08-17 Infineon Technologies Ag Integrierter Halbleiterspeicher mit einer Anordnung nichtflüchtiger Speicherzellen und Verfahren
TWI449045B (zh) * 2010-07-16 2014-08-11 Yield Microelectronics Corp Low cost electronic erasure can be rewritten read only memory array
CN102376718B (zh) * 2010-08-05 2013-09-11 亿而得微电子股份有限公司 低成本电可擦可编程只读存储器阵列
US8837219B2 (en) * 2011-09-30 2014-09-16 Ememory Technology Inc. Method of programming nonvolatile memory
CN103137181B (zh) * 2013-02-25 2017-06-06 上海华虹宏力半导体制造有限公司 存储器、存储阵列的编程方法及电压提供系统
CN110619910B (zh) * 2019-08-30 2021-08-03 长江存储科技有限责任公司 存储器的控制方法、装置、存储介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR910004166B1 (ko) * 1988-12-27 1991-06-22 삼성전자주식회사 낸드쎌들을 가지는 전기적으로 소거 및 프로그램 가능한 반도체 메모리장치
KR100206709B1 (ko) * 1996-09-21 1999-07-01 윤종용 멀티비트 불휘발성 반도체 메모리의 셀 어레이의 구조 및 그의 구동방법
KR100232190B1 (ko) * 1996-10-01 1999-12-01 김영환 비휘발성 메모리장치
US5986931A (en) * 1997-01-02 1999-11-16 Caywood; John M. Low voltage single CMOS electrically erasable read-only memory
JP3951443B2 (ja) * 1997-09-02 2007-08-01 ソニー株式会社 不揮発性半導体記憶装置及びその書き込み方法
JP3198998B2 (ja) * 1997-09-11 2001-08-13 日本電気株式会社 半導体不揮発性メモリ
US6300183B1 (en) * 1999-03-19 2001-10-09 Microchip Technology Incorporated Independently programmable memory segments within a PMOS electrically erasable programmable read only memory array achieved by N-well separation and method therefor

Also Published As

Publication number Publication date
JP2001319487A (ja) 2001-11-16
KR100523529B1 (ko) 2005-10-24
CN1317800A (zh) 2001-10-17
KR20010100834A (ko) 2001-11-14
TW507200B (en) 2002-10-21
ATE337602T1 (de) 2006-09-15
EP1137012A3 (de) 2003-09-03
EP1137012A2 (de) 2001-09-26
EP1137012B1 (de) 2006-08-23
DE60122412T2 (de) 2007-05-03

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