DE3643108C2 - - Google Patents

Info

Publication number
DE3643108C2
DE3643108C2 DE3643108A DE3643108A DE3643108C2 DE 3643108 C2 DE3643108 C2 DE 3643108C2 DE 3643108 A DE3643108 A DE 3643108A DE 3643108 A DE3643108 A DE 3643108A DE 3643108 C2 DE3643108 C2 DE 3643108C2
Authority
DE
Germany
Prior art keywords
light beam
phase
particles
polarized light
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3643108A
Other languages
German (de)
English (en)
Other versions
DE3643108A1 (de
Inventor
Toshimitsu Prof. Machida Tokio/Tokyo Jp Musha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE3643108A1 publication Critical patent/DE3643108A1/de
Application granted granted Critical
Publication of DE3643108C2 publication Critical patent/DE3643108C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/53—Immunoassay; Biospecific binding assay; Materials therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4792—Polarisation of scatter light

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Urology & Nephrology (AREA)
  • Hematology (AREA)
  • Molecular Biology (AREA)
  • Biomedical Technology (AREA)
  • Biotechnology (AREA)
  • Cell Biology (AREA)
  • Microbiology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19863643108 1985-12-20 1986-12-17 Verfahren und vorrichtung zum messen immunologischer reaktionen mittels phasenmodulierten lichtes Granted DE3643108A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60285819A JPS62145165A (ja) 1985-12-20 1985-12-20 光の位相変調を利用した免疫反応の測定方法および装置

Publications (2)

Publication Number Publication Date
DE3643108A1 DE3643108A1 (de) 1987-07-16
DE3643108C2 true DE3643108C2 (US20030220297A1-20031127-C00009.png) 1988-11-17

Family

ID=17696495

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19863643108 Granted DE3643108A1 (de) 1985-12-20 1986-12-17 Verfahren und vorrichtung zum messen immunologischer reaktionen mittels phasenmodulierten lichtes

Country Status (3)

Country Link
US (1) US4799796A (US20030220297A1-20031127-C00009.png)
JP (1) JPS62145165A (US20030220297A1-20031127-C00009.png)
DE (1) DE3643108A1 (US20030220297A1-20031127-C00009.png)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912059A (en) * 1988-10-21 1990-03-27 The Johns Hopkins University Phase sensitive differential polarimetry technique and apparatus
US5133602A (en) * 1991-04-08 1992-07-28 International Business Machines Corporation Particle path determination system
JPH0749303A (ja) * 1993-04-01 1995-02-21 High Yield Technol Inc 粒子センサ及び粒子検出方法
CZ286103B6 (cs) * 1993-11-26 2000-01-12 Rokos A Spol., S.R.O. Způsob měření spektropolarimetrických vlastností opticky aktivních látek a dichrograf k provedení tohoto způsobu
DE4343663C1 (de) * 1993-12-21 1995-04-20 Fraunhofer Ges Forschung Vorrichtung zur polarisationsempfindlichen Spektroskopie
US5903352A (en) * 1995-01-27 1999-05-11 Canon Kabushiki Kaisha Apparatus and method for measuring optical anisotropy
US5940178A (en) * 1996-07-03 1999-08-17 Beckman Instruments, Inc. Nephelometer and turbidimeter combination
US6188477B1 (en) * 1998-05-04 2001-02-13 Cornell Research Foundation, Inc. Optical polarization sensing apparatus and method
US6445485B1 (en) * 2000-01-21 2002-09-03 At&T Corp. Micro-machine polarization-state controller
JP4559650B2 (ja) * 2001-03-22 2010-10-13 シチズンホールディングス株式会社 旋光度測定装置及び旋光度測定方法
CN1479864A (zh) * 2001-08-28 2004-03-03 ���µ�����ҵ��ʽ���� 特定成分信息测量装置
CN101960294B (zh) * 2008-03-19 2013-01-23 小幡彻 凝胶粒子测定装置
WO2011149525A1 (en) 2010-05-25 2011-12-01 Arryx, Inc. Holographic fluctuation microscopy apparatus and method for determining mobility of particle and/or cell dispersions

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1068409A (en) * 1975-12-12 1979-12-18 Pierre-Andre Grandchamp Determination of parameters of an autocorrelation function
US4480916A (en) * 1982-07-06 1984-11-06 The United States Of America As Represented By The Secretary Of The Navy Phase-modulated polarizing interferometer
JPS6128866A (ja) * 1984-07-18 1986-02-08 Toshimitsu Musha 光強度ゆらぎを用いる免疫反応の測定方法および装置
JPS62118255A (ja) * 1985-11-19 1987-05-29 Toshimitsu Musha 磁界を用いた免疫反応の検出法

Also Published As

Publication number Publication date
DE3643108A1 (de) 1987-07-16
US4799796A (en) 1989-01-24
JPS62145165A (ja) 1987-06-29
JPH0580980B2 (US20030220297A1-20031127-C00009.png) 1993-11-11

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee