DE2924244C2 - Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des Verfahrens - Google Patents
Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des VerfahrensInfo
- Publication number
- DE2924244C2 DE2924244C2 DE2924244A DE2924244A DE2924244C2 DE 2924244 C2 DE2924244 C2 DE 2924244C2 DE 2924244 A DE2924244 A DE 2924244A DE 2924244 A DE2924244 A DE 2924244A DE 2924244 C2 DE2924244 C2 DE 2924244C2
- Authority
- DE
- Germany
- Prior art keywords
- anode
- ray tube
- sample
- ray
- absorption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title claims description 13
- 238000004876 x-ray fluorescence Methods 0.000 title claims description 5
- 230000005855 radiation Effects 0.000 claims description 28
- 238000010521 absorption reaction Methods 0.000 claims description 20
- 239000010405 anode material Substances 0.000 claims description 14
- 229910052790 beryllium Inorganic materials 0.000 claims description 6
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 claims description 6
- 238000001228 spectrum Methods 0.000 claims description 4
- 239000011247 coating layer Substances 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 description 12
- 230000005284 excitation Effects 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012921 fluorescence analysis Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/10—Power supply arrangements for feeding the X-ray tube
- H05G1/12—Power supply arrangements for feeding the X-ray tube with dc or rectified single-phase ac or double-phase
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
- H01J35/116—Transmissive anodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
- H01J35/18—Windows
- H01J35/186—Windows used as targets or X-ray converters
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE7807078A SE415804B (sv) | 1978-06-21 | 1978-06-21 | Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2924244A1 DE2924244A1 (de) | 1980-01-03 |
| DE2924244C2 true DE2924244C2 (de) | 1987-05-07 |
Family
ID=20335268
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2924244A Expired DE2924244C2 (de) | 1978-06-21 | 1979-06-15 | Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des Verfahrens |
Country Status (11)
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE428974B (sv) * | 1979-02-07 | 1983-08-01 | Nils Johannes Baecklund | Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov |
| US4484341A (en) * | 1981-10-02 | 1984-11-20 | Radiation Dynamics, Inc. | Method and apparatus for selectively radiating materials with electrons and X-rays |
| US4731804A (en) * | 1984-12-31 | 1988-03-15 | North American Philips Corporation | Window configuration of an X-ray tube |
| FR2600422B1 (fr) * | 1986-05-29 | 1989-10-13 | Instruments Sa | Appareil et procede d'analyses chimiques locales a la surface de materiaux solides par spectroscopie de photo-electrons x |
| GB8621983D0 (en) * | 1986-09-12 | 1986-10-22 | K X Technology Ltd | Ore analysis |
| US5369679A (en) * | 1990-09-05 | 1994-11-29 | Photoelectron Corporation | Low power x-ray source with implantable probe for treatment of brain tumors |
| US5153900A (en) * | 1990-09-05 | 1992-10-06 | Photoelectron Corporation | Miniaturized low power x-ray source |
| US5428658A (en) * | 1994-01-21 | 1995-06-27 | Photoelectron Corporation | X-ray source with flexible probe |
| US5452720A (en) * | 1990-09-05 | 1995-09-26 | Photoelectron Corporation | Method for treating brain tumors |
| US5115457A (en) * | 1990-10-01 | 1992-05-19 | E. I. Du Pont De Nemours And Company | Method of determining titanium dioxide content in paint |
| US6377846B1 (en) | 1997-02-21 | 2002-04-23 | Medtronic Ave, Inc. | Device for delivering localized x-ray radiation and method of manufacture |
| US6799075B1 (en) | 1995-08-24 | 2004-09-28 | Medtronic Ave, Inc. | X-ray catheter |
| DE69823406T2 (de) * | 1997-02-21 | 2005-01-13 | Medtronic AVE, Inc., Santa Rosa | Röntgenvorrichtung versehen mit einer Dehnungsstruktur zur lokalen Bestrahlung des Inneren eines Körpers |
| FI102697B (fi) * | 1997-06-26 | 1999-01-29 | Metorex Internat Oy | Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärje stely ja röntgenputki |
| US5854822A (en) * | 1997-07-25 | 1998-12-29 | Xrt Corp. | Miniature x-ray device having cold cathode |
| US6108402A (en) * | 1998-01-16 | 2000-08-22 | Medtronic Ave, Inc. | Diamond vacuum housing for miniature x-ray device |
| US6069938A (en) * | 1998-03-06 | 2000-05-30 | Chornenky; Victor Ivan | Method and x-ray device using pulse high voltage source |
| US6195411B1 (en) | 1999-05-13 | 2001-02-27 | Photoelectron Corporation | Miniature x-ray source with flexible probe |
| JP2003142294A (ja) * | 2001-10-31 | 2003-05-16 | Ge Medical Systems Global Technology Co Llc | 高電圧発生回路およびｘ線発生装置 |
| CN103933606B (zh) | 2006-12-15 | 2016-08-24 | 生命连结有限公司 | 明胶-转谷氨酰胺酶止血敷料和密封材料 |
| US20100008989A1 (en) | 2008-06-12 | 2010-01-14 | Ishay Attar | Process for manufacture of gelatin solutions and products thereof |
| WO2009153748A2 (en) * | 2008-06-18 | 2009-12-23 | Lifebond Ltd | Methods and devices for use with sealants |
| JP5450612B2 (ja) | 2008-06-18 | 2014-03-26 | ライフボンド リミテッド | 改良された架橋組成物 |
| EP2303341A2 (en) * | 2008-06-18 | 2011-04-06 | Lifebond Ltd | A method for enzymatic cross-linking of a protein |
| CA2782863A1 (en) | 2009-12-22 | 2011-06-30 | Lifebond Ltd | Modification of enzymatic crosslinkers for controlling properties of crosslinked matrices |
| US8961544B2 (en) | 2010-08-05 | 2015-02-24 | Lifebond Ltd. | Dry composition wound dressings and adhesives comprising gelatin and transglutaminase in a cross-linked matrix |
| US11998654B2 (en) | 2018-07-12 | 2024-06-04 | Bard Shannon Limited | Securing implants and medical devices |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE518895A (US06312121-20011106-C00033.png) * | 1952-02-20 | |||
| US2999937A (en) * | 1958-10-20 | 1961-09-12 | Philips Corp | X-ray apparatus |
| DE1773759A1 (de) * | 1968-07-03 | 1972-03-16 | Vnii Raswedotschnoj Geofisiki | Vorrichtung fuer Roentgenspektralanalyse |
| JPS5435078B1 (US06312121-20011106-C00033.png) * | 1970-07-30 | 1979-10-31 | ||
| US4048496A (en) * | 1972-05-08 | 1977-09-13 | Albert Richard D | Selectable wavelength X-ray source, spectrometer and assay method |
| US3925660A (en) * | 1972-05-08 | 1975-12-09 | Richard D Albert | Selectable wavelength X-ray source, spectrometer and assay method |
| JPS5139580B2 (US06312121-20011106-C00033.png) * | 1973-02-08 | 1976-10-28 | ||
| JPS5232593B2 (US06312121-20011106-C00033.png) * | 1973-09-06 | 1977-08-23 | ||
| JPS5346062Y2 (US06312121-20011106-C00033.png) * | 1973-11-06 | 1978-11-04 | ||
| JPS5139580U (US06312121-20011106-C00033.png) * | 1974-09-18 | 1976-03-24 | ||
| US3963922A (en) * | 1975-06-09 | 1976-06-15 | Nuclear Semiconductor | X-ray fluorescence device |
| GB1537099A (en) * | 1976-06-15 | 1978-12-29 | United Scient Corp | X-ray fluorescence device |
-
1978
- 1978-06-21 SE SE7807078A patent/SE415804B/sv not_active IP Right Cessation
-
1979
- 1979-06-06 CA CA000329226A patent/CA1139021A/en not_active Expired
- 1979-06-07 FI FI791817A patent/FI72814C/fi not_active IP Right Cessation
- 1979-06-08 NL NL7904500A patent/NL7904500A/xx not_active Application Discontinuation
- 1979-06-15 DE DE2924244A patent/DE2924244C2/de not_active Expired
- 1979-06-18 JP JP7575179A patent/JPS552991A/ja active Pending
- 1979-06-19 GB GB7921398A patent/GB2025040B/en not_active Expired
- 1979-06-20 AU AU48236/79A patent/AU522334B2/en not_active Ceased
- 1979-06-21 FR FR7915882A patent/FR2429425A1/fr active Granted
- 1979-06-21 ZA ZA793095A patent/ZA793095B/xx unknown
-
1980
- 1980-12-09 US US06/214,862 patent/US4344181A/en not_active Expired - Lifetime
-
1988
- 1988-07-08 JP JP1988090072U patent/JPH0334681Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2924244A1 (de) | 1980-01-03 |
| SE415804B (sv) | 1980-10-27 |
| AU4823679A (en) | 1980-01-03 |
| SE7807078L (sv) | 1979-12-22 |
| GB2025040B (en) | 1982-11-17 |
| GB2025040A (en) | 1980-01-16 |
| JPS6419160U (US06312121-20011106-C00033.png) | 1989-01-31 |
| CA1139021A (en) | 1983-01-04 |
| AU522334B2 (en) | 1982-05-27 |
| FI791817A (fi) | 1979-12-22 |
| FR2429425A1 (fr) | 1980-01-18 |
| ZA793095B (en) | 1980-08-27 |
| JPH0334681Y2 (US06312121-20011106-C00033.png) | 1991-07-23 |
| JPS552991A (en) | 1980-01-10 |
| NL7904500A (nl) | 1979-12-28 |
| FI72814C (fi) | 1987-07-10 |
| US4344181A (en) | 1982-08-10 |
| FR2429425B1 (US06312121-20011106-C00033.png) | 1985-04-26 |
| FI72814B (fi) | 1987-03-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE2924244C2 (de) | Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des Verfahrens | |
| DE2407133C3 (US06312121-20011106-C00033.png) | ||
| DE3322870C2 (de) | Optoakustische Meßvorrichtung zum Bestimmen einer Partikelkonzentration | |
| DE2407133B2 (de) | Verfahren und vorrichtung zur bestimmung von stickoxid | |
| DE3633738A1 (de) | Radiologische untersuchungsgeraet | |
| DE2844704A1 (de) | Verfahren und vorrichtung fuer eine roentgenanalyse von materialproben | |
| DE3104468C2 (de) | Röntgenfluoreszenzspektrometer | |
| EP0349839B1 (de) | Mehrkomponenten-Photometer | |
| DE1523077A1 (de) | Verfahren und Vorrichtung zur radiometrischen Analyse | |
| EP0217464A2 (de) | Verfahren zur Bestimmung der Fotoschwächung in einem Bereich eines Untersuchungskörpers und Anordnung zur Durchführung des Verfahrens | |
| DE2543011A1 (de) | Einrichtung zur roentgenstrahlen- fluoreszenzanalyse | |
| DE69800159T2 (de) | Röntgenfluoreszenz-Messsystem unter Verwendung polarisierter Strahlung und Röntgenröhre | |
| DE2642637C2 (de) | Röntgenfluoreszenzspektrometer | |
| DE1245174B (de) | Vorrichtung zur Roentgenstrahlen-fluoreszenzanalyse eines Werkstoffes | |
| DE2048862C3 (de) | Vorrichtung zur spektralphotometrischen Analyse | |
| DE2411841B2 (de) | Auger-Elektronenspektrometer | |
| DE2637364A1 (de) | Geraet zur spektroskopischen untersuchung der zusammensetzung einer unbekannten substanz und diesbezuegliches verfahren | |
| DE1648863C3 (de) | Verfahren und Vorrichtung für die Atom-Absorptions-Spektralanalyse | |
| DE1110909B (de) | Lichtelektrisches Polarimeter | |
| DE3015352A1 (de) | Verfahren und vorrichtung zum spektoskopischen naschweis von an der oberflaeche eines festkoerpers befindlichen elementen | |
| DE2528596A1 (de) | Verfahren zur lokalen, chemischen analyse einer festkoerperprobe | |
| DE2621331C3 (de) | Lichtquelle mit Strahlenteilung zur Gewinnung zweier Lichtstrahlen von zueinander proportionaler Intensität | |
| CH665026A5 (de) | Spektrometer. | |
| DE1673348A1 (de) | Verfahren und Vorrichtung zur spektroskopischen Analyse von Festkoerpern,Loesungen und Gasen | |
| DE1146278B (de) | Verfahren und Vorrichtung zum spektroskopischen Abtasten eines Wellenlaengenbereiches |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |