TW200601401A - Dut interface of semiconductor test apparatus - Google Patents

Dut interface of semiconductor test apparatus

Info

Publication number
TW200601401A
TW200601401A TW094112844A TW94112844A TW200601401A TW 200601401 A TW200601401 A TW 200601401A TW 094112844 A TW094112844 A TW 094112844A TW 94112844 A TW94112844 A TW 94112844A TW 200601401 A TW200601401 A TW 200601401A
Authority
TW
Taiwan
Prior art keywords
test apparatus
semiconductor test
dut
interface
board
Prior art date
Application number
TW094112844A
Other languages
Chinese (zh)
Other versions
TWI299179B (en
Inventor
Mitsutada Hanajima
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200601401A publication Critical patent/TW200601401A/en
Application granted granted Critical
Publication of TWI299179B publication Critical patent/TWI299179B/en

Links

Classifications

    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B19/00—Hoop exercising apparatus

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physical Education & Sports Medicine (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

To provide a DUT (device under test) interface of a semiconductor test apparatus in which it is easy to attach and detach different types of performance boards corresponding to different types of DUTs and which allows the semiconductor test apparatus to test DUTs stably. A DUT interface of a semiconductor test apparatus connects the semiconductor test apparatus which tests a DUT based on a test signal output from a driver circuit provided in a pin electronics board of the semiconductor test apparatus, to the DUT electrically via a performance board and a contact ring, and the DUT interface is characterized in that it connects the contact ring and the pin electronics board using a connector provided in the performance board.
TW094112844A 2004-05-07 2005-04-22 Dut interface of semiconductor test apparatus TWI299179B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004138025A JP2005321238A (en) 2004-05-07 2004-05-07 Dut interface for semi-conductor testing device

Publications (2)

Publication Number Publication Date
TW200601401A true TW200601401A (en) 2006-01-01
TWI299179B TWI299179B (en) 2008-07-21

Family

ID=35468648

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094112844A TWI299179B (en) 2004-05-07 2005-04-22 Dut interface of semiconductor test apparatus

Country Status (3)

Country Link
JP (1) JP2005321238A (en)
KR (1) KR100636303B1 (en)
TW (1) TWI299179B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007322372A (en) * 2006-06-05 2007-12-13 Yokogawa Electric Corp Ic tester
JP4972386B2 (en) * 2006-12-04 2012-07-11 株式会社アドバンテスト Test equipment and measuring equipment
JP4962794B2 (en) * 2008-02-18 2012-06-27 横河電機株式会社 Connector device and semiconductor test system
JP5351071B2 (en) 2009-02-24 2013-11-27 株式会社アドバンテスト Test unit, test head, and electronic component test equipment
JP2011242339A (en) 2010-05-20 2011-12-01 Advantest Corp Test head, testing board and test device
JP7170494B2 (en) * 2018-10-15 2022-11-14 東京エレクトロン株式会社 Intermediate connection member and inspection device
KR20230024466A (en) 2021-08-11 2023-02-21 삼성전자주식회사 Interface board for testing image sensor, test system having the same, and operating methed thereof
CN115754556B (en) * 2022-11-25 2024-01-05 温州众彩汽车零部件有限公司 Multi-tentacle vehicle panel aging deformation rate detection equipment

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6437586B1 (en) 1997-11-03 2002-08-20 Micron Technology, Inc. Load board socket adapter and interface method
JP2001074816A (en) 1999-09-09 2001-03-23 Advantest Corp Semiconductor test device

Also Published As

Publication number Publication date
KR100636303B1 (en) 2006-10-18
JP2005321238A (en) 2005-11-17
KR20060045879A (en) 2006-05-17
TWI299179B (en) 2008-07-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees