CN1956225B - 薄膜晶体管及其制造方法、具有薄膜晶体管的液晶显示面板及电发光显示面板 - Google Patents
薄膜晶体管及其制造方法、具有薄膜晶体管的液晶显示面板及电发光显示面板 Download PDFInfo
- Publication number
- CN1956225B CN1956225B CN200610152496XA CN200610152496A CN1956225B CN 1956225 B CN1956225 B CN 1956225B CN 200610152496X A CN200610152496X A CN 200610152496XA CN 200610152496 A CN200610152496 A CN 200610152496A CN 1956225 B CN1956225 B CN 1956225B
- Authority
- CN
- China
- Prior art keywords
- layer
- active layer
- driving
- gate
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6732—Bottom-gate only TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0312—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
- H10D30/0316—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes of lateral bottom-gate TFTs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/6737—Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
- H10D30/6746—Amorphous silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/441—Interconnections, e.g. scanning lines
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
- Electroluminescent Light Sources (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050102429 | 2005-10-28 | ||
| KR10-2005-0102429 | 2005-10-28 | ||
| KR1020050102429A KR101158896B1 (ko) | 2005-10-28 | 2005-10-28 | 박막트랜지스터 기판 및 이의 제조방법과,박막트랜지스터를 갖는 액정표시패널 및 전계발광 표시패널 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1956225A CN1956225A (zh) | 2007-05-02 |
| CN1956225B true CN1956225B (zh) | 2010-08-18 |
Family
ID=37995068
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200610152496XA Expired - Fee Related CN1956225B (zh) | 2005-10-28 | 2006-10-09 | 薄膜晶体管及其制造方法、具有薄膜晶体管的液晶显示面板及电发光显示面板 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7615867B2 (enExample) |
| JP (1) | JP5352912B2 (enExample) |
| KR (1) | KR101158896B1 (enExample) |
| CN (1) | CN1956225B (enExample) |
| TW (1) | TWI413256B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8440502B2 (en) | 2008-11-07 | 2013-05-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the semiconductor device |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030086166A (ko) * | 2002-05-03 | 2003-11-07 | 엘지.필립스 엘시디 주식회사 | 유기전계 발광소자와 그 제조방법 |
| US8334537B2 (en) * | 2007-07-06 | 2012-12-18 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device |
| US7897971B2 (en) * | 2007-07-26 | 2011-03-01 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
| JP2009105390A (ja) * | 2007-10-05 | 2009-05-14 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
| JP2009103732A (ja) * | 2007-10-19 | 2009-05-14 | Sony Corp | 表示装置およびその製造方法 |
| KR101432109B1 (ko) * | 2007-10-31 | 2014-08-22 | 삼성디스플레이 주식회사 | 박막 트랜지스터의 제조 방법 |
| KR101485585B1 (ko) | 2008-02-14 | 2015-01-23 | 삼성디스플레이 주식회사 | 표시 장치 및 이의 제조 방법 |
| KR101392162B1 (ko) * | 2008-02-15 | 2014-05-08 | 삼성디스플레이 주식회사 | 표시 기판 및 이의 제조 방법 |
| JP2010249935A (ja) | 2009-04-13 | 2010-11-04 | Sony Corp | 表示装置 |
| USD632657S1 (en) * | 2009-07-28 | 2011-02-15 | Panasonic Electric Works Co., Ltd. | Electro luminescence module |
| USD633450S1 (en) * | 2009-07-28 | 2011-03-01 | Panasonic Electric Works Co., Ltd. | Electro luminescence module |
| USD633054S1 (en) * | 2009-07-28 | 2011-02-22 | Panasonic Electric Works Co., Ltd. | Electro luminescence module |
| USD633055S1 (en) * | 2009-09-25 | 2011-02-22 | Panasonic Electric Works Co., Ltd. | Electro luminescence module |
| USD633057S1 (en) * | 2009-09-25 | 2011-02-22 | Panasonic Electric Works Co., Ltd. | Electro luminescence module |
| USD633451S1 (en) * | 2009-09-25 | 2011-03-01 | Panasonic Electric Works Co., Ltd. | Electro luminescence module |
| USD633056S1 (en) * | 2009-09-25 | 2011-02-22 | Panasonic Electric Works Co., Ltd. | Electro luminescence module |
| KR101638977B1 (ko) * | 2009-11-13 | 2016-07-12 | 삼성전자주식회사 | 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자 |
| KR101635212B1 (ko) * | 2009-12-14 | 2016-06-30 | 엘지디스플레이 주식회사 | 플렉서블 유기발광다이오드 표시장치와 그 제조방법 |
| USD638379S1 (en) * | 2010-04-09 | 2011-05-24 | Panasonic Electric Works Co., Ltd. | Electroluminescence module |
| USD643820S1 (en) * | 2010-04-09 | 2011-08-23 | Panasonic Electric Works Co., Ltd. | Electroluminescence module |
| USD642996S1 (en) * | 2010-04-09 | 2011-08-09 | Panasonic Electric Works Co., Ltd. | Electroluminescence apparatus |
| USD638383S1 (en) * | 2010-04-09 | 2011-05-24 | Panasonic Electric Works Co., Ltd. | Electroluminescence module |
| USD637165S1 (en) * | 2010-04-09 | 2011-05-03 | Panasonic Electric Works Co., Ltd. | Electroluminescence module |
| JP1437719S (enExample) * | 2010-04-09 | 2015-03-30 | ||
| USD638382S1 (en) * | 2010-04-09 | 2011-05-24 | Panasonic Electric Works Co., Ltd. | Electroluminescence module |
| USD637166S1 (en) * | 2010-04-09 | 2011-05-03 | Panasonic Electric Works Co., Ltd. | Electroluminescence module |
| USD638381S1 (en) * | 2010-04-09 | 2011-05-24 | Panasonic Electric Works Co., Ltd. | Electroluminescence module |
| US9178071B2 (en) * | 2010-09-13 | 2015-11-03 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| JP2013026345A (ja) * | 2011-07-19 | 2013-02-04 | Toshiba Corp | 半導体装置の製造方法 |
| CN103229301B (zh) | 2011-11-29 | 2017-02-08 | 株式会社日本有机雷特显示器 | 薄膜晶体管以及薄膜晶体管的制造方法 |
| USD742841S1 (en) * | 2013-03-26 | 2015-11-10 | Sony Corporation | Touch sensitive device |
| KR102197854B1 (ko) | 2014-05-13 | 2021-01-05 | 삼성디스플레이 주식회사 | 박막 트랜지스터, 이를 포함하는 표시기판 및 이의 제조방법 |
| KR102279884B1 (ko) * | 2014-12-05 | 2021-07-22 | 삼성디스플레이 주식회사 | 박막 트랜지스터 기판 및 그 제조 방법 |
| KR20190070380A (ko) | 2017-12-12 | 2019-06-21 | 삼성디스플레이 주식회사 | 표시 장치 |
| CN111490161A (zh) * | 2020-04-24 | 2020-08-04 | 电子科技大学 | 一种有机薄场效应晶体管及其制备方法 |
| CN113327935B (zh) * | 2021-05-21 | 2022-07-12 | Tcl华星光电技术有限公司 | 显示面板及其制备方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6255706B1 (en) * | 1999-01-13 | 2001-07-03 | Fujitsu Limited | Thin film transistor and method of manufacturing same |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03220529A (ja) * | 1990-01-25 | 1991-09-27 | Nec Corp | アクティブマトリックス液晶ディスプレイの製造方法 |
| JPH0548106A (ja) * | 1991-02-20 | 1993-02-26 | Alps Electric Co Ltd | 薄膜トランジスタ及びその製造方法 |
| JP2809153B2 (ja) * | 1995-09-28 | 1998-10-08 | 日本電気株式会社 | 液晶表示装置及びその製造方法 |
| KR0175410B1 (ko) * | 1995-11-21 | 1999-02-01 | 김광호 | 액정 표시 장치용 박막 트랜지스터 기판 및 그 제조 방법 |
| JP3873158B2 (ja) * | 1998-06-11 | 2007-01-24 | カシオ計算機株式会社 | 表示パネル及びその製造方法 |
| JP2001147424A (ja) * | 1999-11-19 | 2001-05-29 | Hitachi Ltd | 導電性薄膜形成用の絶縁基板およびこの絶縁基板を用いた液晶表示素子 |
| JP2001257350A (ja) * | 2000-03-08 | 2001-09-21 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
| TWI336921B (en) * | 2003-07-18 | 2011-02-01 | Semiconductor Energy Lab | Method for manufacturing semiconductor device |
| CN100438119C (zh) * | 2003-12-15 | 2008-11-26 | 乐金显示有限公司 | 双面板型有机电致发光器件及其制造方法 |
| KR101090252B1 (ko) * | 2004-09-24 | 2011-12-06 | 삼성전자주식회사 | 박막 트랜지스터 표시판 및 그의 제조 방법 |
-
2005
- 2005-10-28 KR KR1020050102429A patent/KR101158896B1/ko not_active Expired - Fee Related
-
2006
- 2006-09-14 TW TW095134088A patent/TWI413256B/zh not_active IP Right Cessation
- 2006-10-03 US US11/538,394 patent/US7615867B2/en not_active Expired - Fee Related
- 2006-10-09 CN CN200610152496XA patent/CN1956225B/zh not_active Expired - Fee Related
- 2006-10-30 JP JP2006294638A patent/JP5352912B2/ja not_active Expired - Fee Related
-
2009
- 2009-10-22 US US12/604,318 patent/US8088653B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6255706B1 (en) * | 1999-01-13 | 2001-07-03 | Fujitsu Limited | Thin film transistor and method of manufacturing same |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8440502B2 (en) | 2008-11-07 | 2013-05-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5352912B2 (ja) | 2013-11-27 |
| US8088653B2 (en) | 2012-01-03 |
| KR101158896B1 (ko) | 2012-06-25 |
| KR20070045770A (ko) | 2007-05-02 |
| CN1956225A (zh) | 2007-05-02 |
| US7615867B2 (en) | 2009-11-10 |
| TW200717818A (en) | 2007-05-01 |
| US20070096097A1 (en) | 2007-05-03 |
| JP2007123906A (ja) | 2007-05-17 |
| TWI413256B (zh) | 2013-10-21 |
| US20100062574A1 (en) | 2010-03-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: SAMSUNG DISPLAY CO., LTD. Free format text: FORMER OWNER: SAMSUNG ELECTRONICS CO., LTD. Effective date: 20121219 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20121219 Address after: Gyeonggi Do, South Korea Patentee after: Samsung Display Co., Ltd. Address before: Gyeonggi Do, South Korea Patentee before: Samsung Electronics Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100818 Termination date: 20161009 |
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| CF01 | Termination of patent right due to non-payment of annual fee |