DE102005012993A1 - Konfokales Mikroskop - Google Patents

Konfokales Mikroskop Download PDF

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Publication number
DE102005012993A1
DE102005012993A1 DE102005012993A DE102005012993A DE102005012993A1 DE 102005012993 A1 DE102005012993 A1 DE 102005012993A1 DE 102005012993 A DE102005012993 A DE 102005012993A DE 102005012993 A DE102005012993 A DE 102005012993A DE 102005012993 A1 DE102005012993 A1 DE 102005012993A1
Authority
DE
Germany
Prior art keywords
light
splitting
reflective
confocal microscope
central
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102005012993A
Other languages
German (de)
English (en)
Inventor
Hisashi Okugawa
Naoshi Aikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Nippon Kogaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp, Nippon Kogaku KK filed Critical Nikon Corp
Publication of DE102005012993A1 publication Critical patent/DE102005012993A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • G02B21/0044Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/006Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008Details of detection or image processing, including general computer control

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
DE102005012993A 2004-03-22 2005-03-21 Konfokales Mikroskop Withdrawn DE102005012993A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004/083319 2004-03-22
JP2004083319A JP4677728B2 (ja) 2004-03-22 2004-03-22 共焦点顕微鏡及び共焦点顕微鏡システム

Publications (1)

Publication Number Publication Date
DE102005012993A1 true DE102005012993A1 (de) 2005-10-13

Family

ID=34545165

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102005012993A Withdrawn DE102005012993A1 (de) 2004-03-22 2005-03-21 Konfokales Mikroskop

Country Status (4)

Country Link
US (1) US7271953B2 (enExample)
JP (1) JP4677728B2 (enExample)
DE (1) DE102005012993A1 (enExample)
GB (1) GB2412528B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010006662A1 (de) * 2010-02-03 2011-08-04 Diehl BGT Defence GmbH & Co. KG, 88662 Vorrichtung und Verfahren zum Abbilden einer Umgebung auf eine Detektoreinrichtung

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0221014D0 (en) * 2002-09-11 2002-10-23 Medical Res Council Spectral discrimination apparatus and method
WO2006128442A1 (de) * 2005-05-31 2006-12-07 W.O.M. World Of Medicine Ag Verfahren und vorrichtung zur optischen charakterisierung von gewebe
JP2007279085A (ja) * 2006-04-03 2007-10-25 Nikon Corp 共焦点顕微鏡
DE602008006373D1 (de) * 2007-02-26 2011-06-01 Koninkl Philips Electronics Nv Verfahren und vorrichtung zur optischen gewebeanalyse
WO2008152802A1 (ja) 2007-06-13 2008-12-18 Nikon Corporation 共焦点顕微鏡装置
JP4968337B2 (ja) * 2007-06-15 2012-07-04 株式会社ニコン 共焦点顕微鏡装置
DE112015001154T5 (de) 2014-04-24 2016-12-08 Olympus Corporation Mikroskop und Mikroskopie-Verfahren
CN104296687A (zh) * 2014-11-05 2015-01-21 哈尔滨工业大学 基于荧光共焦显微技术的光滑大曲率样品测量装置与方法
CN104568884B (zh) * 2014-12-31 2017-03-29 深圳先进技术研究院 基于焦点调制的荧光显微系统及方法
WO2017046863A1 (ja) 2015-09-15 2017-03-23 オリンパス株式会社 顕微鏡および顕微鏡観察方法
US11042016B2 (en) * 2017-12-12 2021-06-22 Trustees Of Boston University Multi-Z confocal imaging system
CN108759698B (zh) * 2018-08-02 2020-02-14 淮阴师范学院 多镜面透镜组镜面间距的低相干光干涉测量方法和装置
WO2023224929A1 (en) * 2022-05-16 2023-11-23 Colgate-Palmolive Company Technologies for simultaneous sampling of more than one sample plane using a mirrored pinhole array

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH073508B2 (ja) * 1989-02-22 1995-01-18 浜松ホトニクス株式会社 コンフオーカルスキヤンニング顕微鏡
JPH0616927A (ja) 1992-06-30 1994-01-25 Kanebo Ltd ポリアミド樹脂組成物
DE4330347C2 (de) 1993-09-08 1998-04-09 Leica Lasertechnik Verwendung einer Vorrichtung zur Selektion und Detektion mindestens zweier Spektralbereiche eines Lichtstrahls
US5886784A (en) 1993-09-08 1999-03-23 Leica Lasertechink Gmbh Device for the selection and detection of at least two spectral regions in a beam of light
JPH08136815A (ja) * 1994-11-11 1996-05-31 Olympus Optical Co Ltd 共焦点走査型光学顕微鏡
US5932871A (en) 1995-11-08 1999-08-03 Olympus Optical Co., Ltd. Microscope having a confocal point and a non-confocal point, and a confocal point detect method applied thereto
DE19650391C2 (de) 1996-12-05 2001-07-26 Leica Microsystems Anordnung zur simultanen polyfokalen Abbildung des Oberflächenprofils beliebiger Objekte
JP3816632B2 (ja) * 1997-05-14 2006-08-30 オリンパス株式会社 走査型顕微鏡
JPH11237557A (ja) * 1998-02-23 1999-08-31 Olympus Optical Co Ltd 走査型光学顕微鏡
GB9825267D0 (en) 1998-11-19 1999-01-13 Medical Res Council Scanning confocal optical microscope system
US6423960B1 (en) * 1999-12-31 2002-07-23 Leica Microsystems Heidelberg Gmbh Method and system for processing scan-data from a confocal microscope
DE10132638A1 (de) * 2001-07-05 2003-01-16 Leica Microsystems Scanmikroskop und Verfahren zur wellenlängenabhängigen Detektion

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010006662A1 (de) * 2010-02-03 2011-08-04 Diehl BGT Defence GmbH & Co. KG, 88662 Vorrichtung und Verfahren zum Abbilden einer Umgebung auf eine Detektoreinrichtung
DE102010006662B4 (de) * 2010-02-03 2019-07-25 Diehl Defence Gmbh & Co. Kg Vorrichtung und Verfahren zum Abbilden einer Umgebung auf eine Detektoreinrichtung

Also Published As

Publication number Publication date
JP2005274591A (ja) 2005-10-06
GB2412528A (en) 2005-09-28
GB2412528B (en) 2009-10-21
US20050213206A1 (en) 2005-09-29
GB0505755D0 (en) 2005-04-27
JP4677728B2 (ja) 2011-04-27
US7271953B2 (en) 2007-09-18

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Legal Events

Date Code Title Description
R005 Application deemed withdrawn due to failure to request examination

Effective date: 20120322