JPS6367552A - Ｘ線検査装置 - Google Patents

Ｘ線検査装置

Info

Publication number
JPS6367552A
JPS6367552A JP61211617A JP21161786A JPS6367552A JP S6367552 A JPS6367552 A JP S6367552A JP 61211617 A JP61211617 A JP 61211617A JP 21161786 A JP21161786 A JP 21161786A JP S6367552 A JPS6367552 A JP S6367552A
Authority
JP
Japan
Prior art keywords
ray
detector
rays
shape
detectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61211617A
Other languages
English (en)
Japanese (ja)
Inventor
Mineo Kano
加野　岑夫
Hiroshi Shimizu
宏 清水
Isao Kawashima
川嶋　勲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Healthcare Manufacturing Ltd
Original Assignee
Hitachi Medical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Medical Corp filed Critical Hitachi Medical Corp
Priority to JP61211617A priority Critical patent/JPS6367552A/ja
Priority to DE19873708843 priority patent/DE3708843A1/de
Publication of JPS6367552A publication Critical patent/JPS6367552A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/60—Circuit arrangements for obtaining a series of X-ray photographs or for X-ray cinematography
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode

Landscapes

  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
JP61211617A 1986-09-10 1986-09-10 Ｘ線検査装置 Pending JPS6367552A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP61211617A JPS6367552A (ja) 1986-09-10 1986-09-10 Ｘ線検査装置
DE19873708843 DE3708843A1 (de) 1986-09-10 1987-03-18 Roentgenstrahlenpruefvorrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61211617A JPS6367552A (ja) 1986-09-10 1986-09-10 Ｘ線検査装置

Publications (1)

Publication Number Publication Date
JPS6367552A true JPS6367552A (ja) 1988-03-26

Family

ID=16608725

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61211617A Pending JPS6367552A (ja) 1986-09-10 1986-09-10 Ｘ線検査装置

Country Status (2)

Country Link
JP (1) JPS6367552A (enrdf_load_stackoverflow)
DE (1) DE3708843A1 (enrdf_load_stackoverflow)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02243753A (ja) * 1989-03-16 1990-09-27 Showa Denko Kk 溶射材料およびその製造方法
JPH05306972A (ja) * 1992-04-30 1993-11-19 Toshiba Corp 断層撮影装置
JPH06347424A (ja) * 1993-06-08 1994-12-22 Hamamatsu Photonics Kk 軟ｘ線非破壊検査装置
US5379334A (en) * 1992-07-20 1995-01-03 Heimann Systems Gmbh & Co. Kg Object testing system
JPH0712756A (ja) * 1993-06-25 1995-01-17 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線検査車両
US5692744A (en) * 1994-05-16 1997-12-02 Fuji Xerox Co., Ltd. Paper feeder
JPH10267867A (ja) * 1997-03-25 1998-10-09 Hitachi Medical Corp Ｘ線検査装置
JP2006258781A (ja) * 2005-02-15 2006-09-28 Takashima Giken Kk 異物検査方法及び異物検査装置
JP2010243169A (ja) * 2009-04-01 2010-10-28 Ihi Inspection & Instrumentation Co Ltd Ｘ線検査車両
JP2019011981A (ja) * 2017-06-29 2019-01-24 株式会社日立製作所 荷物検査装置及び荷物検査システム
JP2020071217A (ja) * 2018-10-03 2020-05-07 日本信号株式会社 検査システム
JP2022013217A (ja) * 2020-07-03 2022-01-18 株式会社日立ソリューションズ Ｘ線画像処理装置およびｘ線画像処理方法
JP2024523535A (ja) * 2021-07-07 2024-06-28 ヌクテック カンパニー リミテッド 放射線走査装置及び放射線走査システム

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0795100B2 (ja) * 1986-09-24 1995-10-11 株式会社日立メデイコ Ｘ線荷物検査装置
JPH0668779B2 (ja) * 1987-02-13 1994-08-31 三菱重工業株式会社 リネン計数識別装置
EP0412190B1 (de) * 1989-08-09 1993-10-27 Heimann Systems GmbH & Co. KG Vorrichtung zum Durchstrahlen von Gegenständen mittels fächerförmiger Strahlung
JPH04353792A (ja) * 1991-05-31 1992-12-08 Toshiba Corp 散乱線映像装置及びそれに用いる散乱線検出器
DE4135282C2 (de) * 1991-10-25 1994-09-22 Heimann Systems Gmbh & Co Röntgenscanner
ES2270254T3 (es) 2003-10-06 2007-04-01 Yxlon International Security Gmbh Un procedimiento para determinar el cambio de posicion de una unidad de equipaje para inspeccionar una zona sospechosa en esta unidad de equipaje.
DE10352411B4 (de) 2003-11-10 2007-02-22 Yxlon International Security Gmbh Verfahren zur Entzerrung eines Röntgenbildes eines Gepäckstücks
DE102005016632B3 (de) * 2005-01-26 2006-08-10 Smiths Heimann Gmbh Strahlenschutztor
CN111076777B (zh) * 2019-12-31 2021-07-23 乌鲁木齐海关技术中心 海关核生化智能筛查、查验及处置系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
FI68330C (fi) * 1981-04-29 1985-08-12 Radiographic Screen Oy Roentgenkollimator
DE3140145A1 (de) * 1981-10-09 1983-04-21 Heimann Gmbh, 6200 Wiesbaden Vorrichtung zur herstellung eines roentgenbildes von koerpern

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02243753A (ja) * 1989-03-16 1990-09-27 Showa Denko Kk 溶射材料およびその製造方法
JPH05306972A (ja) * 1992-04-30 1993-11-19 Toshiba Corp 断層撮影装置
US5379334A (en) * 1992-07-20 1995-01-03 Heimann Systems Gmbh & Co. Kg Object testing system
JPH06347424A (ja) * 1993-06-08 1994-12-22 Hamamatsu Photonics Kk 軟ｘ線非破壊検査装置
JPH0712756A (ja) * 1993-06-25 1995-01-17 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線検査車両
US5692744A (en) * 1994-05-16 1997-12-02 Fuji Xerox Co., Ltd. Paper feeder
JPH10267867A (ja) * 1997-03-25 1998-10-09 Hitachi Medical Corp Ｘ線検査装置
JP2006258781A (ja) * 2005-02-15 2006-09-28 Takashima Giken Kk 異物検査方法及び異物検査装置
JP2010243169A (ja) * 2009-04-01 2010-10-28 Ihi Inspection & Instrumentation Co Ltd Ｘ線検査車両
JP2019011981A (ja) * 2017-06-29 2019-01-24 株式会社日立製作所 荷物検査装置及び荷物検査システム
JP2020071217A (ja) * 2018-10-03 2020-05-07 日本信号株式会社 検査システム
JP2022013217A (ja) * 2020-07-03 2022-01-18 株式会社日立ソリューションズ Ｘ線画像処理装置およびｘ線画像処理方法
JP2024523535A (ja) * 2021-07-07 2024-06-28 ヌクテック カンパニー リミテッド 放射線走査装置及び放射線走査システム

Also Published As

Publication number Publication date
DE3708843A1 (de) 1988-03-24
DE3708843C2 (enrdf_load_stackoverflow) 1991-01-17

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