DE237654T1 - Leseverstaerker fuer einen festwertspeicher. - Google Patents
Leseverstaerker fuer einen festwertspeicher.Info
- Publication number
- DE237654T1 DE237654T1 DE198686202064T DE86202064T DE237654T1 DE 237654 T1 DE237654 T1 DE 237654T1 DE 198686202064 T DE198686202064 T DE 198686202064T DE 86202064 T DE86202064 T DE 86202064T DE 237654 T1 DE237654 T1 DE 237654T1
- Authority
- DE
- Germany
- Prior art keywords
- line
- input line
- node
- potential
- difference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005669 field effect Effects 0.000 claims 2
- 238000005070 sampling Methods 0.000 claims 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/14—Dummy cell management; Sense reference voltage generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
- G11C17/10—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
- G11C17/12—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices
- G11C17/123—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/18—Bit line organisation; Bit line lay-out
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Dram (AREA)
Claims (3)
- Dipl.-lng. Kurt KahlerEuropean Patent AttorneyPostfach 248Anmelder: NCR Corporation Gerberstrasse 3Dayton, Ohio D-8948 MindelheimUSAPhone:(0)8261-3027Telefax: 8261-6563Telex: 53 37 69Ihr Zeichen: Unset Zeichen: Datum:3403A/EPC 12. Nov. 1987Europäische Patentanmeldung: 86202064.1
Europ. Veröffentlichungsnr.: 0 237 654Patentansprüche:1. Ein Abtastverstärker mit einer Eingangsleitung (117) und einer Bezugsleitung (93), gekennzeichnet durch: eine erste und zweite Konstantstromerzeugungsvorrichtung (99, 101), die mit entsprechenden ersten und zweiten Bezugsknoten (112, 122) verbunden sind, einem ersten Durchlaß-Feldeffekttransistor (121), der zwischen die Eingangsleitung (117) und den ersten Bezugsknoten (112) geschaltet ist und seine Gateelektrode umgekehrt proportional zum Potential an der Eingangsleitung (117) vorgespannt hat, einen zweiten Durchlaß-Feldeffekttransistor, der zwischen die Bezugsleitung (93) und den zweiten Bezugsknoten (122) geschaltet ist und seine Gateelektrode umgekehrt proportional zum Potential an der Bezugsleitung (93) vorgespannt hat, und eine Detektorvorrichtung (102), die geeignet ist, eine Differenz in der Stromabsinkkapazität zwischen der Eingangsleitung (117) und der Bezugsleitung (93) festzustellen. - 2. Ein Abtastverstärker nach Anspruch 1, dadurch gekennzeichnet, daß die Detektorvorrichtung einen Differenzverstärker (122) aufweist, der auf eine Differenz zwischen den Potentialen desersten und zweiten Bezugsknotens (112, 122) anspricht, wobei das Nennpotential an dem ersten Bezugsknoten (112) um eine konstante Differenz versetzt zum Nennpotential am zweiten Bezugsknoten (122) ist.
- 3. Ein Abtastverstärker nach Anspruch 2, dadurch gekennzeichnet, daß die Eingangsleitung (117) geeignet ist, selektiv verbunden zu werden mit einem vorladbaren Knoten (33) eines Nur-Lesen-Speichers und daß die Bezugsleitung geeignet ist, gekoppelt zu werden mit einer Bezugszelle (94), die einen Abschnitt des Nur-Lesen-Speichers wiedergibt.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/456,938 US4602354A (en) | 1983-01-10 | 1983-01-10 | X-and-OR memory array |
Publications (1)
Publication Number | Publication Date |
---|---|
DE237654T1 true DE237654T1 (de) | 1988-02-25 |
Family
ID=23814760
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686202064T Expired - Lifetime DE3483836D1 (de) | 1983-01-10 | 1984-01-05 | Leseverstaerker fuer einen festwertspeicher. |
DE198686202064T Pending DE237654T1 (de) | 1983-01-10 | 1984-01-05 | Leseverstaerker fuer einen festwertspeicher. |
DE8484900775T Expired DE3473674D1 (en) | 1983-01-10 | 1984-01-05 | Read-only memory system |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686202064T Expired - Lifetime DE3483836D1 (de) | 1983-01-10 | 1984-01-05 | Leseverstaerker fuer einen festwertspeicher. |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8484900775T Expired DE3473674D1 (en) | 1983-01-10 | 1984-01-05 | Read-only memory system |
Country Status (6)
Country | Link |
---|---|
US (1) | US4602354A (de) |
EP (2) | EP0134237B1 (de) |
JP (1) | JPH0680560B2 (de) |
CA (1) | CA1202724A (de) |
DE (3) | DE3483836D1 (de) |
WO (1) | WO1984002800A2 (de) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4692923A (en) * | 1984-09-28 | 1987-09-08 | Ncr Corporation | Fault tolerant memory |
US4638459A (en) * | 1985-01-31 | 1987-01-20 | Standard Microsystems Corp. | Virtual ground read only memory |
US4933904A (en) * | 1985-11-29 | 1990-06-12 | General Electric Company | Dense EPROM having serially coupled floating gate transistors |
US5877981A (en) * | 1987-06-29 | 1999-03-02 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device having a matrix of memory cells |
US5270969A (en) * | 1987-06-29 | 1993-12-14 | Kabushiki Kaisha Toshiba | Electrically programmable nonvolatile semiconductor memory device with nand cell structure |
US6034899A (en) * | 1987-06-29 | 2000-03-07 | Kabushiki Kaisha Toshiba | Memory cell of nonvolatile semiconductor memory device |
US5448517A (en) * | 1987-06-29 | 1995-09-05 | Kabushiki Kaisha Toshiba | Electrically programmable nonvolatile semiconductor memory device with NAND cell structure |
US5008856A (en) * | 1987-06-29 | 1991-04-16 | Kabushiki Kaisha Toshiba | Electrically programmable nonvolatile semiconductor memory device with NAND cell structure |
US6545913B2 (en) | 1987-06-29 | 2003-04-08 | Kabushiki Kaisha Toshiba | Memory cell of nonvolatile semiconductor memory device |
US4931999A (en) * | 1987-07-27 | 1990-06-05 | Mitsubishi Denki Kabushiki Kaisha | Access circuit for a semiconductor memory |
JP2685770B2 (ja) * | 1987-12-28 | 1997-12-03 | 株式会社東芝 | 不揮発性半導体記憶装置 |
USRE35838E (en) * | 1987-12-28 | 1998-07-07 | Kabushiki Kaisha Toshiba | Electrically erasable programmable read-only memory with NAND cell structure |
US4939690A (en) * | 1987-12-28 | 1990-07-03 | Kabushiki Kaisha Toshiba | Electrically erasable programmable read-only memory with NAND cell structure that suppresses memory cell threshold voltage variation |
JP2625991B2 (ja) * | 1988-11-17 | 1997-07-02 | 三菱電機株式会社 | マスクrom装置 |
KR910004166B1 (ko) * | 1988-12-27 | 1991-06-22 | 삼성전자주식회사 | 낸드쎌들을 가지는 전기적으로 소거 및 프로그램 가능한 반도체 메모리장치 |
US4969125A (en) * | 1989-06-23 | 1990-11-06 | International Business Machines Corporation | Asynchronous segmented precharge architecture |
US4992980A (en) * | 1989-08-07 | 1991-02-12 | Intel Corporation | Novel architecture for virtual ground high-density EPROMS |
EP0461904A3 (en) * | 1990-06-14 | 1992-09-09 | Creative Integrated Systems, Inc. | An improved semiconductor read-only vlsi memory |
US5467300A (en) * | 1990-06-14 | 1995-11-14 | Creative Integrated Systems, Inc. | Grounded memory core for Roms, Eproms, and EEpproms having an address decoder, and sense amplifier |
JP3109537B2 (ja) * | 1991-07-12 | 2000-11-20 | 日本電気株式会社 | 読み出し専用半導体記憶装置 |
DE69224125T2 (de) * | 1991-09-26 | 1998-08-27 | St Microelectronics Srl | Leseverstärker |
US5513148A (en) * | 1994-12-01 | 1996-04-30 | Micron Technology Inc. | Synchronous NAND DRAM architecture |
KR0179097B1 (ko) * | 1995-04-07 | 1999-04-15 | 김주용 | 데이타 리드/라이트 방법 및 장치 |
US5825710A (en) * | 1997-02-26 | 1998-10-20 | Powerchip Semiconductor Corp. | Synchronous semiconductor memory device |
US6430099B1 (en) | 2001-05-11 | 2002-08-06 | Broadcom Corporation | Method and apparatus to conditionally precharge a partitioned read-only memory with shared wordlines for low power operation |
US20040001355A1 (en) * | 2002-06-27 | 2004-01-01 | Matrix Semiconductor, Inc. | Low-cost, serially-connected, multi-level mask-programmable read-only memory |
WO2004002453A1 (en) | 2002-06-28 | 2004-01-08 | Protiva Biotherapeutics Ltd. | Method and apparatus for producing liposomes |
US7042750B2 (en) * | 2002-07-18 | 2006-05-09 | Samsung Electronics Co., Ltd. | Read only memory devices with independently precharged virtual ground and bit lines |
KR100429889B1 (ko) * | 2002-07-18 | 2004-05-03 | 삼성전자주식회사 | 가상접지선과 비트선을 별개로 프리차지시키는 롬집적회로 장치 |
US7005350B2 (en) * | 2002-12-31 | 2006-02-28 | Matrix Semiconductor, Inc. | Method for fabricating programmable memory array structures incorporating series-connected transistor strings |
US7505321B2 (en) * | 2002-12-31 | 2009-03-17 | Sandisk 3D Llc | Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same |
US7233522B2 (en) * | 2002-12-31 | 2007-06-19 | Sandisk 3D Llc | NAND memory array incorporating capacitance boosting of channel regions in unselected memory cells and method for operation of same |
US6822903B2 (en) * | 2003-03-31 | 2004-11-23 | Matrix Semiconductor, Inc. | Apparatus and method for disturb-free programming of passive element memory cells |
US7233024B2 (en) * | 2003-03-31 | 2007-06-19 | Sandisk 3D Llc | Three-dimensional memory device incorporating segmented bit line memory array |
US6879505B2 (en) | 2003-03-31 | 2005-04-12 | Matrix Semiconductor, Inc. | Word line arrangement having multi-layer word line segments for three-dimensional memory array |
US20050128807A1 (en) * | 2003-12-05 | 2005-06-16 | En-Hsing Chen | Nand memory array incorporating multiple series selection devices and method for operation of same |
US7023739B2 (en) * | 2003-12-05 | 2006-04-04 | Matrix Semiconductor, Inc. | NAND memory array incorporating multiple write pulse programming of individual memory cells and method for operation of same |
US7221588B2 (en) * | 2003-12-05 | 2007-05-22 | Sandisk 3D Llc | Memory array incorporating memory cells arranged in NAND strings |
US7272052B2 (en) * | 2005-03-31 | 2007-09-18 | Sandisk 3D Llc | Decoding circuit for non-binary groups of memory line drivers |
US7359279B2 (en) * | 2005-03-31 | 2008-04-15 | Sandisk 3D Llc | Integrated circuit memory array configuration including decoding compatibility with partial implementation of multiple memory layers |
US7054219B1 (en) | 2005-03-31 | 2006-05-30 | Matrix Semiconductor, Inc. | Transistor layout configuration for tight-pitched memory array lines |
US7142471B2 (en) * | 2005-03-31 | 2006-11-28 | Sandisk 3D Llc | Method and apparatus for incorporating block redundancy in a memory array |
US7272040B2 (en) * | 2005-04-29 | 2007-09-18 | Infineon Technologies Ag | Multi-bit virtual-ground NAND memory device |
WO2007079295A2 (en) * | 2005-11-25 | 2007-07-12 | Novelics Llc | Dense read-only memory |
IL292615B2 (en) | 2009-07-01 | 2023-11-01 | Protiva Biotherapeutics Inc | Nucleic acid-lipid particles, preparations containing them and their uses |
WO2012000104A1 (en) | 2010-06-30 | 2012-01-05 | Protiva Biotherapeutics, Inc. | Non-liposomal systems for nucleic acid delivery |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3560765A (en) * | 1968-12-04 | 1971-02-02 | Nat Semiconductor Corp | High speed mos read-only memory |
US3882326A (en) * | 1973-12-26 | 1975-05-06 | Ibm | Differential amplifier for sensing small signals |
US3932848A (en) * | 1975-01-20 | 1976-01-13 | Intel Corporation | Feedback circuit for allowing rapid charging and discharging of a sense node in a static memory |
US4142176A (en) * | 1976-09-27 | 1979-02-27 | Mostek Corporation | Series read only memory structure |
US4082966A (en) * | 1976-12-27 | 1978-04-04 | Texas Instruments Incorporated | Mos detector or sensing circuit |
US4195356A (en) * | 1978-11-16 | 1980-03-25 | Electronic Memories And Magnetics Corporation | Sense line termination circuit for semiconductor memory systems |
US4223394A (en) * | 1979-02-13 | 1980-09-16 | Intel Corporation | Sensing amplifier for floating gate memory devices |
DE2932605C2 (de) * | 1979-08-10 | 1982-12-16 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung mit MOS-Transistoren zum raschen Bewerten des logischen Zustandes eines Abtastknotens |
JPS5633873A (en) * | 1979-08-29 | 1981-04-04 | Hitachi Ltd | Read only memory device |
US4274147A (en) * | 1979-09-04 | 1981-06-16 | Rockwell International Corporation | Static read only memory |
JPS5736498A (en) * | 1980-08-13 | 1982-02-27 | Hitachi Ltd | Multisplit longitudinal type rom |
GB2089612B (en) * | 1980-12-12 | 1984-08-30 | Tokyo Shibaura Electric Co | Nonvolatile semiconductor memory device |
US4489400A (en) * | 1982-03-01 | 1984-12-18 | Texas Instruments Incorporated | Serially banked read only memory |
JPS5982698A (ja) * | 1982-11-04 | 1984-05-12 | Toshiba Corp | マスクrom |
-
1983
- 1983-01-10 US US06/456,938 patent/US4602354A/en not_active Expired - Lifetime
- 1983-11-30 CA CA000442302A patent/CA1202724A/en not_active Expired
-
1984
- 1984-01-05 EP EP84900775A patent/EP0134237B1/de not_active Expired
- 1984-01-05 DE DE8686202064T patent/DE3483836D1/de not_active Expired - Lifetime
- 1984-01-05 EP EP86202064A patent/EP0237654B1/de not_active Expired - Lifetime
- 1984-01-05 DE DE198686202064T patent/DE237654T1/de active Pending
- 1984-01-05 DE DE8484900775T patent/DE3473674D1/de not_active Expired
- 1984-01-05 JP JP59500788A patent/JPH0680560B2/ja not_active Expired - Lifetime
- 1984-01-05 WO PCT/US1984/000018 patent/WO1984002800A2/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
WO1984002800A2 (en) | 1984-07-19 |
DE3473674D1 (en) | 1988-09-29 |
EP0237654B1 (de) | 1991-01-02 |
EP0134237B1 (de) | 1988-08-24 |
JPS60500352A (ja) | 1985-03-14 |
CA1202724A (en) | 1986-04-01 |
US4602354A (en) | 1986-07-22 |
WO1984002800A3 (en) | 1984-10-11 |
EP0237654A1 (de) | 1987-09-23 |
DE3483836D1 (de) | 1991-02-07 |
EP0134237A1 (de) | 1985-03-20 |
JPH0680560B2 (ja) | 1994-10-12 |
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