DE60016061D1 - Abgeschirmte Bitleitungen für statischen Ramspeicher - Google Patents
Abgeschirmte Bitleitungen für statischen RamspeicherInfo
- Publication number
- DE60016061D1 DE60016061D1 DE60016061T DE60016061T DE60016061D1 DE 60016061 D1 DE60016061 D1 DE 60016061D1 DE 60016061 T DE60016061 T DE 60016061T DE 60016061 T DE60016061 T DE 60016061T DE 60016061 D1 DE60016061 D1 DE 60016061D1
- Authority
- DE
- Germany
- Prior art keywords
- bit lines
- ram memory
- static ram
- shielded bit
- shielded
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003068 static effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/418—Address circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/419—Read-write [R-W] circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/18—Bit line organisation; Bit line lay-out
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/14—Word line organisation; Word line lay-out
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
- H10B10/12—Static random access memory [SRAM] devices comprising a MOSFET load element
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Static Random-Access Memory (AREA)
- Semiconductor Memories (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US247633 | 1999-02-10 | ||
US09/247,633 US5966317A (en) | 1999-02-10 | 1999-02-10 | Shielded bitlines for static RAMs |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60016061D1 true DE60016061D1 (de) | 2004-12-30 |
DE60016061T2 DE60016061T2 (de) | 2005-11-03 |
Family
ID=22935681
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60016061T Expired - Lifetime DE60016061T2 (de) | 1999-02-10 | 2000-01-31 | Abgeschirmte Bitleitungen für statischen Ramspeicher |
Country Status (5)
Country | Link |
---|---|
US (1) | US5966317A (de) |
EP (1) | EP1028431B1 (de) |
JP (2) | JP2000236029A (de) |
KR (1) | KR100688738B1 (de) |
DE (1) | DE60016061T2 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11328967A (ja) * | 1998-05-14 | 1999-11-30 | Fujitsu Ltd | 半導体記憶装置 |
US6262911B1 (en) | 2000-06-22 | 2001-07-17 | International Business Machines Corporation | Method to statically balance SOI parasitic effects, and eight device SRAM cells using same |
TW522546B (en) * | 2000-12-06 | 2003-03-01 | Mitsubishi Electric Corp | Semiconductor memory |
JP4083977B2 (ja) * | 2000-12-20 | 2008-04-30 | 富士通株式会社 | 半導体集積回路及び配線決定方法 |
JP4278338B2 (ja) * | 2002-04-01 | 2009-06-10 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
CN100520955C (zh) * | 2002-09-12 | 2009-07-29 | 松下电器产业株式会社 | 存储装置 |
US20040070008A1 (en) * | 2002-10-09 | 2004-04-15 | Sun Microsystems, Inc. | High speed dual-port memory cell having capacitive coupling isolation and layout design |
JP4416428B2 (ja) * | 2003-04-30 | 2010-02-17 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
US20050253287A1 (en) * | 2004-05-11 | 2005-11-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Dual-port SRAM cell structure |
DE102005021825A1 (de) * | 2005-05-11 | 2006-11-16 | Infineon Technologies Ag | Halbleiterspeichervorrichtung mit verbesserter Ladungserhaltung durch Bitleitungsabschirmung |
KR101231242B1 (ko) * | 2005-12-29 | 2013-02-08 | 매그나칩 반도체 유한회사 | 이웃한 비트라인간 캐패시티브 커플링노이즈를 방지한에스램셀 |
US7577040B2 (en) * | 2006-07-18 | 2009-08-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Dual port memory device with reduced coupling effect |
JP5362198B2 (ja) | 2007-08-31 | 2013-12-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP5648460B2 (ja) * | 2010-12-15 | 2015-01-07 | セイコーエプソン株式会社 | 記憶装置、集積回路装置、及び電子機器 |
US20140299941A1 (en) * | 2013-04-04 | 2014-10-09 | Globalfoundries Inc. | Sram cell with reduced voltage droop |
EP2824313B1 (de) | 2013-07-10 | 2017-09-06 | Continental Automotive GmbH | Kraftstoffeinspritzventil für einen Verbrennungsmotor |
JP6963994B2 (ja) | 2017-12-22 | 2021-11-10 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US11257766B1 (en) | 2020-08-21 | 2022-02-22 | Micron Technology, Inc. | Methods of forming microelectronic devices, and related microelectronic devices, memory devices, and electronic systems |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61206254A (ja) * | 1985-03-08 | 1986-09-12 | Fujitsu Ltd | 半導体記憶装置 |
JPS6325881A (ja) * | 1986-07-17 | 1988-02-03 | Nec Ic Microcomput Syst Ltd | 半導体記憶装置 |
US5523968A (en) * | 1988-05-07 | 1996-06-04 | Seiko Epson Corporation | IC semiconductor memory devices with maintained stable operation and lower operating current characteristics |
JPH03152793A (ja) * | 1989-11-09 | 1991-06-28 | Nec Ic Microcomput Syst Ltd | 半導体記憶装置 |
KR940008132B1 (ko) * | 1991-11-28 | 1994-09-03 | 삼성전자 주식회사 | 신호선간의 잡음을 억제하는 메모리 소자 |
JPH08125130A (ja) * | 1994-10-26 | 1996-05-17 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
JP2689945B2 (ja) * | 1995-03-30 | 1997-12-10 | 日本電気株式会社 | 半導体記憶装置 |
JPH097373A (ja) * | 1995-06-20 | 1997-01-10 | Oki Electric Ind Co Ltd | 半導体記憶装置 |
JP3154650B2 (ja) * | 1995-09-07 | 2001-04-09 | 富士通株式会社 | 半導体装置 |
JPH09162305A (ja) * | 1995-12-08 | 1997-06-20 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP3852729B2 (ja) * | 1998-10-27 | 2006-12-06 | 富士通株式会社 | 半導体記憶装置 |
-
1999
- 1999-02-10 US US09/247,633 patent/US5966317A/en not_active Expired - Lifetime
-
2000
- 2000-01-31 DE DE60016061T patent/DE60016061T2/de not_active Expired - Lifetime
- 2000-01-31 EP EP00300736A patent/EP1028431B1/de not_active Expired - Lifetime
- 2000-02-07 JP JP2000029413A patent/JP2000236029A/ja active Pending
- 2000-02-09 KR KR1020000005893A patent/KR100688738B1/ko not_active IP Right Cessation
-
2007
- 2007-03-20 JP JP2007071999A patent/JP5039403B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1028431B1 (de) | 2004-11-24 |
US5966317A (en) | 1999-10-12 |
DE60016061T2 (de) | 2005-11-03 |
EP1028431A3 (de) | 2001-05-23 |
KR100688738B1 (ko) | 2007-02-28 |
JP2007194657A (ja) | 2007-08-02 |
KR20000057971A (ko) | 2000-09-25 |
JP5039403B2 (ja) | 2012-10-03 |
JP2000236029A (ja) | 2000-08-29 |
EP1028431A2 (de) | 2000-08-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |