DE3708843A1 - Roentgenstrahlenpruefvorrichtung - Google Patents

Roentgenstrahlenpruefvorrichtung

Info

Publication number
DE3708843A1
DE3708843A1 DE19873708843 DE3708843A DE3708843A1 DE 3708843 A1 DE3708843 A1 DE 3708843A1 DE 19873708843 DE19873708843 DE 19873708843 DE 3708843 A DE3708843 A DE 3708843A DE 3708843 A1 DE3708843 A1 DE 3708843A1
Authority
DE
Germany
Prior art keywords
ray
rays
detectors
detector
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19873708843
Other languages
German (de)
English (en)
Other versions
DE3708843C2 (enrdf_load_stackoverflow
Inventor
Mineo Kano
Hiromu Shimizu
Isao Kawashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Healthcare Manufacturing Ltd
Original Assignee
Hitachi Medical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Medical Corp filed Critical Hitachi Medical Corp
Publication of DE3708843A1 publication Critical patent/DE3708843A1/de
Application granted granted Critical
Publication of DE3708843C2 publication Critical patent/DE3708843C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/60—Circuit arrangements for obtaining a series of X-ray photographs or for X-ray cinematography
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode

Landscapes

  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
DE19873708843 1986-09-10 1987-03-18 Roentgenstrahlenpruefvorrichtung Granted DE3708843A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61211617A JPS6367552A (ja) 1986-09-10 1986-09-10 Ｘ線検査装置

Publications (2)

Publication Number Publication Date
DE3708843A1 true DE3708843A1 (de) 1988-03-24
DE3708843C2 DE3708843C2 (enrdf_load_stackoverflow) 1991-01-17

Family

ID=16608725

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19873708843 Granted DE3708843A1 (de) 1986-09-10 1987-03-18 Roentgenstrahlenpruefvorrichtung

Country Status (2)

Country Link
JP (1) JPS6367552A (enrdf_load_stackoverflow)
DE (1) DE3708843A1 (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3710502A1 (de) * 1986-09-24 1988-04-07 Hitachi Medical Corp Vorrichtung zur gepaeckpruefung mit roentgenstrahlen
DE3804307A1 (de) * 1987-02-13 1988-08-25 Mitsubishi Heavy Ind Ltd Einrichtung zum identifizieren und zaehlen von waeschestuecken
EP0412190A1 (de) * 1989-08-09 1991-02-13 Heimann Systems GmbH & Co. KG Vorrichtung zum Durchstrahlen von Gegenständen mittels fächerförmiger Strahlung
DE4135282A1 (de) * 1991-10-25 1993-04-29 Heimann Gmbh Roentgenscanner
EP0579848A1 (de) * 1992-07-20 1994-01-26 Heimann Systems GmbH Prüfanlage für Gegenstände
US7162006B2 (en) 2003-11-10 2007-01-09 Yxlon International Security Gmbh Method for de-skewing an X-ray picture of an item of luggage
CN111076777A (zh) * 2019-12-31 2020-04-28 乌鲁木齐海关技术中心 海关核生化智能筛查查验及处置系统

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02243753A (ja) * 1989-03-16 1990-09-27 Showa Denko Kk 溶射材料およびその製造方法
JPH04353792A (ja) * 1991-05-31 1992-12-08 Toshiba Corp 散乱線映像装置及びそれに用いる散乱線検出器
JP3313755B2 (ja) * 1992-04-30 2002-08-12 東芝アイティー・コントロールシステム株式会社 断層撮影装置
JPH06347424A (ja) * 1993-06-08 1994-12-22 Hamamatsu Photonics Kk 軟ｘ線非破壊検査装置
JP3218810B2 (ja) * 1993-06-25 2001-10-15 石川島播磨重工業株式会社 Ｘ線検査車両
JPH07309476A (ja) * 1994-05-16 1995-11-28 Fuji Xerox Co Ltd 用紙搬送装置
JP3435648B2 (ja) * 1997-03-25 2003-08-11 株式会社日立メディコ Ｘ線検査装置
ES2270254T3 (es) 2003-10-06 2007-04-01 Yxlon International Security Gmbh Un procedimiento para determinar el cambio de posicion de una unidad de equipaje para inspeccionar una zona sospechosa en esta unidad de equipaje.
DE102005016632B3 (de) * 2005-01-26 2006-08-10 Smiths Heimann Gmbh Strahlenschutztor
JP2006258781A (ja) * 2005-02-15 2006-09-28 Takashima Giken Kk 異物検査方法及び異物検査装置
JP5508751B2 (ja) * 2009-04-01 2014-06-04 株式会社Ｉｈｉ検査計測 Ｘ線検査車両
JP6918604B2 (ja) * 2017-06-29 2021-08-11 株式会社日立製作所 荷物検査装置及び荷物検査システム
JP6947778B2 (ja) * 2018-10-03 2021-10-13 日本信号株式会社 検査システム
JP7422023B2 (ja) * 2020-07-03 2024-01-25 株式会社日立ソリューションズ Ｘ線画像処理装置およびｘ線画像処理方法
CN115097538A (zh) * 2021-07-07 2022-09-23 同方威视技术股份有限公司 射线扫描设备及射线扫描系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
DE3215025A1 (de) * 1981-04-29 1982-11-18 Radiographic Screens Oy, 00300 Helsinki Roentgenkollimator
DE3140145A1 (de) * 1981-10-09 1983-04-21 Heimann Gmbh, 6200 Wiesbaden Vorrichtung zur herstellung eines roentgenbildes von koerpern

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
DE3215025A1 (de) * 1981-04-29 1982-11-18 Radiographic Screens Oy, 00300 Helsinki Roentgenkollimator
DE3140145A1 (de) * 1981-10-09 1983-04-21 Heimann Gmbh, 6200 Wiesbaden Vorrichtung zur herstellung eines roentgenbildes von koerpern

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3710502A1 (de) * 1986-09-24 1988-04-07 Hitachi Medical Corp Vorrichtung zur gepaeckpruefung mit roentgenstrahlen
DE3804307A1 (de) * 1987-02-13 1988-08-25 Mitsubishi Heavy Ind Ltd Einrichtung zum identifizieren und zaehlen von waeschestuecken
DE3804307C2 (enrdf_load_stackoverflow) * 1987-02-13 1992-01-23 Mitsubishi Jukogyo K.K., Tokio/Tokyo, Jp
EP0412190A1 (de) * 1989-08-09 1991-02-13 Heimann Systems GmbH & Co. KG Vorrichtung zum Durchstrahlen von Gegenständen mittels fächerförmiger Strahlung
DE4135282A1 (de) * 1991-10-25 1993-04-29 Heimann Gmbh Roentgenscanner
EP0579848A1 (de) * 1992-07-20 1994-01-26 Heimann Systems GmbH Prüfanlage für Gegenstände
US7162006B2 (en) 2003-11-10 2007-01-09 Yxlon International Security Gmbh Method for de-skewing an X-ray picture of an item of luggage
CN111076777A (zh) * 2019-12-31 2020-04-28 乌鲁木齐海关技术中心 海关核生化智能筛查查验及处置系统
CN111076777B (zh) * 2019-12-31 2021-07-23 乌鲁木齐海关技术中心 海关核生化智能筛查、查验及处置系统

Also Published As

Publication number Publication date
JPS6367552A (ja) 1988-03-26
DE3708843C2 (enrdf_load_stackoverflow) 1991-01-17

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8128 New person/name/address of the agent

Representative=s name: STREHL, P., DIPL.-ING. DIPL.-WIRTSCH.-ING. SCHUEBE

D2 Grant after examination
8363 Opposition against the patent
8330 Complete disclaimer