DE60035318D1 - Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsregelung - Google Patents

Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsregelung

Info

Publication number
DE60035318D1
DE60035318D1 DE60035318T DE60035318T DE60035318D1 DE 60035318 D1 DE60035318 D1 DE 60035318D1 DE 60035318 T DE60035318 T DE 60035318T DE 60035318 T DE60035318 T DE 60035318T DE 60035318 D1 DE60035318 D1 DE 60035318D1
Authority
DE
Germany
Prior art keywords
reset signal
semiconductor integrated
integrated circuit
circuit
pulse width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60035318T
Other languages
English (en)
Other versions
DE60035318T2 (de
Inventor
Shigeki Aoki
Haruo Kamijo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Application granted granted Critical
Publication of DE60035318D1 publication Critical patent/DE60035318D1/de
Publication of DE60035318T2 publication Critical patent/DE60035318T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/24—Resetting means
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE60035318T 1999-07-23 2000-07-19 Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsregelung Expired - Fee Related DE60035318T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP20931499 1999-07-23
JP20931499 1999-07-23
JP2000170271 2000-06-07
JP2000170271 2000-06-07

Publications (2)

Publication Number Publication Date
DE60035318D1 true DE60035318D1 (de) 2007-08-09
DE60035318T2 DE60035318T2 (de) 2008-02-07

Family

ID=26517371

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60035318T Expired - Fee Related DE60035318T2 (de) 1999-07-23 2000-07-19 Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsregelung

Country Status (5)

Country Link
EP (1) EP1085332B1 (de)
KR (1) KR100383341B1 (de)
CN (2) CN1145213C (de)
AT (1) ATE365923T1 (de)
DE (1) DE60035318T2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030084020A (ko) * 2002-04-24 2003-11-01 삼성전자주식회사 액정 표시 장치 및 그 구동 방법
CN100526902C (zh) * 2003-03-25 2009-08-12 株式会社半导体能源研究所 半导体装置的检查电路及检查方法
JP5123182B2 (ja) 2005-08-17 2013-01-16 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 臨床作業ワークフローによるシンプルクリックスタイルインタラクションを特徴とする方法及び装置
KR101167201B1 (ko) * 2010-11-10 2012-07-24 매그나칩 반도체 유한회사 다이렉트 모드를 갖는 디지털 ｐｗｍ 방식에서 디밍 신호를 이용한 ｄｃ－ｄｃ 컨버터용 ｐｗｍ 신호 생성회로 및 이를 이용한 ｌｅｄ 구동회로
CN102540055B (zh) * 2011-12-22 2015-07-29 深圳创维数字技术有限公司 一种检测逻辑电平极限值的方法及装置
CN102769272A (zh) * 2012-07-18 2012-11-07 北京三一自动化技术有限责任公司 功率变换器的故障锁存及复位系统和功率变换器
JP6444475B1 (ja) * 2017-11-28 2018-12-26 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5418487A (en) * 1992-09-04 1995-05-23 Benchmarg Microelectronics, Inc. Fuse state sense circuit
KR0147194B1 (ko) * 1995-05-26 1998-11-02 문정환 반도체 메모리 소자
JP2000132990A (ja) * 1998-10-27 2000-05-12 Fujitsu Ltd 冗長判定回路、半導体記憶装置及び冗長判定方法

Also Published As

Publication number Publication date
EP1085332A2 (de) 2001-03-21
KR20010015398A (ko) 2001-02-26
CN1145213C (zh) 2004-04-07
KR100383341B1 (ko) 2003-05-12
CN1266755C (zh) 2006-07-26
EP1085332A3 (de) 2002-05-08
EP1085332B1 (de) 2007-06-27
DE60035318T2 (de) 2008-02-07
CN1282108A (zh) 2001-01-31
CN1516255A (zh) 2004-07-28
ATE365923T1 (de) 2007-07-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee