DE2556822C2 - Monolithische hochintegrierte Halbleiterschaltung - Google Patents

Monolithische hochintegrierte Halbleiterschaltung

Info

Publication number
DE2556822C2
DE2556822C2 DE2556822A DE2556822A DE2556822C2 DE 2556822 C2 DE2556822 C2 DE 2556822C2 DE 2556822 A DE2556822 A DE 2556822A DE 2556822 A DE2556822 A DE 2556822A DE 2556822 C2 DE2556822 C2 DE 2556822C2
Authority
DE
Germany
Prior art keywords
registers
semiconductor circuit
data
memory
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2556822A
Other languages
German (de)
English (en)
Other versions
DE2556822A1 (de
Inventor
Edward B. Purdy Station N.Y. Eichelberger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE2556822A1 publication Critical patent/DE2556822A1/de
Application granted granted Critical
Publication of DE2556822C2 publication Critical patent/DE2556822C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
DE2556822A 1974-12-20 1975-12-17 Monolithische hochintegrierte Halbleiterschaltung Expired DE2556822C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/534,606 US3961252A (en) 1974-12-20 1974-12-20 Testing embedded arrays

Publications (2)

Publication Number Publication Date
DE2556822A1 DE2556822A1 (de) 1976-06-24
DE2556822C2 true DE2556822C2 (de) 1982-10-21

Family

ID=24130783

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2556822A Expired DE2556822C2 (de) 1974-12-20 1975-12-17 Monolithische hochintegrierte Halbleiterschaltung

Country Status (7)

Country Link
US (1) US3961252A (enExample)
JP (1) JPS5441450B2 (enExample)
CA (1) CA1038079A (enExample)
DE (1) DE2556822C2 (enExample)
FR (1) FR2295531A1 (enExample)
GB (1) GB1525274A (enExample)
IT (1) IT1043514B (enExample)

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DE2904874A1 (de) * 1979-02-09 1980-08-14 Standard Elektrik Lorenz Ag Monolithisch integrierte grosschaltung und deren betriebsschaltung
DE2824224A1 (de) * 1978-06-02 1979-12-20 Standard Elektrik Lorenz Ag Monolithisch integrierte grosschaltung
FR2432175A1 (fr) * 1978-07-27 1980-02-22 Cii Honeywell Bull Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
DE2902375C2 (de) * 1979-01-23 1984-05-17 Siemens AG, 1000 Berlin und 8000 München Logikbaustein für integrierte Digitalschaltungen
ATE8544T1 (de) * 1979-05-15 1984-08-15 Mostek Corporation Verfahren und schaltung zum pruefen der arbeitsweise eines internen regenerierungszaehlers in einem speicher mit wahlfreiem zugriff.
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GB2070779B (en) * 1980-02-28 1984-02-15 Solartron Electronic Group Apparatus for testing digital electronic circuits
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
DE3030299A1 (de) 1980-08-09 1982-04-08 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
EP0059188A1 (en) * 1980-09-08 1982-09-08 Mostek Corporation Tape burn-in circuit
US4380805A (en) * 1980-09-08 1983-04-19 Mostek Corporation Tape burn-in circuit
US4404519A (en) * 1980-12-10 1983-09-13 International Business Machine Company Testing embedded arrays in large scale integrated circuits
US4441182A (en) * 1981-05-15 1984-04-03 Rockwell International Corporation Repetitious logic state signal generation apparatus
US4433412A (en) * 1981-05-15 1984-02-21 Rockwell International Corporation Method and apparatus for testing and verifying the operability of register based state machine apparatus
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4481627A (en) * 1981-10-30 1984-11-06 Honeywell Information Systems Inc. Embedded memory testing method and apparatus
US4808915A (en) * 1981-10-30 1989-02-28 Honeywell Bull, Inc. Assembly of electronic components testable by a reciprocal quiescent testing technique
US4556840A (en) * 1981-10-30 1985-12-03 Honeywell Information Systems Inc. Method for testing electronic assemblies
US4503386A (en) * 1982-04-20 1985-03-05 International Business Machines Corporation Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
US4527115A (en) * 1982-12-22 1985-07-02 Raytheon Company Configurable logic gate array
US4499579A (en) * 1983-03-10 1985-02-12 Honeywell Information Systems Inc. Programmable logic array with dynamic test capability in the unprogrammed state
DE3375843D1 (en) * 1983-12-28 1988-04-07 Ibm Electrical-diagnosis method for a defect cell in a chain of cells of a shift register
US4608669A (en) * 1984-05-18 1986-08-26 International Business Machines Corporation Self contained array timing
JPH073865B2 (ja) * 1984-08-07 1995-01-18 富士通株式会社 半導体集積回路及び半導体集積回路の試験方法
US4715034A (en) * 1985-03-04 1987-12-22 John Fluke Mfg. Co., Inc. Method of and system for fast functional testing of random access memories
GB8507613D0 (en) * 1985-03-23 1985-05-01 Int Computers Ltd Testing digital integrated circuits
GB8511188D0 (en) * 1985-05-02 1985-06-12 Int Computers Ltd Testing digital integrated circuits
GB8511187D0 (en) * 1985-05-02 1985-06-12 Int Computers Ltd Testing digital integrated circuits
US4719411A (en) * 1985-05-13 1988-01-12 California Institute Of Technology Addressable test matrix for measuring analog transfer characteristics of test elements used for integrated process control and device evaluation
JPS6238600A (ja) * 1985-08-14 1987-02-19 Fujitsu Ltd 半導体記憶装置
US4783782A (en) * 1985-12-12 1988-11-08 Alcatel U.S.A. Corporation Manufacturing test data storage apparatus for dynamically reconfigurable cellular array processor chip
US4669081A (en) * 1986-02-04 1987-05-26 Raytheon Company LSI fault insertion
US4726023A (en) * 1986-05-14 1988-02-16 International Business Machines Corporation Determination of testability of combined logic end memory by ignoring memory
DE3619255A1 (de) * 1986-06-07 1987-12-10 Ant Nachrichtentech Einrichtung zur pruefung von schreib-/lesespeichern
US4853628A (en) * 1987-09-10 1989-08-01 Gazelle Microcircuits, Inc. Apparatus for measuring circuit parameters of a packaged semiconductor device
US4841485A (en) * 1987-11-05 1989-06-20 International Business Machines Corporation Read/write memory device with an embedded read-only pattern and method for providing same
US4852094A (en) * 1987-11-10 1989-07-25 Eaton Corporation Dual path switch gate array
US4878209A (en) * 1988-03-17 1989-10-31 International Business Machines Corporation Macro performance test
US4875209A (en) * 1988-04-04 1989-10-17 Raytheon Company Transient and intermittent fault insertion
US4975641A (en) * 1988-07-14 1990-12-04 Sharp Kabushiki Kaisha Integrated circuit and method for testing the integrated circuit
KR920001079B1 (ko) * 1989-06-10 1992-02-01 삼성전자 주식회사 직렬데이타 통로가 내장된 메모리소자의 테스트방법
FR2653913B1 (fr) * 1989-10-31 1992-01-03 Sgs Thomson Microelectronics Systeme de test d'un microprocesseur.
US5228040A (en) * 1990-03-09 1993-07-13 At&T Bell Laboratories Testable implementations of finite state machines and methods for producing them
US5254940A (en) * 1990-12-13 1993-10-19 Lsi Logic Corporation Testable embedded microprocessor and method of testing same
US5369648A (en) * 1991-11-08 1994-11-29 Ncr Corporation Built-in self-test circuit
US5442640A (en) * 1993-01-19 1995-08-15 International Business Machines Corporation Test and diagnosis of associated output logic for products having embedded arrays
US5371748A (en) * 1993-03-26 1994-12-06 Vlsi Technology, Inc. Technique and apparatus for testing an electrically programmable ROM embedded among other digital circuitry on an IC chip
JPH0773699A (ja) * 1993-09-02 1995-03-17 Sony Corp デュアルポートメモリの埋込みテスト回路
GB9417266D0 (en) * 1994-08-26 1994-10-19 Inmos Ltd Testing a non-volatile memory
GB2295700B (en) * 1994-12-02 1999-04-21 Westinghouse Brake & Signal Data testing
US5847561A (en) * 1994-12-16 1998-12-08 Texas Instruments Incorporated Low overhead input and output boundary scan cells
US6041007A (en) * 1998-02-02 2000-03-21 Motorola, Inc. Device with programmable memory and method of programming
GB2345976B (en) 1999-01-22 2003-06-25 Sgs Thomson Microelectronics Test circuit for memory
US6928581B1 (en) 1999-09-14 2005-08-09 International Business Machines Corporation Innovative bypass circuit for circuit testing and modification
US6931580B1 (en) 2000-03-13 2005-08-16 International Business Machines Corporation Rapid fail analysis of embedded objects
US7707472B1 (en) * 2004-05-17 2010-04-27 Altera Corporation Method and apparatus for routing efficient built-in self test for on-chip circuit blocks
US7257745B2 (en) * 2005-01-31 2007-08-14 International Business Machines Corporation Array self repair using built-in self test techniques
US7908532B2 (en) * 2008-02-16 2011-03-15 International Business Machines Corporation Automated system and processing for expedient diagnosis of broken shift registers latch chains

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Publication number Priority date Publication date Assignee Title
FR1382401A (fr) * 1962-12-08 1964-12-18 Olympia Werke Ag Procédé et dispositif pour la détection d'erreurs dans une mémoire de calculatrice
US3387276A (en) * 1965-08-13 1968-06-04 Sperry Rand Corp Off-line memory test
US3631229A (en) * 1970-09-30 1971-12-28 Ibm Monolithic memory array tester
US3758761A (en) * 1971-08-17 1973-09-11 Texas Instruments Inc Self-interconnecting/self-repairable electronic systems on a slice
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
JPS4992970A (enExample) * 1972-10-31 1974-09-04
US3781670A (en) * 1972-12-29 1973-12-25 Ibm Ac performance test for large scale integrated circuit chips
FR2256706A5 (enExample) * 1973-12-27 1975-07-25 Cii

Also Published As

Publication number Publication date
DE2556822A1 (de) 1976-06-24
JPS5178142A (enExample) 1976-07-07
CA1038079A (en) 1978-09-05
GB1525274A (en) 1978-09-20
JPS5441450B2 (enExample) 1979-12-08
IT1043514B (it) 1980-02-29
FR2295531A1 (fr) 1976-07-16
FR2295531B1 (enExample) 1978-05-12
US3961252A (en) 1976-06-01

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Legal Events

Date Code Title Description
OD Request for examination
D2 Grant after examination
8339 Ceased/non-payment of the annual fee