DE10217290B4 - Verfahren zum Schreiben in einen RAM mit Spaltenlöschung - Google Patents

Verfahren zum Schreiben in einen RAM mit Spaltenlöschung Download PDF

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Publication number
DE10217290B4
DE10217290B4 DE10217290A DE10217290A DE10217290B4 DE 10217290 B4 DE10217290 B4 DE 10217290B4 DE 10217290 A DE10217290 A DE 10217290A DE 10217290 A DE10217290 A DE 10217290A DE 10217290 B4 DE10217290 B4 DE 10217290B4
Authority
DE
Germany
Prior art keywords
memory cells
column
array
selected row
row
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE10217290A
Other languages
German (de)
English (en)
Other versions
DE10217290A1 (de
Inventor
Samuel D. Fort Collins Naffziger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of DE10217290A1 publication Critical patent/DE10217290A1/de
Application granted granted Critical
Publication of DE10217290B4 publication Critical patent/DE10217290B4/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/419Read-write [R-W] circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/16Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)
DE10217290A 2001-04-30 2002-04-18 Verfahren zum Schreiben in einen RAM mit Spaltenlöschung Expired - Lifetime DE10217290B4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/845,387 2001-04-30
US09/845,387 US6772277B2 (en) 2001-04-30 2001-04-30 Method of writing to a memory array using clear enable and column clear signals

Publications (2)

Publication Number Publication Date
DE10217290A1 DE10217290A1 (de) 2002-11-07
DE10217290B4 true DE10217290B4 (de) 2010-04-08

Family

ID=25295121

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10217290A Expired - Lifetime DE10217290B4 (de) 2001-04-30 2002-04-18 Verfahren zum Schreiben in einen RAM mit Spaltenlöschung

Country Status (5)

Country Link
US (1) US6772277B2 (enExample)
JP (1) JP2002343086A (enExample)
DE (1) DE10217290B4 (enExample)
FR (1) FR2828758B1 (enExample)
GB (1) GB2377797B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070014137A1 (en) * 2005-07-18 2007-01-18 Mellinger Todd W Banked cache with multiplexer
US7200020B2 (en) * 2005-08-30 2007-04-03 Freescale Semiconductor, Inc. Storage element with clear operation and method thereof
US7458040B1 (en) * 2005-09-01 2008-11-25 Synopsys, Inc. Resettable memory apparatuses and design
US20090144504A1 (en) * 2007-12-04 2009-06-04 International Business Machines Corporation STRUCTURE FOR IMPLEMENTING REFRESHLESS SINGLE TRANSISTOR CELL eDRAM FOR HIGH PERFORMANCE MEMORY APPLICATIONS
US8024513B2 (en) * 2007-12-04 2011-09-20 International Business Machines Corporation Method and system for implementing dynamic refresh protocols for DRAM based cache
US8108609B2 (en) * 2007-12-04 2012-01-31 International Business Machines Corporation Structure for implementing dynamic refresh protocols for DRAM based cache
US20090144507A1 (en) * 2007-12-04 2009-06-04 International Business Machines Corporation APPARATUS AND METHOD FOR IMPLEMENTING REFRESHLESS SINGLE TRANSISTOR CELL eDRAM FOR HIGH PERFORMANCE MEMORY APPLICATIONS
US9646177B2 (en) * 2011-04-29 2017-05-09 Altera Corporation Systems and methods for preventing data remanence in memory systems
US11238923B2 (en) 2019-10-18 2022-02-01 Taiwan Semiconductor Manufacturing Company, Ltd. Memory device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4805149A (en) * 1986-08-28 1989-02-14 Advanced Micro Devices, Inc. Digital memory with reset/preset capabilities
JPH02121190A (ja) * 1988-10-28 1990-05-09 Fujitsu Ltd スタティック・ランダム・アクセス・メモリ
US5285420A (en) * 1989-11-24 1994-02-08 Nec Corporation Semiconductor memory device having concurrently resettable memory cells
DE68916858T2 (de) * 1988-05-18 1995-02-16 Sgs Thomson Microelectronics SRAM mit schneller Löschung von auswählbaren Eingängen/Ausgängen.
US6014732A (en) * 1997-10-22 2000-01-11 Hewlett-Packard Company Cache memory with reduced access time

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58222489A (ja) * 1982-06-18 1983-12-24 Nec Corp 半導体記憶装置
JPH0734311B2 (ja) * 1986-01-21 1995-04-12 株式会社東芝 メモリセル
US4789967A (en) * 1986-09-16 1988-12-06 Advanced Micro Devices, Inc. Random access memory device with block reset
US4858182A (en) * 1986-12-19 1989-08-15 Texas Instruments Incorporated High speed zero power reset circuit for CMOS memory cells
US4928266A (en) * 1988-05-26 1990-05-22 Visic, Inc. Static ram with high speed, low power reset
US4890263A (en) * 1988-05-31 1989-12-26 Dallas Semiconductor Corporation RAM with capability for rapid clearing of data from memory by simultaneously selecting all row lines
JPH0289288A (ja) * 1988-09-27 1990-03-29 Toshiba Corp 半導体メモリ
US5235543A (en) * 1989-12-29 1993-08-10 Intel Corporation Dual port static memory with one cycle read-modify-write
JPH04360095A (ja) 1991-06-06 1992-12-14 Nec Corp 半導体記憶回路
JPH0745077A (ja) * 1993-08-02 1995-02-14 Nec Corp 記憶装置
US5710742A (en) * 1995-05-12 1998-01-20 International Business Machines Corporation High density two port SRAM cell for low voltage CMOS applications
US5742557A (en) * 1996-06-20 1998-04-21 Northern Telecom Limited Multi-port random access memory
FR2760286B1 (fr) * 1997-02-28 1999-04-16 Sgs Thomson Microelectronics Procede d'effacement d'une memoire ram statique et memoire en circuit integre associe
US6128215A (en) 1997-08-19 2000-10-03 Altera Corporation Static random access memory circuits
US6208565B1 (en) * 2000-02-18 2001-03-27 Hewlett-Packard Company Multi-ported register structure utilizing a pulse write mechanism
US6301186B1 (en) * 2001-04-30 2001-10-09 Hewlett-Packard Company RAM cell with column clear

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4805149A (en) * 1986-08-28 1989-02-14 Advanced Micro Devices, Inc. Digital memory with reset/preset capabilities
DE68916858T2 (de) * 1988-05-18 1995-02-16 Sgs Thomson Microelectronics SRAM mit schneller Löschung von auswählbaren Eingängen/Ausgängen.
JPH02121190A (ja) * 1988-10-28 1990-05-09 Fujitsu Ltd スタティック・ランダム・アクセス・メモリ
US5285420A (en) * 1989-11-24 1994-02-08 Nec Corporation Semiconductor memory device having concurrently resettable memory cells
US6014732A (en) * 1997-10-22 2000-01-11 Hewlett-Packard Company Cache memory with reduced access time

Also Published As

Publication number Publication date
GB2377797A (en) 2003-01-22
JP2002343086A (ja) 2002-11-29
GB0208887D0 (en) 2002-05-29
GB2377797B (en) 2005-06-22
FR2828758B1 (fr) 2006-09-22
US6772277B2 (en) 2004-08-03
US20020161964A1 (en) 2002-10-31
DE10217290A1 (de) 2002-11-07
FR2828758A1 (fr) 2003-02-21

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8127 New person/name/address of the applicant

Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, TE

8127 New person/name/address of the applicant

Owner name: SAMSUNG ELECTRONICS CO., LTD., SUWON, KYONGGI, KR

8128 New person/name/address of the agent

Representative=s name: KUHNEN & WACKER PATENT- UND RECHTSANWALTSBUERO, 85

8364 No opposition during term of opposition
R071 Expiry of right