DE3752255T2 - Statische Induktiontransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung - Google Patents

Statische Induktiontransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung

Info

Publication number
DE3752255T2
DE3752255T2 DE3752255T DE3752255T DE3752255T2 DE 3752255 T2 DE3752255 T2 DE 3752255T2 DE 3752255 T DE3752255 T DE 3752255T DE 3752255 T DE3752255 T DE 3752255T DE 3752255 T2 DE3752255 T2 DE 3752255T2
Authority
DE
Germany
Prior art keywords
incised
stage
production
insulated gate
static induction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3752255T
Other languages
English (en)
Other versions
DE3752255D1 (de
Inventor
Junichi Nishizawa
Nobuo Takeda
Soubei Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZUKI
Japan Science and Technology Agency
Original Assignee
SUZUKI
Research Development Corp of Japan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP27393486A external-priority patent/JPS63128674A/ja
Priority claimed from JP27393586A external-priority patent/JPS63128675A/ja
Priority claimed from JP27675486A external-priority patent/JPS63131583A/ja
Priority claimed from JP27675586A external-priority patent/JPS63131584A/ja
Application filed by SUZUKI, Research Development Corp of Japan filed Critical SUZUKI
Publication of DE3752255D1 publication Critical patent/DE3752255D1/de
Application granted granted Critical
Publication of DE3752255T2 publication Critical patent/DE3752255T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66416—Static induction transistors [SIT]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/32—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers using masks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76897—Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/7722—Field effect transistors using static field induced regions, e.g. SIT, PBT
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/7725—Field effect transistors with delta-doped channel

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
DE3752255T 1986-11-19 1987-11-18 Statische Induktiontransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung Expired - Fee Related DE3752255T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP27393486A JPS63128674A (ja) 1986-11-19 1986-11-19 切り込み型絶縁ゲ−ト静電誘導トランジスタ
JP27393586A JPS63128675A (ja) 1986-11-19 1986-11-19 切り込み型絶縁ゲ−ト静電誘導トランジスタ
JP27675486A JPS63131583A (ja) 1986-11-21 1986-11-21 切り込み型絶縁ゲ−ト静電誘導トランジスタの製造方法
JP27675586A JPS63131584A (ja) 1986-11-21 1986-11-21 切り込み型絶縁ゲ−ト静電誘導トランジスタの製造方法

Publications (2)

Publication Number Publication Date
DE3752255D1 DE3752255D1 (de) 1999-04-01
DE3752255T2 true DE3752255T2 (de) 1999-09-02

Family

ID=27479007

Family Applications (4)

Application Number Title Priority Date Filing Date
DE3752273T Expired - Fee Related DE3752273T2 (de) 1986-11-19 1987-11-10 Statische Induktionstransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung
DE3752215T Expired - Fee Related DE3752215T2 (de) 1986-11-19 1987-11-18 Verfahren zur Herstellung der Statischen Induktionstransistoren mit isoliertem Gatter in einer eingeschnitteten Stufe
DE87310185T Expired - Fee Related DE3789003T2 (de) 1986-11-19 1987-11-18 Statische Induktionstransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung.
DE3752255T Expired - Fee Related DE3752255T2 (de) 1986-11-19 1987-11-18 Statische Induktiontransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung

Family Applications Before (3)

Application Number Title Priority Date Filing Date
DE3752273T Expired - Fee Related DE3752273T2 (de) 1986-11-19 1987-11-10 Statische Induktionstransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung
DE3752215T Expired - Fee Related DE3752215T2 (de) 1986-11-19 1987-11-18 Verfahren zur Herstellung der Statischen Induktionstransistoren mit isoliertem Gatter in einer eingeschnitteten Stufe
DE87310185T Expired - Fee Related DE3789003T2 (de) 1986-11-19 1987-11-18 Statische Induktionstransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung.

Country Status (3)

Country Link
US (1) US5115287A (de)
EP (4) EP0690513B1 (de)
DE (4) DE3752273T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3752273T2 (de) * 1986-11-19 1999-09-09 Japan Res Dev Corp Statische Induktionstransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung
US5266523A (en) * 1991-11-14 1993-11-30 Micron Technology, Inc. Method of forming self-aligned contacts using the local oxidation of silicon
DE19503641A1 (de) * 1995-02-06 1996-08-08 Forschungszentrum Juelich Gmbh Schichtstruktur mit einer Silicid-Schicht, sowie Verfahren zur Herstellung einer solchen Schichtstruktur
US6341144B1 (en) * 1996-09-20 2002-01-22 At&T Corp. Video coder providing implicit coefficient prediction and scan adaptation for image coding and intra coding of video
US6977406B2 (en) 2001-04-27 2005-12-20 National Institute Of Information And Communications Technology, Incorporated Administrative Agency Short channel insulated-gate static induction transistor and method of manufacturing the same

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE29971E (en) * 1971-07-31 1979-04-17 Zaidan Hojin Hondotai Kenkyn Shinkokai Field effect semiconductor device having an unsaturated triode vacuum tube characteristic
JPS53142189A (en) * 1977-05-17 1978-12-11 Matsushita Electronics Corp Insulating gate type field effect transistor
JPS54125986A (en) * 1978-03-23 1979-09-29 Handotai Kenkyu Shinkokai Semiconductor including insulated gate type transistor
GB2020600B (en) * 1978-04-24 1983-02-16 Yoshino Kogyosho Co Ltd Device for removing and trimming injection moulded parisonbefore blow moulding
US4427990A (en) * 1978-07-14 1984-01-24 Zaidan Hojin Handotai Kenkyu Shinkokai Semiconductor photo-electric converter with insulated gate over p-n charge storage region
JPS5565463A (en) * 1978-11-13 1980-05-16 Semiconductor Res Found Semiconductor device
JPS55133574A (en) * 1979-04-05 1980-10-17 Nec Corp Insulated gate field effect transistor
JPS5735591A (en) * 1980-08-12 1982-02-26 Mochida Pharmaceut Co Ltd Novel pyrimidine derivative
US4654680A (en) * 1980-09-24 1987-03-31 Semiconductor Energy Laboratory Co., Ltd. Sidewall gate IGFET
GB2103879B (en) * 1981-08-19 1985-04-11 Secr Defence Method for producing a vertical channel transistor
JPS5856270A (ja) * 1981-09-30 1983-04-02 Fujitsu Ltd 滋気デイスク装置
JPS59186371A (ja) * 1983-04-07 1984-10-23 Fuji Xerox Co Ltd 半導体装置
JPS6028394A (ja) * 1983-07-26 1985-02-13 Matsushita Electric Ind Co Ltd ビデオ再生装置
FR2555816B1 (fr) * 1983-11-25 1986-04-11 Thomson Csf Transistor a effet de champ a structure verticale
DE3752273T2 (de) * 1986-11-19 1999-09-09 Japan Res Dev Corp Statische Induktionstransistoren mit isoliertem Gatter in einer eingeschnittenen Stufe und Verfahren zu deren Herstellung

Also Published As

Publication number Publication date
US5115287A (en) 1992-05-19
DE3752215T2 (de) 1999-04-08
EP0481965B1 (de) 1998-09-09
DE3752255D1 (de) 1999-04-01
EP0481965A3 (en) 1992-09-30
EP0268472B1 (de) 1994-02-02
DE3789003T2 (de) 1994-05-11
EP0268472A2 (de) 1988-05-25
DE3752215D1 (de) 1998-10-15
EP0547030A3 (en) 1993-07-21
EP0690513B1 (de) 1999-05-06
EP0268472A3 (en) 1988-08-17
EP0547030A2 (de) 1993-06-16
DE3789003D1 (de) 1994-03-17
EP0690513A2 (de) 1996-01-03
DE3752273T2 (de) 1999-09-09
EP0481965A2 (de) 1992-04-22
DE3752273D1 (de) 1999-06-10
EP0547030B1 (de) 1999-02-24
EP0690513A3 (de) 1996-01-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: BOECK, TAPPE, KIRSCHNER RECHTSANWAELTE PATENTANWAELTE

8339 Ceased/non-payment of the annual fee