DE102004061510A1 - Prüfvorrichtung und Prüfverfahren - Google Patents
Prüfvorrichtung und Prüfverfahren Download PDFInfo
- Publication number
- DE102004061510A1 DE102004061510A1 DE200410061510 DE102004061510A DE102004061510A1 DE 102004061510 A1 DE102004061510 A1 DE 102004061510A1 DE 200410061510 DE200410061510 DE 200410061510 DE 102004061510 A DE102004061510 A DE 102004061510A DE 102004061510 A1 DE102004061510 A1 DE 102004061510A1
- Authority
- DE
- Germany
- Prior art keywords
- jitter
- electronic device
- input signal
- sinusoidal
- deterministic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 74
- 230000002950 deficient Effects 0.000 title claims abstract description 5
- 206010044565 Tremor Diseases 0.000 claims description 112
- 238000012546 transfer Methods 0.000 claims description 42
- 238000010998 test method Methods 0.000 claims description 39
- 238000005070 sampling Methods 0.000 claims description 20
- 230000014509 gene expression Effects 0.000 description 57
- 238000011084 recovery Methods 0.000 description 11
- 230000004044 response Effects 0.000 description 11
- 238000001228 spectrum Methods 0.000 description 10
- 238000005259 measurement Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 230000000630 rising effect Effects 0.000 description 5
- 230000010363 phase shift Effects 0.000 description 4
- 238000004891 communication Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 241000238876 Acari Species 0.000 description 1
- 206010008531 Chills Diseases 0.000 description 1
- 241000272168 Laridae Species 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002068 genetic effect Effects 0.000 description 1
- RGNPBRKPHBKNKX-UHFFFAOYSA-N hexaflumuron Chemical compound C1=C(Cl)C(OC(F)(F)C(F)F)=C(Cl)C=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F RGNPBRKPHBKNKX-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000001131 transforming effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
- G01R31/2841—Signal generators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B3/00—Line transmission systems
- H04B3/02—Details
- H04B3/46—Monitoring; Testing
- H04B3/462—Testing group delay or phase shift, e.g. timing jitter
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
- H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- General Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/737,716 US7136773B2 (en) | 2003-12-16 | 2003-12-16 | Testing apparatus and testing method |
| US10/737,716 | 2003-12-16 | ||
| US10/824,763 US7397847B2 (en) | 2003-12-16 | 2004-04-14 | Testing device for testing electronic device and testing method thereof |
| US10/824,763 | 2004-04-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102004061510A1 true DE102004061510A1 (de) | 2005-10-06 |
Family
ID=34798985
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE200410061510 Withdrawn DE102004061510A1 (de) | 2003-12-16 | 2004-12-16 | Prüfvorrichtung und Prüfverfahren |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP5170939B2 (https=) |
| DE (1) | DE102004061510A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010000133B4 (de) | 2009-01-22 | 2019-07-04 | Anritsu Corp. | Vorrichtung zum Messen der Jittertransferkennlinie |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7313496B2 (en) * | 2005-02-11 | 2007-12-25 | Advantest Corporation | Test apparatus and test method for testing a device under test |
| JP4895551B2 (ja) * | 2005-08-10 | 2012-03-14 | 株式会社アドバンテスト | 試験装置および試験方法 |
| US7596173B2 (en) * | 2005-10-28 | 2009-09-29 | Advantest Corporation | Test apparatus, clock generator and electronic device |
| US8744798B2 (en) * | 2007-06-12 | 2014-06-03 | Tektronix International Sales Gmbh | Signal generator and user interface for adding amplitude noise to selected portions of a test signal |
| US8090009B2 (en) * | 2007-08-07 | 2012-01-03 | Advantest Corporation | Test apparatus |
| US7808252B2 (en) | 2007-12-13 | 2010-10-05 | Advantest Corporation | Measurement apparatus and measurement method |
| JP7481881B2 (ja) | 2020-03-31 | 2024-05-13 | 日本放送協会 | ジッタ発生装置 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0850156A (ja) * | 1994-08-05 | 1996-02-20 | Anritsu Corp | ジッタ耐力測定装置 |
| US5793822A (en) * | 1995-10-16 | 1998-08-11 | Symbios, Inc. | Bist jitter tolerance measurement technique |
| JP3857011B2 (ja) * | 2000-02-29 | 2006-12-13 | アンリツ株式会社 | ディジタルハイパスフィルタおよびディジタルハイパスフィルタを用いたジッタ測定器 |
| WO2003007578A1 (en) * | 2001-07-13 | 2003-01-23 | Anritsu Corporation | Jitter resistance measuring instrument and method for enabling efficient measurement of jitter resistance characteristic and adequate evaluation |
| JP4170918B2 (ja) * | 2002-02-06 | 2008-10-22 | 富士通株式会社 | ジッタトレランス診断方法およびジッタトレランス診断装置 |
| WO2003073115A1 (fr) * | 2002-02-26 | 2003-09-04 | Advantest Corporation | Instrument et procede de mesure |
| US7054358B2 (en) * | 2002-04-29 | 2006-05-30 | Advantest Corporation | Measuring apparatus and measuring method |
-
2004
- 2004-12-16 DE DE200410061510 patent/DE102004061510A1/de not_active Withdrawn
- 2004-12-16 JP JP2004364984A patent/JP5170939B2/ja not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010000133B4 (de) | 2009-01-22 | 2019-07-04 | Anritsu Corp. | Vorrichtung zum Messen der Jittertransferkennlinie |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005181325A (ja) | 2005-07-07 |
| JP5170939B2 (ja) | 2013-03-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20110701 |