CN1774766B - 具有传感放大器和自定时锁存器的存储装置及其操作方法 - Google Patents

具有传感放大器和自定时锁存器的存储装置及其操作方法 Download PDF

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Publication number
CN1774766B
CN1774766B CN200480009750XA CN200480009750A CN1774766B CN 1774766 B CN1774766 B CN 1774766B CN 200480009750X A CN200480009750X A CN 200480009750XA CN 200480009750 A CN200480009750 A CN 200480009750A CN 1774766 B CN1774766 B CN 1774766B
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Prior art keywords
data
transistor
galvanic electrode
electrode
storage unit
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Expired - Fee Related
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CN200480009750XA
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English (en)
Chinese (zh)
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CN1774766A (zh
Inventor
杰利米亚·T·C·帕默尔
佩里·H·派莱伊三世
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NXP USA Inc
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Freescale Semiconductor Inc
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/419—Read-write [R-W] circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Static Random-Access Memory (AREA)
  • Dram (AREA)
CN200480009750XA 2003-04-11 2004-04-08 具有传感放大器和自定时锁存器的存储装置及其操作方法 Expired - Fee Related CN1774766B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/412,490 2003-04-11
US10/412,490 US6862208B2 (en) 2003-04-11 2003-04-11 Memory device with sense amplifier and self-timed latch
PCT/US2004/010812 WO2004093139A2 (en) 2003-04-11 2004-04-08 Memory device with sense amplifier and self-timed latch

Publications (2)

Publication Number Publication Date
CN1774766A CN1774766A (zh) 2006-05-17
CN1774766B true CN1774766B (zh) 2012-07-04

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Family Applications (1)

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CN200480009750XA Expired - Fee Related CN1774766B (zh) 2003-04-11 2004-04-08 具有传感放大器和自定时锁存器的存储装置及其操作方法

Country Status (6)

Country Link
US (1) US6862208B2 (enExample)
JP (1) JP4504364B2 (enExample)
KR (1) KR101060037B1 (enExample)
CN (1) CN1774766B (enExample)
TW (1) TWI333209B (enExample)
WO (1) WO2004093139A2 (enExample)

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CN104036812A (zh) * 2013-03-04 2014-09-10 德克萨斯仪器股份有限公司 具有改进的时间常数的比较器

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US6757202B2 (en) * 2002-08-29 2004-06-29 Micron Technology, Inc. Bias sensing in DRAM sense amplifiers
US7042776B2 (en) * 2004-02-18 2006-05-09 International Business Machines Corporation Method and circuit for dynamic read margin control of a memory array
US6967861B2 (en) * 2004-02-27 2005-11-22 International Business Machines Corporation Method and apparatus for improving cycle time in a quad data rate SRAM device
JP2007115362A (ja) * 2005-10-21 2007-05-10 Nec Electronics Corp 半導体記憶装置
US7313040B2 (en) * 2005-10-28 2007-12-25 Sony Corporation Dynamic sense amplifier for SRAM
JP4810350B2 (ja) * 2006-08-14 2011-11-09 株式会社東芝 半導体記憶装置
CN101118780B (zh) * 2007-09-18 2010-09-08 钰创科技股份有限公司 一种具有感测放大器的闩锁器
AU2009346782A1 (en) * 2009-05-29 2011-12-15 El-Forest Ab Hybrid utility vehicle
US8593896B2 (en) * 2011-03-30 2013-11-26 Taiwan Semiconductor Manufacturing Company, Ltd. Differential read write back sense amplifier circuits and methods
US8604838B2 (en) * 2011-12-12 2013-12-10 Texas Instruments Incorporated Comparator with improved time constant
KR102076602B1 (ko) 2013-02-19 2020-02-13 삼성전자주식회사 센스앰프회로 및 반도체 메모리 장치
WO2015079608A1 (ja) * 2013-11-27 2015-06-04 株式会社ソシオネクスト 半導体記憶装置
JP2016062618A (ja) * 2014-09-12 2016-04-25 株式会社東芝 半導体記憶装置
TWI537975B (zh) * 2014-11-27 2016-06-11 常憶科技股份有限公司 自我時序差動放大器
US9281041B1 (en) 2014-12-16 2016-03-08 Honeywell International Inc. Delay-based read system for a magnetoresistive random access memory (MRAM) bit
US9548089B2 (en) * 2015-04-01 2017-01-17 Qualcomm Incorporated Pipelining an asynchronous memory reusing a sense amp and an output latch
US9881687B2 (en) * 2015-12-18 2018-01-30 Texas Instruments Incorporated Self-latch sense timing in a one-time-programmable memory architecture
CN105976859B (zh) * 2016-05-20 2019-05-17 西安紫光国芯半导体有限公司 一种超低写功耗的静态随机存储器写操作的控制方法
KR102548599B1 (ko) * 2016-06-17 2023-06-29 삼성전자주식회사 버퍼메모리를 포함하는 메모리 장치 및 이를 포함하는 메모리 모듈
FR3055735B1 (fr) * 2016-09-07 2018-09-28 Commissariat A L'energie Atomique Et Aux Energies Alternatives Amplificateur de detection apte a controler une operation de lecture dans une memoire
US9997212B1 (en) * 2017-04-24 2018-06-12 Micron Technology, Inc. Accessing data in memory
US10170164B1 (en) * 2018-02-13 2019-01-01 Globalfoundries Inc. Sense amplifier latch circuit and sense amplifier multiplexed latch circuit
US10290340B1 (en) * 2018-03-29 2019-05-14 Qualcomm Technologies, Incorporated Offset-canceling (OC) write operation sensing circuits for sensing switching in a magneto-resistive random access memory (MRAM) bit cell in an MRAM for a write operation
TWI693766B (zh) 2018-04-18 2020-05-11 力旺電子股份有限公司 靜電放電防護裝置
KR102562118B1 (ko) * 2018-06-26 2023-08-02 에스케이하이닉스 주식회사 신호 수신 회로
US10923185B2 (en) * 2019-06-04 2021-02-16 Qualcomm Incorporated SRAM with burst mode operation
US11328752B2 (en) * 2020-05-20 2022-05-10 Silicon Storage Technology, Inc. Self-timed sensing architecture for a non-volatile memory system
CN113674777B (zh) * 2021-10-21 2022-03-15 北京紫光青藤微系统有限公司 数据存储装置和用于调用存储数据的方法
KR102754466B1 (ko) * 2022-12-30 2025-01-13 성균관대학교산학협력단 비휘발성 메모리용 의사-차동 고속 감지 스킴

Citations (3)

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US5701268A (en) * 1995-08-23 1997-12-23 Samsung Electronics Co., Ltd. Sense amplifier for integrated circuit memory devices having boosted sense and current drive capability and methods of operating same
CN1201985A (zh) * 1997-02-27 1998-12-16 日本电气株式会社 高读出速度的多值只读存储装置
US6445632B2 (en) * 2000-02-15 2002-09-03 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory device for fast access

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US5267197A (en) * 1990-12-13 1993-11-30 Sgs-Thomson Microelectronics, Inc. Read/write memory having an improved write driver
JP3169819B2 (ja) * 1996-02-28 2001-05-28 日本電気アイシーマイコンシステム株式会社 半導体記憶装置
JPH09284100A (ja) * 1996-04-19 1997-10-31 Hitachi Ltd レジスタ回路
US6101145A (en) 1998-12-21 2000-08-08 Motorola, Inc. Sensing circuit and method

Patent Citations (3)

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Publication number Priority date Publication date Assignee Title
US5701268A (en) * 1995-08-23 1997-12-23 Samsung Electronics Co., Ltd. Sense amplifier for integrated circuit memory devices having boosted sense and current drive capability and methods of operating same
CN1201985A (zh) * 1997-02-27 1998-12-16 日本电气株式会社 高读出速度的多值只读存储装置
US6445632B2 (en) * 2000-02-15 2002-09-03 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory device for fast access

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104036812A (zh) * 2013-03-04 2014-09-10 德克萨斯仪器股份有限公司 具有改进的时间常数的比较器
CN104036812B (zh) * 2013-03-04 2017-04-12 德克萨斯仪器股份有限公司 具有改进的时间常数的比较器

Also Published As

Publication number Publication date
KR101060037B1 (ko) 2011-08-29
WO2004093139A3 (en) 2005-04-07
KR20060002967A (ko) 2006-01-09
TWI333209B (en) 2010-11-11
WO2004093139B1 (en) 2005-09-15
WO2004093139A2 (en) 2004-10-28
US20040202014A1 (en) 2004-10-14
JP2006523360A (ja) 2006-10-12
US6862208B2 (en) 2005-03-01
TW200504751A (en) 2005-02-01
JP4504364B2 (ja) 2010-07-14
CN1774766A (zh) 2006-05-17

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