DE102004033993B4 - Ionenquelle für ein Massenspektrometer - Google Patents

Ionenquelle für ein Massenspektrometer Download PDF

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Publication number
DE102004033993B4
DE102004033993B4 DE102004033993A DE102004033993A DE102004033993B4 DE 102004033993 B4 DE102004033993 B4 DE 102004033993B4 DE 102004033993 A DE102004033993 A DE 102004033993A DE 102004033993 A DE102004033993 A DE 102004033993A DE 102004033993 B4 DE102004033993 B4 DE 102004033993B4
Authority
DE
Germany
Prior art keywords
ion source
region
ions
discharge
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE102004033993A
Other languages
German (de)
English (en)
Other versions
DE102004033993A1 (de
Inventor
Stevan Bajic
Robert Harold Bateman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micromass UK Ltd
Original Assignee
Micromass UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micromass UK Ltd filed Critical Micromass UK Ltd
Priority to DE102004064078A priority Critical patent/DE102004064078B4/de
Publication of DE102004033993A1 publication Critical patent/DE102004033993A1/de
Application granted granted Critical
Publication of DE102004033993B4 publication Critical patent/DE102004033993B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE102004033993A 2003-07-16 2004-07-14 Ionenquelle für ein Massenspektrometer Expired - Fee Related DE102004033993B4 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE102004064078A DE102004064078B4 (de) 2003-07-16 2004-07-14 ESI/APCI-Ionenquelle und Verfahren zur Erzeugung von Ionen

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0316628A GB0316628D0 (en) 2003-07-16 2003-07-16 Mass spectrometer
GB03166287 2003-07-16

Publications (2)

Publication Number Publication Date
DE102004033993A1 DE102004033993A1 (de) 2005-02-24
DE102004033993B4 true DE102004033993B4 (de) 2010-11-25

Family

ID=27763920

Family Applications (3)

Application Number Title Priority Date Filing Date
DE102004033993A Expired - Fee Related DE102004033993B4 (de) 2003-07-16 2004-07-14 Ionenquelle für ein Massenspektrometer
DE102004064078A Expired - Fee Related DE102004064078B4 (de) 2003-07-16 2004-07-14 ESI/APCI-Ionenquelle und Verfahren zur Erzeugung von Ionen
DE200420011017 Expired - Lifetime DE202004011017U1 (de) 2003-07-16 2004-07-14 Massenspektrometer

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE102004064078A Expired - Fee Related DE102004064078B4 (de) 2003-07-16 2004-07-14 ESI/APCI-Ionenquelle und Verfahren zur Erzeugung von Ionen
DE200420011017 Expired - Lifetime DE202004011017U1 (de) 2003-07-16 2004-07-14 Massenspektrometer

Country Status (4)

Country Link
JP (1) JP4812070B2 (https=)
CA (1) CA2474836C (https=)
DE (3) DE102004033993B4 (https=)
GB (2) GB0316628D0 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005041655B4 (de) * 2005-09-02 2010-05-20 Bruker Daltonik Gmbh Erzeugung mehrfach geladener Ionen für die Tandem Massenspektrometrie
WO2012024570A2 (en) 2010-08-19 2012-02-23 Leco Corporation Mass spectrometer with soft ionizing glow discharge and conditioner
TWI488216B (zh) * 2013-04-18 2015-06-11 國立中山大學 多游離源的質譜游離裝置及質譜分析系統
JP2013254752A (ja) * 2013-09-25 2013-12-19 Shimadzu Corp 液体クロマトグラフ質量分析装置
WO2020223341A1 (en) * 2019-04-29 2020-11-05 Ohio State Innovation Foundation Method and apparatus for mass spectrometry

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA928199A (en) * 1971-06-25 1973-06-12 Canadian Patents And Development Limited Method of gas analysis
DE3938314A1 (de) * 1988-11-18 1990-05-23 Vg Instr Group Massenspektrometer
DE3913763C2 (de) * 1988-04-27 1994-07-07 Hitachi Ltd Massenspektrometer
DE19608963A1 (de) * 1995-03-28 1996-10-02 Bruker Franzen Analytik Gmbh Verfahren zur Ionisierung schwerer Moleküle bei Atmosphärendruck
WO2002078047A2 (en) * 2001-03-23 2002-10-03 The Secretary Of State For Defense Corona ionisation source

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH077660B2 (ja) * 1984-05-16 1995-01-30 株式会社日立製作所 大気圧イオン化質量分析計
JPS63193454A (ja) * 1987-02-03 1988-08-10 Hitachi Ltd 質量分析装置
JP2902197B2 (ja) * 1992-02-04 1999-06-07 株式会社日立製作所 大気圧イオン化質量分析装置
JPH06302295A (ja) * 1993-04-14 1994-10-28 Hitachi Ltd 質量分析装置および差動排気装置
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
CA2366625C (en) * 1999-03-22 2008-01-22 Analytica Of Branford, Inc. Direct flow injection analysis nebulization electrospray and apci mass spectrometry
US6573510B1 (en) * 1999-06-18 2003-06-03 The Regents Of The University Of California Charge exchange molecular ion source
US6545419B2 (en) * 2001-03-07 2003-04-08 Advanced Technology Materials, Inc. Double chamber ion implantation system
JP3660279B2 (ja) * 2001-07-23 2005-06-15 株式会社日立製作所 試料イオン化装置及び質量分析計

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA928199A (en) * 1971-06-25 1973-06-12 Canadian Patents And Development Limited Method of gas analysis
DE3913763C2 (de) * 1988-04-27 1994-07-07 Hitachi Ltd Massenspektrometer
DE3938314A1 (de) * 1988-11-18 1990-05-23 Vg Instr Group Massenspektrometer
DE19608963A1 (de) * 1995-03-28 1996-10-02 Bruker Franzen Analytik Gmbh Verfahren zur Ionisierung schwerer Moleküle bei Atmosphärendruck
WO2002078047A2 (en) * 2001-03-23 2002-10-03 The Secretary Of State For Defense Corona ionisation source

Also Published As

Publication number Publication date
GB2406703B (en) 2005-11-30
DE102004033993A1 (de) 2005-02-24
GB2406703A (en) 2005-04-06
GB0415777D0 (en) 2004-08-18
DE102004064078B4 (de) 2010-12-02
GB0316628D0 (en) 2003-08-20
DE202004011017U1 (de) 2004-11-18
CA2474836C (en) 2013-05-14
CA2474836A1 (en) 2005-01-16
JP2005135897A (ja) 2005-05-26
JP4812070B2 (ja) 2011-11-09

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