DE2557074C2 - Einrichtung zum Aufnehmen und Transportieren eines Werkstücks - Google Patents

Einrichtung zum Aufnehmen und Transportieren eines Werkstücks

Info

Publication number
DE2557074C2
DE2557074C2 DE2557074A DE2557074A DE2557074C2 DE 2557074 C2 DE2557074 C2 DE 2557074C2 DE 2557074 A DE2557074 A DE 2557074A DE 2557074 A DE2557074 A DE 2557074A DE 2557074 C2 DE2557074 C2 DE 2557074C2
Authority
DE
Germany
Prior art keywords
piston
probe
workpiece
chip
needle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2557074A
Other languages
German (de)
English (en)
Other versions
DE2557074A1 (de
Inventor
Dieter Klaus Cambridge Vt. Neff
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE2557074A1 publication Critical patent/DE2557074A1/de
Application granted granted Critical
Publication of DE2557074C2 publication Critical patent/DE2557074C2/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7412—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • H10P72/7414—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support the auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
  • Dicing (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE2557074A 1974-12-20 1975-12-18 Einrichtung zum Aufnehmen und Transportieren eines Werkstücks Expired DE2557074C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/534,935 US3973682A (en) 1974-12-20 1974-12-20 Pick up assembly for fragile devices

Publications (2)

Publication Number Publication Date
DE2557074A1 DE2557074A1 (de) 1976-06-24
DE2557074C2 true DE2557074C2 (de) 1984-05-24

Family

ID=24132134

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2557074A Expired DE2557074C2 (de) 1974-12-20 1975-12-18 Einrichtung zum Aufnehmen und Transportieren eines Werkstücks

Country Status (5)

Country Link
US (1) US3973682A (enExample)
JP (1) JPS5842619B2 (enExample)
DE (1) DE2557074C2 (enExample)
FR (1) FR2295569A1 (enExample)
GB (1) GB1495984A (enExample)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5425073U (enExample) * 1977-07-21 1979-02-19
US4261681A (en) * 1978-08-18 1981-04-14 International Business Machines Corporation Article transfer apparatus
JPH0217479Y2 (enExample) * 1981-03-18 1990-05-16
US4458412A (en) * 1981-05-06 1984-07-10 Universal Instruments Corporation Leadless chip placement machine for printed circuit boards
NL8103573A (nl) * 1981-07-29 1983-02-16 Philips Nv Inrichting voor het tegelijkertijd toevoeren van meerdere in banden verpakte electrische en/of electronische onderdelen aan een bepaalde positie.
CH664320A5 (de) * 1982-03-08 1988-02-29 Miroslav Tresky Dr Ing Vorrichtung zum bestuecken eines objektes mit verschiedenen in elektrischen und elektronischen schaltkreisen ueblichen komponenten.
US4749329A (en) * 1982-12-06 1988-06-07 Motorola, Inc. Die pick mechanism for automatic assembly of semiconductor devices
GB2139597B (en) * 1983-05-13 1986-07-09 Tdk Corp Apparatus for automatically mounting chip type circuit elements on printed circuit boards
DE3336606A1 (de) * 1983-10-07 1985-04-25 Siemens AG, 1000 Berlin und 8000 München Verfahren zur mikropackherstellung
JPS6089938A (ja) * 1983-10-24 1985-05-20 Rohm Co Ltd 半導体チツプの試験分類法
EP0194487B1 (de) * 1985-02-28 1990-07-18 Siemens Aktiengesellschaft Verfahren zur Lagebestimmung eines Objekts in einem automatisierten Fertigungsverfahren und Vorrichtung zur Durchführung des Verfahrens
US4703965A (en) * 1986-02-25 1987-11-03 Micro Component Technology, Inc. Integrated circuit placement device vacuum head
GB8702618D0 (en) * 1987-02-05 1987-03-11 Dynapert Precima Ltd Suction pick-up apparatus
GB8714175D0 (en) * 1987-06-17 1987-07-22 Dynapert Precima Ltd Suction pick-up apparatus
US4875279A (en) * 1987-08-21 1989-10-24 E. I. Du Pont De Nemours And Company Die attach pickup tools
US4850780A (en) * 1987-09-28 1989-07-25 Kulicke And Soffa Industries Inc. Pre-peel die ejector apparatus
US4990051A (en) * 1987-09-28 1991-02-05 Kulicke And Soffa Industries, Inc. Pre-peel die ejector apparatus
JP2530013B2 (ja) * 1988-11-18 1996-09-04 富士通株式会社 半導体装置の製造方法
CA2031776A1 (en) * 1989-12-08 1991-06-09 Masanori Nishiguchi Pickup method and the pickup apparatus for chip-type part
DE10121578C2 (de) * 2001-05-03 2003-04-10 Infineon Technologies Ag Verfahren und Bestückungssystem zum Bestücken eines Substrats mit elektronischen Bauteilen
US6592325B2 (en) * 2001-06-25 2003-07-15 Industrial Technology Research Institute Air-suspended die sorter
US6772509B2 (en) * 2002-01-28 2004-08-10 Motorola, Inc. Method of separating and handling a thin semiconductor die on a wafer
JP4673546B2 (ja) * 2002-10-25 2011-04-20 ハイデルベルガー ドルツクマシーネン アクチエンゲゼルシヤフト 跳上げ式吸い口
US20070048120A1 (en) * 2005-08-15 2007-03-01 Texas Instruments Incorporated Vacuum shroud for a die attach tool
US20090148258A1 (en) * 2007-12-07 2009-06-11 Chi Wah Cheng Pick and place apparatus incorporating debris removal device
US8801352B2 (en) * 2011-08-11 2014-08-12 International Business Machines Corporation Pick and place tape release for thin semiconductor dies
JP5934514B2 (ja) * 2012-02-16 2016-06-15 セキ工業株式会社 真空吸着ヘッドを有する物品供給装置
CN104670892B (zh) * 2013-11-29 2017-02-08 鸿富锦精密工业（深圳）有限公司 取放料装置
CN105583841B (zh) * 2014-10-20 2018-01-23 富鼎电子科技(嘉善)有限公司 定位治具
KR102545230B1 (ko) * 2016-11-02 2023-06-19 삼성전자주식회사 피커 어셈블리 및 이를 구비하는 추출장치
US10099387B2 (en) * 2017-01-24 2018-10-16 Jabil Inc. Apparatus, system and method for providing a vacuum ejector for an end effector
US10493638B1 (en) * 2018-09-11 2019-12-03 Jabil Inc. Apparatus, system and method for providing a vacuum ejector for an end effector
JP2018129324A (ja) * 2017-02-06 2018-08-16 株式会社東芝 ピックアップ装置
US11084175B2 (en) * 2018-12-13 2021-08-10 Amazon Technologies, Inc. End-of-arm tool having concentric suction cups, and related systems and methods
US11911894B2 (en) * 2019-05-09 2024-02-27 Intelligrated Headquarters, Llc Method and system for manipulating articles
CN110422416A (zh) * 2019-07-04 2019-11-08 宁波市鄞州特尔斐电子有限公司 一种集成电路及其撕膜方法和撕膜排板设备
CN110429048A (zh) * 2019-07-04 2019-11-08 宁波市鄞州特尔斐电子有限公司 一种集成电路撕膜机的载板上料装置
CN110589417B (zh) * 2019-09-17 2020-12-01 日照丰华脚手架有限公司 一种圆管自动化上料设备
CN113594079B (zh) * 2020-04-30 2024-01-16 先进科技新加坡有限公司 用于将电子元件从粘性载体分离的顶出器单元
CN112367827B (zh) * 2020-12-03 2021-10-22 赣州深奥电子有限公司 一种smt贴片机吸附装置
TWI799111B (zh) * 2022-01-26 2023-04-11 東佑達自動化科技股份有限公司 自動化生產線送料裝置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2932281A (en) * 1958-06-25 1960-04-12 North American Aviation Inc Double-acting actuator means
JPS436858Y1 (enExample) * 1967-01-10 1968-03-27
US3567043A (en) * 1968-08-05 1971-03-02 Sun Chemical Corp Transfer assembly for use with container printing machines
US3785507A (en) * 1968-12-19 1974-01-15 Teledyne Inc Die sorting system
US3720309A (en) * 1971-12-07 1973-03-13 Teledyne Inc Method and apparatus for sorting semiconductor dice
US3870164A (en) * 1972-07-12 1975-03-11 Harold A Haase Work transfer device
US3847284A (en) * 1973-05-11 1974-11-12 Teledyne Inc Magnetic tape die sorting system

Also Published As

Publication number Publication date
JPS5178172A (enExample) 1976-07-07
FR2295569A1 (fr) 1976-07-16
US3973682A (en) 1976-08-10
DE2557074A1 (de) 1976-06-24
GB1495984A (en) 1977-12-21
JPS5842619B2 (ja) 1983-09-21
FR2295569B1 (enExample) 1978-05-12

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Legal Events

Date Code Title Description
OD Request for examination
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee