DE102023211597A1 - Halbleitervorrichtung - Google Patents
Halbleitervorrichtung Download PDFInfo
- Publication number
- DE102023211597A1 DE102023211597A1 DE102023211597.2A DE102023211597A DE102023211597A1 DE 102023211597 A1 DE102023211597 A1 DE 102023211597A1 DE 102023211597 A DE102023211597 A DE 102023211597A DE 102023211597 A1 DE102023211597 A1 DE 102023211597A1
- Authority
- DE
- Germany
- Prior art keywords
- insulating layer
- oxide
- semiconductor device
- oxide semiconductor
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
- H10D30/6713—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6757—Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/40—Crystalline structures
- H10D62/405—Orientations of crystalline planes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P10/00—Bonding of wafers, substrates or parts of devices
Landscapes
- Thin Film Transistor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022189329A JP2024077307A (ja) | 2022-11-28 | 2022-11-28 | 半導体装置 |
| JP2022-189329 | 2022-11-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102023211597A1 true DE102023211597A1 (de) | 2024-05-29 |
Family
ID=91026369
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102023211597.2A Pending DE102023211597A1 (de) | 2022-11-28 | 2023-11-22 | Halbleitervorrichtung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20240178325A1 (https=) |
| JP (1) | JP2024077307A (https=) |
| KR (1) | KR20240079175A (https=) |
| CN (1) | CN118099223A (https=) |
| DE (1) | DE102023211597A1 (https=) |
| TW (1) | TWI902041B (https=) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014099601A (ja) | 2012-10-19 | 2014-05-29 | Semiconductor Energy Lab Co Ltd | 酸化物半導体膜を含む多層膜及び半導体装置の作製方法 |
| JP2016184771A (ja) | 2012-08-03 | 2016-10-20 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2018006730A (ja) | 2016-02-12 | 2018-01-11 | 株式会社半導体エネルギー研究所 | 半導体装置、該半導体装置を有する表示装置 |
| JP2021108405A (ja) | 2010-09-13 | 2021-07-29 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP2021141338A (ja) | 2012-09-14 | 2021-09-16 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP2021153196A (ja) | 2013-09-23 | 2021-09-30 | 株式会社半導体エネルギー研究所 | 半導体装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050218407A1 (en) * | 2003-08-18 | 2005-10-06 | Yuki Matsuura | Array substrate, liquid crystal display device and method of manufacturing array substrate |
| CN102569412B (zh) * | 2010-12-20 | 2015-02-04 | 京东方科技集团股份有限公司 | 薄膜晶体管器件及其制造方法 |
| WO2012147657A1 (ja) * | 2011-04-28 | 2012-11-01 | シャープ株式会社 | 半導体装置、アクティブマトリクス基板、及び表示装置 |
| TWI644434B (zh) * | 2013-04-29 | 2018-12-11 | 日商半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| JP6970511B2 (ja) * | 2016-02-12 | 2021-11-24 | 株式会社半導体エネルギー研究所 | トランジスタ |
| CN111788664B (zh) * | 2018-03-01 | 2024-04-16 | 株式会社半导体能源研究所 | 半导体装置的制造方法 |
| US11121263B2 (en) * | 2019-08-27 | 2021-09-14 | Apple Inc. | Hydrogen trap layer for display device and the same |
| JP7534083B2 (ja) * | 2019-11-26 | 2024-08-14 | 株式会社ジャパンディスプレイ | 薄膜トランジスタの製造方法 |
-
2022
- 2022-11-28 JP JP2022189329A patent/JP2024077307A/ja active Pending
-
2023
- 2023-11-01 TW TW112141932A patent/TWI902041B/zh active
- 2023-11-21 CN CN202311553939.6A patent/CN118099223A/zh active Pending
- 2023-11-22 DE DE102023211597.2A patent/DE102023211597A1/de active Pending
- 2023-11-27 US US18/519,392 patent/US20240178325A1/en active Pending
- 2023-11-28 KR KR1020230167823A patent/KR20240079175A/ko active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021108405A (ja) | 2010-09-13 | 2021-07-29 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP2016184771A (ja) | 2012-08-03 | 2016-10-20 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2021141338A (ja) | 2012-09-14 | 2021-09-16 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP2014099601A (ja) | 2012-10-19 | 2014-05-29 | Semiconductor Energy Lab Co Ltd | 酸化物半導体膜を含む多層膜及び半導体装置の作製方法 |
| JP2021153196A (ja) | 2013-09-23 | 2021-09-30 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2018006730A (ja) | 2016-02-12 | 2018-01-11 | 株式会社半導体エネルギー研究所 | 半導体装置、該半導体装置を有する表示装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20240178325A1 (en) | 2024-05-30 |
| KR20240079175A (ko) | 2024-06-04 |
| CN118099223A (zh) | 2024-05-28 |
| TW202422890A (zh) | 2024-06-01 |
| JP2024077307A (ja) | 2024-06-07 |
| TWI902041B (zh) | 2025-10-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed | ||
| R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: H01L0029120000 Ipc: H10D0030670000 |
|
| R081 | Change of applicant/patentee |
Owner name: JAPAN DISPLAY INC., JP Free format text: FORMER OWNER: JAPAN DISPLAY INC., TOKYO, JP Owner name: IDEMITSU KOSAN CO., LTD., JP Free format text: FORMER OWNER: JAPAN DISPLAY INC., TOKYO, JP |
|
| R016 | Response to examination communication |